JPS55148436A - Probe base plate - Google Patents
Probe base plateInfo
- Publication number
- JPS55148436A JPS55148436A JP5725279A JP5725279A JPS55148436A JP S55148436 A JPS55148436 A JP S55148436A JP 5725279 A JP5725279 A JP 5725279A JP 5725279 A JP5725279 A JP 5725279A JP S55148436 A JPS55148436 A JP S55148436A
- Authority
- JP
- Japan
- Prior art keywords
- base plate
- probe base
- probe
- socket
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To confirm the multi-needle probe base plate by overlaying the second prove base plate on which a defectless semiconductor device is mounted, to a testing probe base plate which has electrical connections with it. CONSTITUTION:On the first probe base plate 1, a plural number of probe needles 2 are arranged to be correspondent with each electrode on a semiconductor device, and a plural number of terminals 5 which are arranged electrical connections with each probe needle 2 and in the same way with electrodes 4 of the base plate. On the second plate 6 a socket 8 on which a defectless sample is to be inserted is provided, and each electrode on the socket 8 is connected with terminals 7 which are disposed arround the socket 8. A defectless sample is inserted into the socket 8, and with terminals 5 of the probe base plate 1 connected with terminals 7 of the probe base plate 6, a multi-needle probe base plate is confirmed with ease.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5725279A JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5725279A JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55148436A true JPS55148436A (en) | 1980-11-19 |
JPS626653B2 JPS626653B2 (en) | 1987-02-12 |
Family
ID=13050331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5725279A Granted JPS55148436A (en) | 1979-05-10 | 1979-05-10 | Probe base plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55148436A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4514022A (en) * | 1983-06-29 | 1985-04-30 | Tektronix, Inc. | Probe cable assemblies |
US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
US4926117A (en) * | 1988-05-02 | 1990-05-15 | Micron Technology, Inc. | Burn-in board having discrete test capability |
US5923176A (en) * | 1991-08-19 | 1999-07-13 | Ncr Corporation | High speed test fixture |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53102379U (en) * | 1977-01-20 | 1978-08-18 |
-
1979
- 1979-05-10 JP JP5725279A patent/JPS55148436A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53102379U (en) * | 1977-01-20 | 1978-08-18 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4514022A (en) * | 1983-06-29 | 1985-04-30 | Tektronix, Inc. | Probe cable assemblies |
US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
US4926117A (en) * | 1988-05-02 | 1990-05-15 | Micron Technology, Inc. | Burn-in board having discrete test capability |
US5923176A (en) * | 1991-08-19 | 1999-07-13 | Ncr Corporation | High speed test fixture |
Also Published As
Publication number | Publication date |
---|---|
JPS626653B2 (en) | 1987-02-12 |
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