JPS6431064A - Apparatus for measuring electric parts - Google Patents

Apparatus for measuring electric parts

Info

Publication number
JPS6431064A
JPS6431064A JP18838387A JP18838387A JPS6431064A JP S6431064 A JPS6431064 A JP S6431064A JP 18838387 A JP18838387 A JP 18838387A JP 18838387 A JP18838387 A JP 18838387A JP S6431064 A JPS6431064 A JP S6431064A
Authority
JP
Japan
Prior art keywords
power source
output
value
varicap
deterioration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18838387A
Other languages
Japanese (ja)
Other versions
JP2585007B2 (en
Inventor
Hideki Wakamatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP62188383A priority Critical patent/JP2585007B2/en
Publication of JPS6431064A publication Critical patent/JPS6431064A/en
Application granted granted Critical
Publication of JP2585007B2 publication Critical patent/JP2585007B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To perform high speed measurement reduced in the deterioration of accuracy, by performing the setting of a bias power source and the setting of the measuring range corresponding to the output value of the power source in parallel on the basis of an internally stored corresponding table. CONSTITUTION:A varicap 1 to be measured is energized by a DC bias source 3 through a measuring AC power source 2 and an AC inhibiting apparatus 4 and generates the output corresponding to the applied AC voltage and current of the varicap 1 by a bridge circuit 5. The output is converted to a digital value by an A/D converter 6 and the digital value is subsequently processed by an operation apparatus 7 to calculate a capacity value. The apparatus is controlled by a microprocessor 10 and a memory 11 through a bus 12. The digital signal from the outside is inputted through an interface 13. By this constitution, high speed measurement reduced in the deterioration of accuracy can be performed.
JP62188383A 1987-07-28 1987-07-28 Electrical component measuring device Expired - Lifetime JP2585007B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62188383A JP2585007B2 (en) 1987-07-28 1987-07-28 Electrical component measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62188383A JP2585007B2 (en) 1987-07-28 1987-07-28 Electrical component measuring device

Publications (2)

Publication Number Publication Date
JPS6431064A true JPS6431064A (en) 1989-02-01
JP2585007B2 JP2585007B2 (en) 1997-02-26

Family

ID=16222664

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62188383A Expired - Lifetime JP2585007B2 (en) 1987-07-28 1987-07-28 Electrical component measuring device

Country Status (1)

Country Link
JP (1) JP2585007B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018081019A (en) * 2016-11-17 2018-05-24 日置電機株式会社 Measurement device and measurement method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166181U (en) * 1983-04-20 1984-11-07 ロ−ム株式会社 classification device
JPS61142471A (en) * 1984-12-17 1986-06-30 Yokogawa Hewlett Packard Ltd Impedance measuring apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166181U (en) * 1983-04-20 1984-11-07 ロ−ム株式会社 classification device
JPS61142471A (en) * 1984-12-17 1986-06-30 Yokogawa Hewlett Packard Ltd Impedance measuring apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018081019A (en) * 2016-11-17 2018-05-24 日置電機株式会社 Measurement device and measurement method

Also Published As

Publication number Publication date
JP2585007B2 (en) 1997-02-26

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