JPH09181150A - Pickup equipment of semiconductor chip and pickup method using the same - Google Patents

Pickup equipment of semiconductor chip and pickup method using the same

Info

Publication number
JPH09181150A
JPH09181150A JP33746495A JP33746495A JPH09181150A JP H09181150 A JPH09181150 A JP H09181150A JP 33746495 A JP33746495 A JP 33746495A JP 33746495 A JP33746495 A JP 33746495A JP H09181150 A JPH09181150 A JP H09181150A
Authority
JP
Japan
Prior art keywords
semiconductor chip
tape
needle
expand
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33746495A
Other languages
Japanese (ja)
Inventor
Koji Shibata
公司 柴田
Toshihiro Kakushi
智弘 嘉久志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP33746495A priority Critical patent/JPH09181150A/en
Publication of JPH09181150A publication Critical patent/JPH09181150A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68318Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H01L2221/68322Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support

Landscapes

  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Die Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve yield of chips and reduce adjustment of equipment and maintenance work in the pickup work of a semiconductor chip. SOLUTION: This pickup equipment is provided with an expanded tape 2 on which a plurality of semiconductor chips 1 are stuck, a tape guide 7 arranged under the tape 2, needles 9 for peeling the chip 1 from the tape 2, and a collet 12 for sucking the peeled chips 1 and transferring them. In the almost central part of the guide face 6 of the tape guide 7, a recessed part 6a having needle holes which the needles can penetrate and which have diameters smaller than the chip 1 and a vacuum hole 8 for sucking the tape 2 is formed. The upper end height of the needle 9 which has penetrated the needle hole is made to coincide almost with the guide face. From the vacuum hole 8, the adhesive tape 2 is sucked toward the recessed part 6a, and the semiconductor chip 1 is peeled from the adhesive tape 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本願発明は半導体チップのピ
ックアップ装置の構造及びこれを用いて行う半導体チッ
プのピックアップ方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of a semiconductor chip pickup device and a method of picking up a semiconductor chip using the structure.

【0002】[0002]

【従来の技術】ダイオード、トランジスタ、IC等の半
導体装置は、シリコン等のウェハ基板上にフォトエッチ
ング技術により多数個一括して形成した半導体素子を分
割・分離して個別の半導体チップにした後、ダイボンデ
ィング、ワイヤボンディング、パッケージング、外装処
理、トリム・フォーミング、標印、検査等の工程を経て
組み立てられ、半導体装置の完成品となる。
2. Description of the Related Art A semiconductor device such as a diode, a transistor, an IC, etc. is divided into individual semiconductor chips by dividing and separating a plurality of semiconductor elements collectively formed on a wafer substrate such as silicon by a photoetching technique. A semiconductor device is completed by assembling through processes such as die bonding, wire bonding, packaging, exterior processing, trim forming, marking, and inspection.

【0003】これらの工程の中で、半導体素子を個別の
半導体チップに分割・分離する工程は、通常、次のよう
に行われる。即ち、ウェハ基板の裏面に伸張性のあるエ
キスパンドテープを貼着し、この状態でダイシング装置
と言われる切断装置でウェハ基板にハーフカット溝を形
成し、クラッキングと言われる作業を行って個々の半導
体チップに分割し、エキスパンドテープを引き伸ばすこ
とにより個々の半導体チップ間の距離を確保するように
分離する。その後、図2または図3に示すような半導体
チップ1のピックアップ装置を使用し、ニードルで半導
体チップ1の裏面を突き上げるようにしてエキスパンド
テープ2から剥離し、コレット12で図示しないリード
フレーム等に半導体チップ1を移送する。
Of these steps, the step of dividing and separating the semiconductor element into individual semiconductor chips is usually performed as follows. That is, an expandable tape having stretchability is attached to the back surface of the wafer substrate, and in this state, a half cutting groove is formed in the wafer substrate by a cutting device called a dicing device, and an operation called cracking is performed to separate individual semiconductors. It is divided into chips, and the expand tape is stretched to separate the chips so as to secure a distance between the individual semiconductor chips. Then, using a pickup device for the semiconductor chip 1 as shown in FIG. 2 or FIG. 3, the back surface of the semiconductor chip 1 is pushed up with a needle to peel it off from the expand tape 2, and a collet 12 is used to attach a semiconductor to a lead frame or the like not shown. Transfer chip 1.

【0004】図2は従来の一般的な半導体チップのピッ
クアップ装置の動作を示す断面説明図で、図2(a)は
エキスパンドテープ2に所定の間隔で貼着されている半
導体チップ1がピックアップ装置に設置された状態を示
し、図2(b)はエキスパンドテープ2を真空吸引によ
り吸着しながら突き上げ部5aのニードル9により半導
体チップ1を下方から突き上げている状態を示し、図2
(c)は半導体チップがコレット12に吸着されるとと
もに突き上げ部5aが初期の位置へ戻って半導体チップ
1の突き上げが完了した状態を示している。図2(a)
〜図2(c)の工程を順次繰り返すことにより、所定の
半導体チップ1がエキスパンドテープ2から剥離され、
ダイボンディング等の工程へと個別に移送される。
FIG. 2 is a cross-sectional explanatory view showing the operation of a conventional general semiconductor chip pickup device. FIG. 2 (a) shows a semiconductor chip 1 attached to an expanding tape 2 at a predetermined interval. 2B shows the state in which the semiconductor chip 1 is pushed up from below by the needle 9 of the push-up portion 5a while sucking the expanded tape 2 by vacuum suction.
(C) shows a state in which the semiconductor chip is attracted to the collet 12, the push-up portion 5a returns to the initial position, and the push-up of the semiconductor chip 1 is completed. FIG. 2 (a)
~ By repeating the process of Fig. 2 (c) sequentially, the predetermined semiconductor chip 1 is peeled from the expand tape 2,
Individually transferred to a process such as die bonding.

【0005】しかしながら、図2に示すピックアップ装
置は、突き上げ部5aを上下に移動させるための駆動機
構必要になるとともに、ニードル9を突き上げたときに
エキスパンドテープ2に形成された孔から空気が漏れ込
んでテープガイド7a内の負圧が低下するのを防ぐよう
な構造にしなければならないので、ピックアップ装置の
構造が複雑になるとともに、メンテナンス等の作業を随
時行わなければならなかった。また、突き上げ部5aの
上下動に伴う振動でニードル9の先端が振れることによ
り、半導体チップ1の裏面を傷つけてリードフレームと
の接触性を悪くしたり、半導体チップ1に割れや欠けを
生じさせたりすることがあった。
However, the pickup device shown in FIG. 2 requires a drive mechanism for moving the push-up portion 5a up and down, and air leaks from the hole formed in the expand tape 2 when the needle 9 is pushed up. Therefore, it is necessary to have a structure that prevents the negative pressure in the tape guide 7a from decreasing, so that the structure of the pickup device becomes complicated and maintenance work and the like must be performed at any time. Further, the vibration of the up-and-down portion 5a causes the tip of the needle 9 to swing, which damages the back surface of the semiconductor chip 1 and deteriorates the contact with the lead frame, and the semiconductor chip 1 is cracked or chipped. There was something that happened.

【0006】そのため、図3に主要部の断面説明図を示
す特開平6−275663のピックアップ装置では、ニ
ードル9を固定したままエキスパンドテープ2の方を真
空吸引して半導体チップ1と分離する方法を開発してい
た。図3は、ガイド面6bを有するテープガイド7の上
方にエキスパンドテープ2に貼着された半導体チップ1
が配置され、更にその上方にはコレット12が配置され
ている。また、ガイド面6bの中央部には半導体チップ
1に対して十分な大きさのバキューム孔8bが形成さ
れ、半導体チップ1の直下にはニードルホルダ4に固定
されたニードル9が配置された構成になっている。
Therefore, in the pickup device of Japanese Patent Laid-Open No. 6-275663, whose cross-sectional explanatory view of the main part is shown in FIG. 3, there is a method of separating the semiconductor chip 1 by vacuum suction of the expand tape 2 with the needle 9 fixed. Was developing. FIG. 3 shows a semiconductor chip 1 attached to an expanding tape 2 above a tape guide 7 having a guide surface 6b.
Is arranged, and the collet 12 is arranged above it. Further, a vacuum hole 8b having a sufficient size for the semiconductor chip 1 is formed in the center of the guide surface 6b, and a needle 9 fixed to the needle holder 4 is arranged immediately below the semiconductor chip 1. Has become.

【0007】このような構成により、テープガイド7内
を図中の矢印A1で示す方向に真空吸引すればエキスパ
ンドテープ2が図3の実線で示すように伸びるので、半
導体チップ1はニードル9により相対的に突き上げられ
ることになり、半導体チップ1はエキスパンドテープ2
から剥離されるようになる。
With such a structure, when the tape guide 7 is vacuum-sucked in the direction indicated by the arrow A1 in the figure, the expand tape 2 extends as shown by the solid line in FIG. Semiconductor chip 1 is expanded tape 2
Will be peeled from.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、図3の
ピックアップ装置は、ニードル9を上下動させるための
駆動機構が不要になるというメリットがあるものの、バ
キューム孔8bを半導体チップ1に対して十分な大きさ
に形成していたので、半導体チップ1の大きさに合わせ
た大きさのバキューム孔8bを有する複数のテープガイ
ド7を用意しなければならないとともに、エキスパンド
テープ2の伸張性によっては同図の波線2bで示すエキ
スパンドテープ2のように引き込まれ過ぎてしまうこと
があり、これを防ぐために真空吸引の負圧を制御するよ
うにして引き込み量を一定にしなければならなかった
が、ニードル9がエキスパンドテープ2を突き破ったと
きにそこから空気が漏れ込む場合があり調整が難しかっ
た。また、伸びすぎたエキスパンドテープ2がガイド面
6bに移動したときにエキスパンドテープ2がガイド面
6bから浮いて半導体チップ1が傾いてしまい、コレッ
ト12による吸着が正常に出来ないこともあった。
However, the pickup device of FIG. 3 has an advantage that a drive mechanism for moving the needle 9 up and down is not required, but the vacuum hole 8b is sufficient for the semiconductor chip 1. Since it is formed in a size, it is necessary to prepare a plurality of tape guides 7 each having a vacuum hole 8b having a size corresponding to the size of the semiconductor chip 1 and, depending on the expandability of the expand tape 2, It may be drawn too much like the expanded tape 2 shown by the wavy line 2b, and in order to prevent this, it was necessary to control the negative pressure of the vacuum suction to make the drawing amount constant, but the needle 9 was expanded. When the tape 2 was pierced, air could leak from it, making adjustment difficult. In addition, when the expanded tape 2 that has stretched too much moves to the guide surface 6b, the expanded tape 2 floats from the guide surface 6b and the semiconductor chip 1 tilts, so that the suction by the collet 12 may not be performed normally.

【0009】そこで本発明は、半導体チップのピックア
ップ作業において、半導体チップの歩留まりを向上でき
るようにするとともに、ピックアップ装置の調整やメン
テナンス等の作業を更に軽減することのできるピックア
ップ装置及びこれを用いたピックアップ方法を提供でき
るようにすることを目的としている。
Therefore, the present invention uses a pickup device and a pickup device which can improve the yield of semiconductor chips in the pickup work of semiconductor chips and can further reduce the work such as adjustment and maintenance of the pickup device. The purpose is to be able to provide a pick-up method.

【0010】[0010]

【課題を解決するための手段】上記の課題を解決するた
めに、請求項1に記載した半導体装置のピックアップ装
置は、複数の半導体チップが貼着されたエキスパンドテ
ープと、上記エキスパンドテープに摺接するガイド面を
有して上記エキスパンドテープの下方に配置されたテー
プガイドと、上記半導体チップを上記エキスパンドテー
プから剥離するためのニードルと、剥離された上記半導
体チップを吸着して移送するコレットとを備える半導体
チップのピックアップ装置において、上記テープガイド
にはそのガイド面の略中央部に上記ニードルが貫通可能
で上記半導体チップよりも小径のニードル孔と上記エキ
スパンドテープを吸引するためのバキューム孔とを有す
る凹部を形成し、上記ニードル孔を貫通した上記ニード
ルの上端高さをガイド面と略一致するように配置し、ピ
ックアップすべき上記半導体チップが上記ニードルの上
部に位置するときに上記バキューム孔より上記エキスパ
ンドテープを上記凹部に吸引することにより上記半導体
チップを上記エキスパンドテープから剥離することを特
徴とする。
In order to solve the above-mentioned problems, a pickup device for a semiconductor device according to a first aspect of the present invention is an expand tape having a plurality of semiconductor chips attached thereto, and is in sliding contact with the expand tape. A tape guide having a guide surface and arranged below the expand tape, a needle for separating the semiconductor chip from the expand tape, and a collet for adsorbing and transferring the separated semiconductor chip are provided. In a semiconductor chip pickup device, the tape guide has a concave portion having a needle hole having a diameter smaller than that of the semiconductor chip and a vacuum hole for sucking the expanding tape, the needle being capable of penetrating substantially the central portion of the guide surface. The height of the needle through the needle hole. The semiconductor tape to be picked up from the expand tape by sucking the expand tape into the recess from the vacuum hole when the semiconductor chip to be picked up is located above the needle. It is characterized by peeling.

【0011】また、請求項2に記載した発明は、請求項
1に記載のピックアップ装置を用いた半導体チップのピ
ックアップ方法であって、(a)上記エキスパンドテー
プに貼着された上記半導体チップが上記ニードルの上部
に位置するように位置調整するステップ、(b)上記バ
キューム孔に所定の負圧を作用させて上記エキスパンド
テープを上記ガイド面の上記凹部に引き込み、上記ニー
ドルにより相対的に突き上げられた上記半導体チップと
上記エキスパンドテープとを剥離させるステップ、
(c)剥離された上記半導体チップを上記吸着コレット
により吸着して移送するステップ、を含むことを特徴と
する。
According to a second aspect of the present invention, there is provided a semiconductor chip pickup method using the pickup device according to the first aspect, wherein (a) the semiconductor chip attached to the expand tape is the above-mentioned. A step of adjusting the position so that the expanded tape is positioned above the needle, (b) a predetermined negative pressure is applied to the vacuum hole to draw the expand tape into the recess of the guide surface, and the needle is relatively pushed up by the needle. A step of separating the semiconductor chip and the expanding tape,
(C) Adsorbing the separated semiconductor chip by the adsorption collet and transferring the semiconductor chip.

【0012】従って、本願発明のピックアップ装置にお
いては、エキスパンドテープに負圧を作用させて凹部内
に一定量を引き込むとともに固定されたニードルにより
半導体チップの移動を阻止するように動作するので、半
導体チップはニードルで相対的に突き上げられるように
なる。また、ニードルを上下動させるための駆動機構や
負圧の制御装置が不要になりピックアップ装置の構成が
簡略化されるようになるとともに、ニードルの先端を固
定出来るようになる。
Therefore, in the pickup device of the present invention, a negative pressure is applied to the expand tape to draw a certain amount into the recess and the fixed needle operates so as to prevent the semiconductor chip from moving. Can be relatively pushed up by the needle. Further, a drive mechanism for moving the needle up and down and a negative pressure control device are not required, the structure of the pickup device is simplified, and the tip of the needle can be fixed.

【0013】[0013]

【実施の形態】以下、本発明の実施の形態を図1を参照
しながら詳細に説明する。尚、本明細書では、全図面を
通して、同一または同様の部位には同一の符号を付して
説明を簡略化するようにしている。図1は、本発明のピ
ックアップ装置を用いて半導体チップをピックアップす
る方法を工程順に示す断面説明図で、図1(a)乃至図
1(c)の工程を順次繰り返すことにより、所定の半導
体チップをエキスパンドテープから剥離する様子を表し
ている。尚、本説明では図面上で見て上側を上方、下側
を下方として説明しているが、該ピックアップ装置の方
向は任意で構わない。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be described in detail below with reference to FIG. Throughout the drawings, the same or similar portions are denoted by the same reference symbols throughout the drawings to simplify the description. 1A to 1C are cross-sectional explanatory views showing a method of picking up a semiconductor chip using the pickup device of the present invention in order of steps. By repeating the steps of FIGS. 1A to 1C sequentially, a predetermined semiconductor chip is obtained. Shows the state of peeling from the expanded tape. In the description, the upper side is the upper side and the lower side is the lower side as viewed in the drawings, but the direction of the pickup device may be arbitrary.

【0014】以下各工程について順を追って詳細に説明
する。図1(a)は、半導体チップ1のピックアップ前
の状態を示し、樹脂性で伸張性のあるエキスパンドテー
プ2(「粘着シート」ともいう)に貼着されて所定の間
隔に分離された半導体チップ1をピックアップ装置の所
定の位置に配置した状態を示している。エキスパンドテ
ープ2はテープガイド7(「吸着台」ともいう)のガイ
ド面6に接するように配置され、半導体チップ1の上方
には半導体チップ1を吸着して移送するためのコレット
12(「吸着コレット」ともいう)が配置され、半導体
チップ1の下方には半導体チップ1を相対的に突き上げ
るためのニードルホルダ4に固定されたニードル9
(「突き上げピン」ともいう)が配置されている。
The respective steps will be described in detail below step by step. FIG. 1A shows a state before the semiconductor chip 1 is picked up, which is a semiconductor chip which is attached to an expandable tape 2 (also referred to as an “adhesive sheet”) which is resinous and stretchable and is separated at predetermined intervals. 1 shows a state in which 1 is arranged at a predetermined position of the pickup device. The expand tape 2 is arranged so as to contact a guide surface 6 of a tape guide 7 (also referred to as an "adsorption table"), and a collet 12 ("adsorption collet" for adsorbing and transferring the semiconductor chip 1 is provided above the semiconductor chip 1. (Also referred to as “”) is disposed below the semiconductor chip 1, and the needle 9 is fixed to the needle holder 4 for relatively pushing up the semiconductor chip 1.
(Also called "push-up pin") is arranged.

【0015】各部の詳細について更に説明する。テープ
ガイド7は半導体チップ1のチップサイズよりも十分に
大きな内径を有する筒状形状で、ガイド面6の略中央部
には半導体チップ1のチップサイズよりも十分に広く半
導体チップ1の厚さより深い凹部6aが設けられ、凹部
6a内には半導体チップ1の一辺の長さよりも小径でニ
ードル9の先端が貫通するニードル孔と、半導体チップ
1の一辺の長さよりも小径の孔でエキスパンドテープ2
を凹部6aに吸着するためのバキューム孔8が複数形成
されている。また、凹部6aの周囲は傾斜を有するよう
形成され、エキスパンドテープ2が凹部6aに密着し易
いような構造に形成されている。更に、ニードル9は先
端が尖塔形状をした針で超硬質金属またはダイヤモンド
等で形成され、半導体チップ1のチップサイズに応じて
1本乃至数本をニードルホルダに突き刺して用いる。
The details of each unit will be further described. The tape guide 7 has a cylindrical shape having an inner diameter sufficiently larger than the chip size of the semiconductor chip 1, and is substantially wider than the chip size of the semiconductor chip 1 and deeper than the thickness of the semiconductor chip 1 in a substantially central portion of the guide surface 6. A concave portion 6a is provided, and a needle hole having a diameter smaller than the length of one side of the semiconductor chip 1 through which the tip of the needle 9 penetrates and a hole having a diameter smaller than the length of the one side of the semiconductor chip 1 are provided in the concave tape 6a.
A plurality of vacuum holes 8 are formed for adsorbing in the concave portion 6a. Further, the periphery of the concave portion 6a is formed to have an inclination, and the expand tape 2 is formed in a structure such that it can easily adhere to the concave portion 6a. Further, the needle 9 is a needle having a steeple-shaped tip and is made of superhard metal or diamond, and one or several needles are pierced into the needle holder according to the chip size of the semiconductor chip 1 and used.

【0016】尚、ニードル9の先端が摩耗もしくは欠け
てしてしまったときや何らかの要因で曲がってしまった
ようなときには、ニードルホルダ4からニードル9を抜
き取って新しいニードル9とさし換えて使用する。ま
た、複数のニードル9を一つのピックアップ装置に用い
る場合にはその先端高さが半導体チップ1に対して平行
になるように調整して使用する。コレット12は半導体
チップ1の角部と接触するような吸着面の形状の場合を
示しているが、半導体チップ1の上面を吸着するような
形状でも良く、吸着面の形状は任意で構わない。
When the tip of the needle 9 is worn or chipped or is bent due to some cause, the needle 9 is pulled out from the needle holder 4 and replaced with a new needle 9. . When using a plurality of needles 9 in one pickup device, the heights of the tips are adjusted so as to be parallel to the semiconductor chip 1 before use. Although the collet 12 has a shape of a suction surface that comes into contact with a corner of the semiconductor chip 1, it may have a shape that sucks the upper surface of the semiconductor chip 1, and the shape of the suction surface may be arbitrary.

【0017】図1(b)は半導体チップ1をエキスパン
ドテープ2から剥離したときの状態を示し、テープガイ
ド7内を図示しないポンプ装置で図中の矢印A1で示す
方向に真空吸引してエキスパンドテープ2を負圧で引き
下げて凹部6a内に吸着し、固定されたニードル9の存
在により下方に移動できない半導体チップ1がエキスパ
ンドテープ2から剥離された状態を示す。この状態をエ
キスパンドテープ2の位置を中心に見て言い換えれば、
ニードル9が半導体チップ1を相対的に突き上げてエキ
スパンドテープ2から半導体チップ1を剥離することに
なる。同時に、コレット12が下方に移動して半導体チ
ップ1に接近し、孔12aから図中の矢印A2で示す方
向に真空吸引して半導体チップ1を吸着した状態を示し
ている。このとき、ニードル孔にニードル9を貫通した
後でニードル孔を樹脂性の接着剤等で封止しておけば、
ニードル9がエキスパンドテープ2を突き破ったときに
形成された孔とニードル孔を介して空気が漏れ込んでテ
ーブルガイド7内の真空圧が低下するのを防止出来るよ
うになる。
FIG. 1B shows a state in which the semiconductor chip 1 is peeled off from the expanding tape 2, and the inside of the tape guide 7 is vacuum-sucked in the direction shown by an arrow A1 in the drawing by a pump device (not shown). 2 shows a state in which the semiconductor chip 1 which is pulled down by a negative pressure to be sucked in the concave portion 6a and which cannot move downward due to the presence of the fixed needle 9 is peeled from the expand tape 2. In other words, focusing on the position of the expanding tape 2 in this state,
The needle 9 pushes up the semiconductor chip 1 relatively and separates the semiconductor chip 1 from the expand tape 2. At the same time, the collet 12 moves downward and approaches the semiconductor chip 1, and the semiconductor chip 1 is sucked by vacuum suction from the hole 12a in the direction shown by an arrow A2 in the figure. At this time, if the needle hole is sealed with a resin adhesive or the like after penetrating the needle 9 into the needle hole,
It is possible to prevent the vacuum pressure in the table guide 7 from decreasing due to air leaking through the hole and the needle hole formed when the needle 9 breaks through the expanded tape 2.

【0018】尚、コレット12が半導体チップ1に接近
して半導体チップ1を吸着するタイミングは、図1
(b)のようにエキスパンドテープ2から剥離された半
導体チップ1がニードル9上に静止している状態のとき
でも、図1(a)のようにエキスパンドテープ2に半導
体チップ1が貼着された状態のときでも構わない。ま
た、テープガイド7内の真空吸引力はエキスパンドテー
プ2と半導体チップ1とを剥離できる程度の負圧が有れ
ば良く、吸引されたエキスパンドテープ2が凹部6a内
に完全に密着する必要はない。
The timing when the collet 12 approaches the semiconductor chip 1 and sucks the semiconductor chip 1 is as shown in FIG.
Even when the semiconductor chip 1 peeled from the expanding tape 2 is still on the needle 9 as shown in (b), the semiconductor chip 1 is attached to the expanding tape 2 as shown in FIG. 1 (a). It doesn't matter even in the state. Further, the vacuum suction force in the tape guide 7 only needs to have a negative pressure enough to separate the expanded tape 2 and the semiconductor chip 1, and it is not necessary that the sucked expanded tape 2 is completely adhered to the concave portion 6a. .

【0019】図1(c)は半導体チップ1の剥離が完了
した状態を示し、半導体チップ1を吸着したコレット1
2が上方に移動するとともに、負圧状態だったテープガ
イド7内を図中の矢印A3で示す方向に加圧することに
よりエキスパンドテープ2が図1(a)と同様なガイド
面6と略同一平面に復帰した状態を示している。その
後、コレット12に吸着されている半導体チップ1は図
示しない半導体パッケージのリードフレーム等に移動さ
れるとともに、次にピックアップすべき半導体チップ1
がニードル9の上方になるようにエキスパンドテープ2
を水平方向に平行移動すれば、図1(a)の状態に戻
る。
FIG. 1C shows a state in which the peeling of the semiconductor chip 1 has been completed, and the collet 1 having the semiconductor chip 1 adsorbed thereto.
2 moves upward, and the expanded tape 2 is substantially flush with the guide surface 6 similar to that shown in FIG. 1A by pressing the inside of the tape guide 7 in the negative pressure direction in the direction indicated by the arrow A3 in the figure. It has returned to the state. After that, the semiconductor chip 1 attracted to the collet 12 is moved to a lead frame or the like of a semiconductor package (not shown), and the semiconductor chip 1 to be picked up next time.
Expanding tape 2 so that it is above needle 9.
Is translated in the horizontal direction, the state returns to the state shown in FIG.

【0020】尚、エキスパンドテープ2がガイド面6と
略同一平面に復帰させるためには、上述のようにテープ
ガイド7内の加圧した方が短時間で復帰できるが、高速
性を要求しない場合には負圧を開放すだけでも良い。本
発明のピックアップ装置をトランジスタチップのピック
アップに使用した場合は、一辺が約0.7mmのトラン
ジスタチップに対して、凹部6aの直径及び深さを約6
mmと約0.5mmとし、ニードル孔の直径を約2mm
として1個形成し、バキューム孔8の直径を約1mmと
してニードル孔を囲むように8個配置するようにした。
更に、凹部6a周辺の傾斜角は約45度とし、ニードル
9の直径は約0.8mmとし、ニードルホルダ4から突
出したニードル9の長さは約5mmとした。
In order to return the expand tape 2 to the substantially same plane as the guide surface 6, it is possible to return the expanded tape 2 in the tape guide 7 in a short time as described above, but when high speed is not required. It is enough to release the negative pressure. When the pickup device of the present invention is used for picking up a transistor chip, the diameter and depth of the recess 6a are about 6 for a transistor chip having a side of about 0.7 mm.
mm and about 0.5 mm, the diameter of the needle hole is about 2 mm
Was formed, and the vacuum holes 8 had a diameter of about 1 mm and were arranged so as to surround the needle holes.
Further, the inclination angle around the recess 6a was about 45 degrees, the diameter of the needle 9 was about 0.8 mm, and the length of the needle 9 protruding from the needle holder 4 was about 5 mm.

【0021】[0021]

【発明の効果】以上説明したように本発明のピックアッ
プ装置によれば、エキスパンドテープに負圧を作用させ
て凹部内に一定量を引き込むとともに固定されたニード
ルにより半導体チップの移動を阻止するように動作する
ので、半導体チップはニードルで相対的に突き上げられ
ることになり、エキスパンドテープから半導体チップを
容易に剥離することができるようになる。また、ニード
ルを上下動させるための駆動機構や負圧の制御装置が不
要になりピックアップ装置の構成が簡略化されるので、
ピックアップ装置の故障の発生が少なくなるとともにメ
ンテナンス作業による時間及び費用の損失を大幅に削減
できるという効果がある。また、駆動機構が全く無いの
で半導体チップの剥離を従来に比べて高速に行うことが
でき、量産性を向上できるという効果がある。更に、ニ
ードルの先端を固定出来るようになるので、ニードルの
先端の振れが少なくなりニードルの振れによって発生し
ていた半導体チップの割れや欠け等の不良や位置ずれ等
が無くなり、半導体チップの歩留まりを向上できるよう
になると言う効果がある。
As described above, according to the pickup device of the present invention, a negative pressure is applied to the expanding tape to draw a certain amount into the concave portion, and the fixed needle prevents movement of the semiconductor chip. Since it operates, the semiconductor chip is relatively pushed up by the needle, and the semiconductor chip can be easily peeled off from the expand tape. Further, since a drive mechanism for moving the needle up and down and a negative pressure control device are not required, the configuration of the pickup device is simplified,
It is possible to reduce the occurrence of failure of the pickup device and to significantly reduce the loss of time and cost due to maintenance work. Further, since there is no driving mechanism at all, the semiconductor chips can be peeled off at a higher speed than in the conventional case, and the mass productivity can be improved. Furthermore, since the tip of the needle can be fixed, the deflection of the tip of the needle is reduced, and the defects such as cracking and chipping of the semiconductor chip and misalignment caused by the deflection of the needle are eliminated, and the yield of semiconductor chips is improved. There is an effect that it will be possible to improve.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明のピックアップ装置の動作を示す断面
説明図、
FIG. 1 is a sectional explanatory view showing an operation of a pickup device of the present invention,

【図2】 従来の一般的なピックアップ装置の動作を示
す断面説明図、
FIG. 2 is a cross-sectional explanatory view showing an operation of a conventional general pickup device,

【図3】 従来の他のピックアップ装置を示す断面説明
図ある。
FIG. 3 is an explanatory sectional view showing another conventional pickup device.

【符号の説明】[Explanation of symbols]

1 :半導体チップ 2 :エキスパンドテープ(粘着テープ) 4 :ニードルホルダ 5 :突き上げ部 6 :ガイド面 6a:凹部 7 :テープガイド(吸着台) 8 :バキューム孔 9 :ニードル(突き上げピン) 12:コレット(吸着コレット) 1: Semiconductor chip 2: Expanding tape (adhesive tape) 4: Needle holder 5: Push-up part 6: Guide surface 6a: Recess 7: Tape guide (suction table) 8: Vacuum hole 9: Needle (pushing pin) 12: Collet ( Adsorption collet)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数の半導体チップが貼着されたエキス
パンドテープと、前記エキスパンドテープに摺接するガ
イド面を有して前記エキスパンドテープの下方に配置さ
れたテープガイドと、前記半導体チップを前記エキスパ
ンドテープから剥離するためのニードルと、剥離された
前記半導体チップを吸着して移送するコレットとを備え
る半導体チップのピックアップ装置において、前記テー
プガイドにはそのガイド面の略中央部に前記ニードルが
貫通可能で前記半導体チップよりも小径のニードル孔と
前記エキスパンドテープを吸引するためのバキューム孔
とを有する凹部を形成し、前記ニードル孔を貫通した前
記ニードルの上端高さをガイド面と略一致するように配
置し、ピックアップすべき前記半導体チップが前記ニー
ドルの上部に位置するときに前記バキューム孔より前記
エキスパンドテープを前記凹部に吸引することにより前
記半導体チップを前記エキスパンドテープから剥離する
ことを特徴とする半導体チップのピックアップ装置
1. An expand tape to which a plurality of semiconductor chips are adhered, a tape guide disposed below the expand tape having a guide surface in sliding contact with the expand tape, and the semiconductor chip being the expand tape. In a pickup device for a semiconductor chip, which comprises a needle for peeling from the tape and a collet for sucking and transferring the peeled semiconductor chip, the tape guide has the needle pierceable at a substantially central portion of its guide surface. A concave portion having a needle hole having a diameter smaller than that of the semiconductor chip and a vacuum hole for sucking the expand tape is formed, and the upper end height of the needle penetrating the needle hole is arranged so as to substantially coincide with the guide surface. The semiconductor chip to be picked up is located above the needle. The semiconductor chip pickup device is characterized in that the semiconductor chip is separated from the expand tape by sucking the expand tape into the concave portion from the vacuum hole when the semiconductor tape is opened.
【請求項2】 請求項1の装置を用いた半導体チップの
ピックアップ方法であって、 (a)前記エキスパンドテープに貼着された前記半導体
チップが前記ニードルの上部に位置するように位置調整
するステップ、 (b)前記バキューム孔に所定の負圧を作用させて前記
エキスパンドテープを前記ガイド面の前記凹部に引き込
み、前記ニードルにより相対的に突き上げられた前記半
導体チップと前記エキスパンドテープとを剥離させるス
テップ、 (c)剥離された前記半導体チップを前記吸着コレット
により吸着して移送するステップ、を含むことを特徴と
する半導体チップのピックアップ方法。
2. A method of picking up a semiconductor chip using the apparatus according to claim 1, wherein the step (a) adjusts the position of the semiconductor chip attached to the expand tape so as to be located above the needle. (B) a step of applying a predetermined negative pressure to the vacuum hole to draw the expand tape into the recess of the guide surface, and separating the semiconductor chip relatively pushed up by the needle from the expand tape And (c) adsorbing the separated semiconductor chip by the adsorption collet and transferring the semiconductor chip, the method of picking up a semiconductor chip.
JP33746495A 1995-12-25 1995-12-25 Pickup equipment of semiconductor chip and pickup method using the same Pending JPH09181150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33746495A JPH09181150A (en) 1995-12-25 1995-12-25 Pickup equipment of semiconductor chip and pickup method using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33746495A JPH09181150A (en) 1995-12-25 1995-12-25 Pickup equipment of semiconductor chip and pickup method using the same

Publications (1)

Publication Number Publication Date
JPH09181150A true JPH09181150A (en) 1997-07-11

Family

ID=18308894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33746495A Pending JPH09181150A (en) 1995-12-25 1995-12-25 Pickup equipment of semiconductor chip and pickup method using the same

Country Status (1)

Country Link
JP (1) JPH09181150A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
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EP0901154A2 (en) * 1997-09-04 1999-03-10 Hitachi, Ltd. Method and system for mounting semiconductor device, semiconductor device separating system, and method for fabricating IC card
US6774011B2 (en) 2000-08-04 2004-08-10 Kabushiki Kaisha Toshiba Chip pickup device and method of manufacturing semiconductor device
JP2008109119A (en) * 2006-09-29 2008-05-08 Toray Eng Co Ltd Pickup apparatus and pickup method
JP2009094539A (en) * 2009-01-21 2009-04-30 Disco Abrasive Syst Ltd Method of dividing and processing csp substrate
CN102044404A (en) * 2009-10-12 2011-05-04 桑迪士克股份有限公司 System for separating cut semiconductor bare chip from bare chip adhesive tape
KR101128093B1 (en) * 2007-08-14 2012-04-02 도쿄 세이미츄 코퍼레이션 리미티드 Wafer table, surface protection film removing apparatus and surface protection film removing method
JP2018501972A (en) * 2014-12-15 2018-01-25 ダブリュ.エル.ゴア アンド アソシエイツ,インコーポレイティドW.L. Gore & Associates, Incorporated Vent mounting system for microelectromechanical systems
JP2018026554A (en) * 2016-08-04 2018-02-15 日本ファインテック株式会社 Chip peeling device and chip peeling method
JP2019212801A (en) * 2018-06-06 2019-12-12 株式会社デンソー Semiconductor device and manufacturing method thereof
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US11488940B2 (en) 2015-03-20 2022-11-01 Rohinni, Inc. Method for transfer of semiconductor devices onto glass substrates
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Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0901154A2 (en) * 1997-09-04 1999-03-10 Hitachi, Ltd. Method and system for mounting semiconductor device, semiconductor device separating system, and method for fabricating IC card
EP0901154A3 (en) * 1997-09-04 2002-09-11 Hitachi, Ltd. Method and system for mounting semiconductor device, semiconductor device separating system, and method for fabricating IC card
US6629553B2 (en) 1997-09-04 2003-10-07 Hitachi, Ltd. Method and system for mounting semiconductor device, semiconductor device separating system, and method for fabricating IC card
US6774011B2 (en) 2000-08-04 2004-08-10 Kabushiki Kaisha Toshiba Chip pickup device and method of manufacturing semiconductor device
JP2008109119A (en) * 2006-09-29 2008-05-08 Toray Eng Co Ltd Pickup apparatus and pickup method
US8182632B2 (en) 2007-08-14 2012-05-22 Tokyo Seimitsu Co., Ltd. Wafer table, surface protective film peeling apparatus and surface protective film peeling method
KR101128093B1 (en) * 2007-08-14 2012-04-02 도쿄 세이미츄 코퍼레이션 리미티드 Wafer table, surface protection film removing apparatus and surface protection film removing method
JP2009094539A (en) * 2009-01-21 2009-04-30 Disco Abrasive Syst Ltd Method of dividing and processing csp substrate
CN102044404A (en) * 2009-10-12 2011-05-04 桑迪士克股份有限公司 System for separating cut semiconductor bare chip from bare chip adhesive tape
JP2018501972A (en) * 2014-12-15 2018-01-25 ダブリュ.エル.ゴア アンド アソシエイツ,インコーポレイティドW.L. Gore & Associates, Incorporated Vent mounting system for microelectromechanical systems
US11488940B2 (en) 2015-03-20 2022-11-01 Rohinni, Inc. Method for transfer of semiconductor devices onto glass substrates
US11515293B2 (en) 2015-03-20 2022-11-29 Rohinni, LLC Direct transfer of semiconductor devices from a substrate
US11562990B2 (en) 2015-03-20 2023-01-24 Rohinni, Inc. Systems for direct transfer of semiconductor device die
JP2018026554A (en) * 2016-08-04 2018-02-15 日本ファインテック株式会社 Chip peeling device and chip peeling method
JP2021523573A (en) * 2018-05-12 2021-09-02 ロヒンニ リミテッド ライアビリティ カンパニー Methods and Devices for Multiple Direct Transfers of Semiconductor Devices
JP2019212801A (en) * 2018-06-06 2019-12-12 株式会社デンソー Semiconductor device and manufacturing method thereof
US11728195B2 (en) 2018-09-28 2023-08-15 Rohinni, Inc. Apparatuses for executing a direct transfer of a semiconductor device die disposed on a first substrate to a second substrate

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