JPS5293248A - Trouble discriminator - Google Patents
Trouble discriminatorInfo
- Publication number
- JPS5293248A JPS5293248A JP955876A JP955876A JPS5293248A JP S5293248 A JPS5293248 A JP S5293248A JP 955876 A JP955876 A JP 955876A JP 955876 A JP955876 A JP 955876A JP S5293248 A JPS5293248 A JP S5293248A
- Authority
- JP
- Japan
- Prior art keywords
- trouble
- discriminator
- measure
- length
- binary pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
Abstract
PURPOSE: To discriminate the trouble by the simple constitution with the capability to measure the area of the quantized binary pattern to compute the boundary length and to measure the boundary length of binary pattern to compare the two boundery length.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP955876A JPS5293248A (en) | 1976-01-31 | 1976-01-31 | Trouble discriminator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP955876A JPS5293248A (en) | 1976-01-31 | 1976-01-31 | Trouble discriminator |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5293248A true JPS5293248A (en) | 1977-08-05 |
JPS5713030B2 JPS5713030B2 (en) | 1982-03-15 |
Family
ID=11723602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP955876A Granted JPS5293248A (en) | 1976-01-31 | 1976-01-31 | Trouble discriminator |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5293248A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58179343A (en) * | 1982-04-14 | 1983-10-20 | Nec Corp | Inspection method of figure |
JPS6149282A (en) * | 1984-08-17 | 1986-03-11 | Fuji Electric Co Ltd | Pattern processing device |
JPS62288553A (en) * | 1986-06-06 | 1987-12-15 | Sumitomo Special Metals Co Ltd | Detection of surface flaw |
JPH10122821A (en) * | 1996-10-21 | 1998-05-15 | Nittetsu Mining Co Ltd | Method for discriminating false detection at detection of excessively large grain |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5055380A (en) * | 1973-09-12 | 1975-05-15 |
-
1976
- 1976-01-31 JP JP955876A patent/JPS5293248A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5055380A (en) * | 1973-09-12 | 1975-05-15 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58179343A (en) * | 1982-04-14 | 1983-10-20 | Nec Corp | Inspection method of figure |
JPS6149282A (en) * | 1984-08-17 | 1986-03-11 | Fuji Electric Co Ltd | Pattern processing device |
JPS62288553A (en) * | 1986-06-06 | 1987-12-15 | Sumitomo Special Metals Co Ltd | Detection of surface flaw |
JPH10122821A (en) * | 1996-10-21 | 1998-05-15 | Nittetsu Mining Co Ltd | Method for discriminating false detection at detection of excessively large grain |
Also Published As
Publication number | Publication date |
---|---|
JPS5713030B2 (en) | 1982-03-15 |
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