JPS5713341A - Defect detector - Google Patents

Defect detector

Info

Publication number
JPS5713341A
JPS5713341A JP8751080A JP8751080A JPS5713341A JP S5713341 A JPS5713341 A JP S5713341A JP 8751080 A JP8751080 A JP 8751080A JP 8751080 A JP8751080 A JP 8751080A JP S5713341 A JPS5713341 A JP S5713341A
Authority
JP
Japan
Prior art keywords
inspected
memory
signal
stored
bottle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8751080A
Other languages
Japanese (ja)
Other versions
JPS6249927B2 (en
Inventor
Takashi Miyazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kirin Brewery Co Ltd
Original Assignee
Kirin Brewery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kirin Brewery Co Ltd filed Critical Kirin Brewery Co Ltd
Priority to JP8751080A priority Critical patent/JPS5713341A/en
Priority to US06/272,792 priority patent/US4448526A/en
Priority to NLAANVRAGE8102944,A priority patent/NL185368C/en
Priority to AU71990/81A priority patent/AU535792B2/en
Priority to GB8119463A priority patent/GB2078948B/en
Priority to DE3124949A priority patent/DE3124949C2/en
Priority to DK285081A priority patent/DK156283C/en
Priority to CA000380646A priority patent/CA1175139A/en
Priority to FR8112630A priority patent/FR2485734B1/en
Publication of JPS5713341A publication Critical patent/JPS5713341A/en
Publication of JPS6249927B2 publication Critical patent/JPS6249927B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable the whole bottle-bottom to be inspected with a high accuracy, by a method wherein the light passing through the bottom of a bottle being inspected is received by means of an image pickup tube, the video signal is stored in a memory, and the stored data is read out through the address designation by means of a spiral scanning. CONSTITUTION:Through a diffusing plate 11, a lamp 12 irradiates a body 10 to be inspected, which is carried thereto, from the direction of the bottle bottom. The optical image thereof is picked up by means of a TV camera 13, and the 1-frame picture thereof is converted into a video signal VS, which is then sent out. Said signal is converted into a digital signal DS in an A/D converter 20 and stored in a memory 30 according to the address designated by the write signal WR from a memory controlling curcuit 40. The stored data are read out in correspondence to the spiral scanning position from the center of the body being inspected, according to the read- out signal from the memory controlling circuit 40 operated by a pulse generator 402. If the body 10 being inspected has any defect, there is a sudden change in the data read out from the memory 30. Therefore, said change is discriminated by means of a discriminating circuit 50, and said body 10 is discharged through a discharger 60.
JP8751080A 1980-06-27 1980-06-27 Defect detector Granted JPS5713341A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP8751080A JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector
US06/272,792 US4448526A (en) 1980-06-27 1981-06-11 Defect detecting method and device
NLAANVRAGE8102944,A NL185368C (en) 1980-06-27 1981-06-18 DEVICE FOR DETECTING DEFECTS IN AN OBJECT.
AU71990/81A AU535792B2 (en) 1980-06-27 1981-06-19 l
GB8119463A GB2078948B (en) 1980-06-27 1981-06-24 Defect detecting method and device
DE3124949A DE3124949C2 (en) 1980-06-27 1981-06-25 Defect detection device for detecting scratches, cracks, cracks or inclusions in an object
DK285081A DK156283C (en) 1980-06-27 1981-06-26 TROUBLESHOOTING DEVICE FOR DETERMINING SCREAMS, CRACKS, BROKEN OR CONTAINMENTS
CA000380646A CA1175139A (en) 1980-06-27 1981-06-26 Defect detecting method and device
FR8112630A FR2485734B1 (en) 1980-06-27 1981-06-26 DEFECT DETECTION METHOD AND APPARATUS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8751080A JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector

Publications (2)

Publication Number Publication Date
JPS5713341A true JPS5713341A (en) 1982-01-23
JPS6249927B2 JPS6249927B2 (en) 1987-10-22

Family

ID=13916974

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8751080A Granted JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector

Country Status (1)

Country Link
JP (1) JPS5713341A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937406A (en) * 1982-05-06 1984-02-29 エムハート・グラス・マシーナリー・インベストメンツ・インコーポレーテッド Flaw detector
EP0142379A2 (en) * 1983-11-17 1985-05-22 BRITISH TELECOMMUNICATIONS public limited company Jointing arrangements
JPH02276988A (en) * 1989-04-18 1990-11-13 Kandenko Co Ltd Method and device for detecting foreign matter in tube
JPH06118026A (en) * 1992-10-01 1994-04-28 Toyo Seikan Kaisha Ltd Method for inspecting vessel inner surface

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2649500A (en) * 1949-12-16 1953-08-18 Owens Illinois Glass Co Inspecting apparatus
JPS5026935A (en) * 1973-06-16 1975-03-20
US3987244A (en) * 1975-12-31 1976-10-19 United Technologies Corporation Programmable image processor
JPS5316681A (en) * 1976-07-29 1978-02-15 Kirin Brewery Detector using laser rays
JPS53127583U (en) * 1977-03-17 1978-10-11
JPS5461980A (en) * 1977-10-27 1979-05-18 Nec Corp Automatic inspector of surface flaws
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54110891A (en) * 1978-02-17 1979-08-30 Mitsubishi Electric Corp Pattern flaw inspecting apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2649500A (en) * 1949-12-16 1953-08-18 Owens Illinois Glass Co Inspecting apparatus
JPS5026935A (en) * 1973-06-16 1975-03-20
US3987244A (en) * 1975-12-31 1976-10-19 United Technologies Corporation Programmable image processor
JPS5316681A (en) * 1976-07-29 1978-02-15 Kirin Brewery Detector using laser rays
JPS53127583U (en) * 1977-03-17 1978-10-11
JPS5461980A (en) * 1977-10-27 1979-05-18 Nec Corp Automatic inspector of surface flaws
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54110891A (en) * 1978-02-17 1979-08-30 Mitsubishi Electric Corp Pattern flaw inspecting apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937406A (en) * 1982-05-06 1984-02-29 エムハート・グラス・マシーナリー・インベストメンツ・インコーポレーテッド Flaw detector
EP0142379A2 (en) * 1983-11-17 1985-05-22 BRITISH TELECOMMUNICATIONS public limited company Jointing arrangements
EP0142379B1 (en) * 1983-11-17 1989-11-29 BRITISH TELECOMMUNICATIONS public limited company Jointing arrangements
JPH02276988A (en) * 1989-04-18 1990-11-13 Kandenko Co Ltd Method and device for detecting foreign matter in tube
JPH06118026A (en) * 1992-10-01 1994-04-28 Toyo Seikan Kaisha Ltd Method for inspecting vessel inner surface

Also Published As

Publication number Publication date
JPS6249927B2 (en) 1987-10-22

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