JPS54141695A - Method and device for nonndestructively detecting technical characteristic value of strip - Google Patents

Method and device for nonndestructively detecting technical characteristic value of strip

Info

Publication number
JPS54141695A
JPS54141695A JP4731679A JP4731679A JPS54141695A JP S54141695 A JPS54141695 A JP S54141695A JP 4731679 A JP4731679 A JP 4731679A JP 4731679 A JP4731679 A JP 4731679A JP S54141695 A JPS54141695 A JP S54141695A
Authority
JP
Japan
Prior art keywords
nonndestructively
strip
characteristic value
technical characteristic
detecting technical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4731679A
Other languages
Japanese (ja)
Other versions
JPH0237539B2 (en
Inventor
Betohiaa Buorufugangu
Yoozefu Kopinetsuku Heruman
Mauraa Aruburehito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoesch Werke AG
Original Assignee
Hoesch Werke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoesch Werke AG filed Critical Hoesch Werke AG
Publication of JPS54141695A publication Critical patent/JPS54141695A/en
Publication of JPH0237539B2 publication Critical patent/JPH0237539B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP4731679A 1978-04-22 1979-04-19 Method and device for nonndestructively detecting technical characteristic value of strip Granted JPS54141695A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2817742A DE2817742C2 (en) 1978-04-22 1978-04-22 Method and device for determining technological parameters

Publications (2)

Publication Number Publication Date
JPS54141695A true JPS54141695A (en) 1979-11-05
JPH0237539B2 JPH0237539B2 (en) 1990-08-24

Family

ID=6037775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4731679A Granted JPS54141695A (en) 1978-04-22 1979-04-19 Method and device for nonndestructively detecting technical characteristic value of strip

Country Status (8)

Country Link
JP (1) JPS54141695A (en)
AT (1) AT381394B (en)
BE (1) BE875722A (en)
DE (1) DE2817742C2 (en)
FR (1) FR2423774A1 (en)
GB (1) GB2019559B (en)
IT (1) IT1114999B (en)
LU (1) LU81170A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (en) * 1988-07-29 1990-02-01 Hoesch Stahl Ag METHOD AND DEVICE FOR TEXTURE ANALYSIS
US5381458A (en) * 1993-02-23 1995-01-10 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
FR2833081B1 (en) * 2001-11-30 2004-05-07 Centre Nat Rech Scient METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS
DE102016222644A1 (en) 2016-03-14 2017-09-28 Sms Group Gmbh Process for rolling and / or heat treating a metallic product
DE102017208576A1 (en) 2016-05-25 2017-11-30 Sms Group Gmbh Apparatus and method for determining a microstructure of a metal product and metallurgical plant

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
JPS5332789A (en) * 1976-09-08 1978-03-28 Hitachi Ltd Method and apparatus for measuring of stress of white color x-ray

Also Published As

Publication number Publication date
BE875722A (en) 1979-10-22
DE2817742B1 (en) 1979-10-31
JPH0237539B2 (en) 1990-08-24
FR2423774A1 (en) 1979-11-16
ATA149679A (en) 1986-02-15
AT381394B (en) 1986-10-10
IT1114999B (en) 1986-02-03
LU81170A1 (en) 1979-11-07
GB2019559A (en) 1979-10-31
GB2019559B (en) 1983-01-06
DE2817742C2 (en) 1980-07-24
IT7948613A0 (en) 1979-04-04
FR2423774B1 (en) 1984-05-04

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JPS54141695A (en) Method and device for nonndestructively detecting technical characteristic value of strip