JPS5568755A - Error measuring instrument for tdma circuit - Google Patents
Error measuring instrument for tdma circuitInfo
- Publication number
- JPS5568755A JPS5568755A JP14250178A JP14250178A JPS5568755A JP S5568755 A JPS5568755 A JP S5568755A JP 14250178 A JP14250178 A JP 14250178A JP 14250178 A JP14250178 A JP 14250178A JP S5568755 A JPS5568755 A JP S5568755A
- Authority
- JP
- Japan
- Prior art keywords
- burst
- reception
- sent
- transmission
- tdma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J3/00—Time-division multiplex systems
- H04J3/02—Details
- H04J3/14—Monitoring arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Time-Division Multiplex Systems (AREA)
Abstract
PURPOSE:To realize a high-speed measurement in a simple constitution by storing the whole or part of the local transmission burst into the buffer memory in sequence and then giving the comparison and detection between the contents of the buffer memory and the local reception burst received after the circuit delay time to measure the error rate. CONSTITUTION:Transmission burst (a) sent from time-division multiple access (TDMA) transmission part 4 which transmits transmission data 5 is applied to modulator 6, and transmission carrier d sent from modulator 6 is sent to satellite repeater 7. The reception carrier (e) from repeater 7 is received and demodulated at demodulator 8 to deliver reception burst (b). And reception data 10 is delivered from TDMA reception part 9. For measurement of the error rate of the TDMA circuit in the real working state, burst (a) sent from part 4 is stored in buffer memory 11 sequentially. And a comprison is given between the contents written into memory 11 after the both-way delay time and burst (b) which has just arrived at comparator 12. And error pulse (c) is delivered when no coincidence is obtained through the comparison.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14250178A JPS5568755A (en) | 1978-11-17 | 1978-11-17 | Error measuring instrument for tdma circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14250178A JPS5568755A (en) | 1978-11-17 | 1978-11-17 | Error measuring instrument for tdma circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5568755A true JPS5568755A (en) | 1980-05-23 |
Family
ID=15316799
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14250178A Pending JPS5568755A (en) | 1978-11-17 | 1978-11-17 | Error measuring instrument for tdma circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5568755A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0131190A2 (en) * | 1983-06-25 | 1985-01-16 | Nec Corporation | Test apparatus for digital speech interpolator for use in TDMA scheme |
-
1978
- 1978-11-17 JP JP14250178A patent/JPS5568755A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0131190A2 (en) * | 1983-06-25 | 1985-01-16 | Nec Corporation | Test apparatus for digital speech interpolator for use in TDMA scheme |
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