JPS5448175A - Measuring method for forward transmission admittance of field effect transistor - Google Patents
Measuring method for forward transmission admittance of field effect transistorInfo
- Publication number
- JPS5448175A JPS5448175A JP11459177A JP11459177A JPS5448175A JP S5448175 A JPS5448175 A JP S5448175A JP 11459177 A JP11459177 A JP 11459177A JP 11459177 A JP11459177 A JP 11459177A JP S5448175 A JPS5448175 A JP S5448175A
- Authority
- JP
- Japan
- Prior art keywords
- fet
- measurement
- vgs
- measuring method
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To realize a measuring method for the forward admittance of FET, featuring reduced power consumption and a short measurement time.
CONSTITUTION: The necessary current value ID1 flowing to FET is subscribed, and the measurement is given to gate-source voltage VGS1 obtained based on value VD1. Then variation ΔVGS (for example 1V) of the voltage predetermined is subtracted from voltage VGS1; this voltage (VGS1-VGS) is applied to FET; current ID2 obtained then is measured. Based on these readings, an and operation is carried out to satisfy the equation GM=(ID1-ID2)/ΔVGS, and the forward transmission admittance is measured for FET. As a result, the measurement time can be shorten ed since the switch is kept on for a little moment by the pulse for measurement, and the self heat generation can be avoided for FET since the current is flown for a little moment. Furthermore, the AC signals and their process circuit are not needed within the measurement circuit because the process is performed only with the DC signals
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11459177A JPS5448175A (en) | 1977-09-26 | 1977-09-26 | Measuring method for forward transmission admittance of field effect transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11459177A JPS5448175A (en) | 1977-09-26 | 1977-09-26 | Measuring method for forward transmission admittance of field effect transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5448175A true JPS5448175A (en) | 1979-04-16 |
Family
ID=14641682
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11459177A Pending JPS5448175A (en) | 1977-09-26 | 1977-09-26 | Measuring method for forward transmission admittance of field effect transistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5448175A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5875073A (en) * | 1981-10-29 | 1983-05-06 | Yokogawa Hewlett Packard Ltd | Dc characteristic measuring system |
-
1977
- 1977-09-26 JP JP11459177A patent/JPS5448175A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5875073A (en) * | 1981-10-29 | 1983-05-06 | Yokogawa Hewlett Packard Ltd | Dc characteristic measuring system |
JPH0472195B2 (en) * | 1981-10-29 | 1992-11-17 | Yokogawa Hyuuretsuto Patsukaado Kk |
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