JPS5693193A - Ic memory test device - Google Patents
Ic memory test deviceInfo
- Publication number
- JPS5693193A JPS5693193A JP17003379A JP17003379A JPS5693193A JP S5693193 A JPS5693193 A JP S5693193A JP 17003379 A JP17003379 A JP 17003379A JP 17003379 A JP17003379 A JP 17003379A JP S5693193 A JPS5693193 A JP S5693193A
- Authority
- JP
- Japan
- Prior art keywords
- memory
- error
- test
- exerciser
- address stored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE: To realize a test for an IC memory containing a faulty bit, by ignoring a reading result of the IC memory for an error address stored in a fail memory.
CONSTITUTION: Various types of test patterns are applied to the IC memory 2 successively by the exerciser 3. In this case, if an error is detected with the reading of the memory 2, the error address stored previously in the fail memory 5 is masked to be excluded from to be the subject for decision of quality. Then the noncoincidence signal l8 is generated from the comparator 4 and in the memory address where the logic 0 is read out to the output of the memory 5, the error signal ERR is transmitted, and the exerciser 3 discontinues the generation of the test pattern, then the error lamp is displayed to complete a function test.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17003379A JPS5693193A (en) | 1979-12-26 | 1979-12-26 | Ic memory test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17003379A JPS5693193A (en) | 1979-12-26 | 1979-12-26 | Ic memory test device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5693193A true JPS5693193A (en) | 1981-07-28 |
Family
ID=15897355
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17003379A Pending JPS5693193A (en) | 1979-12-26 | 1979-12-26 | Ic memory test device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5693193A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58155599A (en) * | 1982-03-10 | 1983-09-16 | Hitachi Ltd | Memory tester |
JPS61210975A (en) * | 1985-03-15 | 1986-09-19 | Sony Tektronix Corp | Electronic circuit testing method |
JPH01187469A (en) * | 1987-10-30 | 1989-07-26 | Teledyne Inc | Leakage current tester |
-
1979
- 1979-12-26 JP JP17003379A patent/JPS5693193A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58155599A (en) * | 1982-03-10 | 1983-09-16 | Hitachi Ltd | Memory tester |
JPS61210975A (en) * | 1985-03-15 | 1986-09-19 | Sony Tektronix Corp | Electronic circuit testing method |
JPH01187469A (en) * | 1987-10-30 | 1989-07-26 | Teledyne Inc | Leakage current tester |
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