JPS57172207A - Measuring method for plating thickness by x rays - Google Patents

Measuring method for plating thickness by x rays

Info

Publication number
JPS57172207A
JPS57172207A JP5746081A JP5746081A JPS57172207A JP S57172207 A JPS57172207 A JP S57172207A JP 5746081 A JP5746081 A JP 5746081A JP 5746081 A JP5746081 A JP 5746081A JP S57172207 A JPS57172207 A JP S57172207A
Authority
JP
Japan
Prior art keywords
rays
fluorescent
plating layer
nickel
iron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5746081A
Other languages
Japanese (ja)
Inventor
Yoshio Uto
Kazuo Sasaki
Susumu Hiradate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP5746081A priority Critical patent/JPS57172207A/en
Publication of JPS57172207A publication Critical patent/JPS57172207A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the thickness of a plating layer accurately by passing fluorescent X rays from the plating layer consisting of metallic materials having an unknown composite ratio through an metallic filter of the same material with a base material and another metallic filter of the same material with objective metal in the plating layer. CONSTITUTION:When a steel plate 5 having a composite plating layer 3 consisting of zinc and nickel is irradiated with X rays 8 from an X-ray tube 7, fluorescent X rays 10 are emitted. The fluorescent X rays 10 include fluorescent X rays emitted from the zinc and nickel in the plating layer 3 and iron in the steel plate 5. Iron fluorescent X rays 10a separated and extracted by an iron filter 13 are maded into the 1st detection pulse P1 which has density corresponding to the intensity by an ionization box 15, and it is amplified at a part 16 to obtain the 1st detection signal D1. From iron fluorescent X rays 10a and nickel fluorescent X rays 10b separated and extracted by a nickel filter 14, the 2nd detection signal D2 is obtained similarly. Then, both the signals D1 and D2 inputted to a central arithmetic device 20 through an interface 19 are processed to measure the thickness of the plating layer.
JP5746081A 1981-04-16 1981-04-16 Measuring method for plating thickness by x rays Pending JPS57172207A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5746081A JPS57172207A (en) 1981-04-16 1981-04-16 Measuring method for plating thickness by x rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5746081A JPS57172207A (en) 1981-04-16 1981-04-16 Measuring method for plating thickness by x rays

Publications (1)

Publication Number Publication Date
JPS57172207A true JPS57172207A (en) 1982-10-23

Family

ID=13056282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5746081A Pending JPS57172207A (en) 1981-04-16 1981-04-16 Measuring method for plating thickness by x rays

Country Status (1)

Country Link
JP (1) JPS57172207A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179705A (en) * 1981-04-30 1982-11-05 Sumitomo Metal Ind Ltd Method and device for measuring thickness of alloy plating
EP0465797A2 (en) * 1990-07-06 1992-01-15 Eberline Instruments GmbH Apparatus for measuring the iron content in zinc layers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179705A (en) * 1981-04-30 1982-11-05 Sumitomo Metal Ind Ltd Method and device for measuring thickness of alloy plating
EP0465797A2 (en) * 1990-07-06 1992-01-15 Eberline Instruments GmbH Apparatus for measuring the iron content in zinc layers

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