JPS55162263A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS55162263A JPS55162263A JP6964979A JP6964979A JPS55162263A JP S55162263 A JPS55162263 A JP S55162263A JP 6964979 A JP6964979 A JP 6964979A JP 6964979 A JP6964979 A JP 6964979A JP S55162263 A JPS55162263 A JP S55162263A
- Authority
- JP
- Japan
- Prior art keywords
- depression
- edge part
- junction
- high voltage
- reverse bias
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 230000015556 catabolic process Effects 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Light Receiving Elements (AREA)
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To obtain a high voltage resistance device by the method wherein a PN-junction to which a reverse bias is to be applied is formed along the inner wall of a depression formed on a semiconductor substrate, and the breakdown voltage in the surrounding part is raised. CONSTITUTION:After a depression is formed on N<+>-type InP substrate 21 by mesa- etching, P-type InGaAsP active layer 22 and P<+>-type InP layer 23 are epitaxially formed. Then, the edge part of the bottom of the depression is made thick. Next, by lapping the upper surface, the exposed part of the PN-junction is covered with SiO2 film 25. By this structure, a depletion layer expands inwardly in the vertical direction on the inner wall of the depression at the time when a reverse bias is applied. In the edge part of the bottom, it expands wider than in the center part. Consequently, the breakdown voltate becomes higher in the edge part of the bottom, so that it is possible to obtain a device of high voltage resistance easily.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6964979A JPS55162263A (en) | 1979-06-01 | 1979-06-01 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6964979A JPS55162263A (en) | 1979-06-01 | 1979-06-01 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55162263A true JPS55162263A (en) | 1980-12-17 |
Family
ID=13408895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6964979A Pending JPS55162263A (en) | 1979-06-01 | 1979-06-01 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55162263A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57190369A (en) * | 1981-05-19 | 1982-11-22 | Nec Corp | Photo detector |
JPS57197878A (en) * | 1981-05-29 | 1982-12-04 | Nec Corp | Photodetector |
JPS57197877A (en) * | 1981-05-29 | 1982-12-04 | Nec Corp | Photo detector |
-
1979
- 1979-06-01 JP JP6964979A patent/JPS55162263A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57190369A (en) * | 1981-05-19 | 1982-11-22 | Nec Corp | Photo detector |
JPS57197878A (en) * | 1981-05-29 | 1982-12-04 | Nec Corp | Photodetector |
JPS57197877A (en) * | 1981-05-29 | 1982-12-04 | Nec Corp | Photo detector |
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