JPS5724869A - High voltage pulse applicator - Google Patents
High voltage pulse applicatorInfo
- Publication number
- JPS5724869A JPS5724869A JP10019380A JP10019380A JPS5724869A JP S5724869 A JPS5724869 A JP S5724869A JP 10019380 A JP10019380 A JP 10019380A JP 10019380 A JP10019380 A JP 10019380A JP S5724869 A JPS5724869 A JP S5724869A
- Authority
- JP
- Japan
- Prior art keywords
- terminals
- sockets
- charging
- high voltage
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To improve the mounting condition about sockets by commonly connecting high voltage terminals of charging relays in N sets of specified charging/discharging circuits while free terminals of discharging relays are separately connected direct to sample socket terminals. CONSTITUTION:N sets of charging/discharging circuits comprising R c, R b and CcD are so arranged that R c is connected in common on the high voltage side while contact terminals on the side of sample IC sockets of R D are connected to terminals of IC sockets respectively. Thus, the charging/discharging circuits are packaged in a radial manner centered on IC sockets. Connection points of R c, R D and CcD are mounted lifted from a package substrate while the terminals of R D and IC sockets are connected lifted from the package substrate. This reduces the distance between the R D and the sample IC socket terminals thereby lessening the capacitance while eliminating crossing between wires. Accordingly, induction can be prevented improving the mounting condition about the sockets.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10019380A JPS5724869A (en) | 1980-07-22 | 1980-07-22 | High voltage pulse applicator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10019380A JPS5724869A (en) | 1980-07-22 | 1980-07-22 | High voltage pulse applicator |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5724869A true JPS5724869A (en) | 1982-02-09 |
Family
ID=14267460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10019380A Pending JPS5724869A (en) | 1980-07-22 | 1980-07-22 | High voltage pulse applicator |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5724869A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6011083U (en) * | 1983-06-30 | 1985-01-25 | 日本電気ホームエレクトロニクス株式会社 | Characteristic testing equipment for electronic components |
US4812755A (en) * | 1986-06-05 | 1989-03-14 | Hanwa Electronic Co., Ltd. | Base board for testing integrated circuits |
-
1980
- 1980-07-22 JP JP10019380A patent/JPS5724869A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6011083U (en) * | 1983-06-30 | 1985-01-25 | 日本電気ホームエレクトロニクス株式会社 | Characteristic testing equipment for electronic components |
US4812755A (en) * | 1986-06-05 | 1989-03-14 | Hanwa Electronic Co., Ltd. | Base board for testing integrated circuits |
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