JPS5714717A - Interpolation - Google Patents

Interpolation

Info

Publication number
JPS5714717A
JPS5714717A JP6434881A JP6434881A JPS5714717A JP S5714717 A JPS5714717 A JP S5714717A JP 6434881 A JP6434881 A JP 6434881A JP 6434881 A JP6434881 A JP 6434881A JP S5714717 A JPS5714717 A JP S5714717A
Authority
JP
Japan
Prior art keywords
interpolation
scanning
computer
direct voltage
correction values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6434881A
Other languages
English (en)
Inventor
Shiyuueefueru Erunsuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Publication of JPS5714717A publication Critical patent/JPS5714717A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/24409—Interpolation using memories

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Complex Calculations (AREA)
  • Automatic Focus Adjustment (AREA)
  • Optical Transform (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
JP6434881A 1980-06-30 1981-04-30 Interpolation Pending JPS5714717A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3024716A DE3024716C2 (de) 1980-06-30 1980-06-30 Digitales Längen- oder Winkelmeßsystem

Publications (1)

Publication Number Publication Date
JPS5714717A true JPS5714717A (en) 1982-01-26

Family

ID=6106026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6434881A Pending JPS5714717A (en) 1980-06-30 1981-04-30 Interpolation

Country Status (5)

Country Link
US (1) US4462083A (ja)
EP (1) EP0042917B1 (ja)
JP (1) JPS5714717A (ja)
AT (1) ATE18097T1 (ja)
DE (1) DE3024716C2 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59144516U (ja) * 1983-03-18 1984-09-27 横河電機株式会社 光学式スケ−ル読取装置
JPS59146722U (ja) * 1983-03-23 1984-10-01 横河電機株式会社 光学式スケ−ル読取装置
WO1986000401A1 (en) * 1984-06-26 1986-01-16 Fanuc Ltd Device for detecting absolute position
JPS62142220A (ja) * 1985-12-17 1987-06-25 Makome Kenkyusho:Kk デコ−ダを用いる内插回路
JPH0238814A (ja) * 1988-07-27 1990-02-08 Tokyo Seimitsu Co Ltd ディジタル位相検出方法
JPH03177495A (ja) * 1989-12-06 1991-08-01 Sumitomo Metal Ind Ltd 石炭の液化方法

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3202339C2 (de) * 1982-01-26 1983-12-15 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Digitale elektrische Längen- oder Winkelmeßeinrichtung
DE3213267A1 (de) * 1982-04-08 1983-10-20 Nukem Gmbh, 6450 Hanau Verfahren und vorrichtung zur pruefung von werkstoffen nach dem wirbelstromprinzip
AT397157B (de) * 1982-12-24 1994-02-25 Heinz Rieder Verfahren zum auswerten von messsignalen, die durch abtastung eines inkrementalmassstabes mit einer abtasteinheit erzeugt werden und messeinrichtung zur durchführung dieses verfahrens
DE3409891C2 (de) * 1984-03-17 1986-04-17 Kuhnke, Falko, Dr., 3300 Braunschweig Verfahren zum Interpolieren von ortsperiodischen elektrischen Signalen
CH666348A5 (de) * 1984-04-12 1988-07-15 Heinz Rieder Verfahren zum auswerten von messsignalen, die durch abtastung eines inkrementalmassstabes mit einer abtasteinheit erhalten werden und messeinrichtung zur durchfuehrung dieses verfahrens.
DE3417015C2 (de) * 1984-05-09 1986-03-13 Preibisch, Herbert, Dr.-Ing., 8000 München Interpolationsverfahren
DE3417016C1 (de) * 1984-05-09 1985-12-05 Preibisch, Herbert, Dr.-Ing., 8000 München Verfahren zur Ermittlung der Lage und Geschwindigkeit von Objekten
US4631520A (en) * 1984-06-08 1986-12-23 Dynamics Research Corporation Position encoder compensation system
AT379893B (de) * 1984-07-03 1986-03-10 R S F Elektronik Ohg Rechtsfor Verfahren zur digitalen elektrischen laengenoder winkelmessung und schaltungsanordnung zur durchfuehrung dieses verfahrens
DE3443176C1 (de) * 1984-11-27 1990-11-15 Angewandte Digital Elektronik Gmbh, 2051 Brunstorf Verfahren zur Kalibrierung eines elektronischen Positionsgebers
US5229957A (en) * 1986-04-17 1993-07-20 Robert Bosch Gmbh Method for tolerance compensation of a position transducer
US4751655A (en) * 1986-06-11 1988-06-14 Amoco Corporation Method of reconstituting seismic data
WO1987007943A1 (en) * 1986-06-21 1987-12-30 Renishaw Plc Interpolation apparatus
JPS63159983A (ja) * 1986-12-23 1988-07-02 Dainippon Screen Mfg Co Ltd ルツクアツプテ−ブルデ−タの生成方法および装置
DE4014479A1 (de) * 1989-05-11 1990-11-15 Volkswagen Ag Einrichtung zur ermittlung der bewegungsstrecke zwischen zwei relativbewegungen ausfuehrenden teilen
GB2233457A (en) * 1989-06-21 1991-01-09 Schlumberger Technologies Ltd Temperature reference junction for a multichannel temperature sensing system.
JP2515891B2 (ja) * 1989-09-20 1996-07-10 株式会社日立製作所 角度センサ及びトルクセンサ、そのセンサの出力に応じて制御される電動パワ―ステアリング装置
JP2582906B2 (ja) * 1989-10-21 1997-02-19 東芝マイクロエレクトロニクス株式会社 半導体装置の直流電流・電圧特性の測定方法
US5173936A (en) * 1990-05-08 1992-12-22 The Goeken Group Corporation Telephone handset holder assembly
JP3029657B2 (ja) * 1990-09-28 2000-04-04 カヤバ工業株式会社 位置検出装置
JP3173531B2 (ja) * 1992-09-18 2001-06-04 ソニー株式会社 位置検出方法
US5748195A (en) * 1992-10-29 1998-05-05 International Business Machines Corporation Method and means for evaluating a tetrahedral linear interpolation function
US5432892A (en) * 1992-11-25 1995-07-11 International Business Machines Corporation Volummetric linear interpolation
JPH06167354A (ja) * 1992-11-27 1994-06-14 Sony Magnescale Inc スケールの内挿処理装置
US5751926A (en) * 1992-12-23 1998-05-12 International Business Machines Corporation Function approximation using a centered cubic packing with tetragonal disphenoid extraction
US5390035A (en) * 1992-12-23 1995-02-14 International Business Machines Corporation Method and means for tetrahedron/octahedron packing and tetrahedron extraction for function approximation
DE69414173T2 (de) * 1993-05-28 1999-06-02 Eastman Kodak Co Verfahren und Gerät zum Bestimmen von Farbflächengrenzen und Vorrichtung zur Beschreibung von Farbflächen
US5625378A (en) * 1993-05-28 1997-04-29 Eastman Kodak Company Method and apparatus for convex interpolation for color calibration
JPH07229757A (ja) * 1994-02-18 1995-08-29 Canon Inc 信号処理装置、位置検出装置及び駆動装置
WO1995024612A1 (de) * 1994-03-07 1995-09-14 International Business Machines Corporation Verfahren und vorrichtung zur schnellen interpolation von zwischenwerten aus periodischen phasenverschobenen signalen und zur erkennung von defekten in einem drehkörper
US5442313A (en) * 1994-05-27 1995-08-15 The Torrington Company Resolution multiplying circuit
JP3367226B2 (ja) * 1994-10-20 2003-01-14 ソニー・プレシジョン・テクノロジー株式会社 変位量検出装置
DE19502276C2 (de) * 1995-01-26 1999-12-09 Gemac Ges Fuer Mikroelektronik Interpolationsverfahren und hochauflösende digitale Interpolationseinrichtung
US5590059A (en) * 1995-03-14 1996-12-31 Schier; J. Alan Position encoder system which utilites the fundamental frequency of a ruled scale on an object
US6137494A (en) * 1995-08-18 2000-10-24 International Business Machines Corporation Method and means for evaluating a tetrahedral linear interpolation function
DE19544948C2 (de) * 1995-12-01 2002-09-26 Gemac Ges Fuer Mikroelektronik Digitale Interpolationseinrichtung mit Amplituden- und Nullageregelung der Eingangssignale
DE19548385C2 (de) * 1995-12-22 1998-11-12 Siemens Ag Verfahren zur Ermittlung der Winkelposition einer Drehachse eines Gegenstandes durch einen Rechner
DE19712622C5 (de) * 1997-03-26 2010-07-15 Dr. Johannes Heidenhain Gmbh Anordnung und Verfahren zur automatischen Korrektur fehlerbehafteter Abtastsignale inkrementaler Positionsmeßeinrichtungen
DE59814046D1 (de) † 1997-04-16 2007-08-09 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung
DE19831960A1 (de) * 1998-07-16 2000-01-20 Itt Mfg Enterprises Inc Wegsensor
DE19934478B4 (de) * 1999-07-27 2007-12-27 GEMAC-Gesellschaft für Mikroelektronikanwendung Chemnitz mbH Digitale Interpolationseinrichtung
DE19938802B4 (de) * 1999-08-16 2004-04-08 Dr. Johannes Heidenhain Gmbh Verfahren und Schaltungsanorndung zur Interpolation
EP1195880B1 (de) * 2000-10-04 2003-09-17 Nti Ag Verfahren zur Erhöhung der Positioniergenauigkeit eines relativ zu einem Stator bewegbar angeordneten Elements
DE10054075A1 (de) * 2000-10-31 2002-05-08 Heidenhain Gmbh Dr Johannes Verfahren zur Positionsbestimmung und Positionsmesseinrichtung
WO2003058820A2 (de) * 2002-01-11 2003-07-17 Dr. Johannes Heidenhain Gmbh Verfahren zur interpolation mindestens zweier positionsabhängiger, periodischer, zueinander phasenverschobener analogsignale
US9904904B2 (en) * 2008-04-22 2018-02-27 Intuit Inc. Determining time histories for financial information
DE102014219188A1 (de) * 2014-09-23 2016-03-24 Dr. Johannes Heidenhain Gmbh Verfahren zur Fehlerkorrektur in Positionsmesseinrichtungen

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5419773A (en) * 1977-07-01 1979-02-14 Heidenhain Gmbh Dr Johannes Interpolation method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3720813A (en) * 1971-08-23 1973-03-13 Damon Corp Interpolative readout apparatus
GB1508193A (en) * 1975-05-21 1978-04-19 Railweight Inc Ltd Means for automatically correcting for gain variations of a measuring system
US4084248A (en) * 1976-02-02 1978-04-11 The Perkin-Elmer Corporation Method and apparatus for error correction
CH615503A5 (ja) * 1977-02-08 1980-01-31 Zumbach Electronic Ag
JPS5481095A (en) * 1977-12-12 1979-06-28 Toshiba Corp Computer tomography device
US4205575A (en) * 1978-05-19 1980-06-03 The Wurlitzer Company Binary interpolator for electronic musical instrument
AU532664B2 (en) * 1979-06-19 1983-10-06 Kubota Ltd. Electronic weigher

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5419773A (en) * 1977-07-01 1979-02-14 Heidenhain Gmbh Dr Johannes Interpolation method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59144516U (ja) * 1983-03-18 1984-09-27 横河電機株式会社 光学式スケ−ル読取装置
JPS59146722U (ja) * 1983-03-23 1984-10-01 横河電機株式会社 光学式スケ−ル読取装置
JPH0244173Y2 (ja) * 1983-03-23 1990-11-22
WO1986000401A1 (en) * 1984-06-26 1986-01-16 Fanuc Ltd Device for detecting absolute position
JPS62142220A (ja) * 1985-12-17 1987-06-25 Makome Kenkyusho:Kk デコ−ダを用いる内插回路
JPH0238814A (ja) * 1988-07-27 1990-02-08 Tokyo Seimitsu Co Ltd ディジタル位相検出方法
JPH03177495A (ja) * 1989-12-06 1991-08-01 Sumitomo Metal Ind Ltd 石炭の液化方法

Also Published As

Publication number Publication date
ATE18097T1 (de) 1986-03-15
EP0042917B1 (de) 1986-02-19
US4462083A (en) 1984-07-24
EP0042917A3 (en) 1982-12-01
DE3024716A1 (de) 1982-01-21
DE3024716C2 (de) 1986-10-23
EP0042917A2 (de) 1982-01-06

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