JPH11118678A - Method and apparatus for adjusting angle of microtome sample - Google Patents
Method and apparatus for adjusting angle of microtome sampleInfo
- Publication number
- JPH11118678A JPH11118678A JP28242097A JP28242097A JPH11118678A JP H11118678 A JPH11118678 A JP H11118678A JP 28242097 A JP28242097 A JP 28242097A JP 28242097 A JP28242097 A JP 28242097A JP H11118678 A JPH11118678 A JP H11118678A
- Authority
- JP
- Japan
- Prior art keywords
- angle
- sample
- angle adjusting
- adjusting member
- solid sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Sampling And Sample Adjustment (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、理科学試験分析や
生体試料の顕微鏡観察などの医療分析において固形試料
に包埋された検体を最適角度で薄切するために用いるミ
クロトーム用試料角度調整装置及びその試料角度調整方
法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample angle adjusting device for a microtome used for slicing a sample embedded in a solid sample at an optimum angle in medical analysis such as scientific test analysis or microscopic observation of a biological sample. And a method for adjusting the sample angle.
【０００２】[0002]
【従来の技術】従来、薄切片の作製（切り出し）作業
は、ミクロトームを用いて作業者（人間）が行ってい
る。固形試料には、主として生体試料をパラフィン包埋
したものが用いられ、これを切断し、薄切片を作製す
る。図１２は従来の一般的なミクロトームの概略構成斜
視図である。2. Description of the Related Art Conventionally, a thin section is cut (cut) by a worker (human) using a microtome. As the solid sample, a biological sample in which a biological sample is embedded in paraffin is mainly used, and this is cut to produce a thin section. FIG. 12 is a perspective view schematically showing the configuration of a conventional general microtome.
【０００３】従来のミクロトームの基本的な構造には、
送り工程のための移動軸及び切断工程のための移動軸を
固形試料側に取り付けるか、または切断刃側に取り付け
るかという相違点はあるが、送り工程及び切断工程時の
切断刃と固形試料の相対的な動きはどちらを移動させて
も同じなので、今回は送り工程では固形試料２を、切断
工程では切断刃１を移動させることにしている。The basic structure of a conventional microtome is as follows:
There is a difference between attaching the moving shaft for the feed process and the moving shaft for the cutting process to the solid sample side or to the cutting blade side. Since the relative movement is the same regardless of which one is moved, the solid sample 2 is moved in the feeding step and the cutting blade 1 is moved in the cutting step.
【０００４】まず、固形試料２をＺ＋の方向へ送り（送
り工程：ここでは、図示していないがＺの方向のみに動
作可能な案内面とアクチュエータを具備する）その後、
切断刃をＸ＋の方向へ送る（切断工程：送り工程と同
様、Ｘの方向のみに動作可能な案内面を具備しており、
専用のアクチュエータを具備するものと手動で動作させ
るものがある。）ことにより、固形試料２を切断し、薄
切片を取り出すことができる。[0004] First, the solid sample 2 is fed in the Z + direction (feeding step: a guide surface and an actuator, not shown here, which are operable only in the Z direction) are provided.
Send the cutting blade in the X + direction (Cutting step: similar to the feeding step, the guide blade is provided with a guide surface operable only in the X direction.
Some are equipped with a dedicated actuator and others are operated manually. ), The solid sample 2 can be cut and a thin section can be taken out.
【０００５】固形試料２内には前述のように生体試料等
の検体３が包埋されているが、包埋時に前記検体３の姿
勢を完全に制御することは困難であり、加えて包埋材が
非透明である場合、包埋材に包まれた検体３の姿勢を観
察し、包埋状況を把握することも困難である。なお、図
１２において、１０は試料用ベースである。前記包埋状
況について、図１３（ａ），図１４（ａ）を用いて説明
する。As described above, the specimen 3 such as a biological sample is embedded in the solid sample 2. However, it is difficult to completely control the posture of the specimen 3 at the time of embedding. When the material is non-transparent, it is also difficult to observe the posture of the specimen 3 wrapped in the embedding material and to grasp the embedding state. In FIG. 12, reference numeral 10 denotes a sample base. The embedding status will be described with reference to FIGS. 13 (a) and 14 (a).
【０００６】図１３（ａ）は前記固形試料２内に包埋さ
れた検体３を図１のＣ方向から観察したものであり、図
１４（ａ）は同様にＤ方向から観察したものである。検
体３が図１２、図１３（ａ）及び図１４（ａ）に示すよ
うな姿勢で包埋されている場合、図１３（ａ）に示す固
形試料２の左エッジ４の点が右エッジ５の点よりもＺ＋
の方向に位置するように、また、図１４（ａ）に示す固
形試料２の右エッジ７の点が左エッジ６の点よりも同様
に、Ｚ＋の方向に位置するように角度をそれぞれ、図１
３（ｂ）、図１４（ｂ）に示すように修正する必要があ
る。FIG. 13 (a) shows the specimen 3 embedded in the solid sample 2 observed from the direction C in FIG. 1, and FIG. 14 (a) shows the specimen 3 observed similarly from the direction D. . When the specimen 3 is embedded in the posture as shown in FIGS. 12, 13A and 14A, the point of the left edge 4 of the solid sample 2 shown in FIG. Z + than point
14 (a), and so that the point of the right edge 7 of the solid sample 2 shown in FIG. 1
3 (b) and need to be modified as shown in FIG. 14 (b).
【０００７】このように、包埋材の中から現れた検体の
姿勢等の包埋状況が良好でない場合、前記検体の姿勢等
の包埋状況に応じての試料の角度調整が必要となる。従
来、前述のような試料の角度調整は、図１５に示すよう
に、薄切工程時に切断刃の先端が構成する平面からＥの
距離がある直交する２本の旋回中心軸（図１５ではＸ
軸、Ｙ軸としている）を旋回中心として前記Ｘ，Ｙ軸回
りに各々Ｆ及びＧの方向に回転可能な案内面及びクラン
プを有する装置を利用し、作業者が手作業で行ってい
る。As described above, when the embedding state such as the posture of the specimen that emerges from the embedding material is not good, it is necessary to adjust the angle of the sample according to the embedding state such as the posture of the specimen. Conventionally, as described above with reference to FIG. 15, the angle adjustment of a sample is performed by two orthogonal pivot axes (X in FIG. 15) having a distance of E from a plane formed by the tip of the cutting blade during the slicing step.
An axis and a Y axis) are used as the center of rotation, and the operator manually performs the operation by using a device having a guide surface and a clamp rotatable in the directions of F and G around the X and Y axes.
【０００８】なお、図１５に示すＸ軸及びＹ軸は点８に
おいてＺ軸と交差しているが、このことは前記案内面が
球状であることを意味する。しかし、実際は図１６に示
すようにＸ軸とＹ軸はＺ方向において交差しないことが
多く（図１６にＨで示す）、このような場合の案内面は
円筒状のものを２段に重ねたものが用いられる。The X axis and the Y axis shown in FIG. 15 intersect the Z axis at the point 8, which means that the guide surface is spherical. However, in practice, as shown in FIG. 16, the X axis and the Y axis often do not intersect in the Z direction (indicated by H in FIG. 16), and the guide surface in such a case is formed by stacking two cylindrical guide surfaces. Things are used.
【０００９】[0009]
【発明が解決しようとする課題】上記した従来の薄切片
の作製工程において、図１５、図１６、図１７に示す従
来の装置を用いての固形試料の角度調整における問題点
を以下に示す。 固形試料の角度調整の際に、図１７（ａ），１７
（ｂ）に示すように（図１７は図１２のＤ方向からの矢
視図であり、Ｙ軸回りの（Ｇ方向）の角度調整に関して
の説明図である）Ｙ軸を旋回中心にして回転させると、
旋回中心が薄切工程時に切断刃の先端が構成する平面内
の固形試料薄切面の中心９に位置している場合に比べ、
角度調整後に固形試料２がＺ方向変位する量が大きくな
り、角度調整後のＺ方向に関する固形試料２の位置を把
握し難く、再薄切までの調整に時間を要する。Problems to be solved by the conventional thin section preparation process described above in adjusting the angle of the solid sample using the conventional apparatus shown in FIGS. 15, 16 and 17 will be described below. When adjusting the angle of the solid sample, FIGS.
As shown in (b), FIG. 17 is a view from the direction D in FIG. 12 and is an explanatory view regarding the angle adjustment (G direction) around the Y axis. When you do
Compared to the case where the center of rotation is located at the center 9 of the solid sample thin section in the plane formed by the tip of the cutting blade during the thin section process,
The amount by which the solid sample 2 is displaced in the Z direction after the angle adjustment becomes large, it is difficult to grasp the position of the solid sample 2 in the Z direction after the angle adjustment, and it takes time to adjust until the thinning again.
【００１０】 固形試料の角度調整の際に、図１７
（ａ），１７（ｂ）に示すように、Ｙ軸を旋回中心にし
て回転させると、旋回中心が薄切工程時に切断刃の先端
が構成する平面内の固形試料薄切面の中心９に位置して
いる場合に比べ、角度調整後に固形試料２がＸ軸方向に
変位してしまうため、薄切のためのカッタナイフの移動
量が大きくなり、結果として装置が大きくなってしま
う。When adjusting the angle of the solid sample, FIG.
As shown in FIGS. 17 (a) and 17 (b), when the rotation is performed with the Y axis as the center of rotation, the center of rotation is positioned at the center 9 of the solid sample thin section in the plane formed by the tip of the cutting blade during the thin section process. Since the solid sample 2 is displaced in the X-axis direction after the angle adjustment as compared with the case where the angle is adjusted, the amount of movement of the cutter knife for slicing becomes large, and as a result, the apparatus becomes large.
【００１１】 角度調整は図１７（ａ），１７（ｂ）
に示すＧ方向のみに回転可能な案内面を有するのみであ
り、微小な角度の調整を行うことが困難であるため、希
望する角度に調整するのに時間を要する。 角度調整後のクランプは手動でクランプ用ねじを回
転させ、移動体の固定体に対する自由度を無くすること
により行うが、前記のようにねじ方式のクランプでは折
角調整した角度が再度ずれてしまう。（実際はＸ軸回り
の角度調整も行わなければならない。） 本発明は、上記問題点を除去し、固形試料の角度調整
を、迅速、かつ的確に実施することができるミクロトー
ム用試料角度調整装置及びその試料角度調整方法を提供
することを目的とする。The angle adjustment is shown in FIGS. 17A and 17B.
Has only a guide surface rotatable only in the G direction shown in FIG. 1 and it is difficult to adjust a minute angle, and it takes time to adjust the angle to a desired angle. Clamping after angle adjustment is performed by manually rotating the clamping screw to eliminate the degree of freedom of the moving body with respect to the fixed body. However, in the case of the screw-type clamp as described above, the angle whose bending angle has been adjusted is shifted again. (Actually, the angle adjustment about the X-axis must also be performed.) The present invention eliminates the above-mentioned problems, and a microtome sample angle adjustment device capable of quickly and accurately adjusting the angle of a solid sample. An object of the present invention is to provide a method for adjusting the sample angle.
【００１２】[0012]
【課題を解決するための手段】本発明は、上記目的を達
成するために、 〔１〕固形試料または切断刃を所望の切片の厚さに対応
する量だけ移動させた後、前記切断刃によって固形試料
を薄切にし、薄切片を作製するミクロトーム用試料角度
調整装置において、固形試料の薄切面の中心を回転中心
とした角度調整が可能な角度調整手段を具備する。In order to achieve the above object, the present invention provides: [1] After moving a solid sample or a cutting blade by an amount corresponding to a desired thickness of a section, the cutting sample is moved by the cutting blade. A sample angle adjusting device for a microtome for thinly cutting a solid sample to produce a thin section is provided with an angle adjusting means capable of adjusting an angle about a center of a thin section of the solid sample as a rotation center.
【００１３】〔２〕上記〔１〕記載のミクロトーム用試
料角度調整装置において、前記角度調整手段は、Ｚ軸方
向に保持される軸にクランプされ、Ｙ軸回りの回転を行
うＹ軸方向角度調整部材と、このＹ軸方向角度調整部材
にクランプされ、Ｘ軸回りの回転を行うＸ軸方向角度調
整部材とを備え、前記軸を中心として前記Ｘ軸方向角度
調整部材を駆動するアクチュエータと前記Ｙ軸方向角度
調整部材を駆動するアクチュエータとを具備する。[2] In the sample angle adjusting device for a microtome according to the above [1], the angle adjusting means is clamped on a shaft held in the Z-axis direction and adjusts the angle in the Y-axis direction for rotation about the Y-axis. An actuator for driving the X-axis direction angle adjustment member about the axis, the actuator including an X-axis direction angle adjustment member clamped to the Y-axis direction angle adjustment member and rotating about the X axis; An actuator for driving the axial angle adjustment member.
【００１４】〔３〕上記〔２〕記載のミクロトーム用試
料角度調整装置において、前記アクチュエータは、エピ
ゾインパクトドライブ装置である。 〔４〕固形試料または切断刃を所望の切片の厚さに対応
する量だけ移動させた後、前記切断刃によって固形試料
を薄切にし、薄切片を作製するミクロトーム用試料角度
調整方法において、前記切断刃の先端が構成する平面
に、前記固形試料に包埋された検体の傾きを対応させる
ように固形試料の薄切面の中心を回転中心とし、前記固
形試料の角度調整を行うようにしたものである。[3] In the sample angle adjusting device for a microtome according to the above [2], the actuator is an epizo impact drive device. [4] After moving the solid sample or the cutting blade by an amount corresponding to the thickness of a desired section, the cutting sample is sliced into a solid sample, and the method for adjusting a sample angle for a microtome for producing a thin section, The center of the thin section of the solid sample is set as the rotation center so that the inclination of the sample embedded in the solid sample corresponds to the plane formed by the tip of the cutting blade, and the angle of the solid sample is adjusted. It is.
【００１５】[0015]
【発明の実施の形態】以下、本発明の実施の形態につい
て図面を参照しながら詳細に説明する。図１は本発明の
実施例を示すミクロトーム用試料角度調整装置の正面
図、図２はそのミクロトーム用試料角度調整装置の右側
面図、図３はそのミクロトーム用試料角度調整装置の左
側面図、図４はそのミクロトーム用試料角度調整装置の
上面図、図５はそのミクロトーム用試料角度調整装置の
底面図、図６は図１のＢ−Ｂ線断面図、図７は図２のＡ
−Ａ線断面図、図８はそのミクロトーム用試料角度調整
装置の要部構成図（図２のＡ−Ａ線をずらして角度調整
部材（Ｘ）のアクチュエータを示した断面図）、図９は
図１のＣ−Ｃ線断面図、図１０はそのミクロトーム用試
料角度調整装置の制御盤の平面図である。Embodiments of the present invention will be described below in detail with reference to the drawings. 1 is a front view of a sample angle adjusting device for a microtome showing an embodiment of the present invention, FIG. 2 is a right side view of the sample angle adjusting device for a microtome, FIG. 3 is a left side view of the sample angle adjusting device for a microtome, 4 is a top view of the sample angle adjusting device for a microtome, FIG. 5 is a bottom view of the sample angle adjusting device for a microtome, FIG. 6 is a sectional view taken along the line BB of FIG. 1, and FIG.
FIG. 8 is a cross-sectional view of a main part of the sample angle adjusting device for a microtome (a cross-sectional view showing the actuator of the angle adjusting member (X) by shifting the line AA in FIG. 2), and FIG. 1 and FIG. 10 is a plan view of a control panel of the microtome sample angle adjusting device.
【００１６】これらの図に示すように、試料用ベース１
０に載置され、生体試料等の検体（図示なし）を包埋し
た固形試料２は、角度調整部材（Ｘ）１１（図６参照）
に取り付けられる。この角度調整部材（Ｘ）１１は、外
周に凸状の円筒面１２（図７参照）と凹状の球面１３
（図７参照）を有する。凸状の円筒面１２は角度調整部
材（Ｙ）１４（図７参照）の凹状の円筒面１５と同じ曲
率半径であり、角度調整部材（Ｘ）１１は角度調整部材
（Ｙ）１４の凹状の円筒面１５をガイド面としてＸ軸回
りに旋回可能となっている。As shown in these figures, the sample base 1
The solid sample 2 placed on the solid sample 2 and embedding a specimen (not shown) such as a biological sample is provided with an angle adjusting member (X) 11 (see FIG. 6).
Attached to. This angle adjusting member (X) 11 has a cylindrical surface 12 (see FIG. 7) convex on the outer periphery and a concave spherical surface 13.
(See FIG. 7). The convex cylindrical surface 12 has the same radius of curvature as the concave cylindrical surface 15 of the angle adjusting member (Y) 14 (see FIG. 7), and the angle adjusting member (X) 11 has a concave radius of the angle adjusting member (Y) 14. The cylindrical surface 15 can be turned around the X axis using the guide surface as a guide surface.
【００１７】また、角度調整部材（Ｙ）１４は前述した
ように、外周に凹状の円筒面１５と凸状の円筒面１６を
有する。同様に、前記凸状の円筒面１６は本体１７の凹
状の円筒面１８と同じ曲率半径であり、角度調整部材
（Ｙ）１４は本体１７の凹状の円筒面１８をガイド面と
してＹ軸回りに旋回可能となっている。角度調整部材
（Ｘ）１１と角度調整部材（Ｙ）１４は、本体１７に設
けられ、Ｚ方向のみに動作可能なガイド１９によって拘
束される軸２０の凸球面２１（極率半径は角度調整部材
（Ｘ）１１の凹状の球面１３と同一である）により、本
体１７と一体となるようにクランプされる。つまり、軸
２０はエアシリンダ２２の駆動により生じるＺ方向への
力により、角度調整部材（Ｘ）１１と角度調整部材
（Ｙ）１４及び本体１７をクランプする。As described above, the angle adjusting member (Y) 14 has a concave cylindrical surface 15 and a convex cylindrical surface 16 on its outer periphery. Similarly, the convex cylindrical surface 16 has the same radius of curvature as the concave cylindrical surface 18 of the main body 17, and the angle adjusting member (Y) 14 rotates around the Y axis using the concave cylindrical surface 18 of the main body 17 as a guide surface. It is possible to turn. The angle adjusting member (X) 11 and the angle adjusting member (Y) 14 are provided on the main body 17, and have a convex spherical surface 21 (the radius of curvature is an angle adjusting member) of a shaft 20 that is constrained by a guide 19 operable only in the Z direction. (The same as the concave spherical surface 13 of (X) 11). That is, the shaft 20 clamps the angle adjusting member (X) 11, the angle adjusting member (Y) 14, and the main body 17 by the force in the Z direction generated by driving the air cylinder 22.
【００１８】また、２３（１），２３（２）は角度調整
部材（Ｘ）１１のストロークエンドを検出するための近
接センサであり、２４（１），２４（２）は、角度調整
部材（Ｙ）１４のストロークエンドを検出するための近
接センサである。角度調整部材（Ｘ）１１には、角度調
整部材（Ｘ）１１を角度調整部材（Ｙ）１４に対して相
対的に旋回させるためのアクチュエータとしてのピエゾ
アクチュエータ（積層型圧電素子）２５（１），２５
（２）と、錘２６（１），２６（２）を具備する。Reference numerals 23 (1) and 23 (2) denote proximity sensors for detecting the stroke end of the angle adjusting member (X) 11, and 24 (1) and 24 (2) denote angle adjusting members (X). Y) A proximity sensor for detecting the 14 stroke ends. The angle adjusting member (X) 11 includes a piezo actuator (laminated piezoelectric element) 25 (1) as an actuator for rotating the angle adjusting member (X) 11 relatively to the angle adjusting member (Y) 14. , 25
(2) and weights 26 (1) and 26 (2).
【００１９】図８に示すように、後述するインパクトド
ライブにより発生する力を効率良く角度調整部材（Ｘ）
１１の旋回に用いるために、前記した旋回力が角度調整
部材（Ｘ）１１の旋回のガイド面（凸状の円筒面１２）
の接線方向（Ｋ１，Ｋ２で示す方向）に作用するよう
に、前記ピエゾアクチュエータ２５（１），２５（２）
と、錘２６（１），２６（２）が配置されている。As shown in FIG. 8, a force generated by an impact drive described later can be efficiently converted to an angle adjusting member (X).
In order to use the turning force of the angle adjusting member (X) 11, the turning force is used for the turning of the angle adjusting member (X) 11 (the convex cylindrical surface 12).
Piezo actuators 25 (1) and 25 (2) so as to act in tangential directions (directions indicated by K1 and K2)
And weights 26 (1) and 26 (2).
【００２０】また、同様に、角度調整部材（Ｙ）１４に
は、図６に示すように、角度調整部材（Ｙ）１４を本体
１７に対して相対的に旋回させるためのアクチュエータ
としての積層型圧電素子（ピエゾアクチュエータ）２７
（１），２７（２）と、錘２８（１），２８（２）を具
備する。同様に、図６では、後述するインパクトドライ
ブにより発生する力を効率良く角度調整部材（Ｙ）１４
の旋回に用いるために、前記した旋回力が角度調整部材
（Ｙ）１４の旋回のガイド面（凸状の円筒面）１６の接
線方向（Ｌ１，Ｌ２で示す方向）に作用するように、前
記ピエゾアクチュエータ２７（１），２７（２）と、錘
２８（１），２８（２）が配置されている。Similarly, the angle adjusting member (Y) 14 has a laminated type as an actuator for rotating the angle adjusting member (Y) 14 relatively to the main body 17 as shown in FIG. Piezoelectric element (piezo actuator) 27
(1), 27 (2) and weights 28 (1), 28 (2). Similarly, in FIG. 6, a force generated by an impact drive, which will be described later, is efficiently applied to the angle adjusting member (Y) 14.
In order to use the turning force, the turning force acts on the tangential direction (direction indicated by L1 and L2) of the turning guide surface (convex cylindrical surface) 16 of the angle adjusting member (Y) 14. Piezo actuators 27 (1) and 27 (2) and weights 28 (1) and 28 (2) are arranged.
【００２１】なお、軸２０をエアシリンダ２２によりＺ
−方向に移動させ、角度調整部材（Ｘ）１１と角度調整
部材（Ｙ）１４をクランプした状態（それぞれ曲率半径
が同一の球面及び円筒面が接触している状態）におい
て、全ての球面及び円筒面（軸２０の凸球面２１、角度
調整部材（Ｘ）１１の凹状の球面１３、角度調整部材
（Ｘ）１１の凸状の円筒面１２、角度調整部材（Ｙ）１
４の凹状の円筒面１５、角度調整部材（Ｙ）１４の凸状
の円筒面１６、本体１７の凹状の円筒面１８）の中心座
標は、薄切工程時に切断刃の先端が構成する平面内の固
形試料薄切面の中心９に位置するようになっている。The shaft 20 is moved by the air cylinder 22 to Z
In the state where the angle adjusting member (X) 11 and the angle adjusting member (Y) 14 are clamped (the spherical surface and the cylindrical surface having the same radius of curvature are in contact with each other), all the spherical surface and the cylindrical surface are moved. Surface (convex spherical surface 21 of axis 20, concave spherical surface 13 of angle adjusting member (X) 11, convex cylindrical surface 12 of angle adjusting member (X) 11, angle adjusting member (Y) 1
4, the concave cylindrical surface 15, the convex cylindrical surface 16 of the angle adjusting member (Y) 14, and the concave cylindrical surface 18 of the main body 17 have the center coordinates within the plane defined by the tip of the cutting blade during the thinning process. At the center 9 of the thin section of the solid sample.
【００２２】次に、本発明の実施例を示すミクロトーム
用試料角度調整装置の動作を図８を参照しながら説明す
る。本発明に係る試料角度調整装置は、試料用ベース１
０を載置するような位置にセットされる。生体試料等の
検体３（図１３又は図１４の従来例参照）を包埋した固
形試料２をセットした試料用ベース１０が、角度調整部
材（Ｘ）１１に取り付けられる。Next, the operation of the sample angle adjusting device for a microtome according to the embodiment of the present invention will be described with reference to FIG. The sample angle adjusting device according to the present invention includes a sample base 1.
It is set at a position where 0 is placed. A sample base 10 in which a solid sample 2 in which a sample 3 such as a biological sample (see a conventional example in FIG. 13 or 14) is embedded is attached to an angle adjusting member (X) 11.
【００２３】まず、従来技術で示したように、固形試料
２をＺ＋の方向へ送り（送り工程）、その後、切断刃９
をＸ＋方向へ送ることにより、固形試料２を切断する
（切断工程）。この際、角度調整部材（Ｘ）１１及び角
度調整部材（Ｙ）１４は軸２０によって本体１７と一体
となるようにクランプされている。このときのクランプ
力の値をＩとする。なお、このクランプ力は、エアシリ
ンダ２２の空気圧力により決定される。First, as shown in the prior art, the solid sample 2 is fed in the Z + direction (feeding step).
To the X + direction to cut the solid sample 2 (cutting step). At this time, the angle adjusting member (X) 11 and the angle adjusting member (Y) 14 are clamped by the shaft 20 so as to be integrated with the main body 17. The value of the clamping force at this time is defined as I. This clamping force is determined by the air pressure of the air cylinder 22.
【００２４】ここで、固形試料２内に包埋された検体３
（図１３又は図１４の従来例参照）が切断面に現れるま
で、前記動作、つまり、送り工程と切断工程を繰り返
す。そして、検体が現れた際に検体３の包埋状況によっ
て、Ｘ軸回りの角度（Ｆ方向）調整（図７参照）及びＹ
軸回りの角度（Ｇ方向）調整（図３参照）が必要である
か否かを判断する。Here, the specimen 3 embedded in the solid sample 2
The above operation, that is, the feeding step and the cutting step are repeated until (see the conventional example of FIG. 13 or FIG. 14) appears on the cut surface. Then, when the specimen appears, the angle (F direction) adjustment around the X axis (see FIG. 7) and Y
It is determined whether or not it is necessary to adjust the angle (G direction) around the axis (see FIG. 3).
【００２５】今、例えば、検体３が図１３（ａ）に示す
ように包埋されており、前記角度調整が必要であるする
と、 最初にＸ軸回りの角度（Ｆ方向）調整を行う。作業
者は、試料角度調整装置の制御盤２９（図１０参照）内
の角度調整準備ボタン３０を押し、角度調整に備える。
そこで、この角度調整準備ボタン３０を押すことによ
り、このクランプ力Ｉの値がピエゾアクチュエータ２５
（１），２５（２）と、錘２６（１），２６（２）を利
用したインパクトドライブ制御に適したクランプ力に変
化する。Now, for example, when the specimen 3 is embedded as shown in FIG. 13 (a) and the angle adjustment is required, the angle around the X axis (F direction) is adjusted first. The operator presses an angle adjustment preparation button 30 in the control panel 29 (see FIG. 10) of the sample angle adjustment device to prepare for the angle adjustment.
Then, by pressing the angle adjustment preparation button 30, the value of the clamping force I is changed to the piezo actuator 25.
(1), 25 (2) and a clamping force suitable for impact drive control using the weights 26 (1), 26 (2).
【００２６】今、この角度調整時のクランプ力をＪとす
る。一般的に、切断時のクランプ力Ｉは切断工程におい
て、固形試料２に作用する力によって角度調整部材
（Ｘ）１１及び角度調整部材（Ｙ）１４が変位しないよ
うな、つまり、動かないような値であり、角度調整部材
（Ｘ）１１及び角度調整部材（Ｙ）１４を調整する必要
がある場合のクランプ力Ｊより大きくなるが、前記切断
工程時に発生する力よりも後述するインパクトドライブ
の際に発生する方の力がはるかに大きい場合は、前記ク
ランプ力ＩをＪに変更する必要はない。Now, let J be the clamping force at the time of this angle adjustment. Generally, the clamping force I at the time of cutting is such that the angle adjusting member (X) 11 and the angle adjusting member (Y) 14 are not displaced by the force acting on the solid sample 2 in the cutting step, ie, do not move. This value is larger than the clamping force J when the angle adjusting member (X) 11 and the angle adjusting member (Y) 14 need to be adjusted, but is smaller than the force generated during the cutting step during the impact drive described later. In the case where the force generated in the clamping force is much larger, it is not necessary to change the clamping force I to J.
【００２７】 上記したＦ方向に関しては、Ｆ−の方
向へ角度を調整する必要があるため、前記試料角度調整
装置の制御盤２９内のボタン３１を押し、角度調整部材
（Ｘ）１１をＦ−の方向に旋回させることにより、固形
試料２をＦ−の方向に旋回させることができる。ここ
で、前記インパクトドライブの制御に関して説明する。
なお、ここで、インパクトドライブ自体の具体的構成と
しては、本願発明者によって既に提案された特公平４−
５２０７０号公報を挙げることができる。With respect to the above-mentioned F direction, since it is necessary to adjust the angle in the direction of F−, the button 31 in the control panel 29 of the sample angle adjusting device is pressed, and the angle adjusting member (X) 11 is moved to F−. The solid sample 2 can be turned in the direction of F- by turning in the direction of. Here, the control of the impact drive will be described.
Here, a specific configuration of the impact drive itself is disclosed in Japanese Patent Publication No.
No. 52070 can be mentioned.
【００２８】そこで、角度調整部材（Ｘ）１１をＦ−の
方向に旋回させる場合、つまり、図１３（ａ）に示すよ
うに、検体３が包埋された固形試料２をＦ−の方向に旋
回させる場合には、まず、図１１（ａ）に示す積層型圧
電素子２５（２）と錘２６（２）を駆動して旋回させ
る。すなわち、図１１（ａ）では積層型圧電素子２５
（２）は縮んだ状態にある。Therefore, when the angle adjusting member (X) 11 is turned in the direction of F-, that is, as shown in FIG. 13A, the solid sample 2 in which the specimen 3 is embedded is moved in the direction of F-. When turning, first, the multilayer piezoelectric element 25 (2) and the weight 26 (2) shown in FIG. 11A are driven to turn. That is, in FIG.
(2) is in a contracted state.
【００２９】そこで、図１１（ｂ）に示すように、積層
型圧電素子２５（２）を急激に伸長させると、角度調整
部材（Ｘ）１１に衝撃的な慣性力がＫ２−方向に作用す
る。つまり、角度調整部材（Ｘ）１１は、Ｆ−の方向に
微小角度だけ旋回する。次に、図１１（ｃ）に示すよう
に、積層型圧電素子２５（２）を元の長さに戻す際には
ゆっくりと縮める。Therefore, as shown in FIG. 11 (b), when the multilayer piezoelectric element 25 (2) is rapidly extended, an impulsive inertial force acts on the angle adjusting member (X) 11 in the K2-direction. . That is, the angle adjusting member (X) 11 turns by a small angle in the direction of F-. Next, as shown in FIG. 11 (c), when returning the multilayer piezoelectric element 25 (2) to its original length, it is contracted slowly.
【００３０】この慣性力は小さいため、角度調整部材
（Ｘ）１１は、クランプ力Ｊにより生じる静止摩擦力に
よって変位することなく、積層型圧電素子２５（２）の
長さを戻すことができる。しかし、引き戻しの過程で積
層型圧電素子２５（２）の動きを急に止めることで、衝
撃的な慣性力を再度角度調整部材（Ｘ）１１にＫ２−方
向に作用させ、角度調整部材（Ｘ）１１をＦ−の方向に
微小角度だけ旋回させることができる。Since this inertial force is small, the angle adjusting member (X) 11 can return the length of the multilayer piezoelectric element 25 (2) without being displaced by the static friction force generated by the clamping force J. However, by suddenly stopping the movement of the multilayer piezoelectric element 25 (2) in the process of pulling back, an impulsive inertial force is again applied to the angle adjusting member (X) 11 in the K2-direction, and the angle adjusting member (X ) 11 can be turned by a small angle in the direction of F-.
【００３１】このようにして、前記試料角度調整装置の
制御盤２９内のボタン３１を押し続けている間、角度調
整部材（Ｘ）１１をＦ−の方向に微小角度ずつ旋回させ
ることができる。前記微小角度の値は、積層型圧電素子
２５（２）の伸縮時の加速度〔積層型圧電素子２５
（２）に印加する電圧の大きさと印加波形によって決
定）、錘２６（２）の質量等で設定することができるの
で、使用者の希望により調整する必要がある。In this manner, the angle adjusting member (X) 11 can be turned by a small angle in the direction of F- while the button 31 in the control panel 29 of the sample angle adjusting device is kept pressed. The value of the minute angle is the acceleration at the time of expansion and contraction of the multilayer piezoelectric element 25 (2) [the multilayer piezoelectric element 25
(Determined by the magnitude of the voltage applied to (2) and the applied waveform), and the mass of the weight 26 (2), etc., so that it is necessary to adjust according to the user's request.
【００３２】また、角度調整部材（Ｘ）１１をＦ−の方
向に旋回させるには、前述のような方法を採れば良い
が、積層型圧電素子２５（２）の反対側に配置される積
層型圧電素子２５（１）と、錘２６（１）を、以下に示
すように使用しても良い。図１１（ａ）では積層型圧電
素子２５（１）は伸長した状態にある。そこで、図１１
（ｂ）に示すように、積層型圧電素子２５（１）を急激
に短縮させると、角度調整部材（Ｘ）１１に衝撃的な慣
性力がＫ１−方向に作用し、角度調整部材（Ｘ）１１は
Ｆ−の方向に微小角度だけ旋回する。In order to rotate the angle adjusting member (X) 11 in the direction of F-, the above-mentioned method may be adopted. However, the angle adjusting member (X) 11 is disposed on the opposite side of the laminated piezoelectric element 25 (2). The piezoelectric element 25 (1) and the weight 26 (1) may be used as shown below. In FIG. 11A, the multilayer piezoelectric element 25 (1) is in an extended state. Therefore, FIG.
As shown in (b), when the laminated piezoelectric element 25 (1) is rapidly shortened, a shocking inertial force acts on the angle adjusting member (X) 11 in the K1-direction, and the angle adjusting member (X) 11 turns by a small angle in the direction of F-.
【００３３】次に、図１１（ｃ）に示すように、積層型
圧電素子２５（１）を元の長さに戻す際にはゆっくりと
伸ばす。この時の慣性力は小さいため、角度調整部材
（Ｘ）１１はクランプ力Ｊにより生じる静止摩擦力によ
って変位することなく、積層型圧電素子２５（１）の長
さを戻すことができる。しかし、引き伸ばしの過程で積
層型圧電素子２５（１）の動きを急に止めることによ
り、衝撃的な慣性力を再度角度調整部材（Ｘ）１１にＫ
１−方向に作用させ、角度調整部材（Ｘ）１１をＦ−の
方向に微小角度だけ旋回させることができる。Next, as shown in FIG. 11C, when returning the multilayer piezoelectric element 25 (1) to its original length, it is slowly extended. Since the inertial force at this time is small, the angle adjusting member (X) 11 can return the length of the multilayer piezoelectric element 25 (1) without being displaced by the static friction force generated by the clamping force J. However, by suddenly stopping the movement of the multi-layer piezoelectric element 25 (1) in the process of stretching, the impulsive inertial force is again applied to the angle adjusting member (X) 11 by the K.
Acting in one direction, the angle adjusting member (X) 11 can be turned by a small angle in the direction of F-.
【００３４】このようにして、前記試料角度調整装置の
制御盤２９内のボタン３１を押し続けている間、角度調
整部材（Ｘ）１１をＦ−の方向に微小角度ずつ旋回させ
ることができる。このように、角度調整部材（Ｘ）１１
をＦ−の方向に旋回させるには、積層型圧電素子２５
（２）と錘２６（２）を使用しても、また積層型圧電素
子２５（１）と錘２６（１）を使用しても良いが、図１
１（ｂ）及び図１１（ｃ）に示すように、両方を同時に
使用することも可能であり、角度調整に関する自由度を
向上させることができる。In this manner, the angle adjusting member (X) 11 can be turned by a small angle in the direction of F- while the button 31 in the control panel 29 of the sample angle adjusting device is kept pressed. Thus, the angle adjusting member (X) 11
Is rotated in the direction of F-, the multilayer piezoelectric element 25
(2) and the weight 26 (2) or the laminated piezoelectric element 25 (1) and the weight 26 (1) may be used.
As shown in FIG. 1 (b) and FIG. 11 (c), both can be used simultaneously, and the degree of freedom regarding angle adjustment can be improved.
【００３５】 次に、上記と同様に、前記試料角度調
整装置の制御盤２９内のボタン３３を押し、図３に示す
ように、積層型圧電素子２７（１）と錘２８（１）、２
７（２）と錘２８（２）により、角度調整部材（Ｙ）１
４をＧ＋の方向に旋回させることにより、固形試料２を
Ｇ＋の方向に旋回させ、Ｙ軸回りの角度（Ｇ方向）調整
を行う。なお、構造上、角度調整部材（Ｘ）１１はＧ方
向に関しては角度調整部材（Ｙ）１４と一体で動く。Next, in the same manner as described above, a button 33 in the control panel 29 of the sample angle adjusting device is pressed, and as shown in FIG. 3, the stacked piezoelectric element 27 (1) and the weights 28 (1), 2
7 (2) and the weight 28 (2), the angle adjusting member (Y) 1
By rotating the solid sample 2 in the direction of G +, the solid sample 2 is rotated in the direction of G +, and the angle around the Y axis (G direction) is adjusted. Note that, in terms of structure, the angle adjusting member (X) 11 moves integrally with the angle adjusting member (Y) 14 in the G direction.
【００３６】 前記、及びに示す角度調整が終
了した時点で、試料角度調整装置の制御盤２９内の角度
調整終了ボタン３５を押し、角度調整を終了する。この
角度調整終了ボタン３５を押すことにより、クランプ力
Ｊの値が前記クランプ力Ｉの値に再セットされる。この
ように、試料角度調整後、前述の切断工程を行い、更
に、角度の調整が必要な場合は、前述のからを繰り
返す。もちろん、の工程に示すＦ−の方向への旋回が
オーバしてしまった場合は、試料角度調整装置の制御盤
２９内のボタン３２を押し、角度調整部材（Ｘ）１１を
Ｆ＋の方向に旋回させる。また、の工程に示すＧ＋の
方向への旋回がオーバしてしまった場合も、試料角度調
整装置の制御盤２９内のボタン３４を押し、角度調整部
材（Ｙ）１４をＧ−の方向に旋回させる。At the time when the angle adjustment described above is completed, the angle adjustment end button 35 in the control panel 29 of the sample angle adjustment device is pressed to end the angle adjustment. By pressing the angle adjustment end button 35, the value of the clamping force J is reset to the value of the clamping force I. As described above, after the sample angle is adjusted, the above-described cutting step is performed, and when the angle needs to be adjusted, the above steps are repeated. Of course, if the turning in the direction of F− shown in the step is over, the button 32 in the control panel 29 of the sample angle adjusting device is pressed, and the angle adjusting member (X) 11 is turned in the direction of F +. Let it. Also, when the turning in the direction of G + shown in the step is over, the button 34 in the control panel 29 of the sample angle adjusting device is pressed, and the angle adjusting member (Y) 14 is turned in the direction of G-. Let it.
【００３７】このように、この実施例によれば、 （１）Ｚ軸方向に規制された軸２０をエアシリンダ２２
により、Ｚ−方向に移動させ、角度調整部材（Ｘ）１１
と角度調整部材（Ｙ）１４をクランプした状態（それぞ
れ曲率半径が同一の球面及び円筒面が接触している状
態）において、全ての球面及び円筒面（軸２０の凸球面
２１、角度調整部材（Ｘ）１１の凹状の球面１３、角度
調整部材（Ｘ）１１の凸状の円筒面１２、角度調整部材
（Ｙ）１４の凹状の円筒面１５、角度調整部材（Ｙ）１
４の凸状の円筒面１６、本体１７の凹状の円筒面１８）
の中心座標は、薄切工程時に切断刃の先端が構成する平
面内の固形薄切面の中心９に位置するようになっている
ため、角度調整後に固形試料２がＺ方向に変位する量が
従来よりも小さくなり、結果として、再薄切までの要す
る調整時間を短縮することができる。As described above, according to this embodiment, (1) the shaft 20 restricted in the Z-axis direction is
To move in the Z-direction, and the angle adjusting member (X) 11
And all the spherical and cylindrical surfaces (the convex spherical surface 21 of the shaft 20, the angle adjusting member (Y)) are clamped (the spherical surface and the cylindrical surface having the same radius of curvature are in contact with each other) while the angle adjusting member (Y) 14 is clamped. X) 11 concave spherical surface 13, angle adjusting member (X) 11 convex cylindrical surface 12, angle adjusting member (Y) 14 concave cylindrical surface 15, angle adjusting member (Y) 1
4, the convex cylindrical surface 16 and the concave cylindrical surface 18 of the main body 17)
Is located at the center 9 of the solid thin section in the plane defined by the tip of the cutting blade during the thin section process, so that the amount by which the solid sample 2 is displaced in the Z direction after the angle adjustment is conventionally As a result, the adjustment time required until re-slicing can be shortened.
【００３８】（２）角度調整後に固形試料２がＸ軸方向
に変位する量が従来よりも小さくなり、結果として装置
のコンパクト化を図ることができる。 （３）角度調整部材（Ｘ）１１及び角度調整部材（Ｙ）
１４の角度調整にピエゾアクチュエータ（積層型圧電素
子）と錘を利用したインパクトドライブ制御を用いるこ
とにより、作業者がマニュアルで行う角度調整よりも高
精度の最小調整を高能率に行うことができる。(2) The amount by which the solid sample 2 is displaced in the X-axis direction after the angle adjustment becomes smaller than before, and as a result, the apparatus can be made more compact. (3) Angle adjusting member (X) 11 and angle adjusting member (Y)
By using the impact drive control using a piezo actuator (laminated piezoelectric element) and a weight for the angle adjustment of 14, it is possible to perform the minimum adjustment with higher accuracy and higher efficiency than the angle adjustment manually performed by the operator.
【００３９】（４）相対的に摺動運動をするそれぞれの
対となる球面及び円筒面は曲率半径であり、実施例に示
す角度調整時においてもクランプ力Ｊでクランプされて
いるため、試料角度調整後に、再度クランプ力をＩに変
更しても、調整した角度がずれることはない。なお、本
発明は上記実施例に限定されるものではなく、本発明の
趣旨に基づいて種々の変形が可能であり、これらを本発
明の範囲から排除するものではない。(4) The spherical and cylindrical surfaces forming a pair that relatively slide each other have a radius of curvature, and are clamped by the clamping force J during the angle adjustment shown in the embodiment. Even if the clamping force is changed to I again after the adjustment, the adjusted angle does not shift. It should be noted that the present invention is not limited to the above embodiment, and various modifications can be made based on the gist of the present invention, and these are not excluded from the scope of the present invention.
【００４０】[0040]
【発明の効果】以上、詳細に説明したように、本発明に
よれば、以下のような効果を奏することができる。 （Ａ）Ｚ軸方向に規制された軸を駆動装置により、Ｚ−
方向に移動させ、角度調整部材（Ｘ）と角度調整部材
（Ｙ）をクランプした状態において、全ての球面及び円
筒面の中心座標は、薄切工程時に切断刃の先端が構成す
る平面内の固形薄切面の中心に位置するようになってい
るため、角度調整後に試料がＺ方向に変位する量が従来
よりも小さくなり、結果として、再薄切までに要する調
整時間を短縮することができる。As described above, according to the present invention, the following effects can be obtained. (A) An axis regulated in the Z-axis direction is
In the state where the angle adjusting member (X) and the angle adjusting member (Y) are clamped, the center coordinates of all the spherical surfaces and the cylindrical surfaces are determined by the solid coordinates in the plane defined by the tip of the cutting blade during the slicing process. Since the sample is located at the center of the thin section, the amount of displacement of the sample in the Z direction after the angle adjustment becomes smaller than before, and as a result, the adjustment time required for re-slicing can be reduced.
【００４１】（Ｂ）角度調整後に試料がＸ軸方向に変位
する量が従来よりも小さくなり、結果として、装置のコ
ンパクト化を図ることができる。 （Ｃ）角度調整部材（Ｘ）及び角度調整部材（Ｙ）の角
度調整にピエゾアクチュエータ（積層型圧電素子）と錘
を利用したインパクトドライブ制御を用いることによ
り、作業者がマニュアルで行う角度調整よりも高精度の
微細な調整（最小調整）を高能率に行うことができる。(B) The amount by which the sample is displaced in the X-axis direction after the angle adjustment becomes smaller than before, and as a result, the apparatus can be made more compact. (C) The angle adjustment of the angle adjusting member (X) and the angle adjusting member (Y) is performed by using an impact drive control using a piezo actuator (stacked piezoelectric element) and a weight, so that the angle can be adjusted manually by an operator. In addition, fine adjustment (minimum adjustment) with high accuracy can be performed with high efficiency.
【００４２】（Ｄ）相対的に摺動運動をするそれぞれの
対となる球面及び円筒面は同じ曲率半径であり、角度調
整時においてもクランプ力Ｊでクランプされているた
め、試料角度調整後に、再度クランプ力をＩに変更して
も、調整した角度がずれることはない。(D) Each pair of the spherical surface and the cylindrical surface which make a relative sliding motion have the same radius of curvature, and are clamped by the clamping force J during the angle adjustment. Even if the clamping force is changed to I again, the adjusted angle does not shift.
【図１】本発明の実施例を示すミクロトーム用試料角度
調整装置の正面図である。FIG. 1 is a front view of a sample angle adjusting device for a microtome showing an embodiment of the present invention.
【図２】本発明の実施例を示すミクロトーム用試料角度
調整装置の右側面図である。FIG. 2 is a right side view of a sample angle adjusting device for a microtome showing an embodiment of the present invention.
【図３】本発明の実施例を示すミクロトーム用試料角度
調整装置の左側面図である。FIG. 3 is a left side view of the sample angle adjusting device for a microtome according to the embodiment of the present invention.
【図４】本発明の実施例を示すミクロトーム用試料角度
調整装置の上面図である。FIG. 4 is a top view of a sample angle adjusting device for a microtome showing an embodiment of the present invention.
【図５】本発明の実施例を示すミクロトーム用試料角度
調整装置の底面図である。FIG. 5 is a bottom view of a sample angle adjusting device for a microtome showing an embodiment of the present invention.
【図６】図１のＢ−Ｂ線断面図である。FIG. 6 is a sectional view taken along line BB of FIG. 1;
【図７】図２のＡ−Ａ線断面図である。FIG. 7 is a sectional view taken along line AA of FIG. 2;
【図８】本発明の実施例を示すミクロトーム用試料角度
調整装置の要部構成図である。FIG. 8 is a main part configuration diagram of a sample angle adjusting device for a microtome showing an embodiment of the present invention.
【図９】図１のＣ−Ｃ線断面図である。FIG. 9 is a sectional view taken along line CC of FIG. 1;
【図１０】本発明の実施例を示すミクロトーム用試料角
度調整装置の制御盤の平面図である。FIG. 10 is a plan view of a control panel of the microtome sample angle adjusting device according to the embodiment of the present invention.
【図１１】本発明の実施例を示すミクロトーム用試料角
度調整装置のＸ軸方向角度調整の説明図である。FIG. 11 is an explanatory diagram of an X-axis direction angle adjustment of the sample angle adjusting device for a microtome according to the embodiment of the present invention.
【図１２】従来の一般的なミクロトームの概略構成斜視
図である。FIG. 12 is a schematic configuration perspective view of a conventional general microtome.
【図１３】従来の一般的なミクロトームの固形試料への
検体の包埋状況とその固形試料の角度調整の説明図（そ
の１）である。FIG. 13 is an explanatory view (part 1) of the embedding state of a sample in a solid sample of a conventional general microtome and the angle adjustment of the solid sample.
【図１４】従来の一般的なミクロトームの固形試料への
検体の包埋状況とその固形試料の角度調整の説明図（そ
の２）である。FIG. 14 is an explanatory diagram (part 2) of the embedding state of a sample in a solid sample of a conventional general microtome and the angle adjustment of the solid sample.
【図１５】従来の試料の角度調整のための座標の説明図
（その１）である。FIG. 15 is an explanatory diagram (part 1) of coordinates for adjusting the angle of a conventional sample.
【図１６】従来の試料の角度調整のための座標の説明図
（その２）である。FIG. 16 is an explanatory view (part 2) of conventional coordinates for adjusting the angle of a sample.
【図１７】従来の固形試料の角度調整における問題点の
説明図である。FIG. 17 is an explanatory diagram of a problem in conventional angle adjustment of a solid sample.
１ 切断刃 ２ 固形試料 ３ 検体 ４，６ 固形試料の左エッジ ５，７ 固形試料の右エッジ ９ 平面内の固形試料薄切面の中心 １０ 試料用ベース １１ 角度調整部材（Ｘ） １２ 角度調整部材（Ｘ）の凸状の円筒面 １３ 角度調整部材（Ｘ）の凹状の球面 １４ 角度調整部材（Ｙ） １５ 角度調整部材（Ｙ）の凹状の円筒面 １６ 凸状の円筒面 １７ 本体 １８ 本体の凹状の円筒面 １９ ガイド ２０ 軸 ２１ 凸球面 ２２ エアシリンダ ２３（１），２３（２） 角度調整部材（Ｘ）のスト
ロークエンドを検出するための近接センサ ２４（１），２４（２） 角度調整部材（Ｙ）のスト
ロークエンドを検出するための近接センサ ２５（１），２５（２） 角度調整部材（Ｘ）のピエ
ゾアクチュエータ（積層型圧電素子） ２６（１），２６（２） 錘 ２７（１），２７（２） 角度調整部材（Ｙ）のピエ
ゾアクチュエータ（積層型圧電素子） ２８（１），２８（２） 錘 ２９ 試料角度調整装置の制御盤 ３０ 角度調整準備ボタン ３１，３２，３３，３４ ボタン ３５ 角度調整終了ボタンDESCRIPTION OF SYMBOLS 1 Cutting blade 2 Solid sample 3 Sample 4,6 Left edge of solid sample 5,7 Right edge of solid sample 9 Center of thin section of solid sample in plane 10 Sample base 11 Angle adjusting member (X) 12 Angle adjusting member ( X) convex cylindrical surface 13 concave spherical surface of angle adjusting member (X) 14 angle adjusting member (Y) 15 concave cylindrical surface of angle adjusting member (Y) 16 convex cylindrical surface 17 body 18 concave body Cylindrical surface 19 Guide 20 Axis 21 Convex spherical surface 22 Air cylinder 23 (1), 23 (2) Proximity sensor 24 (1), 24 (2) for detecting stroke end of angle adjusting member (X) Proximity sensor 25 (1), 25 (2) for detecting stroke end of (Y) Piezo actuator (laminated piezoelectric element) of angle adjusting member (X) 26 (1), 26 (2) Weight 27 (1) ), 27 (2) Piezo actuator (laminated piezoelectric element) of angle adjustment member (Y) 28 (1), 28 (2) Weight 29 Control panel of sample angle adjustment device 30 Angle adjustment preparation buttons 31, 32, 33, 34 button 35 Angle adjustment end button
───────────────────────────────────────────────────── フロントページの続き (72)発明者 南都 寛 静岡県沼津市大岡2068−３ 東芝機械株式 会社沼津事業所内 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Hiroshi Minato 2068-3 Ooka, Numazu-shi, Shizuoka Pref.
Claims (4)
さに対応する量だけ移動させた後、前記切断刃によって
固形試料を薄切にし、薄切片を作製するミクロトーム用
試料角度調整装置において、 固形試料の薄切面の中心を回転中心とした角度調整が可
能な角度調整手段を具備するミクロトーム用試料角度調
整装置。In a sample angle adjusting apparatus for a microtome, a solid sample or a cutting blade is moved by an amount corresponding to a thickness of a desired section, and then the solid sample is sliced by the cutting blade to produce a thin section. A sample angle adjusting device for a microtome, comprising an angle adjusting means capable of adjusting an angle about a center of a thin section of a solid sample as a rotation center.
調整装置において、前記角度調整手段は、Ｚ軸方向に保
持される軸にクランプされ、Ｙ軸回りの回転を行うＹ軸
方向角度調整部材と、該Ｙ軸方向角度調整部材にクラン
プされ、Ｘ軸回りの回転を行うＸ軸方向角度調整部材と
を備え、前記軸を中心として前記Ｘ軸方向角度調整部材
を駆動するアクチュエータと前記Ｙ軸方向角度調整部材
を駆動するアクチュエータとを具備することを特徴とす
るミクロトーム用試料角度調整装置。2. The sample angle adjusting device for a microtome according to claim 1, wherein the angle adjusting means is clamped on a shaft held in a Z-axis direction, and rotates in a Y-axis direction. An X-axis direction angle adjustment member that is clamped to the Y-axis direction angle adjustment member and rotates about the X-axis; an actuator that drives the X-axis direction angle adjustment member about the axis; and the Y-axis direction. A microtome sample angle adjustment device, comprising: an actuator that drives an angle adjustment member.
調整装置において、前記アクチュエータは、エピゾイン
パクトドライブ装置であることを特徴とするミクロトー
ム用試料角度調整装置。3. The sample angle adjusting device for a microtome according to claim 2, wherein the actuator is an epizo impact drive device.
さに対応する量だけ移動させた後、前記切断刃によって
固形試料を薄切にし、薄切片を作製するミクロトーム用
試料角度調整方法において、 前記切断刃の先端が構成する平面に、前記固形試料に包
埋された検体の傾きを対応させるように固形試料の薄切
面の中心を回転中心とし、前記固形試料の角度調整を行
うことを特徴とするミクロトーム用試料角度調整方法4. A method for adjusting a sample angle for a microtome, wherein a solid sample or a cutting blade is moved by an amount corresponding to a thickness of a desired section, and then the solid sample is sliced by the cutting blade to produce a thin section. The plane of the tip of the cutting blade, the center of the thin section of the solid sample as the center of rotation so as to correspond to the inclination of the sample embedded in the solid sample, to adjust the angle of the solid sample. Characteristic method of adjusting sample angle for microtome
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28242097A JP3865896B2 (en) | 1997-10-15 | 1997-10-15 | Sample angle adjustment device for microtome |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28242097A JP3865896B2 (en) | 1997-10-15 | 1997-10-15 | Sample angle adjustment device for microtome |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11118678A true JPH11118678A (en) | 1999-04-30 |
| JP3865896B2 JP3865896B2 (en) | 2007-01-10 |
Family
ID=17652185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28242097A Expired - Fee Related JP3865896B2 (en) | 1997-10-15 | 1997-10-15 | Sample angle adjustment device for microtome |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3865896B2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007212387A (en) * | 2006-02-13 | 2007-08-23 | Seiko Instruments Inc | Device and method for producing thin section |
| JP2007218616A (en) * | 2006-02-14 | 2007-08-30 | Seiko Instruments Inc | Automatic slicing apparatus, automatic slice specimen manufacturing apparatus and automatic slicing method |
| JP2007218618A (en) * | 2006-02-14 | 2007-08-30 | Seiko Instruments Inc | Automatic slicing apparatus and automatic slicing method |
| JP2008076251A (en) * | 2006-09-21 | 2008-04-03 | Kurabo Ind Ltd | Surface developing method for sample block |
| JP2008134127A (en) * | 2006-11-28 | 2008-06-12 | Seiko Instruments Inc | Automatic slicing apparatus and method |
| JP2009271049A (en) * | 2004-01-22 | 2009-11-19 | Sakura Finetex Usa Inc | Multi-axis workpiece chuck |
| CN111774665A (en) * | 2020-07-13 | 2020-10-16 | 安徽奔腾五金制造有限公司 | Multi-angle steering cutting device for refrigerator bottom plate |
-
1997
- 1997-10-15 JP JP28242097A patent/JP3865896B2/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009271049A (en) * | 2004-01-22 | 2009-11-19 | Sakura Finetex Usa Inc | Multi-axis workpiece chuck |
| JP2007212387A (en) * | 2006-02-13 | 2007-08-23 | Seiko Instruments Inc | Device and method for producing thin section |
| JP2007218616A (en) * | 2006-02-14 | 2007-08-30 | Seiko Instruments Inc | Automatic slicing apparatus, automatic slice specimen manufacturing apparatus and automatic slicing method |
| JP2007218618A (en) * | 2006-02-14 | 2007-08-30 | Seiko Instruments Inc | Automatic slicing apparatus and automatic slicing method |
| JP2008076251A (en) * | 2006-09-21 | 2008-04-03 | Kurabo Ind Ltd | Surface developing method for sample block |
| JP2008134127A (en) * | 2006-11-28 | 2008-06-12 | Seiko Instruments Inc | Automatic slicing apparatus and method |
| CN111774665A (en) * | 2020-07-13 | 2020-10-16 | 安徽奔腾五金制造有限公司 | Multi-angle steering cutting device for refrigerator bottom plate |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3865896B2 (en) | 2007-01-10 |
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