JPS57172207A - Measuring method for plating thickness by x rays - Google Patents
Measuring method for plating thickness by x raysInfo
- Publication number
- JPS57172207A JPS57172207A JP5746081A JP5746081A JPS57172207A JP S57172207 A JPS57172207 A JP S57172207A JP 5746081 A JP5746081 A JP 5746081A JP 5746081 A JP5746081 A JP 5746081A JP S57172207 A JPS57172207 A JP S57172207A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- fluorescent
- plating layer
- nickel
- iron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To measure the thickness of a plating layer accurately by passing fluorescent X rays from the plating layer consisting of metallic materials having an unknown composite ratio through an metallic filter of the same material with a base material and another metallic filter of the same material with objective metal in the plating layer. CONSTITUTION:When a steel plate 5 having a composite plating layer 3 consisting of zinc and nickel is irradiated with X rays 8 from an X-ray tube 7, fluorescent X rays 10 are emitted. The fluorescent X rays 10 include fluorescent X rays emitted from the zinc and nickel in the plating layer 3 and iron in the steel plate 5. Iron fluorescent X rays 10a separated and extracted by an iron filter 13 are maded into the 1st detection pulse P1 which has density corresponding to the intensity by an ionization box 15, and it is amplified at a part 16 to obtain the 1st detection signal D1. From iron fluorescent X rays 10a and nickel fluorescent X rays 10b separated and extracted by a nickel filter 14, the 2nd detection signal D2 is obtained similarly. Then, both the signals D1 and D2 inputted to a central arithmetic device 20 through an interface 19 are processed to measure the thickness of the plating layer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5746081A JPS57172207A (en) | 1981-04-16 | 1981-04-16 | Measuring method for plating thickness by x rays |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5746081A JPS57172207A (en) | 1981-04-16 | 1981-04-16 | Measuring method for plating thickness by x rays |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57172207A true JPS57172207A (en) | 1982-10-23 |
Family
ID=13056282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5746081A Pending JPS57172207A (en) | 1981-04-16 | 1981-04-16 | Measuring method for plating thickness by x rays |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57172207A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57179705A (en) * | 1981-04-30 | 1982-11-05 | Sumitomo Metal Ind Ltd | Method and device for measuring thickness of alloy plating |
EP0465797A2 (en) * | 1990-07-06 | 1992-01-15 | Eberline Instruments GmbH | Apparatus for measuring the iron content in zinc layers |
-
1981
- 1981-04-16 JP JP5746081A patent/JPS57172207A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57179705A (en) * | 1981-04-30 | 1982-11-05 | Sumitomo Metal Ind Ltd | Method and device for measuring thickness of alloy plating |
EP0465797A2 (en) * | 1990-07-06 | 1992-01-15 | Eberline Instruments GmbH | Apparatus for measuring the iron content in zinc layers |
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