JPS553639A - Manufacturing semiconductor substrate - Google Patents

Manufacturing semiconductor substrate

Info

Publication number
JPS553639A
JPS553639A JP7533078A JP7533078A JPS553639A JP S553639 A JPS553639 A JP S553639A JP 7533078 A JP7533078 A JP 7533078A JP 7533078 A JP7533078 A JP 7533078A JP S553639 A JPS553639 A JP S553639A
Authority
JP
Japan
Prior art keywords
polycrystal
layer
plane
laminated
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7533078A
Other languages
Japanese (ja)
Inventor
Tatsuo Shimura
Tadaaki Kariya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7533078A priority Critical patent/JPS553639A/en
Publication of JPS553639A publication Critical patent/JPS553639A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To obtain a dielectric-isolator separated substrate which is in parallel with a single-crystal plane and has less warning in the succeeding heat treatment, by grinding out a final polycrystal layer in parallel with the single-crystal plane, and then laminating an oxidized layer and a polycrystal film on the removed plane again.
CONSTITUTION: An oxidized film 2 is formed on a single-crystal Si substrate 1 having grooves 1', then polycrystal layer 3 is formed. Oxidized films and polycrystal layers are alternately formed thereafter, and a laminated polycrystal substrate 5 is formed. In this case a final polycrystal layer 4 is laminated so that it is thicker than the dispersion d of the thickness between the oxidized film beneath the final layer and a sigle-crystal plane 6 and 1/40 of total thickness of polycrystal layer y. Then, the final polycrystal layer 4 is ground out along the A-A' plane in parallel with the single-crystal plane 6. An oxidized film 12 is formed on a polycrystal plane 7, and a polycrystal layer 13 is laminated in such a way it is smaller than 1/40 of total thickness of laminated layer y'. Since the thickness of the layer 13 is less than 1/40 of the total laminated layers, the unevenness of the thickness is negligible. A dielectric-insulator separated substrate is obtained by removing the B-B' portion of the substrate 11 with reference to the most external polycrystal plane 15.
COPYRIGHT: (C)1980,JPO&Japio
JP7533078A 1978-06-23 1978-06-23 Manufacturing semiconductor substrate Pending JPS553639A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7533078A JPS553639A (en) 1978-06-23 1978-06-23 Manufacturing semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7533078A JPS553639A (en) 1978-06-23 1978-06-23 Manufacturing semiconductor substrate

Publications (1)

Publication Number Publication Date
JPS553639A true JPS553639A (en) 1980-01-11

Family

ID=13573131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7533078A Pending JPS553639A (en) 1978-06-23 1978-06-23 Manufacturing semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS553639A (en)

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