JPS5730943A - Detecting method for defect in ferromagnetic material - Google Patents

Detecting method for defect in ferromagnetic material

Info

Publication number
JPS5730943A
JPS5730943A JP10646780A JP10646780A JPS5730943A JP S5730943 A JPS5730943 A JP S5730943A JP 10646780 A JP10646780 A JP 10646780A JP 10646780 A JP10646780 A JP 10646780A JP S5730943 A JPS5730943 A JP S5730943A
Authority
JP
Japan
Prior art keywords
defective part
ferromagnetic material
inspected
poles
magnetic sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10646780A
Other languages
Japanese (ja)
Inventor
Keigo Sasabayashi
Atsuhiko Matsuda
Nobuyuki Yamaji
Junichi Ujigawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Koji KK
Original Assignee
Showa Koji KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Koji KK filed Critical Showa Koji KK
Priority to JP10646780A priority Critical patent/JPS5730943A/en
Publication of JPS5730943A publication Critical patent/JPS5730943A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To enable a rapid and reliable detection of a defective part generated in a ferromagnetic material, by a method wherein a defect detecting probe, in which a magnetic sensor is adhered to one magnetic pole of a magnet, is brought into contact with an object to be inspected. CONSTITUTION:A detecting part is moved in a state that a space between poles, appearing at the end surfaces of ferromagnetic substances 5, 5', which is magnetically closely adhered to a magnet 3, and poles, positioned facing confrontedly to said poles and appearing at a surface of an object 1 to be inspected, is spaced at a given interval by means of a spacer 6, and as a result, a density of magnetic flux at a defective part 2 decreases as compared with that of a nondefective part. The change in density is detected by means of a bridge circuit, in which a magnetic sensor 4 adhered to the interposing substance 5 and a compensating magnetic sensor 4' positioned in a nonmagnetic field state are connected together, to detect the presence of a defective part in the object to be inspected. This permits the reliable and easy detection of the position and size of the defective part in a ferromagnetic material, and besides, permits detection of the defective part in accordance with the shape of the ferromagnetic material.
JP10646780A 1980-08-04 1980-08-04 Detecting method for defect in ferromagnetic material Pending JPS5730943A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10646780A JPS5730943A (en) 1980-08-04 1980-08-04 Detecting method for defect in ferromagnetic material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10646780A JPS5730943A (en) 1980-08-04 1980-08-04 Detecting method for defect in ferromagnetic material

Publications (1)

Publication Number Publication Date
JPS5730943A true JPS5730943A (en) 1982-02-19

Family

ID=14434349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10646780A Pending JPS5730943A (en) 1980-08-04 1980-08-04 Detecting method for defect in ferromagnetic material

Country Status (1)

Country Link
JP (1) JPS5730943A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0266103A2 (en) * 1986-10-31 1988-05-04 Electric Power Research Institute, Inc Magnetic flux leakage probe for use in nondestructive testing
US6150809A (en) * 1996-09-20 2000-11-21 Tpl, Inc. Giant magnetorestive sensors and sensor arrays for detection and imaging of anomalies in conductive materials
US7176681B2 (en) 2005-03-08 2007-02-13 Siemens Power Generation, Inc. Inspection of composite components using magnetic resonance imaging
WO2015140220A1 (en) * 2014-03-18 2015-09-24 Sensitec Gmbh Magnetic field sensor arrangement
WO2019107575A1 (en) * 2017-12-01 2019-06-06 住友化学株式会社 Defect measurement device, defect measurement method, and inspection probe

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0266103A2 (en) * 1986-10-31 1988-05-04 Electric Power Research Institute, Inc Magnetic flux leakage probe for use in nondestructive testing
US6150809A (en) * 1996-09-20 2000-11-21 Tpl, Inc. Giant magnetorestive sensors and sensor arrays for detection and imaging of anomalies in conductive materials
US7176681B2 (en) 2005-03-08 2007-02-13 Siemens Power Generation, Inc. Inspection of composite components using magnetic resonance imaging
WO2015140220A1 (en) * 2014-03-18 2015-09-24 Sensitec Gmbh Magnetic field sensor arrangement
WO2019107575A1 (en) * 2017-12-01 2019-06-06 住友化学株式会社 Defect measurement device, defect measurement method, and inspection probe
JP2019100850A (en) * 2017-12-01 2019-06-24 住友化学株式会社 Defect measuring apparatus, defect measuring method, and inspection probe
CN111417851A (en) * 2017-12-01 2020-07-14 住友化学株式会社 Defect measuring device, defect measuring method, and inspection probe
US11821870B2 (en) 2017-12-01 2023-11-21 Sumitomo Chemical Company, Limited Defect measurement device, defect measurement method, and inspection probe

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