JPS5494092A - Mass analyzer - Google Patents
Mass analyzerInfo
- Publication number
- JPS5494092A JPS5494092A JP14878A JP14878A JPS5494092A JP S5494092 A JPS5494092 A JP S5494092A JP 14878 A JP14878 A JP 14878A JP 14878 A JP14878 A JP 14878A JP S5494092 A JPS5494092 A JP S5494092A
- Authority
- JP
- Japan
- Prior art keywords
- slit
- voltage
- deflecting
- ions
- impressed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
PURPOSE: To obtain several kinds of spectra of different resolutions only through electric operations by using a collector slit, which is formed with a plurality of slits of different widthes, so that only the ions having passed through a single slit may be guided into a detector by changing over a deflecting voltage.
CONSTITUTION: A collector slit 22 is formed with two slits 24 and 26 having different widthes so that only the ions having passed through one of the slits 24 and 26 can be guided into the detecror by impressing a deflecting voltage upon a pair of deflecting electrodes 14 and 15. In case the positive ions accelerated with 2 KV enter the slit 24, a voltage of - 400 V is impressed upon the deflecting electrode 15. In case only the positive ions entering the slit 26 are to be detected, a voltage of - 500 V is impressed upon the deflecting electrode 14, whereas a voltage of + 550 V is impressed upon the electrode 15. Then, only the ions coming through the slit 16 enter the center of the regulating slit 16 so that they are detected by secondary electron multiplier 18.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53000148A JPS5953501B2 (en) | 1978-01-06 | 1978-01-06 | mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53000148A JPS5953501B2 (en) | 1978-01-06 | 1978-01-06 | mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5494092A true JPS5494092A (en) | 1979-07-25 |
JPS5953501B2 JPS5953501B2 (en) | 1984-12-25 |
Family
ID=11465940
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53000148A Expired JPS5953501B2 (en) | 1978-01-06 | 1978-01-06 | mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5953501B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108255A (en) * | 1982-12-13 | 1984-06-22 | Jeol Ltd | Mass spectrometer |
US8895915B2 (en) | 2010-07-14 | 2014-11-25 | Thermo Fisher Scientific (Bremen) Gmbh | Ion detection arrangement |
WO2015019460A1 (en) * | 2013-08-08 | 2015-02-12 | 株式会社島津製作所 | Time-of-flight mass-spectrometer |
-
1978
- 1978-01-06 JP JP53000148A patent/JPS5953501B2/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108255A (en) * | 1982-12-13 | 1984-06-22 | Jeol Ltd | Mass spectrometer |
JPH04338B2 (en) * | 1982-12-13 | 1992-01-07 | Nippon Electron Optics Lab | |
US8895915B2 (en) | 2010-07-14 | 2014-11-25 | Thermo Fisher Scientific (Bremen) Gmbh | Ion detection arrangement |
WO2015019460A1 (en) * | 2013-08-08 | 2015-02-12 | 株式会社島津製作所 | Time-of-flight mass-spectrometer |
JP6044715B2 (en) * | 2013-08-08 | 2016-12-14 | 株式会社島津製作所 | Time-of-flight mass spectrometer |
Also Published As
Publication number | Publication date |
---|---|
JPS5953501B2 (en) | 1984-12-25 |
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