JPS5489482A - X-ray lithography mask and production of the same - Google Patents

X-ray lithography mask and production of the same

Info

Publication number
JPS5489482A
JPS5489482A JP15881177A JP15881177A JPS5489482A JP S5489482 A JPS5489482 A JP S5489482A JP 15881177 A JP15881177 A JP 15881177A JP 15881177 A JP15881177 A JP 15881177A JP S5489482 A JPS5489482 A JP S5489482A
Authority
JP
Japan
Prior art keywords
film
patterns
substrate
transmission layer
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15881177A
Other languages
Japanese (ja)
Inventor
Katsumi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15881177A priority Critical patent/JPS5489482A/en
Publication of JPS5489482A publication Critical patent/JPS5489482A/en
Pending legal-status Critical Current

Links

Landscapes

  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE: To obtain a mask ideally suited for formation of fine mask patterns by disposing spacers at end edges of the absorber pattern forming surface of a soft X-ray transmission layer provided with X-ray absorber patterns and providing reinforcing supporting beams composed of Si to the end edges on the opposite surface corresponding thereto.
CONSTITUTION: After SiO2 film 2 are deposited on both surfaces of a Si monocrystalline substrate 1 having a thickness necessary for supporting an X-ray transmission layer 5, a Si3N4 film 3 is grown on one surface. Next, patterns of a resist film 4 are provided on this surface and with these as a mask, etching is performed to let the laminated films 2' and 3' of the specified patterns be remained. Thereafter, the film 2 on the opposite surface is removed and an X-ray transmission layer 5 composed of the SiO2 film sandwiched by Si3N4 films is deposited over the entire surface of the exposed substrate 1 and is then covered with a Ti thin film 6 and an Au thin film 7. Next, X-ray absorber patterns 9 composed of Au are formed thereon and thick spacers 11 composed of Ni, Cu or other are provided encircling these. The substrate is then etched from the back side to let the supporting beams 1' thru 3' composed of the substrate and films be remained in opposition to the spacers 11.
COPYRIGHT: (C)1979,JPO&Japio
JP15881177A 1977-12-27 1977-12-27 X-ray lithography mask and production of the same Pending JPS5489482A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15881177A JPS5489482A (en) 1977-12-27 1977-12-27 X-ray lithography mask and production of the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15881177A JPS5489482A (en) 1977-12-27 1977-12-27 X-ray lithography mask and production of the same

Publications (1)

Publication Number Publication Date
JPS5489482A true JPS5489482A (en) 1979-07-16

Family

ID=15679867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15881177A Pending JPS5489482A (en) 1977-12-27 1977-12-27 X-ray lithography mask and production of the same

Country Status (1)

Country Link
JP (1) JPS5489482A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015062212A (en) * 2013-09-23 2015-04-02 ナショナル シンクロトロン ラディエイション リサーチ センターNational Synchrotron Radiation Research Center X-ray mask structure and manufacturing method therefor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015062212A (en) * 2013-09-23 2015-04-02 ナショナル シンクロトロン ラディエイション リサーチ センターNational Synchrotron Radiation Research Center X-ray mask structure and manufacturing method therefor
US9152036B2 (en) 2013-09-23 2015-10-06 National Synchrotron Radiation Research Center X-ray mask structure and method for preparing the same

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