JPS5322033B2 - - Google Patents
Info
- Publication number
- JPS5322033B2 JPS5322033B2 JP2631974A JP2631974A JPS5322033B2 JP S5322033 B2 JPS5322033 B2 JP S5322033B2 JP 2631974 A JP2631974 A JP 2631974A JP 2631974 A JP2631974 A JP 2631974A JP S5322033 B2 JPS5322033 B2 JP S5322033B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2631974A JPS5322033B2 (ja) | 1974-03-08 | 1974-03-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2631974A JPS5322033B2 (ja) | 1974-03-08 | 1974-03-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS50120779A JPS50120779A (ja) | 1975-09-22 |
JPS5322033B2 true JPS5322033B2 (ja) | 1978-07-06 |
Family
ID=12190057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2631974A Expired JPS5322033B2 (ja) | 1974-03-08 | 1974-03-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5322033B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2526252B2 (ja) * | 1987-07-30 | 1996-08-21 | 東京エレクトロン株式会社 | 半導体素子の信頼性試験方法 |
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1974
- 1974-03-08 JP JP2631974A patent/JPS5322033B2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS50120779A (ja) | 1975-09-22 |