JPS57172206A - Correcting method for drift of plating thickness gauge - Google Patents

Correcting method for drift of plating thickness gauge

Info

Publication number
JPS57172206A
JPS57172206A JP5745981A JP5745981A JPS57172206A JP S57172206 A JPS57172206 A JP S57172206A JP 5745981 A JP5745981 A JP 5745981A JP 5745981 A JP5745981 A JP 5745981A JP S57172206 A JPS57172206 A JP S57172206A
Authority
JP
Japan
Prior art keywords
rays
steel plate
measured
measured value
drift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5745981A
Other languages
Japanese (ja)
Inventor
Kazuo Sasaki
Susumu Hiradate
Yoshio Uto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP5745981A priority Critical patent/JPS57172206A/en
Publication of JPS57172206A publication Critical patent/JPS57172206A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To improve precision by correcting the drift of the measured value of a body to be measured by using the measured value of a standard sample of a physically and chemically stable material having equivalent characteristics to X rays to the body to be measured. CONSTITUTION:When X rays 14 radiated from an X-ray tube 2 strike a plated steel plate 15 to be measured, fluorescent X rays 16 are inputted to a detector 3 to detect the intensity of the flourescent X rays which varies with plating thickness. Standard samples 17 and 18 of chemically stable materials having less variation in characteristics with temperature and less variation due to the X rays while having equivalent characteristics to the X rays to the plate steel plate 15 are arranged near the plated steel plate 15. At prescribed intervals of time, a heat moves along a guide rod 8 by a motor 11 and a screw rod 9 to take measurements of those standard samples. From the obtained data, the variation extents of the offset and gain of a measurement system are calculated to correct the measured value of the plating steel plate 15.
JP5745981A 1981-04-16 1981-04-16 Correcting method for drift of plating thickness gauge Pending JPS57172206A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5745981A JPS57172206A (en) 1981-04-16 1981-04-16 Correcting method for drift of plating thickness gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5745981A JPS57172206A (en) 1981-04-16 1981-04-16 Correcting method for drift of plating thickness gauge

Publications (1)

Publication Number Publication Date
JPS57172206A true JPS57172206A (en) 1982-10-23

Family

ID=13056251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5745981A Pending JPS57172206A (en) 1981-04-16 1981-04-16 Correcting method for drift of plating thickness gauge

Country Status (1)

Country Link
JP (1) JPS57172206A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61155917A (en) * 1984-12-28 1986-07-15 Shimadzu Corp Method for displaying output of measuring apparatus
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness
EP0439912A2 (en) * 1989-11-30 1991-08-07 Texas Instruments Incorporated Circuit and method for normalizing detector output
US5274578A (en) * 1989-11-30 1993-12-28 Texas Instruments Incorporated Circuit and method for normalizing detector circuit
KR100933641B1 (en) * 2008-04-16 2009-12-23 주식회사 보광기계 Material inspection device and specimen mounting device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61155917A (en) * 1984-12-28 1986-07-15 Shimadzu Corp Method for displaying output of measuring apparatus
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness
EP0439912A2 (en) * 1989-11-30 1991-08-07 Texas Instruments Incorporated Circuit and method for normalizing detector output
US5274578A (en) * 1989-11-30 1993-12-28 Texas Instruments Incorporated Circuit and method for normalizing detector circuit
KR100933641B1 (en) * 2008-04-16 2009-12-23 주식회사 보광기계 Material inspection device and specimen mounting device

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