JPS55137654A - Particle detector - Google Patents
Particle detectorInfo
- Publication number
- JPS55137654A JPS55137654A JP4292080A JP4292080A JPS55137654A JP S55137654 A JPS55137654 A JP S55137654A JP 4292080 A JP4292080 A JP 4292080A JP 4292080 A JP4292080 A JP 4292080A JP S55137654 A JPS55137654 A JP S55137654A
- Authority
- JP
- Japan
- Prior art keywords
- particle detector
- detector
- particle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7908327A FR2453419A1 (fr) | 1979-04-03 | 1979-04-03 | Dispositif de detection de particules |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55137654A true JPS55137654A (en) | 1980-10-27 |
Family
ID=9223876
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4292080A Pending JPS55137654A (en) | 1979-04-03 | 1980-04-03 | Particle detector |
Country Status (5)
Country | Link |
---|---|
US (1) | US4330731A (ja) |
EP (1) | EP0018253B1 (ja) |
JP (1) | JPS55137654A (ja) |
DE (1) | DE3062316D1 (ja) |
FR (1) | FR2453419A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010150301A1 (ja) * | 2009-06-22 | 2010-12-29 | 株式会社島津製作所 | 質量分析装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2613081B1 (fr) * | 1987-03-26 | 1990-01-19 | Commissariat Energie Atomique | Detecteur de particules |
JP2636113B2 (ja) * | 1992-03-26 | 1997-07-30 | 広島大学長 | 帯域フィルター型逆光電子分光検出装置 |
US5656807A (en) * | 1995-09-22 | 1997-08-12 | Packard; Lyle E. | 360 degrees surround photon detector/electron multiplier with cylindrical photocathode defining an internal detection chamber |
JP5299241B2 (ja) * | 2008-11-28 | 2013-09-25 | 株式会社島津製作所 | パーティクル計数装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2994773A (en) * | 1956-02-20 | 1961-08-01 | Westinghouse Electric Corp | Radiation detector |
US3033984A (en) * | 1959-02-17 | 1962-05-08 | United States Steel Corp | Apparatus for increasing the energy of x-rays |
US3197662A (en) * | 1960-03-11 | 1965-07-27 | Westinghouse Electric Corp | Transmissive spongy secondary emitter |
CA714700A (en) * | 1961-04-28 | 1965-07-27 | Kanter Helmut | Radiation image counter |
US3657596A (en) * | 1965-05-20 | 1972-04-18 | Westinghouse Electric Corp | Electron image device having target comprising porous region adjacent conductive layer and outer, denser region |
US4099079A (en) * | 1975-10-30 | 1978-07-04 | U.S. Philips Corporation | Secondary-emissive layers |
-
1979
- 1979-04-03 FR FR7908327A patent/FR2453419A1/fr active Granted
-
1980
- 1980-03-28 EP EP80400418A patent/EP0018253B1/fr not_active Expired
- 1980-03-28 DE DE8080400418T patent/DE3062316D1/de not_active Expired
- 1980-03-31 US US06/135,245 patent/US4330731A/en not_active Expired - Lifetime
- 1980-04-03 JP JP4292080A patent/JPS55137654A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010150301A1 (ja) * | 2009-06-22 | 2010-12-29 | 株式会社島津製作所 | 質量分析装置 |
US8519327B2 (en) | 2009-06-22 | 2013-08-27 | Shimadzu Corporation | Mass spectrometer |
JP5305053B2 (ja) * | 2009-06-22 | 2013-10-02 | 株式会社島津製作所 | 質量分析装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0018253A3 (en) | 1980-11-12 |
FR2453419A1 (fr) | 1980-10-31 |
DE3062316D1 (en) | 1983-04-21 |
EP0018253B1 (fr) | 1983-03-16 |
US4330731A (en) | 1982-05-18 |
FR2453419B1 (ja) | 1982-01-15 |
EP0018253A2 (fr) | 1980-10-29 |
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