JPS55163847A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS55163847A
JPS55163847A JP7246279A JP7246279A JPS55163847A JP S55163847 A JPS55163847 A JP S55163847A JP 7246279 A JP7246279 A JP 7246279A JP 7246279 A JP7246279 A JP 7246279A JP S55163847 A JPS55163847 A JP S55163847A
Authority
JP
Japan
Prior art keywords
layer
glass
glass powder
mount
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7246279A
Other languages
Japanese (ja)
Inventor
Hisatoshi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Toyo Electronics Industry Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd, Toyo Electronics Industry Corp filed Critical Rohm Co Ltd
Priority to JP7246279A priority Critical patent/JPS55163847A/en
Publication of JPS55163847A publication Critical patent/JPS55163847A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Formation Of Insulating Films (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To readily conduct a step of forming a glass layer in a method of manufacturing a semiconductor device coated with glass on the surface by adhering glass powder on the surface and then removing an calcining the glass powder layer of a mount. CONSTITUTION:A P-type diffused layer 2 is formed on the surface of an N-type silicon substrate 1, and grooves 3 and mount 4 are formed by mesa etching. Glass powder is adhered onto the entire surface by an electrophoresis to form a glass powder layer 5. The mount portion on the layer 5 is scraped off by a hard bladelike squeegee 6. The substrate is charged into an incinerator and incinerated to form a glass film 7 thereon. Then, electrodes 8, 9 are formed by a plating process, isolated at the bottom of the grooves 3 to form respective element products.
JP7246279A 1979-06-08 1979-06-08 Manufacture of semiconductor device Pending JPS55163847A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7246279A JPS55163847A (en) 1979-06-08 1979-06-08 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7246279A JPS55163847A (en) 1979-06-08 1979-06-08 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS55163847A true JPS55163847A (en) 1980-12-20

Family

ID=13489986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7246279A Pending JPS55163847A (en) 1979-06-08 1979-06-08 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS55163847A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210110694A (en) * 2019-02-15 2021-09-08 산둥 차이쥐 일렉트로닉 테크놀로지 컴퍼니 리미티드 Glass powder filling equipment into wafers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210110694A (en) * 2019-02-15 2021-09-08 산둥 차이쥐 일렉트로닉 테크놀로지 컴퍼니 리미티드 Glass powder filling equipment into wafers
JP2022517437A (en) * 2019-02-15 2022-03-08 シャンドン ツァイジュー エレクトロニック テクノロジー カンパニー リミテッド Equipment for filling wafers with glass powder

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