JPS5487249A - Positioning device - Google Patents

Positioning device

Info

Publication number
JPS5487249A
JPS5487249A JP15478177A JP15478177A JPS5487249A JP S5487249 A JPS5487249 A JP S5487249A JP 15478177 A JP15478177 A JP 15478177A JP 15478177 A JP15478177 A JP 15478177A JP S5487249 A JPS5487249 A JP S5487249A
Authority
JP
Japan
Prior art keywords
wafer
coefficients
marks
coordinates
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15478177A
Other languages
Japanese (ja)
Inventor
Yasuo Furukawa
Seigo Igaki
Masahiro Okabe
Noriaki Nakayama
Yushi Inagaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15478177A priority Critical patent/JPS5487249A/en
Publication of JPS5487249A publication Critical patent/JPS5487249A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PURPOSE: To accomplish the positioning operation accurately at a high speed by setting the coefficients of displacement operating equations in a register so that the displacement of a stage may be controlled on the basis of the values stored in the register.
CONSTITUTION: The coordinates of the marks M1 to M4, which are formed at spacings a and b in the perpendicular directions x and y on a wafer, are read out to determine the differences ΔX1 to ΔX4 and ΔY1 to ΔY4 of the wafer placed in reference position from the coordinates of the marks M1 to M4 of the wafer. Then, the parallel displacement distances A and E, rotational error coefficients C and F, varying coefficients of the wafer size B and G, and distrosion error coefficients D and H are calculated on the basis of Equations III to X. Those coefficients A to H are stored in the register so that the displacements corresponding to the coordinates Xi and Yi of the designated positions of the marks M1 to M4 of the wafer, which is reinserted after the retreatment, are calculated on the basis of Equations I and II by means of adding and multiplying circuits. Then, the movement signals required for the stage, on which the wafer is placed, are determined to make it possible to effect the positioning operations accurately at a high speed.
COPYRIGHT: (C)1979,JPO&Japio
JP15478177A 1977-12-22 1977-12-22 Positioning device Pending JPS5487249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15478177A JPS5487249A (en) 1977-12-22 1977-12-22 Positioning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15478177A JPS5487249A (en) 1977-12-22 1977-12-22 Positioning device

Publications (1)

Publication Number Publication Date
JPS5487249A true JPS5487249A (en) 1979-07-11

Family

ID=15591750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15478177A Pending JPS5487249A (en) 1977-12-22 1977-12-22 Positioning device

Country Status (1)

Country Link
JP (1) JPS5487249A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49111665A (en) * 1973-02-22 1974-10-24

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49111665A (en) * 1973-02-22 1974-10-24

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