JPS5293248A - Trouble discriminator - Google Patents

Trouble discriminator

Info

Publication number
JPS5293248A
JPS5293248A JP955876A JP955876A JPS5293248A JP S5293248 A JPS5293248 A JP S5293248A JP 955876 A JP955876 A JP 955876A JP 955876 A JP955876 A JP 955876A JP S5293248 A JPS5293248 A JP S5293248A
Authority
JP
Japan
Prior art keywords
trouble
discriminator
measure
length
binary pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP955876A
Other languages
Japanese (ja)
Other versions
JPS5713030B2 (en
Inventor
Kunihiko Edamatsu
Masao Nito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP955876A priority Critical patent/JPS5293248A/en
Publication of JPS5293248A publication Critical patent/JPS5293248A/en
Publication of JPS5713030B2 publication Critical patent/JPS5713030B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

PURPOSE: To discriminate the trouble by the simple constitution with the capability to measure the area of the quantized binary pattern to compute the boundary length and to measure the boundary length of binary pattern to compare the two boundery length.
COPYRIGHT: (C)1977,JPO&Japio
JP955876A 1976-01-31 1976-01-31 Trouble discriminator Granted JPS5293248A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP955876A JPS5293248A (en) 1976-01-31 1976-01-31 Trouble discriminator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP955876A JPS5293248A (en) 1976-01-31 1976-01-31 Trouble discriminator

Publications (2)

Publication Number Publication Date
JPS5293248A true JPS5293248A (en) 1977-08-05
JPS5713030B2 JPS5713030B2 (en) 1982-03-15

Family

ID=11723602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP955876A Granted JPS5293248A (en) 1976-01-31 1976-01-31 Trouble discriminator

Country Status (1)

Country Link
JP (1) JPS5293248A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58179343A (en) * 1982-04-14 1983-10-20 Nec Corp Inspection method of figure
JPS6149282A (en) * 1984-08-17 1986-03-11 Fuji Electric Co Ltd Pattern processing device
JPS62288553A (en) * 1986-06-06 1987-12-15 Sumitomo Special Metals Co Ltd Detection of surface flaw
JPH10122821A (en) * 1996-10-21 1998-05-15 Nittetsu Mining Co Ltd Method for discriminating false detection at detection of excessively large grain

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5055380A (en) * 1973-09-12 1975-05-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5055380A (en) * 1973-09-12 1975-05-15

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58179343A (en) * 1982-04-14 1983-10-20 Nec Corp Inspection method of figure
JPS6149282A (en) * 1984-08-17 1986-03-11 Fuji Electric Co Ltd Pattern processing device
JPS62288553A (en) * 1986-06-06 1987-12-15 Sumitomo Special Metals Co Ltd Detection of surface flaw
JPH10122821A (en) * 1996-10-21 1998-05-15 Nittetsu Mining Co Ltd Method for discriminating false detection at detection of excessively large grain

Also Published As

Publication number Publication date
JPS5713030B2 (en) 1982-03-15

Similar Documents

Publication Publication Date Title
JPS5291331A (en) Pattern position detector
JPS539739A (en) #-trifluoromethyl-##-isoproxybenzoic acid anilide, its preparation and its use
JPS51142372A (en) Time measuring device
JPS5293248A (en) Trouble discriminator
JPS528729A (en) Type-drum
JPS5380247A (en) Position detector
JPS5210642A (en) Offering analysis device
JPS52144656A (en) N-(diphenylphosphonomethyl)-imino-diacetonitrile and its preparation
JPS5228790A (en) Boring device
JPS52141146A (en) Square root extraction arithmetic system
JPS51126190A (en) Optical measurement, calculation circuit
JPS51124944A (en) Device to detect a tangent line of contour line on a three dimentional object
JPS5219091A (en) Semiconductor pressure-electricity converter
JPS5374842A (en) Pattern rrcognizing device
JPS54575A (en) Semiconductoe device
JPS5319884A (en) Mass marker
JPS53148253A (en) Sequence check circuit
JPS5272257A (en) Multiple point type liquid level device
JPS5361469A (en) Steam jet device
JPS5334452A (en) Am-fm detecting circuit
JPS5219078A (en) Threshold measuring method
JPS52153906A (en) 1-hexadecyne-6-one and its preparation
JPS51139377A (en) Temperature detector
JPS5283704A (en) 2, 6, 11, 15-tetramethylhexadecane-6, 11-diol
JPS5381113A (en) Radiation sensitive material