JPS52129250A - Function test method for logical circuit - Google Patents
Function test method for logical circuitInfo
- Publication number
- JPS52129250A JPS52129250A JP4492576A JP4492576A JPS52129250A JP S52129250 A JPS52129250 A JP S52129250A JP 4492576 A JP4492576 A JP 4492576A JP 4492576 A JP4492576 A JP 4492576A JP S52129250 A JPS52129250 A JP S52129250A
- Authority
- JP
- Japan
- Prior art keywords
- test method
- function test
- logical circuit
- grounding
- decision
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE: To achieve the function test method for the logical circuit, which can reduce greatly the types of patterns by performing detection at or near input/ output pin for grounding, short circuit and open fault prior to decision of logic level.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4492576A JPS52129250A (en) | 1976-04-22 | 1976-04-22 | Function test method for logical circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4492576A JPS52129250A (en) | 1976-04-22 | 1976-04-22 | Function test method for logical circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52129250A true JPS52129250A (en) | 1977-10-29 |
Family
ID=12705036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4492576A Pending JPS52129250A (en) | 1976-04-22 | 1976-04-22 | Function test method for logical circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52129250A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58175058A (en) * | 1982-04-05 | 1983-10-14 | Dainippon Printing Co Ltd | Reader and writer for ic card |
JPS59194267A (en) * | 1983-04-18 | 1984-11-05 | Kyodo Printing Co Ltd | Id card inspecting device |
-
1976
- 1976-04-22 JP JP4492576A patent/JPS52129250A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58175058A (en) * | 1982-04-05 | 1983-10-14 | Dainippon Printing Co Ltd | Reader and writer for ic card |
JPS59194267A (en) * | 1983-04-18 | 1984-11-05 | Kyodo Printing Co Ltd | Id card inspecting device |
JPH0327954B2 (en) * | 1983-04-18 | 1991-04-17 | Kyodo Printing Co Ltd |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS52129250A (en) | Function test method for logical circuit | |
JPS5513818A (en) | Testing method | |
JPS5476040A (en) | Logic circuit package | |
JPS53118327A (en) | Automatic test data generator | |
JPS5544676A (en) | Interruption control unit | |
JPS52146139A (en) | Obtaining method for 3 state output by using 2 state ttl circuit | |
JPS5338266A (en) | Screening method of semiconductors and device for the same | |
JPS52144921A (en) | Clear circuit | |
JPS5399716A (en) | Clamp circuit | |
JPS5362953A (en) | Test method for logical device | |
JPS53119642A (en) | Testing equipment for logic circuit | |
JPS5350940A (en) | Test method for display unit | |
JPS53104283A (en) | Input level detection circuit | |
JPS5268941A (en) | Anti time-limiting apparatus | |
JPS5388547A (en) | Processor for faulty simulation | |
JPS51144699A (en) | Test selling method of an automat | |
JPS53105953A (en) | Pulse generator | |
JPS53101950A (en) | Test equipment for logic circuit function | |
JPS5367086A (en) | Logic sequence system | |
JPS5219032A (en) | Ic memory function testing method | |
JPS5434731A (en) | Arithmetic unit | |
JPS5358799A (en) | Annunciator | |
JPS5440056A (en) | Diagnosis device for computer board | |
JPS5442635A (en) | Inspection method | |
JPS52112267A (en) | Ignition method of adverse parallel rectifier circuit |