Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Hitachi Ltd
Original Assignee
Hitachi Ltd
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Filing date
Publication date
Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP5223676ApriorityCriticalpatent/JPS52135682A/en
Publication of JPS52135682ApublicationCriticalpatent/JPS52135682A/en
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Abstract
PURPOSE: To improve assembly yield and stabilize quality by early identifying passivation defect owing to the occurrence of cracking in glass, insufficient pretreatment or surface contamination in the production of process of semiconductor elements.
COPYRIGHT: (C)1977,JPO&Japio
JP5223676A1976-05-101976-05-10Production of semiconductor element
PendingJPS52135682A
(en)