JPS55158544A - On-line measuring method of and apparatus for aggregation structure - Google Patents
On-line measuring method of and apparatus for aggregation structureInfo
- Publication number
- JPS55158544A JPS55158544A JP6632979A JP6632979A JPS55158544A JP S55158544 A JPS55158544 A JP S55158544A JP 6632979 A JP6632979 A JP 6632979A JP 6632979 A JP6632979 A JP 6632979A JP S55158544 A JPS55158544 A JP S55158544A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- slit
- intensity
- incident
- diffracted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To measure the axial density distribution of the rolled metal plate parallel to the normal thereof employing the parallel beam optical system by applying the slit system having a fixed relationship between the incident and detecting openings to the energy dispersion method requiring no angular scanning theoretically. CONSTITUTION:The slit large in the opening on the incident side is combined with the slit relatively smaller in the opening on the light receiving side in a fixed relationship so that the intensity of diffracted X-rays won't vary as a whole regardless of any change in the position of the sample in one optical system by the energy dispersion method employing parallel beam. Continuous X-rays are radiated at a fixed incident angle theta on the steel plate 7 running between roles 8. The wave height of the electric pulse is selected with a multiple ray analyzer 3 and the data following the analysis thereof is inputted to the electronic computer 5. The intensity of the rolled plate parallel to the diffracted X-rays is obtained for each crystal surface and compared with the random intensity previously obtained from the crystal surfaces of random oriented sample. This continuously provides measured value of the axial density distribution of the normal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6632979A JPS55158544A (en) | 1979-05-29 | 1979-05-29 | On-line measuring method of and apparatus for aggregation structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6632979A JPS55158544A (en) | 1979-05-29 | 1979-05-29 | On-line measuring method of and apparatus for aggregation structure |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55158544A true JPS55158544A (en) | 1980-12-10 |
JPS649575B2 JPS649575B2 (en) | 1989-02-17 |
Family
ID=13312689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6632979A Granted JPS55158544A (en) | 1979-05-29 | 1979-05-29 | On-line measuring method of and apparatus for aggregation structure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55158544A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS568533A (en) * | 1979-07-02 | 1981-01-28 | Kawasaki Steel Corp | Static measuring method for metallic texture |
JPS6095336A (en) * | 1983-10-31 | 1985-05-28 | Kawasaki Steel Corp | Texture measuring method of surface layer |
JPS61104245A (en) * | 1984-10-26 | 1986-05-22 | Rigaku Denki Kogyo Kk | On-line x-ray diffraction apparatus |
JPH01254849A (en) * | 1988-04-05 | 1989-10-11 | Rigaku Corp | Energy dispersive type x-ray diffraction method for thin film |
WO2012015053A1 (en) * | 2010-07-30 | 2012-02-02 | 株式会社リガク | Method for x-ray diffraction, and device therefor |
JP2015062039A (en) * | 2015-01-07 | 2015-04-02 | 株式会社リガク | X-ray diffraction method and portable x-ray diffraction apparatus using the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5017695A (en) * | 1973-06-14 | 1975-02-25 |
-
1979
- 1979-05-29 JP JP6632979A patent/JPS55158544A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5017695A (en) * | 1973-06-14 | 1975-02-25 |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS568533A (en) * | 1979-07-02 | 1981-01-28 | Kawasaki Steel Corp | Static measuring method for metallic texture |
JPS6095336A (en) * | 1983-10-31 | 1985-05-28 | Kawasaki Steel Corp | Texture measuring method of surface layer |
JPH0510617B2 (en) * | 1983-10-31 | 1993-02-10 | Kawasaki Steel Co | |
JPS61104245A (en) * | 1984-10-26 | 1986-05-22 | Rigaku Denki Kogyo Kk | On-line x-ray diffraction apparatus |
JPH0550699B2 (en) * | 1984-10-26 | 1993-07-29 | Rigaku Denki Kogyo Kk | |
JPH01254849A (en) * | 1988-04-05 | 1989-10-11 | Rigaku Corp | Energy dispersive type x-ray diffraction method for thin film |
WO2012015053A1 (en) * | 2010-07-30 | 2012-02-02 | 株式会社リガク | Method for x-ray diffraction, and device therefor |
JP5740401B2 (en) * | 2010-07-30 | 2015-06-24 | 株式会社リガク | X-ray diffraction method and apparatus |
US9417195B2 (en) | 2010-07-30 | 2016-08-16 | Rigaku Corporation | Method and its apparatus for x-ray diffraction |
JP2015062039A (en) * | 2015-01-07 | 2015-04-02 | 株式会社リガク | X-ray diffraction method and portable x-ray diffraction apparatus using the same |
Also Published As
Publication number | Publication date |
---|---|
JPS649575B2 (en) | 1989-02-17 |
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