JPS57104871A - Measuring method of electric characteristic - Google Patents
Measuring method of electric characteristicInfo
- Publication number
- JPS57104871A JPS57104871A JP55182472A JP18247280A JPS57104871A JP S57104871 A JPS57104871 A JP S57104871A JP 55182472 A JP55182472 A JP 55182472A JP 18247280 A JP18247280 A JP 18247280A JP S57104871 A JPS57104871 A JP S57104871A
- Authority
- JP
- Japan
- Prior art keywords
- reliability
- probes
- measuring
- terminal
- measuring method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To improve reliability in measuring the electric characteristics by providing two or more lands for measuring probes at a terminal of a circuit to be measured. CONSTITUTION:In the conventional method, if any one of several probes 1 fails to conduct, the reliability of the entire measuring system is lost. In the measuring method of the present invention, however, the reliability of the entire measuring system can be maintained unless all the probes arranged on the same conductor pattern fail to conduct simultaneously. The reliability Rk<n> of the measuring system is expressed by an equation Rk<n>=[1-(1-r)<k>]<n>, where (n) is the number of terminals, K is the number of the measuring probes per each terminal, and r is the reliability of each probe. In the case the reliability of the probes is high, two probes on the same terminal are sufficient.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55182472A JPS57104871A (en) | 1980-12-23 | 1980-12-23 | Measuring method of electric characteristic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55182472A JPS57104871A (en) | 1980-12-23 | 1980-12-23 | Measuring method of electric characteristic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57104871A true JPS57104871A (en) | 1982-06-30 |
Family
ID=16118856
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55182472A Pending JPS57104871A (en) | 1980-12-23 | 1980-12-23 | Measuring method of electric characteristic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57104871A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53865A (en) * | 1976-06-25 | 1978-01-07 | Hitachi Ltd | Method of confirming terminal connection |
-
1980
- 1980-12-23 JP JP55182472A patent/JPS57104871A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53865A (en) * | 1976-06-25 | 1978-01-07 | Hitachi Ltd | Method of confirming terminal connection |
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