JPS5494092A - Mass analyzer - Google Patents

Mass analyzer

Info

Publication number
JPS5494092A
JPS5494092A JP14878A JP14878A JPS5494092A JP S5494092 A JPS5494092 A JP S5494092A JP 14878 A JP14878 A JP 14878A JP 14878 A JP14878 A JP 14878A JP S5494092 A JPS5494092 A JP S5494092A
Authority
JP
Japan
Prior art keywords
slit
voltage
deflecting
ions
impressed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14878A
Other languages
Japanese (ja)
Other versions
JPS5953501B2 (en
Inventor
Hiroshi Hirose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53000148A priority Critical patent/JPS5953501B2/en
Publication of JPS5494092A publication Critical patent/JPS5494092A/en
Publication of JPS5953501B2 publication Critical patent/JPS5953501B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

PURPOSE: To obtain several kinds of spectra of different resolutions only through electric operations by using a collector slit, which is formed with a plurality of slits of different widthes, so that only the ions having passed through a single slit may be guided into a detector by changing over a deflecting voltage.
CONSTITUTION: A collector slit 22 is formed with two slits 24 and 26 having different widthes so that only the ions having passed through one of the slits 24 and 26 can be guided into the detecror by impressing a deflecting voltage upon a pair of deflecting electrodes 14 and 15. In case the positive ions accelerated with 2 KV enter the slit 24, a voltage of - 400 V is impressed upon the deflecting electrode 15. In case only the positive ions entering the slit 26 are to be detected, a voltage of - 500 V is impressed upon the deflecting electrode 14, whereas a voltage of + 550 V is impressed upon the electrode 15. Then, only the ions coming through the slit 16 enter the center of the regulating slit 16 so that they are detected by secondary electron multiplier 18.
COPYRIGHT: (C)1979,JPO&Japio
JP53000148A 1978-01-06 1978-01-06 mass spectrometer Expired JPS5953501B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53000148A JPS5953501B2 (en) 1978-01-06 1978-01-06 mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53000148A JPS5953501B2 (en) 1978-01-06 1978-01-06 mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5494092A true JPS5494092A (en) 1979-07-25
JPS5953501B2 JPS5953501B2 (en) 1984-12-25

Family

ID=11465940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53000148A Expired JPS5953501B2 (en) 1978-01-06 1978-01-06 mass spectrometer

Country Status (1)

Country Link
JP (1) JPS5953501B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108255A (en) * 1982-12-13 1984-06-22 Jeol Ltd Mass spectrometer
US8895915B2 (en) 2010-07-14 2014-11-25 Thermo Fisher Scientific (Bremen) Gmbh Ion detection arrangement
WO2015019460A1 (en) * 2013-08-08 2015-02-12 株式会社島津製作所 Time-of-flight mass-spectrometer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108255A (en) * 1982-12-13 1984-06-22 Jeol Ltd Mass spectrometer
JPH04338B2 (en) * 1982-12-13 1992-01-07 Nippon Electron Optics Lab
US8895915B2 (en) 2010-07-14 2014-11-25 Thermo Fisher Scientific (Bremen) Gmbh Ion detection arrangement
WO2015019460A1 (en) * 2013-08-08 2015-02-12 株式会社島津製作所 Time-of-flight mass-spectrometer
JP6044715B2 (en) * 2013-08-08 2016-12-14 株式会社島津製作所 Time-of-flight mass spectrometer

Also Published As

Publication number Publication date
JPS5953501B2 (en) 1984-12-25

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