JPS57135366A - Automatic level measuring synchroscope - Google Patents

Automatic level measuring synchroscope

Info

Publication number
JPS57135366A
JPS57135366A JP2020081A JP2020081A JPS57135366A JP S57135366 A JPS57135366 A JP S57135366A JP 2020081 A JP2020081 A JP 2020081A JP 2020081 A JP2020081 A JP 2020081A JP S57135366 A JPS57135366 A JP S57135366A
Authority
JP
Japan
Prior art keywords
circuits
synchroscope
inputted
input signal
differential voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2020081A
Other languages
Japanese (ja)
Inventor
Akira Koda
Fumitoshi Wakiyama
Yasushi Yoneda
Masaki Hamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2020081A priority Critical patent/JPS57135366A/en
Publication of JPS57135366A publication Critical patent/JPS57135366A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To automatically measure the differential voltage between 2 points of an analog input signal, which high accuracy, by providing 2 pieces of time delaying circuits for generating a time delay respectively in accordance with a synchronizing trigger signal of a synchroscope. CONSTITUTION:An input signal 1 is inputted to a synchroscope 3 and sample holding circuits 7 and 8. On the other hand, a trigger signal outputted from the synchroscope 3 is inputted to the first and second time delaying circuits 5 and 6. The input signal 1 inputted to the circuits 7 and 8 is held by point designating trigger signals outputted from the circuits 4 and 5. Voltage held by the circuits 7, 8 becomes differential voltage by making it pass through a subtracting circuit 9, and is inputted to an A/D converter 10. In this converter 10, differential voltage between 2 points of the input signal 1 is converted to a digital value, and is displayed on a numerical indicator 12.
JP2020081A 1981-02-16 1981-02-16 Automatic level measuring synchroscope Pending JPS57135366A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2020081A JPS57135366A (en) 1981-02-16 1981-02-16 Automatic level measuring synchroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020081A JPS57135366A (en) 1981-02-16 1981-02-16 Automatic level measuring synchroscope

Publications (1)

Publication Number Publication Date
JPS57135366A true JPS57135366A (en) 1982-08-20

Family

ID=12020516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020081A Pending JPS57135366A (en) 1981-02-16 1981-02-16 Automatic level measuring synchroscope

Country Status (1)

Country Link
JP (1) JPS57135366A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235269A (en) * 1990-03-19 1993-08-10 Yokogawa Electric Corporation Waveform measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235269A (en) * 1990-03-19 1993-08-10 Yokogawa Electric Corporation Waveform measuring device

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