JPS5575276A - 3[5 group compound semiconductor device - Google Patents
3[5 group compound semiconductor deviceInfo
- Publication number
- JPS5575276A JPS5575276A JP14926378A JP14926378A JPS5575276A JP S5575276 A JPS5575276 A JP S5575276A JP 14926378 A JP14926378 A JP 14926378A JP 14926378 A JP14926378 A JP 14926378A JP S5575276 A JPS5575276 A JP S5575276A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- electrode layer
- aluminum
- evaporated
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04042—Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
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Abstract
PURPOSE: To maintain a good wiring bonding property, by providing a barrier metal layer between a surface aluminum layer and an electrode layer for ohmic contact with a crystal substrate to prevent mutual diffusion between the surface aluminum layer and the electrode layer.
CONSTITUTION: An Ag-Be alloy is evaporated on the surface of a p-layer 9 of a Gap substrate. Silver is then evaporated on the alloy, thereby providing an electrode layer 11. Titanium is evaporated as an electrode layer 12 on the former 11. Aluminum is then evaporated as a surface electrode layer 13. An electrode consisting of the layers 11∼13 is photoetched to a desired pattern. As a result, the electrode layer 12 serves as a barrier metal layer between the electrode layer 11 and the aluminum layer 13 to prevent mutual diffusion between them. The aluminum on the surface of the electrode is prevented from being denatured due to heat treatment for obtaining ohmic contact. Therefore, a good bonding property is maintained.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14926378A JPS5575276A (en) | 1978-12-02 | 1978-12-02 | 3[5 group compound semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14926378A JPS5575276A (en) | 1978-12-02 | 1978-12-02 | 3[5 group compound semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5575276A true JPS5575276A (en) | 1980-06-06 |
Family
ID=15471412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14926378A Pending JPS5575276A (en) | 1978-12-02 | 1978-12-02 | 3[5 group compound semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5575276A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57117283A (en) * | 1981-01-13 | 1982-07-21 | Sharp Corp | 3-5 group compound semiconductor device |
JPS57117284A (en) * | 1981-01-13 | 1982-07-21 | Sharp Corp | 3-5 group compound semiconductor device |
JPS62162327A (en) * | 1985-12-23 | 1987-07-18 | Sharp Corp | Electrode forming method for iii-v compound semiconductor element |
-
1978
- 1978-12-02 JP JP14926378A patent/JPS5575276A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57117283A (en) * | 1981-01-13 | 1982-07-21 | Sharp Corp | 3-5 group compound semiconductor device |
JPS57117284A (en) * | 1981-01-13 | 1982-07-21 | Sharp Corp | 3-5 group compound semiconductor device |
JPS6244836B2 (en) * | 1981-01-13 | 1987-09-22 | Sharp Kk | |
JPS6244837B2 (en) * | 1981-01-13 | 1987-09-22 | Sharp Kk | |
JPS62162327A (en) * | 1985-12-23 | 1987-07-18 | Sharp Corp | Electrode forming method for iii-v compound semiconductor element |
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