JPS556263A - Thermal analyzer - Google Patents

Thermal analyzer

Info

Publication number
JPS556263A
JPS556263A JP7883478A JP7883478A JPS556263A JP S556263 A JPS556263 A JP S556263A JP 7883478 A JP7883478 A JP 7883478A JP 7883478 A JP7883478 A JP 7883478A JP S556263 A JPS556263 A JP S556263A
Authority
JP
Japan
Prior art keywords
sample
electrodes
resistance
container
measure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7883478A
Other languages
Japanese (ja)
Inventor
Wataru Sakurai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7883478A priority Critical patent/JPS556263A/en
Publication of JPS556263A publication Critical patent/JPS556263A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PURPOSE: To provide an accurate measurement of very small changes in state by measuring a change in surface resistance of a sample which is in the heated state.
CONSTITUTION: A pair of electrodes 2 and 2 are mounted on the bottom of a thermally inactive continer 1. A sample 3 to be measured is inserted into the container 1 in a manner to contact with the electrodes 2 and 2. On the other hand, these electrodes 2 and 2 are connected with a resistance meter 5 and a recorder 6 in order to measure the resistance of the sample. And, the container 1 is accommodated in an electric furnace 7, which has its measurement stating temperature and its temperature rising rate adjusted by the control unit 8 of a furnace heat source in accordance with a program. In these ways, in order to measure the aging variations of the insulating resistance of the sample in a direct manner, the fine state change resulting from the temperature rise can be accurately measured.
COPYRIGHT: (C)1980,JPO&Japio
JP7883478A 1978-06-28 1978-06-28 Thermal analyzer Pending JPS556263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7883478A JPS556263A (en) 1978-06-28 1978-06-28 Thermal analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7883478A JPS556263A (en) 1978-06-28 1978-06-28 Thermal analyzer

Publications (1)

Publication Number Publication Date
JPS556263A true JPS556263A (en) 1980-01-17

Family

ID=13672849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7883478A Pending JPS556263A (en) 1978-06-28 1978-06-28 Thermal analyzer

Country Status (1)

Country Link
JP (1) JPS556263A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56122945U (en) * 1980-02-19 1981-09-18
JPS6280550A (en) * 1985-10-03 1987-04-14 Toray Ind Inc Electrochemical analyzer
CN108459046A (en) * 2018-05-09 2018-08-28 哈尔滨工业大学 The test device of film-type thermoelectric material Seebeck coefficient and conductivity

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56122945U (en) * 1980-02-19 1981-09-18
JPS641632Y2 (en) * 1980-02-19 1989-01-13
JPS6280550A (en) * 1985-10-03 1987-04-14 Toray Ind Inc Electrochemical analyzer
CN108459046A (en) * 2018-05-09 2018-08-28 哈尔滨工业大学 The test device of film-type thermoelectric material Seebeck coefficient and conductivity

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