JPS57100323A - Method for spectrochemical analysis of steel by using laser beam - Google Patents

Method for spectrochemical analysis of steel by using laser beam

Info

Publication number
JPS57100323A
JPS57100323A JP17696180A JP17696180A JPS57100323A JP S57100323 A JPS57100323 A JP S57100323A JP 17696180 A JP17696180 A JP 17696180A JP 17696180 A JP17696180 A JP 17696180A JP S57100323 A JPS57100323 A JP S57100323A
Authority
JP
Japan
Prior art keywords
plasma
steel
1mus
16mus
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17696180A
Other languages
Japanese (ja)
Other versions
JPS6312527B2 (en
Inventor
Kozo Sumiyama
Zenji Ohashi
Yasuko Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP17696180A priority Critical patent/JPS57100323A/en
Publication of JPS57100323A publication Critical patent/JPS57100323A/en
Publication of JPS6312527B2 publication Critical patent/JPS6312527B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To improve the accuracy of analysis by irradiating pulse laser beam to a steel surface, turning part thereof to plasma and spectrally analyzing the light emitted from the plasma for 1mus-16mus after the irradiation. CONSTITUTION:Pulse laser beam is irradiated to the surface of steel to turn part of the steel to plasma, and the light emitted from the plasma is spectrally analyzed for the period of 1mus-16mus after the irradiation, whereby the ratio of the signal with respect to background is improved. For example, the laser pulse beam emitted in a laser light emitting part 2 by the effect of an electric power source 12 for a laser oscillator and an electric power source 14 for a high-speed switch is irradiated via a prism 4 and a lens 24 to a steel surface 22 to turn part thereof to plasma, and further the plasma light is conducted by a reflecting mirror 6 into a spectroscope 8 through a slit 24, and is spectrally measured with a photodetector 26 only for the period of 1mus-16mus after the irradiation by the effect of an output detector 18 and a gate circuit 30. The result thereof is displayed in a display device 10.
JP17696180A 1980-12-15 1980-12-15 Method for spectrochemical analysis of steel by using laser beam Granted JPS57100323A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17696180A JPS57100323A (en) 1980-12-15 1980-12-15 Method for spectrochemical analysis of steel by using laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17696180A JPS57100323A (en) 1980-12-15 1980-12-15 Method for spectrochemical analysis of steel by using laser beam

Publications (2)

Publication Number Publication Date
JPS57100323A true JPS57100323A (en) 1982-06-22
JPS6312527B2 JPS6312527B2 (en) 1988-03-19

Family

ID=16022736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17696180A Granted JPS57100323A (en) 1980-12-15 1980-12-15 Method for spectrochemical analysis of steel by using laser beam

Country Status (1)

Country Link
JP (1) JPS57100323A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60347A (en) * 1983-06-16 1985-01-05 Kawasaki Steel Corp Laser continuous analysis of metal and insulator in fluidized state
US4561777A (en) * 1982-09-07 1985-12-31 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for quantitative determination of materials contained in fluids
JPS61500509A (en) * 1983-11-28 1986-03-20 マイダク・コ−ポレ−ション Apparatus and method for photoluminescence analysis
EP0176625A2 (en) * 1984-10-05 1986-04-09 Kawasaki Steel Corporation Method of laser emission spectroscopical analysis of steel and apparatus therefor
JPS61140829A (en) * 1984-12-14 1986-06-27 Kawasaki Steel Corp Laser-emission spectral analyzing device
JPS63193038A (en) * 1987-02-06 1988-08-10 Idemitsu Petrochem Co Ltd Method and apparatus for analyzing solid element
JP2007315945A (en) * 2006-05-26 2007-12-06 Nippon Steel Corp Component analysis method and apparatus of melted metal within finery

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0441032U (en) * 1990-08-03 1992-04-07

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4561777A (en) * 1982-09-07 1985-12-31 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for quantitative determination of materials contained in fluids
JPS60347A (en) * 1983-06-16 1985-01-05 Kawasaki Steel Corp Laser continuous analysis of metal and insulator in fluidized state
JPH0145017B2 (en) * 1983-06-16 1989-10-02 Kawasaki Seitetsu Kk
JPS61500509A (en) * 1983-11-28 1986-03-20 マイダク・コ−ポレ−ション Apparatus and method for photoluminescence analysis
EP0176625A2 (en) * 1984-10-05 1986-04-09 Kawasaki Steel Corporation Method of laser emission spectroscopical analysis of steel and apparatus therefor
JPS6186636A (en) * 1984-10-05 1986-05-02 Kawasaki Steel Corp Emission spectrochemical analysis method of steel using laser
US4645342A (en) * 1984-10-05 1987-02-24 Kawasaki Steel Corp. Method of laser emission spectroscopic analysis of steel and apparatus therefor
JPS61140829A (en) * 1984-12-14 1986-06-27 Kawasaki Steel Corp Laser-emission spectral analyzing device
JPH053888B2 (en) * 1984-12-14 1993-01-18 Kawasaki Steel Co
JPS63193038A (en) * 1987-02-06 1988-08-10 Idemitsu Petrochem Co Ltd Method and apparatus for analyzing solid element
JP2007315945A (en) * 2006-05-26 2007-12-06 Nippon Steel Corp Component analysis method and apparatus of melted metal within finery
JP4625428B2 (en) * 2006-05-26 2011-02-02 新日本製鐵株式会社 Method and apparatus for analyzing component of molten metal in refining furnace

Also Published As

Publication number Publication date
JPS6312527B2 (en) 1988-03-19

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