JPH0870092A - 絶縁性パッケージを有する半導体デバイス - Google Patents

絶縁性パッケージを有する半導体デバイス

Info

Publication number
JPH0870092A
JPH0870092A JP7224721A JP22472195A JPH0870092A JP H0870092 A JPH0870092 A JP H0870092A JP 7224721 A JP7224721 A JP 7224721A JP 22472195 A JP22472195 A JP 22472195A JP H0870092 A JPH0870092 A JP H0870092A
Authority
JP
Japan
Prior art keywords
package
wiring board
semiconductor device
semiconductor
wiring boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7224721A
Other languages
English (en)
Inventor
Alfons Dr Ing Graf
グラーフ アルフオンス
Peter Huber
フーバー ペーター
Schloegel Xaver
シユレーゲル クサーフアー
Peter Sommer
ゾンマー ペーター
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of JPH0870092A publication Critical patent/JPH0870092A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49575Assemblies of semiconductor devices on lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04042Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05553Shape in top view being rectangular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05599Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/0601Structure
    • H01L2224/0603Bonding areas having different sizes, e.g. different heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48472Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • H01L2224/49111Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49175Parallel arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01015Phosphorus [P]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/014Solder alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/925Bridge rectifier module

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Rectifiers (AREA)

Abstract

(57)【要約】 【目的】 半導体デバイスのブリッジ回路を僅かな経費
で形成することができるように改良する。 【構成】 絶縁性パッケージ40内に同一平面内に電気
的に互いに絶縁されている複数の配線板30、31、3
2を配設し、それらの配線板30、31、32上にそれ
ぞれブリッジ整流器の半導体スイッチ33〜36を導電
的に固定し、その際配線板30〜32及び端子導体1〜
24を1つの導体枠(リードフレーム)から切り抜いて
形成する。

Description

【発明の詳細な説明】
【0001】
【産業上の利用分野】本発明は、絶縁性パッケージ、こ
のパッケージ内に配設された薄板製配線板、配線板上に
導電的に固定されている少なくとも1つの半導体基体、
この半導体基体と導電的に接続されている薄板製端子導
体及び配線板と導電的に接続されている少なくとも1つ
の薄板製端子導体を有する半導体デバイスに関する。
【0002】
【従来の技術】このようなパッケージを有する半導体デ
バイスは公知である。このような外観のパッケージの優
れたものには例えばDIL(デュアル・イン・ライン=
Dual−in−Line)パッケージ又はP−DSO
(プラスチック・デュアル・スモール・アウトライン=
Plastick−Dual−Small−Outli
ne)パッケージがある。前者は通常の配線用に、後者
はプリント配線板の表面配線(SMD)に使用できるも
のである。これらのパッケージは薄板製の配線板並びに
薄板製の接続端子導体を含んでおり、配線板又は配線板
上に固定されているデバイスと電気的に接続されてい
る。配線板及び端子導体は1つの導体枠(リードフレー
ム)から切り抜いて形成されている。その際半導体デバ
イスが絶縁層によって配線板と電気的に絶縁されていな
いならば、配線板上に固定されている全てのデバイスが
同じ電位を有していることは欠点である。従ってブリッ
ジ回路を容易には形成することができない。
【0003】
【発明が解決しようとする課題】本発明の課題は、上述
の特徴を有する半導体デバイスのブリッジ回路を僅かな
経費で形成することができるように改良することにあ
る。
【0004】
【課題を解決するための手段】この課題は、パッケージ
が同一平面内にある電気的に互いに絶縁されている複数
の配線板を含んでおり、それらの配線板上にブリッジ整
流器の半導体スイッチが導電的に固定されていることに
より解決される。
【0005】
【実施例】本発明を実施例及び図面に基づき以下に詳述
する。
【0006】図1に基づくブリッジ整流器は全体として
絶縁されているプラスチック製パッケージ40に入れら
れている。パッケージ40の外形は破線により概略的に
示されている。この図のパッケージは符号1〜24を付
された24個の端子導体を有するP−DSO24型のも
のである。パッケージはそれぞれ端子導体10、12、
13、15又は4、9、16、21又は1、3、22、
24と接続されている3枚の配線板30、31、32を
含んでいる。配線板30、31、32上にはそれぞれ半
導体スイッチ33、34及び35、36が配設されてい
る。それらは配線板上に例えばろう付け又は導電性接着
剤により固着されており、そのため配線板と導電的に接
続されている。
【0007】半導体スイッチは配線板に面していない側
でボンド線37〜42によって配線板とは導電的に接続
されていない他の端子導体14、17〜20、23と接
続されている。
【0008】半導体スイッチは例えばMOSトランジス
タであってもよい。配線板30、32上にそれぞれ1個
のMOSトランジスタを、また配線板31上には2個の
MOSトランジスタを配設すれば、簡単な方法で制御さ
れる全波ブリッジを形成することができる。このような
全波ブリッジに関する結線図が図2に示されている。そ
の際図2の回路に相応する部分に図1の機械的に対応す
る部分と同じ符号が付されている。負荷の端子はA及び
Bと符号が付られており、同じ符号はそれぞれ端子3、
19、20又は14、17、18にも見られる。これら
の端子はそれぞれパッケージ内部のボンド線又はパッケ
ージの外側にある導体により互いに接続可能である。
【0009】ブリッジの上半分と下半分に同じチャネル
型のMOSFET、主としてnチャネルMOSFETを
使用する場合上記の全波ブリッジに対して3枚の配線板
が必要である。それというのもこれらの場合正の端子は
常にチップの裏側にあるからである。
【0010】半波ブリッジにはパッケージ内で電気的に
互いに絶縁されている2枚の配線板を備えることで十分
である。
【0011】単純な可制御スイッチの代わりに例えばス
イッチ34、35又は全てのスイッチ33〜36を制御
に必要な例えば過温度、スイッチの遮断、過電流の遮
断、状況報知のような機能を有するSMART−ICと
して形成してもよい。
【0012】配線板30、31、32は同一平面上にあ
り、1枚の薄板から成る導体系(リードフレーム)から
切り抜かれて形成されている。その際端子導体間にある
薄板のウェブは再プレス後に初めて除去される。その結
果直方体のパッケージから端子導体がパッケージの長手
方向に突き出すように形成される。
【図面の簡単な説明】
【図1】本発明によるブリッジ整流器の平面図。
【図2】図1のブリッジの結線図。
【符号の説明】
1〜24 端子導体 30〜32 配線板 33〜36 半導体スイッチ 37〜42 ボンド線
───────────────────────────────────────────────────── フロントページの続き (72)発明者 クサーフアー シユレーゲル ドイツ連邦共和国 83679 ザクセンカム ライフアイゼンシユトラーセ 22 (72)発明者 ペーター ゾンマー ドイツ連邦共和国 80804 ミユンヘン ケルナープラツツ 6

Claims (5)

    【特許請求の範囲】
  1. 【請求項1】 a)絶縁性パッケージ、 b)パッケージ内に配設された薄板製配線板、 c)配線板上に導電的に固定されている少なくとも1個
    の半導体基体、 d)この半導体基体と導電的に接続されている薄板製端
    子導体及び e)配線板と導電的に接続されている少なくとも1つの
    薄板製端子導体を有する半導体デバイスにおいて、パッ
    ケージ(40)が同一平面内にある電気的に互いに絶縁
    されている複数の配線板(30、31、32)を含んで
    おり、それらの配線板上にブリッジ整流器の半導体スイ
    ッチが導電的に固定されていることを特徴とする半導体
    デバイス。
  2. 【請求項2】 パッケージが2枚の配線板を有してお
    り、各々の配線板上に1個の半導体スイッチが配設され
    ていることを特徴とする請求項1記載の半導体デバイ
    ス。
  3. 【請求項3】 パッケージが3枚の配線板(30、3
    1、32)を有しており、1枚の配線板(31)には2
    個の半導体スイッチ(34、35)が、また他の2枚の
    配線板(30、32)にそれぞれ1個の半導体スイッチ
    (33、36)が配設されていることを特徴とする請求
    項1記載の半導体デバイス。
  4. 【請求項4】 配線板(30、31、32)及び端子導
    体(1〜24)が一つの導体枠から切り抜かれて形成さ
    れていることを特徴とする請求項1ないし3の1つに記
    載の半導体デバイス。
  5. 【請求項5】 パッケージ(40)が直方体をしてお
    り、端子導体(1〜24)が長手側にパッケージから突
    出していることを特徴とする請求項1ないし4の1つに
    記載の半導体デバイス。
JP7224721A 1994-08-12 1995-08-09 絶縁性パッケージを有する半導体デバイス Pending JPH0870092A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4428686 1994-08-12
DE4428686.4 1994-08-12

Publications (1)

Publication Number Publication Date
JPH0870092A true JPH0870092A (ja) 1996-03-12

Family

ID=6525599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7224721A Pending JPH0870092A (ja) 1994-08-12 1995-08-09 絶縁性パッケージを有する半導体デバイス

Country Status (4)

Country Link
US (1) US5821618A (ja)
EP (1) EP0696818B1 (ja)
JP (1) JPH0870092A (ja)
DE (1) DE59510918D1 (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1117100A (ja) * 1997-06-19 1999-01-22 Mitsubishi Electric Corp 半導体装置
DE19806817C1 (de) * 1998-02-18 1999-07-08 Siemens Ag EMV-optimierter Leistungsschalter
US5929520A (en) * 1998-03-10 1999-07-27 General Electric Company Circuit with small package for mosfets
US6054765A (en) * 1998-04-27 2000-04-25 Delco Electronics Corporation Parallel dual switch module
US6278199B1 (en) * 1999-02-25 2001-08-21 International Rectifier Corp. Electronic single switch module
JP4096831B2 (ja) * 2003-07-09 2008-06-04 日産自動車株式会社 半導体装置の実装構造
DE102006012007B4 (de) * 2005-03-16 2013-05-16 Infineon Technologies Ag Leistungshalbleitermodul mit oberflächenmontierbaren flachen Außenkontakten und Verfahren zur Herstellung desselben und dessen Verwendung
DE102006020243B3 (de) * 2006-04-27 2008-01-17 Infineon Technologies Austria Ag Leistungshalbleitermodul als H-Brückenschaltung und Verfahren zur Herstellung desselben
DE102006049949B3 (de) 2006-10-19 2008-05-15 Infineon Technologies Ag Halbleitermodul mit Halbleiterchips auf unterschiedlichen Versorgungspotentialen und Verfahren zur Herstelllung desselben
US7955901B2 (en) 2007-10-04 2011-06-07 Infineon Technologies Ag Method for producing a power semiconductor module comprising surface-mountable flat external contacts
US20090200864A1 (en) * 2008-02-12 2009-08-13 Josef Maier Chip on bus bar
DE102017202770B4 (de) 2016-08-31 2023-06-07 Infineon Technologies Austria Ag Halbleiterchipgehäuse mit einem sich wiederholenden Grundflächenmuster

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1047197A (ja) * 1964-10-14
JPS5621355A (en) * 1979-07-28 1981-02-27 Mitsubishi Electric Corp Semiconductor device
DE3106376A1 (de) * 1981-02-20 1982-09-09 Siemens AG, 1000 Berlin und 8000 München Halbleiteranordnung mit aus blech ausgeschnittenen anschlussleitern
JPS60250659A (ja) * 1984-05-25 1985-12-11 Mitsubishi Electric Corp 複合形半導体装置
JPS61225848A (ja) * 1985-03-30 1986-10-07 Toshiba Corp 半導体整流装置
JPH0740790B2 (ja) * 1987-02-23 1995-05-01 株式会社東芝 大電力パワ−モジユ−ル
JPH01289278A (ja) * 1988-05-17 1989-11-21 Mitsubishi Electric Corp 半導体集積回路
DE4031051C2 (de) * 1989-11-14 1997-05-07 Siemens Ag Modul mit mindestens einem Halbleiterschaltelement und einer Ansteuerschaltung
US5043859A (en) * 1989-12-21 1991-08-27 General Electric Company Half bridge device package, packaged devices and circuits
JP2708320B2 (ja) * 1992-04-17 1998-02-04 三菱電機株式会社 マルチチップ型半導体装置及びその製造方法
US5391919A (en) * 1993-10-22 1995-02-21 International Rectifier Corporation Semiconductor power module with identical mounting frames

Also Published As

Publication number Publication date
DE59510918D1 (de) 2004-08-12
EP0696818A3 (de) 1997-07-02
US5821618A (en) 1998-10-13
EP0696818B1 (de) 2004-07-07
EP0696818A2 (de) 1996-02-14

Similar Documents

Publication Publication Date Title
US4933741A (en) Multifunction ground plane
JP3051011B2 (ja) パワ−モジュ−ル
US7821128B2 (en) Power semiconductor device having lines within a housing
EP0996154A4 (en) SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD, CIRCUIT SUBSTRATE AND ELECTRONIC DEVICE
JPH0870092A (ja) 絶縁性パッケージを有する半導体デバイス
US4949220A (en) Hybrid IC with heat sink
KR920001689A (ko) 반도체장치 및 그 제조방법
TW408411B (en) Semiconductor chip scale package
JP3941266B2 (ja) 半導体パワーモジュール
JPH05304248A (ja) 半導体装置
JPH05198732A (ja) 集積回路モジュールの機能を変更する方法および装置
CN110476232B (zh) 双向开关和包括该开关的双向开关装置
CN102468262A (zh) 半导体装置
JPH04273150A (ja) 半導体装置
SE9202943L (sv) Förfarande vid montering på ett substrat av en TAB-krets, varvid TAB-strukturens anslutningar utgörs av ett elektriskt ledande anslutningsmönster som framställts på en filmremsa och vilket är anslutet till TAB-strukturens halvledarkretsbricka
CN100401510C (zh) 半导体装置、半导体主体及其制造方法
JPH04164384A (ja) 電力用混成集積回路
US6927969B2 (en) Circuit arrangement
US5982029A (en) Semiconductor component having upper and lower mounting plates
JPH06291251A (ja) 電力用半導体モジュール
KR970024055A (ko) 동시에 절단된 반도체 칩을 이용한 고밀도 실장형 패키지 및 그 제조 방법
KR100219473B1 (ko) 탭리드를 이용한 반도체 장치 및 그 실장방법
JPH10189809A (ja) 半導体パッケージ及びそれを用いた半導体装置
JPH04127563A (ja) 半導体装置用パッケージ
US9648776B2 (en) Electronic module, electronic system and method of manufacturing the same

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20040430

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20040513

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040728

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050120

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20050419

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20050425

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050715

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20050818