JPS56145312A - Method of continuous measurement for radiation thickness gage - Google Patents
Method of continuous measurement for radiation thickness gageInfo
- Publication number
- JPS56145312A JPS56145312A JP4933580A JP4933580A JPS56145312A JP S56145312 A JPS56145312 A JP S56145312A JP 4933580 A JP4933580 A JP 4933580A JP 4933580 A JP4933580 A JP 4933580A JP S56145312 A JPS56145312 A JP S56145312A
- Authority
- JP
- Japan
- Prior art keywords
- velocity
- measured
- movement
- substance
- width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To facilitate the control of measurement by synchronizing the velocity of movement of a detecting part in the direction of width with the velocity of movement of a substance to be measured at a fixed ratio and thereby fixing the measurement of the thickness of the cross section of the substance to be measured in the direction of the width thereof.
CONSTITUTION: Since the velocity (v) of movement of the substance 1 to be measured is determined by the rotational number of a roll 5, the change in the rotational number of the roll 5 is detected by a moving velocity detector 8 and thereby the velocity (v) of movement is measured. A detection signal thus obtained is transmitted to a control device 9 and a control signal being at a fixed ratio to the detected velocity (v) of movement of the substance 1 to be measured is given to the driving mechanism 6 of the radioactive thickness gage 4, and while the velocity V of movement of the detecting part 3 being synchronized with the velocity (v), the thickness of the cross section of the substance 1 in the direction of the width thereof is measured.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4933580A JPS56145312A (en) | 1980-04-15 | 1980-04-15 | Method of continuous measurement for radiation thickness gage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4933580A JPS56145312A (en) | 1980-04-15 | 1980-04-15 | Method of continuous measurement for radiation thickness gage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56145312A true JPS56145312A (en) | 1981-11-12 |
Family
ID=12828117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4933580A Pending JPS56145312A (en) | 1980-04-15 | 1980-04-15 | Method of continuous measurement for radiation thickness gage |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56145312A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61134649A (en) * | 1984-12-05 | 1986-06-21 | Yokogawa Electric Corp | Physical quantity measuring instrument |
| JPH02222869A (en) * | 1989-02-21 | 1990-09-05 | Toshiba Corp | Reactor core |
| JP2010048569A (en) * | 2008-08-19 | 2010-03-04 | Sumitomo Metal Mining Siporex Kk | Method for inspecting covering depth of main reinforcement bar of alc panel |
-
1980
- 1980-04-15 JP JP4933580A patent/JPS56145312A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61134649A (en) * | 1984-12-05 | 1986-06-21 | Yokogawa Electric Corp | Physical quantity measuring instrument |
| JPH02222869A (en) * | 1989-02-21 | 1990-09-05 | Toshiba Corp | Reactor core |
| JP2010048569A (en) * | 2008-08-19 | 2010-03-04 | Sumitomo Metal Mining Siporex Kk | Method for inspecting covering depth of main reinforcement bar of alc panel |
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