JPH09222452A - Inspection device for double-sided board - Google Patents
Inspection device for double-sided boardInfo
- Publication number
- JPH09222452A JPH09222452A JP8028992A JP2899296A JPH09222452A JP H09222452 A JPH09222452 A JP H09222452A JP 8028992 A JP8028992 A JP 8028992A JP 2899296 A JP2899296 A JP 2899296A JP H09222452 A JPH09222452 A JP H09222452A
- Authority
- JP
- Japan
- Prior art keywords
- double
- sided board
- inspection
- urging
- sided
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は両面基板の検査装置
に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a double-sided board inspection apparatus.
【０００２】[0002]
【従来の技術】従来のこの種検査装置は、両面基板の外
周を保持する保持体と、この両面基板の表裏の一方側に
設けられた第１の検査体と、前記両面基板の表裏の他方
側に設けられた第２の検査体とを備えた構成であった。2. Description of the Related Art A conventional inspection apparatus of this type includes a holder for holding the outer periphery of a double-sided board, a first inspection body provided on one side of the double-sided board, and the other side of the double-sided board. It was the structure provided with the 2nd inspection body provided in the side.
【０００３】[0003]
【発明が解決しようとする課題】上記従来例において第
１、第２の検査体は、保持体によってその外周が保持さ
れた両面基板側へ付勢され、この両面基板に圧接される
ことになるのであるが、この圧接時に、両面基板が割れ
てしまうことがあった。In the above-described conventional example, the first and second inspection bodies are urged toward the double-sided board whose outer periphery is held by the holding body and are pressed against the double-sided board. However, the double-sided substrate may be cracked during this pressure contact.
【０００４】そこで本発明は、第１、第２の検査体の圧
接時に両面基板が割れてしまうのを防止することを目的
とするものである。Therefore, the present invention has an object to prevent the double-sided substrate from cracking when the first and second inspection bodies are pressed against each other.
【０００５】[0005]
【課題を解決するための手段】そしてこの目的を達成す
るために本発明は、前記保持体を支持する支持体を設け
るとともに、この支持体による保持体の支持力は、前記
第１の検査体を両面基板の一方の面側に付勢する時には
低下させるものであり、これによって所期の目的を達成
する。In order to achieve this object, the present invention provides a support for supporting the holder, and the supporting force of the holder by the support is the first inspection body. Is lowered when it is urged to one surface side of the double-sided board, thereby achieving the intended purpose.
【０００６】[0006]
【発明の実施の形態】本発明の請求項１に記載の発明
は、両面基板の外周を保持する保持体と、この両面基板
の表裏の一方側に設けられた第１の検査体と、前記両面
基板の表裏の他方側に設けられた第２の検査体とを備
え、前記保持体を支持する支持体を設けるとともに、こ
の支持体による保持体の支持力は、前記第１の検査体を
両面基板の一方の面側に付勢する時には低下させるもの
であり、支持体による保持体の支持力を低下させている
ので、第１の検査体が両面基板の一方の面に圧接された
時にも、この両面基板が割れてしまうことがなくなるの
である。BEST MODE FOR CARRYING OUT THE INVENTION The invention according to claim 1 of the present invention comprises a holder for holding the outer periphery of a double-sided board, a first inspection body provided on one side of the front and back of the double-sided board, and A second inspection body provided on the other side of the front and back sides of the double-sided board is provided, and a support body for supporting the holding body is provided, and the supporting force of the holding body by the support body is the same as that of the first inspection body. When the first inspection body is pressed against one surface of the double-sided board, the supporting force of the holding body by the support body is decreased when the first inspection body is pressed against one surface of the double-sided board. However, the double-sided substrate will not be broken.
【０００７】本発明の請求項２の発明は、第１、第２の
検査体の両面基板とは反対側の外方には、それぞれの検
査体を両面基板側に付勢する付勢体を設けた請求項１に
記載の両面基板の検査装置であって、一方の付勢距離が
短くなる。According to a second aspect of the present invention, an urging body for urging each of the inspection bodies toward the double-sided board is provided outside the first and second inspection bodies on the opposite side of the double-sided board. The inspection device for a double-sided board according to claim 1, wherein the urging distance on one side is shortened.
【０００８】本発明の請求項３の発明は、検査時におい
ては、先ず第２の付勢体の付勢力を大とし、次に支持体
の支持力を小とし、その後第１の付勢体の付勢力を大と
する請求項２に記載の両面基板の検査装置であって、先
ず第２の付勢体によって第２の検査体を付勢し、それに
よってその後の第１の付勢体による第１の検査体の付勢
距離を短くするものである。According to the invention of claim 3 of the present invention, at the time of inspection, first, the urging force of the second urging body is made large, then the supporting force of the support body is made small, and then the first urging body is made. 3. The double-sided board inspection apparatus according to claim 2, wherein the second biasing body first biases the second biasing body, and thereby the first biasing body thereafter. The urging distance of the first inspection body is shortened.
【０００９】本発明の請求項４の発明は、検査後は、先
ず第１の付勢体の付勢力を小とし、次に支持体の支持力
を大とする請求項３に記載の両面基板の検査装置であっ
て、第２の付勢体による第２の検査体の付勢力を解かず
にその付勢状態を維持することで、次の両面基板の検査
時には、第２の検査体を可動させることが不要となる。According to a fourth aspect of the present invention, after the inspection, the urging force of the first urging member is first reduced, and then the supporting force of the supporting member is increased. Of the second inspection body by maintaining the urging state of the second inspection body without releasing the urging force of the second inspection body by the second urging body. It becomes unnecessary to move.
【００１０】本発明の請求項５の発明は、第１、第２の
検査体は、基台と、この基台の両面基板側に設けられた
可動板と、この可動板と基台間に設けたバネと、前記基
台の可動板側に設けられるとともに、可動板の基台側へ
の移動により、可動板の両面基板側に突出するプローブ
とを備えた請求項１〜４のいずれか一つに記載の両面基
板の検査装置であって、プローブよりも前に可動板が先
ず両面基板に圧接することで、プローブだけが先に圧接
するよりは圧力の集中を抑えることができ、これによっ
ても両面基板の割れを防止できるものである。According to a fifth aspect of the present invention, the first and second inspection bodies include a base, a movable plate provided on the double-sided board side of the base, and between the movable plate and the base. 5. A spring provided, and a probe which is provided on the movable plate side of the base and which projects toward the double-sided board side of the movable plate when the movable plate moves to the base side. A double-sided board inspection device according to one, wherein the movable plate first presses against the double-sided board before the probe, so that the concentration of pressure can be suppressed as compared with the case where only the probe presses first. Also, the double-sided substrate can be prevented from cracking.
【００１１】本発明の請求項６の発明は、第１、第２の
検査体の基台には、位置決め用のピンが貫通する貫通孔
を設けた請求項５に記載の両面基板の検査装置であっ
て、第１、第２の検査体の相対的な位置決めが行えるよ
うになる。According to a sixth aspect of the present invention, the double-sided board inspection apparatus according to the fifth aspect is provided with a through hole through which a positioning pin penetrates in the bases of the first and second inspection bodies. Therefore, relative positioning of the first and second inspection bodies can be performed.
【００１２】以下本発明の一実施形態について図面を用
いて説明する。図１において１は両面基板で、その外周
は保持体２上の定位置に位置決めされた状態で保持され
ている。両面基板の上下面には、それぞれ第１、第２の
検査体３，４が設けられている。これら第１、第２の検
査体３，４は、基台３ａ，４ａとこの基台３ａ，４ａの
両面基板１側に設けられた可動板３ｂ，４ｂと、この可
動板３ｂ，４ｂと基台３ａ，４ａ間に設けたバネ３ｃ，
４ｃと、前記基台３ａ，４ａの可動板３ｂ，４ｂ側に設
けられるとともに、可動板３ｂ，４ｂの基台３ａ，４ａ
側への移動により、可動板３ｂ，４ｂの両面基板１側に
突出するプローブ３ｄ，４ｄとを備えた構成となってい
る。An embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, reference numeral 1 is a double-sided substrate, the outer periphery of which is held in a fixed position on the holder 2. First and second inspection bodies 3 and 4 are provided on the upper and lower surfaces of the double-sided substrate, respectively. These first and second inspection bodies 3 and 4 include bases 3a and 4a, movable plates 3b and 4b provided on the double-sided substrate 1 side of the bases 3a and 4a, and movable plates 3b and 4b. A spring 3c provided between the stands 3a and 4a,
4c and bases 3a, 4a of the movable plates 3b, 4b, which are provided on the movable plates 3b, 4b side of the bases 3a, 4a.
The movable plates 3b and 4b are provided with the probes 3d and 4d protruding toward the double-sided substrate 1 side by the movement to the side.
【００１３】又、基台３ａ，４ａには、第１、第２の付
勢体５，６が設けられている。一方保持体２は、その下
面を支持体７で支持されている。支持体７には高圧用の
レギュレータ８と低圧用のレギュレータ９が接続され、
その切替は弁１０によって行なわれるようになってい
る。上記構成において、先ず、保持体２の定位置に両面
基板１を位置決めする。次に、目視により、第１の検査
体３の位置決めを行なう。その後、両面基板１を取り外
し、基台３ａに設けた貫通孔の上方からピンを挿入し、
そのピンの下端を基台４ａの貫通孔に挿入することで、
第１、第２の検査体３，４と両面基板１の位置決めを行
なう。図１は、再び、両面基板１を保持体２の定位置に
セットした状態を示しており、この状態から先ず、第２
の付勢体６を付勢して、両面基板１の下面側に図１のご
とく接近させる。次に、図２に示すごとく、低圧用レギ
ュレータ９に切替弁１０を切替えることにより、支持体
７による保持体２の支持力を小とする。その状態で、第
１の付勢体５による付勢力を大とすると、第１の検査体
３は、下方に付勢され先ずその可動板３ｂが両面基板１
の上面に圧接される。その状態で、第１の付勢体５の付
勢力を強くしていくと、保持体２は下方に付勢され、
又、第１の検査体３のバネ３ｃは、圧縮されそのプロー
ブ３ｄが、両面基板１の上面に図３のごとく圧接される
ことになる。更に、第１の付勢体５の付勢力を強めてい
くと、可動板４ｂが下方に押され、それによってバネ４
ｃが圧縮されプローブ４ｄが図４のごとく両面基板１の
下面に圧接することになる。この状態で両面基板１の上
下面における導通検査をそれぞれのプローブ３ｄ，４ｄ
にて行なう。そして以上の説明から明らかなように、支
持体７による付勢力を低下させているので、保持体２は
図１〜図４のごとく徐々に下方に移動し、それによって
両面基板１への急激な荷重がかかることはなくその割れ
は生じないのである。Further, the bases 3a and 4a are provided with first and second urging bodies 5 and 6, respectively. On the other hand, the holding body 2 has its lower surface supported by a support body 7. A high pressure regulator 8 and a low pressure regulator 9 are connected to the support 7,
The switching is performed by the valve 10. In the above structure, first, the double-sided board 1 is positioned at a fixed position of the holder 2. Next, the first inspection body 3 is visually positioned. After that, the double-sided board 1 is removed, and the pin is inserted from above the through hole provided in the base 3a,
By inserting the lower end of the pin into the through hole of the base 4a,
The first and second inspection bodies 3 and 4 and the double-sided board 1 are positioned. FIG. 1 shows a state in which the double-sided board 1 is set at a fixed position on the holding body 2 again.
The urging member 6 is urged to bring the lower surface of the double-sided substrate 1 closer to the lower surface side as shown in FIG. Next, as shown in FIG. 2, by switching the switching valve 10 to the low pressure regulator 9, the supporting force of the supporting body 2 by the supporting body 7 is reduced. When the urging force of the first urging body 5 is increased in this state, the first inspecting body 3 is urged downward and the movable plate 3b is first moved to the double-sided board 1
Is pressed against the upper surface of the. In that state, when the urging force of the first urging body 5 is increased, the holding body 2 is urged downward,
Further, the spring 3c of the first inspection body 3 is compressed and the probe 3d is pressed against the upper surface of the double-sided board 1 as shown in FIG. When the urging force of the first urging body 5 is further increased, the movable plate 4b is pushed downward, whereby the spring 4
c is compressed and the probe 4d is pressed against the lower surface of the double-sided substrate 1 as shown in FIG. In this state, the continuity inspection on the upper and lower surfaces of the double-sided board 1 is performed by the respective probes 3d, 4d.
Perform at As is clear from the above description, since the urging force of the support body 7 is reduced, the holding body 2 gradually moves downward as shown in FIGS. No load is applied and the crack does not occur.
【００１４】このようにして、両面基板１の検査が終わ
ると、先ず第１の付勢体５の付勢力を小とし次に、切替
弁１０によって高圧用のレギュレータ８に切替えること
で、支持体７による支持力を大とし、それによって保持
体２を図３、図２、図１のごとく持ち上げていく。この
場合保持体２は、図２の状態で、停止するので第１の付
勢体５は、その付勢力を更に弱めていくことによって具
体的には自らが第１の検査体３の基台３ａを持ち上げて
いくので、図１のような待機状態となる。When the inspection of the double-sided board 1 is completed in this way, first, the urging force of the first urging body 5 is reduced, and then the switching valve 10 is used to switch to the high pressure regulator 8. The supporting force by 7 is increased, and thereby the holding body 2 is lifted as shown in FIGS. 3, 2 and 1. In this case, the holding body 2 stops in the state of FIG. 2, so that the first urging body 5 further weakens its urging force, and specifically, the holding body 2 itself is the base of the first inspection body 3. Since 3a is lifted, the standby state as shown in FIG. 1 is obtained.
【００１５】尚、第２の付勢体６は、その時にも付勢力
を大としたままの状態となっており、よって図１の状態
となる。その後この検査済の両面基板１を、移動させ、
次の両面基板１を保持体２の定位置に保持させ、上記と
同様な動作を行なわせる。尚この場合第１、第２の検査
体３，４の位置関係はすでに前回ピンを用いて調整済で
あるので、再度位置合わせをする必要がない。The second urging body 6 is still in a state in which the urging force is still large at that time, so that the state shown in FIG. 1 is obtained. After that, move the inspected double-sided board 1,
Next, the double-sided substrate 1 is held at a fixed position of the holder 2 and the same operation as above is performed. In this case, since the positional relationship between the first and second inspection bodies 3 and 4 has already been adjusted using the previous pin, it is not necessary to perform the alignment again.
【００１６】[0016]
【発明の効果】以上のように本発明は、両面基板の外周
を保持する保持体と、この両面基板の表裏の一方側に設
けられた第１の検査体と、前記両面基板の表裏の他方側
に設けられた第２の検査体とを備え、前記保持体を支持
する支持体を設けるとともに、この支持体による保持体
の支持力は、前記第１の検査体を両面基板の一方の面側
に付勢する時には低下させるものであり、支持体による
保持体の支持力を低下させているので、第１の検査体が
両面基板の一方の面に圧接された時にも、この両面基板
が割れてしまうことがなくなるのである。As described above, according to the present invention, the holder for holding the outer periphery of the double-sided board, the first inspection body provided on one side of the double-sided board, and the other of the front and back sides of the double-sided board. A second inspection body provided on the side, and a supporting body for supporting the holding body is provided. The supporting force of the holding body by the supporting body is such that the first inspection body is attached to one surface of the double-sided substrate. When the first inspection body is pressed against one surface of the double-sided board, the double-sided board is reduced when the first inspection body is pressed. It won't break.
【図１】本発明の一実施形態の構成図FIG. 1 is a configuration diagram of an embodiment of the present invention.
【図２】本発明の一実施形態の構成図FIG. 2 is a configuration diagram of an embodiment of the present invention.
【図３】本発明の一実施形態の構成図FIG. 3 is a configuration diagram of an embodiment of the present invention.
【図４】本発明の一実施形態の構成図FIG. 4 is a configuration diagram of an embodiment of the present invention.
１ 両面基板 ２ 保持体 ３，４ 第１、第２の検査体 ３ａ，４ａ 基台 ３ｂ，４ｂ 可動板 ３ｃ，４ｃ バネ ３ｄ，４ｄ プローブ ５，６ 第１、第２の付勢体 ７ 支持体 DESCRIPTION OF SYMBOLS 1 Double-sided board 2 Holding body 3,4 1st, 2nd inspection body 3a, 4a Base 3b, 4b Movable plate 3c, 4c Spring 3d, 4d Probe 5, 6 1st, 2nd biasing body 7 Support body
Claims (6)
の両面基板の表裏の一方側に設けられた第１の検査体
と、前記両面基板の表裏の他方側に設けられた第２の検
査体とを備え、前記保持体を支持する支持体を設けると
ともに、この支持体による保持体の支持力は、前記第１
の検査体を両面基板の一方の面側に付勢する時には低下
させることを特徴とする両面基板の検査装置。1. A holding body for holding the outer periphery of a double-sided board, a first inspection body provided on one side of the front and back sides of the double-sided board, and a second inspection body provided on the other side of the front and back side of the double-sided board. A support body for supporting the holding body is provided, and the supporting force of the holding body by the support body is
The inspection device for a double-sided board, wherein the inspection body is lowered when being biased to one surface side of the double-sided board.
側の外方には、それぞれの検査体を両面基板側に付勢す
る付勢体を設けた請求項１に記載の両面基板の検査装
置。2. The urging body for urging each of the inspection bodies toward the double-sided board is provided outside the first and second inspection bodies on the opposite side of the double-sided board. Double-sided board inspection device.
付勢力を大とし、次に支持体の支持力を小とし、その後
第１の付勢体の付勢力を大とする請求項２に記載の両面
基板の検査装置。3. At the time of inspection, first, the urging force of the second urging body is made large, then the supporting force of the support body is made small, and then the urging force of the first urging body is made large. Item 2. The double-sided board inspection device according to Item 2.
小とし、次に支持体の支持力を大とする請求項３に記載
の両面基板の検査装置。4. The double-sided board inspection apparatus according to claim 3, wherein after the inspection, the urging force of the first urging body is first made small and then the supporting force of the support body is made large.
台の両面基板側に設けられた可動板と、この可動板と基
台間に設けたバネと、前記基台の可動板側に設けられる
とともに、可動板の基台側への移動により、可動板の両
面基板側に突出するプローブとを備えた請求項１〜４の
いずれか一つに記載の両面基板の検査装置。5. The first and second inspection bodies include a base, a movable plate provided on the double-sided board side of the base, a spring provided between the movable plate and the base, and the base. 5. The double-sided board according to any one of claims 1 to 4, further comprising: a probe provided on the movable plate side of the movable plate and protruding toward the double-sided board side of the movable plate when the movable plate moves to the base side. Inspection device.
め用のピンが貫通する貫通孔を設けた請求項５に記載の
両面基板の検査装置。6. The double-sided board inspection device according to claim 5, wherein the bases of the first and second inspection bodies are provided with through holes through which positioning pins penetrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8028992A JPH09222452A (en) | 1996-02-16 | 1996-02-16 | Inspection device for double-sided board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8028992A JPH09222452A (en) | 1996-02-16 | 1996-02-16 | Inspection device for double-sided board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH09222452A true JPH09222452A (en) | 1997-08-26 |
Family
ID=12263919
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8028992A Pending JPH09222452A (en) | 1996-02-16 | 1996-02-16 | Inspection device for double-sided board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH09222452A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111175638A (en) * | 2020-01-13 | 2020-05-19 | 易路泰科技(江西)有限公司 | Automatic two-sided test equipment of commonality PCBA board |
-
1996
- 1996-02-16 JP JP8028992A patent/JPH09222452A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111175638A (en) * | 2020-01-13 | 2020-05-19 | 易路泰科技(江西)有限公司 | Automatic two-sided test equipment of commonality PCBA board |
| CN111175638B (en) * | 2020-01-13 | 2021-12-10 | 易路泰科技(江西)有限公司 | Automatic two-sided test equipment of commonality PCBA board |
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