JPS57172206A - Correcting method for drift of plating thickness gauge - Google Patents
Correcting method for drift of plating thickness gaugeInfo
- Publication number
- JPS57172206A JPS57172206A JP5745981A JP5745981A JPS57172206A JP S57172206 A JPS57172206 A JP S57172206A JP 5745981 A JP5745981 A JP 5745981A JP 5745981 A JP5745981 A JP 5745981A JP S57172206 A JPS57172206 A JP S57172206A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- steel plate
- measured
- measured value
- drift
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To improve precision by correcting the drift of the measured value of a body to be measured by using the measured value of a standard sample of a physically and chemically stable material having equivalent characteristics to X rays to the body to be measured. CONSTITUTION:When X rays 14 radiated from an X-ray tube 2 strike a plated steel plate 15 to be measured, fluorescent X rays 16 are inputted to a detector 3 to detect the intensity of the flourescent X rays which varies with plating thickness. Standard samples 17 and 18 of chemically stable materials having less variation in characteristics with temperature and less variation due to the X rays while having equivalent characteristics to the X rays to the plate steel plate 15 are arranged near the plated steel plate 15. At prescribed intervals of time, a heat moves along a guide rod 8 by a motor 11 and a screw rod 9 to take measurements of those standard samples. From the obtained data, the variation extents of the offset and gain of a measurement system are calculated to correct the measured value of the plating steel plate 15.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5745981A JPS57172206A (en) | 1981-04-16 | 1981-04-16 | Correcting method for drift of plating thickness gauge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5745981A JPS57172206A (en) | 1981-04-16 | 1981-04-16 | Correcting method for drift of plating thickness gauge |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57172206A true JPS57172206A (en) | 1982-10-23 |
Family
ID=13056251
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5745981A Pending JPS57172206A (en) | 1981-04-16 | 1981-04-16 | Correcting method for drift of plating thickness gauge |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57172206A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61155917A (en) * | 1984-12-28 | 1986-07-15 | Shimadzu Corp | Method for displaying output of measuring apparatus |
US4656357A (en) * | 1985-04-16 | 1987-04-07 | Twin City International, Inc. | Apparatus for measuring coating thickness |
EP0439912A2 (en) * | 1989-11-30 | 1991-08-07 | Texas Instruments Incorporated | Circuit and method for normalizing detector output |
US5274578A (en) * | 1989-11-30 | 1993-12-28 | Texas Instruments Incorporated | Circuit and method for normalizing detector circuit |
KR100933641B1 (en) * | 2008-04-16 | 2009-12-23 | 주식회사 보광기계 | Material inspection device and specimen mounting device |
-
1981
- 1981-04-16 JP JP5745981A patent/JPS57172206A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61155917A (en) * | 1984-12-28 | 1986-07-15 | Shimadzu Corp | Method for displaying output of measuring apparatus |
US4656357A (en) * | 1985-04-16 | 1987-04-07 | Twin City International, Inc. | Apparatus for measuring coating thickness |
EP0439912A2 (en) * | 1989-11-30 | 1991-08-07 | Texas Instruments Incorporated | Circuit and method for normalizing detector output |
US5274578A (en) * | 1989-11-30 | 1993-12-28 | Texas Instruments Incorporated | Circuit and method for normalizing detector circuit |
KR100933641B1 (en) * | 2008-04-16 | 2009-12-23 | 주식회사 보광기계 | Material inspection device and specimen mounting device |
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