JPS55158544A - On-line measuring method of and apparatus for aggregation structure - Google Patents

On-line measuring method of and apparatus for aggregation structure

Info

Publication number
JPS55158544A
JPS55158544A JP6632979A JP6632979A JPS55158544A JP S55158544 A JPS55158544 A JP S55158544A JP 6632979 A JP6632979 A JP 6632979A JP 6632979 A JP6632979 A JP 6632979A JP S55158544 A JPS55158544 A JP S55158544A
Authority
JP
Japan
Prior art keywords
rays
slit
intensity
incident
diffracted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6632979A
Other languages
Japanese (ja)
Other versions
JPS649575B2 (en
Inventor
Takeshi Kitagawa
Yoshiji Tada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp, Kawasaki Steel Corp filed Critical Rigaku Industrial Corp
Priority to JP6632979A priority Critical patent/JPS55158544A/en
Publication of JPS55158544A publication Critical patent/JPS55158544A/en
Publication of JPS649575B2 publication Critical patent/JPS649575B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the axial density distribution of the rolled metal plate parallel to the normal thereof employing the parallel beam optical system by applying the slit system having a fixed relationship between the incident and detecting openings to the energy dispersion method requiring no angular scanning theoretically. CONSTITUTION:The slit large in the opening on the incident side is combined with the slit relatively smaller in the opening on the light receiving side in a fixed relationship so that the intensity of diffracted X-rays won't vary as a whole regardless of any change in the position of the sample in one optical system by the energy dispersion method employing parallel beam. Continuous X-rays are radiated at a fixed incident angle theta on the steel plate 7 running between roles 8. The wave height of the electric pulse is selected with a multiple ray analyzer 3 and the data following the analysis thereof is inputted to the electronic computer 5. The intensity of the rolled plate parallel to the diffracted X-rays is obtained for each crystal surface and compared with the random intensity previously obtained from the crystal surfaces of random oriented sample. This continuously provides measured value of the axial density distribution of the normal.
JP6632979A 1979-05-29 1979-05-29 On-line measuring method of and apparatus for aggregation structure Granted JPS55158544A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6632979A JPS55158544A (en) 1979-05-29 1979-05-29 On-line measuring method of and apparatus for aggregation structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6632979A JPS55158544A (en) 1979-05-29 1979-05-29 On-line measuring method of and apparatus for aggregation structure

Publications (2)

Publication Number Publication Date
JPS55158544A true JPS55158544A (en) 1980-12-10
JPS649575B2 JPS649575B2 (en) 1989-02-17

Family

ID=13312689

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6632979A Granted JPS55158544A (en) 1979-05-29 1979-05-29 On-line measuring method of and apparatus for aggregation structure

Country Status (1)

Country Link
JP (1) JPS55158544A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568533A (en) * 1979-07-02 1981-01-28 Kawasaki Steel Corp Static measuring method for metallic texture
JPS6095336A (en) * 1983-10-31 1985-05-28 Kawasaki Steel Corp Texture measuring method of surface layer
JPS61104245A (en) * 1984-10-26 1986-05-22 Rigaku Denki Kogyo Kk On-line x-ray diffraction apparatus
JPH01254849A (en) * 1988-04-05 1989-10-11 Rigaku Corp Energy dispersive type x-ray diffraction method for thin film
WO2012015053A1 (en) * 2010-07-30 2012-02-02 株式会社リガク Method for x-ray diffraction, and device therefor
JP2015062039A (en) * 2015-01-07 2015-04-02 株式会社リガク X-ray diffraction method and portable x-ray diffraction apparatus using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5017695A (en) * 1973-06-14 1975-02-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5017695A (en) * 1973-06-14 1975-02-25

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568533A (en) * 1979-07-02 1981-01-28 Kawasaki Steel Corp Static measuring method for metallic texture
JPS6095336A (en) * 1983-10-31 1985-05-28 Kawasaki Steel Corp Texture measuring method of surface layer
JPH0510617B2 (en) * 1983-10-31 1993-02-10 Kawasaki Steel Co
JPS61104245A (en) * 1984-10-26 1986-05-22 Rigaku Denki Kogyo Kk On-line x-ray diffraction apparatus
JPH0550699B2 (en) * 1984-10-26 1993-07-29 Rigaku Denki Kogyo Kk
JPH01254849A (en) * 1988-04-05 1989-10-11 Rigaku Corp Energy dispersive type x-ray diffraction method for thin film
WO2012015053A1 (en) * 2010-07-30 2012-02-02 株式会社リガク Method for x-ray diffraction, and device therefor
JP5740401B2 (en) * 2010-07-30 2015-06-24 株式会社リガク X-ray diffraction method and apparatus
US9417195B2 (en) 2010-07-30 2016-08-16 Rigaku Corporation Method and its apparatus for x-ray diffraction
JP2015062039A (en) * 2015-01-07 2015-04-02 株式会社リガク X-ray diffraction method and portable x-ray diffraction apparatus using the same

Also Published As

Publication number Publication date
JPS649575B2 (en) 1989-02-17

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