JPS5567140A - Method for manufacturing semiconductor device - Google Patents

Method for manufacturing semiconductor device

Info

Publication number
JPS5567140A
JPS5567140A JP14030478A JP14030478A JPS5567140A JP S5567140 A JPS5567140 A JP S5567140A JP 14030478 A JP14030478 A JP 14030478A JP 14030478 A JP14030478 A JP 14030478A JP S5567140 A JPS5567140 A JP S5567140A
Authority
JP
Japan
Prior art keywords
substrate
junction
edge
recess
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14030478A
Other languages
Japanese (ja)
Inventor
Tomihisa Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP14030478A priority Critical patent/JPS5567140A/en
Publication of JPS5567140A publication Critical patent/JPS5567140A/en
Pending legal-status Critical Current

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  • Weting (AREA)

Abstract

PURPOSE: To prevent the fall in dielectric strength by coating a polycrystalline silicon layer on the surface of the substrate and using a mask to perform selective etching, thereby rounding the edge of a mesa recess when the recess extending to a pn junction is provided on a semiconductor substrate which has the pn junction.
CONSTITUTION: Polycrystalline silicon layers 11 are so grown at liquid phase on both the obverse and reverse sides of a silicon substrate 1 having a pnpn construction that each polycrystalline silicon layer 11 has a thickness of 1μm or more. A photoresist film 12 is coated on the layer 11 except for a zone, on which a mesa recess is to be provided. The substrate 1 is dipped in a mixed solution of nitric acid, hydrofluoric acid and acetic acid at a ratio of 6:1:2 so that the substrate is etched. Since the etching speed of the polycrystalline layer 11 is five to ten times higher than that of single crystal, side etching is caused. This results in rounding the edge of the mesa recess 4 which extends through a pn junction. Therefore, a passivation film and a photoresist film 7 coated on the edge of the recess afterward are not cut off by the edge and the pn junction is protected from an etching liquid in photoengraving.
COPYRIGHT: (C)1980,JPO&Japio
JP14030478A 1978-11-14 1978-11-14 Method for manufacturing semiconductor device Pending JPS5567140A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14030478A JPS5567140A (en) 1978-11-14 1978-11-14 Method for manufacturing semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14030478A JPS5567140A (en) 1978-11-14 1978-11-14 Method for manufacturing semiconductor device

Publications (1)

Publication Number Publication Date
JPS5567140A true JPS5567140A (en) 1980-05-21

Family

ID=15265664

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14030478A Pending JPS5567140A (en) 1978-11-14 1978-11-14 Method for manufacturing semiconductor device

Country Status (1)

Country Link
JP (1) JPS5567140A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4305297A1 (en) * 1993-02-20 1994-08-25 Telefunken Microelectron Texturing pickle for semiconductors, and use thereof
CN102244104A (en) * 2011-07-07 2011-11-16 重庆平伟实业股份有限公司 Flat and lug combined bidirectional diode chip and manufacturing process thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4305297A1 (en) * 1993-02-20 1994-08-25 Telefunken Microelectron Texturing pickle for semiconductors, and use thereof
DE4305297C2 (en) * 1993-02-20 1998-09-24 Telefunken Microelectron Structural stains for semiconductors and their application
CN102244104A (en) * 2011-07-07 2011-11-16 重庆平伟实业股份有限公司 Flat and lug combined bidirectional diode chip and manufacturing process thereof

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