JPH0945581A - Laminated capacitor - Google Patents
Laminated capacitorInfo
- Publication number
- JPH0945581A JPH0945581A JP7195214A JP19521495A JPH0945581A JP H0945581 A JPH0945581 A JP H0945581A JP 7195214 A JP7195214 A JP 7195214A JP 19521495 A JP19521495 A JP 19521495A JP H0945581 A JPH0945581 A JP H0945581A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- parts
- barium titanate
- mol
- internal electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Inorganic Insulating Materials (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Ceramic Capacitors (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、チタン酸バリウム
を主成分とし、マンガンを含有する誘電体磁器層と、ニ
ッケル等の卑金属からなる内部電極を有する積層型コン
デンサに関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laminated capacitor having a dielectric ceramic layer containing barium titanate as a main component and containing manganese, and an internal electrode made of a base metal such as nickel.
【０００２】[0002]
【従来技術】従来、積層型コンデンサ等の積層型電子部
品を得るにあたっては、内部電極を構成する電極材料と
誘電体セラミックスとを一体焼成して得られた焼結体が
用いられている。ところで積層コンデンサを製作する場
合、従来のＢａＴｉＯ3 を主成分とする誘電体材料で
は、１３００〜１５００℃で焼成するため、内部電極材
料としては、このような温度で溶融しないＰｔ，Ｐｄ等
の貴金属が使用されていた。2. Description of the Related Art Conventionally, in obtaining a multilayer electronic component such as a multilayer capacitor, a sintered body obtained by integrally firing an electrode material forming an internal electrode and a dielectric ceramics has been used. When a multilayer capacitor is manufactured, a conventional dielectric material containing BaTiO 3 as a main component is fired at 1300 to 1500 ° C., so that noble metal such as Pt or Pd which does not melt at such a temperature is used as an internal electrode material. Was used.
【０００３】しかしながら、これらの貴金属は高価であ
るという問題があり、高容量化を図るために内部電極数
を増加させた場合にはコストが著しく高くなる。そこ
で、安価なニッケル等の卑金属を内部電極材料として用
いることが試みられている。However, these noble metals have a problem that they are expensive, and the cost becomes significantly high when the number of internal electrodes is increased in order to increase the capacity. Therefore, it has been attempted to use an inexpensive base metal such as nickel as an internal electrode material.
【０００４】しかしながらニッケル等の卑金属からなる
内部電極を用いた場合には、内部電極材料が酸化しやす
いため還元雰囲気中で焼成しなければならず、そのよう
な雰囲気下で焼成すると、セラミックスが還元され絶縁
性を失ってしまうという問題があった。このような問題
を解決するものとして、例えばＢａＴｉＯ3 にＭｇＯや
ＭｎＯを添加したり（特開昭５７−７１８６６号公報参
照）、さらにこの系にＣａＺｒＯ3 を添加したり（特開
昭６２−１５７６０３号公報参照）することが提案され
ていた。However, when an internal electrode made of a base metal such as nickel is used, the internal electrode material is likely to be oxidized, so that it must be fired in a reducing atmosphere. If firing is performed in such an atmosphere, the ceramic is reduced. There was a problem that the insulation was lost. In order to solve such a problem, for example, MgO or MnO may be added to BaTiO 3 (see JP-A-57-71866), or CaZrO 3 may be added to this system (JP-A-62-157603). (See Japanese Patent Publication).
【０００５】[0005]
【発明が解決しようとする課題】しかしながら、上記の
ような従来の組成を用いた積層型コンデンサでは、高
温，高電圧の環境で用いられる場合には製品寿命が短い
という問題があった。その原因は、高温，高電圧の環境
においては、誘電体磁器自体の電気伝導性が高くなって
誘電体としての機能を果たさなくなり、即ち、高温，高
電圧環境においては誘電体としての寿命が短くなり、そ
の実用化に際して障害となっていた。特に、高容量化の
ために誘電体層を薄層化する傾向にあるが、従来のグリ
ーンシートを用いた方法では薄層化に限界があった。ま
た、誘電体層が薄くなる程、高温，高電圧環境において
は電気伝導性が高くなり易いという問題があった。However, the multilayer capacitor using the conventional composition as described above has a problem that the product life is short when used in a high temperature and high voltage environment. The cause is that in high temperature and high voltage environments, the electric conductivity of the dielectric ceramic itself becomes high, and it no longer functions as a dielectric. That is, in high temperature and high voltage environments, the life as a dielectric becomes short. It was an obstacle to its practical application. In particular, there is a tendency to thin the dielectric layer in order to increase the capacity, but the conventional method using a green sheet has a limitation in thinning. There is also a problem that the thinner the dielectric layer, the higher the electric conductivity in a high temperature and high voltage environment.
【０００６】また、上記のような従来の組成を用いた積
層型コンデンサでは、高温と低温が交互に生じるような
環境で使用される場合、内部電極層と誘電体層との接合
強度が低下して境界部分にクラック等が生じ易くなり、
熱衝撃性が低いという問題があった。Further, in the multilayer capacitor using the conventional composition as described above, when it is used in an environment where high temperature and low temperature alternate, the bonding strength between the internal electrode layer and the dielectric layer decreases. Easily cracks at the boundary,
There was a problem of low thermal shock resistance.
【０００７】[0007]
【発明の目的】本発明は、誘電体磁器層の厚みが３〜１
０μｍと薄い場合でも、高温，高電圧の環境下における
寿命を向上することができるとともに、熱衝撃性を向上
することができる積層型コンデンサを提供することを目
的とする。SUMMARY OF THE INVENTION The present invention has a dielectric porcelain layer having a thickness of 3 to 1
An object of the present invention is to provide a multilayer capacitor which can improve the life under a high temperature and high voltage environment and can improve the thermal shock resistance even when the thickness is as thin as 0 μm.
【０００８】[0008]
【課題を解決するための手段】本発明者等は、上記問題
点に関して鋭意検討した結果、ＢａＴｉＯ3 １００モル
部に対してマンガンを０．０４〜０．５モル部含有する
厚み３〜１０μｍの誘電体磁器層と、卑金属からなる内
部電極層とを交互に積層してなり、誘電体磁器層の熱処
理前後の重量変化から求められる酸素空孔補償量ΔＶo
が０．００５〜０．５モル％である場合には、誘電体層
が薄層であっても高温，高電圧の環境下における寿命を
向上することができるとともに、熱衝撃性を向上するこ
とができることを見い出し、本発明に至った。Means for Solving the Problems As a result of earnest studies on the above problems, the inventors of the present invention have found that the content of manganese is 0.04 to 0.5 parts by mol with respect to 100 parts by mol of BaTiO 3 , and the thickness is 3 to 10 μm. Oxygen vacancy compensation amount ΔV o, which is obtained by alternately stacking dielectric ceramic layers and internal electrode layers made of base metal, and is obtained from the weight change of the dielectric ceramic layers before and after heat treatment.
Is 0.005 to 0.5 mol%, it is possible to improve the thermal shock resistance as well as the life under high temperature and high voltage environment even if the dielectric layer is a thin layer. The inventors have found that the above can be achieved and have reached the present invention.
【０００９】即ち、本発明の積層型コンデンサは、チタ
ン酸バリウムを主成分とし、このチタン酸バリウム１０
０モル部に対してマンガンを０．０４〜０．５モル部含
有する厚み３〜１０μｍの誘電体磁器層と、卑金属から
なる内部電極層とを交互に積層してなる積層型コンデン
サであって、前記誘電体磁器層の熱処理前後の重量変化
から求められる酸素空孔補償量ΔＶo が０．００５〜
０．５モル％のものである。That is, the multilayer capacitor of the present invention contains barium titanate as a main component, and the barium titanate 10
A multilayer capacitor, comprising: a dielectric ceramic layer having a thickness of 3 to 10 μm and containing 0.04 to 0.5 parts by mole of manganese per 0 parts by mole; and an internal electrode layer made of a base metal, which are alternately laminated. The oxygen vacancy compensation amount ΔV o obtained from the weight change of the dielectric ceramic layer before and after the heat treatment is 0.005
0.5 mol%.
【００１０】[0010]
【作用】本発明の積層型コンデンサでは、酸素空孔濃度
が雰囲気によって変化することが、製品寿命を長くする
ために必要であるが、還元焼成後に熱処理を行ったとし
ても、酸素空孔濃度の変化がなければ製品寿命は変化し
ない。本願発明では、熱処理を行うことと、マンガン添
加量を制御すること、および誘電磁器層用スリップを用
いて３〜１０μｍの誘電体磁器層を作製することによ
り、酸素空孔濃度を変化させ、酸素空孔補償量ΔＶo を
０．００５〜０．５モル％とすることができるのであ
る。In the multilayer capacitor of the present invention, it is necessary for the oxygen vacancy concentration to change depending on the atmosphere in order to prolong the product life, but even if heat treatment is performed after reduction firing, the oxygen vacancy concentration If there is no change, the product life will not change. In the present invention, the oxygen vacancy concentration is changed by performing heat treatment, controlling the amount of added manganese, and producing a dielectric ceramic layer having a thickness of 3 to 10 μm by using a slip for a dielectric ceramic layer. The void compensation amount ΔV o can be set to 0.005 to 0.5 mol%.
【００１１】高温，高電圧の環境下における寿命は電子
濃度の変化によって決まることから、電子濃度が添加物
の価数変化によって補償されるならば寿命を長くするこ
とができる。添加物の価数変化は、同時に酸素空孔濃度
を変化させることから、酸素空孔濃度の変化する磁器は
添加物が価数変化することを示しており、寿命を長くす
る傾向に一致する。即ち、酸素空孔補償量の大きい組成
及びプロセスは、高温、高電圧の環境下における製品寿
命を長くすることができる。Since the life under high temperature and high voltage environment is determined by the change in electron concentration, the life can be extended if the electron concentration is compensated by the change in valence of the additive. Since the valence change of the additive changes the oxygen vacancy concentration at the same time, the porcelain with the varying oxygen vacancy concentration indicates that the valence of the additive changes, which is in agreement with the tendency to prolong the life. That is, a composition and process with a large amount of oxygen vacancy compensation can prolong the product life under an environment of high temperature and high voltage.
【００１２】また、本願発明の積層型コンデンサでは、
内部電極層と誘電体層との接合強度が向上し、高温と低
温が交互に生じるような環境での使用でも、熱衝撃性が
向上し、内部電極層と誘電体層との境界部分にクラック
等が生じることがない。Further, in the multilayer capacitor of the present invention,
The joint strength between the internal electrode layer and the dielectric layer is improved, and the thermal shock resistance is improved even when used in an environment where high temperature and low temperature alternate, and cracks occur at the boundary between the internal electrode layer and the dielectric layer. Etc. will not occur.
【００１３】[0013]
【発明の実施の形態】本発明における積層型コンデンサ
の誘電体磁器層は、チタン酸バリウム（ＢａＴｉＯ3 ）
を主成分とするもので、例えば、ＢａＴｉＯ3 １００モ
ル部に対して、ＭｇＯを０．２〜２．０モル部、Ｙ2 Ｏ
3 を０．５〜１．５モル部、ＭｎＣＯ3 を０．０４〜
０．５モル部からなる成分１００重量部に対して、Ｓｉ
Ｏ2 ２０〜７０モル％、Ｌｉ2 Ｏ０〜５０モル％、Ｂａ
Ｏ０〜４０モル％、ＣａＯ０〜４０モル％からなるガラ
ス成分を０〜３重量部添加して構成される。この場合
に、不純物としてＺｒＯ2 ，Ａｌ2 Ｏ3 ，Ｆｅ2 Ｏ3 が
混入する場合がある。BEST MODE FOR CARRYING OUT THE INVENTION The dielectric ceramic layer of the multilayer capacitor according to the present invention is made of barium titanate (BaTiO 3 ).
Is used as a main component, for example, 0.2 to 2.0 parts by mole of MgO and Y 2 O with respect to 100 parts by mole of BaTiO 3.
3 to 0.5 to 1.5 parts by mole and MnCO 3 to 0.04 to
With respect to 100 parts by weight of the component consisting of 0.5 parts by mole, Si
O 2 20 to 70 mol%, Li 2 O 0 to 50 mol%, Ba
It is constituted by adding 0 to 3 parts by weight of a glass component consisting of O0 to 40 mol% and CaO to 40 mol%. In this case, ZrO 2 , Al 2 O 3 , and Fe 2 O 3 may be mixed as impurities.
【００１４】特には、静電容量温度特性の平坦化という
ためには、ＢａＴｉＯ3 １００モル部に対して、ＭｇＯ
を０．５〜１．５モル部、Ｙ2 Ｏ3 を０．７５〜１．２
５ル部、ＭｎＣＯ3 を０．１〜０．３モル部からなる成
分１００重量部に対して、ＳｉＯ2 ４０〜６０モル％、
Ｌｉ2 Ｏ１０〜２５モル％、ＢａＯ１５〜４０モル％、
ＣａＯ０〜２５モル％からなるガラス成分を１〜２重量
部添加して構成される。Particularly, in order to flatten the temperature characteristic of capacitance, 100 parts by mole of BaTiO 3 is used for MgO.
Is 0.5 to 1.5 parts by mole, and Y 2 O 3 is 0.75 to 1.2.
5 parts by weight, MnCO 3 with respect to 100 parts by weight of a component consisting of 0.1 to 0.3 parts by mole, SiO 2 40 to 60% by mole,
Li 2 O 10 to 25 mol%, BaO 15 to 40 mol%,
It is constituted by adding 1 to 2 parts by weight of a glass component composed of 0 to 25 mol% CaO.
【００１５】誘電体磁器層の厚みを３〜１０μｍとした
のは、厚みを薄くし、高容量下を図るためである。厚み
が３μｍよりも薄い場合には、ドクターブレード法によ
る成形が困難となり、１０μｍよりも厚い場合には、静
電容量が低くなるからである。誘電体磁器層の厚みは耐
電圧という点から５〜１０μｍが望ましい。The reason why the thickness of the dielectric ceramic layer is set to 3 to 10 μm is to reduce the thickness and achieve a high capacity. This is because if the thickness is less than 3 μm, molding by the doctor blade method is difficult, and if it is thicker than 10 μm, the capacitance becomes low. The thickness of the dielectric ceramic layer is preferably 5 to 10 μm from the viewpoint of withstand voltage.
【００１６】マンガンをＢａＴｉＯ3 １００モル部に対
して０．０４〜０．５モル部含有させたのは、マンガン
添加により酸素空孔補償量ΔＶo を増加することができ
るからであり、マンガンが０．０４モル部よりも少ない
場合には必要なΔＶo が得られなくなり、マンガンが
０．５モル部よりも多い場合には、エージング特性が悪
化し、高温，高電圧の環境下における寿命が短くなるか
らである。マンガンは０．１〜０．３モル部含有するこ
とが高温，高電圧の環境下における寿命の確保という点
から望ましい。The manganese is contained in an amount of 0.04 to 0.5 parts by mol based on 100 parts by mol of BaTiO 3 because the amount of oxygen vacancy compensation ΔV o can be increased by adding manganese. When it is less than 0.04 part by mole, the required ΔV o cannot be obtained, and when manganese is more than 0.5 part by mole, the aging characteristics are deteriorated and the life under high temperature and high voltage environment is shortened. Because it will be shorter. It is desirable that manganese be contained in an amount of 0.1 to 0.3 part by mol from the viewpoint of ensuring the life under an environment of high temperature and high voltage.
【００１７】内部電極としてはＮｉ，Ｃｕ等の卑金属か
らなるものである。The internal electrodes are made of a base metal such as Ni or Cu.
【００１８】酸素空孔補償量ΔＶo とは、雰囲気の変化
に対する酸素空孔濃度変化のうち、特に、添加物の価数
変化に基づく変化分を示すものであり、この量が大きい
ほど、高温，高電圧の環境下における寿命が長くなる。
酸素空孔補償量ΔＶo は、例えば温度１０００℃、酸素
分圧１０-4Ｐａの雰囲気中での熱処理前後の重量変化か
ら求められる。The oxygen vacancy compensation amount ΔV o is a change in oxygen vacancy concentration due to a change in atmosphere, which is particularly due to a change in valence of the additive. The larger the amount, the higher the temperature. ， Longer life under high voltage environment.
The oxygen vacancy compensation amount ΔV o can be obtained from the weight change before and after the heat treatment in an atmosphere having a temperature of 1000 ° C. and an oxygen partial pressure of 10 −4 Pa, for example.
【００１９】酸素空孔補償量ΔＶo を０．００５〜０．
５モル％としたのは、この範囲内であれば高温，高電圧
下での寿命を十分に長くできるからである。即ち、酸素
空孔補償量ΔＶo が０．００５モル％よりも少ない場合
や、０．５モル％よりも多い場合には、高温，高電圧下
での寿命が短くなるからである。酸素空孔補償量ΔＶo
は寿命のバラツキを抑制するという点から０．０１〜
０．３モル％含有することが望ましい。The oxygen vacancy compensation amount ΔV o is 0.005 to 0.
The reason why it is set to 5 mol% is that the life under high temperature and high voltage can be sufficiently lengthened within this range. That is, when the oxygen vacancy compensation amount ΔV o is less than 0.005 mol% or more than 0.5 mol%, the life at high temperature and high voltage is shortened. Oxygen vacancy compensation amount ΔV o
0.01 to 0.01 from the viewpoint of suppressing variations in life.
It is desirable to contain 0.3 mol%.
【００２０】本発明の積層型コンデンサは、先ず、例え
ば、上記したような組成からなる誘電体磁器層用スリッ
プを作製するとともに、上記したような組成からなる内
部電極層用スリップを作製する。In the multilayer capacitor of the present invention, first, for example, a dielectric ceramic layer slip having the above-described composition is produced, and an internal electrode layer slip having the above-described composition is produced.
【００２１】この後、台板に誘電体磁器層用スリップを
ドクターブレード法により複数回塗布し、厚みが５〜１
３μｍの厚みの誘電体成形膜を形成し、この誘電体成形
膜の表面に電極層用スリップをスクリーン印刷して所定
形状の電極膜を形成する。この工程を所望の容量が得ら
れるまで繰り返す。この積層体を酸素分圧が３×１０-5
〜３×１０-3Ｐａの非還元性雰囲気において１２００〜
１３００℃で１〜５時間一体焼成し、この後、誘電体磁
器中の酸素空孔補償量が増加する条件、即ち、酸素分圧
が１×１０-2〜2 ×１０4 Ｐａの雰囲気中において８０
０〜１１００℃で１〜５時間熱処理し、本発明の積層型
コンデンサを得る。Thereafter, the base plate is coated with a slip for a dielectric ceramic layer a plurality of times by the doctor blade method, and the thickness is 5 to 1
A dielectric molded film having a thickness of 3 μm is formed, and an electrode layer slip is screen-printed on the surface of the dielectric molded film to form an electrode film having a predetermined shape. This process is repeated until the desired volume is obtained. This laminated body has an oxygen partial pressure of 3 × 10 −5.
~ 3 × 10 -3 Pa in a non-reducing atmosphere 1200-
It is integrally fired at 1300 ° C. for 1 to 5 hours, and after that, in the condition that the oxygen vacancy compensation amount in the dielectric ceramic increases, that is, in the atmosphere of oxygen partial pressure of 1 × 10 −2 to 2 × 10 4 Pa. 80
Heat treatment is performed at 0 to 1100 ° C. for 1 to 5 hours to obtain the multilayer capacitor of the present invention.
【００２２】[0022]
【実施例】出発原料としてＢａＣＯ3 粉末，ＴｉＯ2 粉
末を用い、混合後１１５０℃にて固相反応させＢａＴｉ
Ｏ3 を合成し、粒径０．５μｍに微粉砕した。次にＢａ
ＴｉＯ3 ，ＭｇＯ，Ｙ2 Ｏ3 ，ＭｎＣＯ3 を、表１の組
成となるように調合し、さらに、この組成物１００重量
部に対して、ＳｉＯ2 ５０モル％、Ｌｉ2 Ｏ２０モル
％、ＢａＯ２０モル％、ＣａＯ１０モル％からなるガラ
ス成分を１．５重量部添加し、ＺｒＯ2 ボールにより混
合し、バインダー，可塑剤を加え、誘電体磁器層用スリ
ップを得た。また、Ｎｉとテルピネオールを添加し、Ａ
ｌ2 Ｏ3 ボールにより混合し、バインダー、可塑剤を加
え、電極層用スリップを得た。EXAMPLES BaCO 3 powder and TiO 2 powder were used as starting materials, and after mixing, solid-phase reaction was carried out at 1150 ° C. to form BaTi.
O 3 was synthesized and finely pulverized to a particle size of 0.5 μm. Next, Ba
TiO 3 , MgO, Y 2 O 3 and MnCO 3 were blended so as to have the composition shown in Table 1. Further, with respect to 100 parts by weight of this composition, SiO 2 50 mol%, Li 2 O 20 mol%, BaO 20 1.5 parts by weight of a glass component consisting of mol% and CaO 10 mol% was added and mixed with a ZrO 2 ball, and a binder and a plasticizer were added to obtain a slip for a dielectric ceramic layer. Also, by adding Ni and terpineol, A
The mixture was mixed with l 2 O 3 balls, a binder and a plasticizer were added, and a slip for an electrode layer was obtained.
【００２３】そして、誘電体磁器層用スリップを台板に
ドクターブレード法により塗布し、この誘電体成形膜の
上面に、Ｎｉを主成分とする電極層用スリップをクシ型
構造となるようにスクリーン印刷し、誘電体成形膜と電
極膜の成形工程を５０回繰り返し、誘電体成形膜を５０
層有する積層成形体を作製した。この積層成形体を熱圧
着後、酸素分圧が３×１０-4Ｐａの非還元性雰囲気にお
いて１２５０℃で２時間焼成した後、表１のような熱処
理を行った。Then, the dielectric ceramic layer slip is applied to the base plate by the doctor blade method, and the electrode layer slip containing Ni as a main component is screened on the upper surface of the dielectric molded film so as to form a comb structure. Print and repeat the process of forming the dielectric film and electrode film 50 times to form the dielectric film 50 times.
A laminated molded body having layers was produced. After heat-pressing this laminated molded body, it was fired at 1250 ° C. for 2 hours in a non-reducing atmosphere having an oxygen partial pressure of 3 × 10 −4 Pa, and then heat treated as shown in Table 1.
【００２４】[0024]
【表１】 [Table 1]
【００２５】このようにして得られた積層型コンデンサ
に対して、誘電体層厚みを測定するとともに、熱衝撃特
性，容量，誘電体磁器中の酸素空孔補償量ΔＶo を測定
し、さらに、信頼性試験を行った。With respect to the multilayer capacitor thus obtained, the dielectric layer thickness was measured, and the thermal shock characteristics, the capacity, and the oxygen vacancy compensation amount ΔV o in the dielectric porcelain were measured. A reliability test was conducted.
【００２６】誘電体層厚みは金属顕微鏡により測定し
た。熱衝撃特性は室温に保持した２００個の試料を３４
０℃の半田槽中に浸漬し、表面にクラックが生じた個数
で判断した。容量はＬＣＲメータで測定し、誘電体一層
当たりの容量に換算した。The thickness of the dielectric layer was measured with a metallurgical microscope. Thermal shock resistance was measured by using 200 samples kept at room temperature
It was immersed in a solder bath at 0 ° C. and judged by the number of cracks on the surface. The capacity was measured with an LCR meter and converted into the capacity per one dielectric layer.
【００２７】また、誘電体磁器中の酸素空孔補償量ΔＶ
o は、上記表１の組成の誘電体磁器層用スリップをドク
ターブレード法により複数回塗布し、打ち抜き法により
直径２０ｍｍ厚み１ｍｍの誘電体成形体を作製し、上記
のような焼成条件で焼成した後、誘電体磁器の重量を測
定し、表１のような熱処理を行った後の誘電体磁器の重
量を測定し、熱処理前の重量に対する熱処理後の重量減
少分を酸素空孔量の変化によるものとみなし、酸素空孔
補償量を算出した。Further, the oxygen vacancy compensation amount ΔV in the dielectric ceramics
For o , a dielectric ceramic layer slip having the composition shown in Table 1 above was applied multiple times by the doctor blade method, and a dielectric compact having a diameter of 20 mm and a thickness of 1 mm was prepared by a punching method and fired under the firing conditions as described above. After that, the weight of the dielectric porcelain is measured, and the weight of the dielectric porcelain after the heat treatment as shown in Table 1 is measured. The weight decrease after the heat treatment with respect to the weight before the heat treatment is determined by the change of the oxygen vacancy amount. Assuming that the oxygen vacancy was compensated, the oxygen vacancy compensation amount was calculated.
【００２８】信頼性試験は、上記のように作製した積層
コンデンサの両端面にスパッタ法により金電極を形成
し、これを３００℃の測定炉中で１０００Ｖの電圧を印
加し、ショート故障に至るまでの時間を測定した。これ
らの結果を表２に示す。In the reliability test, gold electrodes were formed on both end surfaces of the multilayer capacitor manufactured as described above by a sputtering method, and a voltage of 1000 V was applied to the gold electrodes in a measuring furnace at 300 ° C. until a short circuit failure occurred. Was measured. Table 2 shows the results.
【００２９】[0029]
【表２】 [Table 2]
【００３０】この表２より、本発明の積層型コンデンサ
では、高温，高電圧の環境下における寿命（信頼性）を
向上することができるとともに、熱衝撃性を向上するこ
とができる。From Table 2, the multilayer capacitor of the present invention can have improved life (reliability) under a high temperature and high voltage environment and improved thermal shock resistance.
【００３１】[0031]
【発明の効果】本発明の積層型コンデンサでは、誘電体
磁器層の厚みが１〜１０μｍと薄い場合でも、高温，高
電圧の環境下における寿命を向上することができるとと
もに、熱衝撃性を向上することができる。According to the multilayer capacitor of the present invention, even when the thickness of the dielectric ceramic layer is as thin as 1 to 10 μm, the life under high temperature and high voltage environment can be improved and the thermal shock resistance can be improved. can do.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 藤川 信儀 鹿児島県国分市山下町１番１号 京セラ株 式会社鹿児島国分工場内 (72)発明者 藤岡 芳博 鹿児島県国分市山下町１番４号 京セラ株 式会社総合研究所内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Nobuyoshi Fujikawa 1-1 Yamashita-cho, Kokubun-shi, Kagoshima Prefecture Kyocera Co., Ltd. Kagoshima Kokubun Plant (72) Yoshihiro Fujioka 1-4-4 Yamashita-cho, Kokubun-shi, Kagoshima Kyocera Incorporated Research Institute
Claims (1)
ン酸バリウム１００モル部に対してマンガンを０．０４
〜０．５モル部含有する厚み３〜１０μｍの誘電体磁器
層と、卑金属からなる内部電極層とを交互に積層してな
る積層型コンデンサであって、前記誘電体磁器層の熱処
理前後の重量変化から求められる酸素空孔補償量ΔＶo
が０．００５〜０．５モル％であることを特徴とする積
層型コンデンサ。1. Barium titanate as a main component, and manganese of 0.04 is added to 100 parts by mole of barium titanate.
A multilayer capacitor, wherein a dielectric ceramic layer having a thickness of 3 to 10 μm and containing 0.5 to 0.5 parts by mole, and an internal electrode layer made of a base metal are alternately laminated, the weight of the dielectric ceramic layer before and after heat treatment. Oxygen vacancy compensation amount ΔV o calculated from change
Is 0.005 to 0.5 mol%, a multilayer capacitor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19521495A JP3287980B2 (en) | 1995-07-31 | 1995-07-31 | Multilayer capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19521495A JP3287980B2 (en) | 1995-07-31 | 1995-07-31 | Multilayer capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0945581A true JPH0945581A (en) | 1997-02-14 |
| JP3287980B2 JP3287980B2 (en) | 2002-06-04 |
Family
ID=16337368
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19521495A Expired - Fee Related JP3287980B2 (en) | 1995-07-31 | 1995-07-31 | Multilayer capacitors |
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| Country | Link |
|---|---|
| JP (1) | JP3287980B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002265260A (en) * | 2001-03-07 | 2002-09-18 | Kyocera Corp | Dielectric ceramic and lamination type electronic part |
| US7099141B1 (en) * | 2005-06-06 | 2006-08-29 | The United States Of America As Represented By The United States Department Of Energy | Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor |
| JP2014165447A (en) * | 2013-02-27 | 2014-09-08 | Kyocera Corp | Multilayer ceramic capacitor |
| WO2023120173A1 (en) * | 2021-12-23 | 2023-06-29 | 京セラ株式会社 | Multilayer ceramic electronic component |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5461774B2 (en) * | 2005-06-24 | 2014-04-02 | Ｔｄｋ株式会社 | Electronic component and manufacturing method thereof |
-
1995
- 1995-07-31 JP JP19521495A patent/JP3287980B2/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002265260A (en) * | 2001-03-07 | 2002-09-18 | Kyocera Corp | Dielectric ceramic and lamination type electronic part |
| JP4663141B2 (en) * | 2001-03-07 | 2011-03-30 | 京セラ株式会社 | Dielectric porcelain and multilayer electronic components |
| US7099141B1 (en) * | 2005-06-06 | 2006-08-29 | The United States Of America As Represented By The United States Department Of Energy | Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor |
| JP2014165447A (en) * | 2013-02-27 | 2014-09-08 | Kyocera Corp | Multilayer ceramic capacitor |
| WO2023120173A1 (en) * | 2021-12-23 | 2023-06-29 | 京セラ株式会社 | Multilayer ceramic electronic component |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3287980B2 (en) | 2002-06-04 |
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