JPS56166406A - Measuring device for wave form - Google Patents

Measuring device for wave form

Info

Publication number
JPS56166406A
JPS56166406A JP7191580A JP7191580A JPS56166406A JP S56166406 A JPS56166406 A JP S56166406A JP 7191580 A JP7191580 A JP 7191580A JP 7191580 A JP7191580 A JP 7191580A JP S56166406 A JPS56166406 A JP S56166406A
Authority
JP
Japan
Prior art keywords
inputted
circuit
detected
output
binary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7191580A
Other languages
Japanese (ja)
Other versions
JPS6247243B2 (en
Inventor
Kazuo Takashima
Minoru Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7191580A priority Critical patent/JPS56166406A/en
Publication of JPS56166406A publication Critical patent/JPS56166406A/en
Publication of JPS6247243B2 publication Critical patent/JPS6247243B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To obtain highly reliable measurement results, by a method wherein a waveform to be detected is binarized as compared with 2 reference voltages being different from each other, prohibiting the output of measured result when a difference between the two exceeds a given value. CONSTITUTION:A signal 2a of a member 1, which is detected by a camera 2, is inputted to binary circuits 5 and 7 to be compared with a reference voltage. The output from the binary circuit 5 is inputted to a computing circuit 8, and a high- level period thereof is computed. The outputs from the binary circuis 5 and 7 are inputted to a detector 9 where a noncoincidence part between the two is detected, and the results are inputted to a circuit 10. The circuit 10 is provided with a counter and a comparator, computes an input, compares the computed value with a set value, and outputs a prohibition signal. The prohibition signal is inputted to a computing circuit 8, and the output of the computing results is suspended.
JP7191580A 1980-05-27 1980-05-27 Measuring device for wave form Granted JPS56166406A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7191580A JPS56166406A (en) 1980-05-27 1980-05-27 Measuring device for wave form

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7191580A JPS56166406A (en) 1980-05-27 1980-05-27 Measuring device for wave form

Publications (2)

Publication Number Publication Date
JPS56166406A true JPS56166406A (en) 1981-12-21
JPS6247243B2 JPS6247243B2 (en) 1987-10-07

Family

ID=13474305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7191580A Granted JPS56166406A (en) 1980-05-27 1980-05-27 Measuring device for wave form

Country Status (1)

Country Link
JP (1) JPS56166406A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143608A (en) * 1990-10-05 1992-05-18 Nkk Corp Device for measuring flatness of steel plate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143608A (en) * 1990-10-05 1992-05-18 Nkk Corp Device for measuring flatness of steel plate

Also Published As

Publication number Publication date
JPS6247243B2 (en) 1987-10-07

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