JPH08297292A - Cog system liquid crystal display panel - Google Patents
Cog system liquid crystal display panelInfo
- Publication number
- JPH08297292A JPH08297292A JP10129495A JP10129495A JPH08297292A JP H08297292 A JPH08297292 A JP H08297292A JP 10129495 A JP10129495 A JP 10129495A JP 10129495 A JP10129495 A JP 10129495A JP H08297292 A JPH08297292 A JP H08297292A
- Authority
- JP
- Japan
- Prior art keywords
- driving
- liquid crystal
- probe
- probing pad
- display panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Liquid Crystal (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は各駆動用ＩＣに対してプ
ロービングパッド列を有するＣＯＧ方式液晶表示パネル
に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a COG type liquid crystal display panel having a probing pad row for each driving IC.
【０００２】[0002]
【従来の技術】液晶表示パネルの一種に、ガラス基板上
に駆動用ＩＣを実装したチップオングラス（ＣＨＩＰ−
ＯＮ−ＧＬＡＳＳ、以下、ＣＯＧと略記する）方式の液
晶表示パネルがあり、すでに実用化されている。2. Description of the Related Art One type of liquid crystal display panel is a chip-on-glass (CHIP-type) in which a driving IC is mounted on a glass substrate.
There is an ON-GLASS (hereinafter abbreviated as COG) type liquid crystal display panel, which has already been put into practical use.
【０００３】図３はＣＯＧ方式の液晶表示パネル１の平
面図であり、図４は図３のＸ−Ｘ断面線による断面図で
ある。これらの図によれば、内面に透明電極２、３が形
成された走査側基板４と信号側基板５が対向して配置さ
れ、各透明電極２、３の上には配向膜（図示せず）を形
成して表示領域を成す。そして、両基板４、５はシール
剤６を介して固定され、さらにスペーサ７でもって基板
間隔を一定にしながら、両基板間の内部に液晶８を封入
している。また、走査側基板４の透明電極２はその端部
に印刷法にて設けたＡｇペースト９を介して信号側基板
５上の透明電極３に電気的導通するようになっている。
１０は駆動用ＩＣ、１１はフレキシブル印刷配線板から
成る信号の入力ケーブルである。さらにまた、信号側基
板５上に設けた透明電極３については、その非表示領域
にある透明電極３の上に金属層を形成し、これによって
高導電率の導電線３ａを構成し、これによって配線の抵
抗率を下げるようにしている。FIG. 3 is a plan view of the COG type liquid crystal display panel 1, and FIG. 4 is a sectional view taken along the line XX in FIG. According to these figures, the scanning side substrate 4 and the signal side substrate 5 having the transparent electrodes 2 and 3 formed on the inner surfaces thereof are arranged to face each other, and an alignment film (not shown) is provided on each transparent electrode 2 and 3. ) To form a display area. Both the substrates 4 and 5 are fixed via a sealant 6, and a liquid crystal 8 is sealed inside the both substrates with a spacer 7 keeping the substrate spacing constant. Further, the transparent electrode 2 of the scanning side substrate 4 is electrically connected to the transparent electrode 3 on the signal side substrate 5 through an Ag paste 9 provided on the end portion by a printing method.
Reference numeral 10 is a driving IC, and 11 is a signal input cable composed of a flexible printed wiring board. Furthermore, regarding the transparent electrode 3 provided on the signal-side substrate 5, a metal layer is formed on the transparent electrode 3 in the non-display area, whereby a conductive line 3a having a high conductivity is formed. The resistivity of the wiring is reduced.
【０００４】上記構成の液晶表示パネル１によれば、走
査側基板４と信号側基板５とを作製するに当たっては、
ガラス基板上に透明導電膜を一面に設け、その後にフォ
トエッチングによって所定形状の透明電極２、３を形成
する工程があり、この工程後に両透明電極２、３の導通
検査がおこなわれる。According to the liquid crystal display panel 1 having the above-described structure, when the scanning side substrate 4 and the signal side substrate 5 are manufactured,
There is a step of forming a transparent conductive film on one surface of a glass substrate and then forming the transparent electrodes 2 and 3 having a predetermined shape by photoetching. After this step, a continuity test of both transparent electrodes 2 and 3 is performed.
【０００５】信号側基板５を導通検査する場合を例とし
て図５により説明する。同図は信号側基板５の検査直前
の透明電極パターンを示す。表示領域内の各透明電極３
には、それぞれ対応して導電線３ａが接続され、これら
の端にはボンディングパッド部となるＩＣ出力線部１２
を成す。（ｎ−１）個の一群のＩＣ出力線部１２は、後
工程において、それぞれに対応する駆動用ＩＣ１０と接
続される。なお、図中の１３は駆動用ＩＣ搭載領域であ
る。An example of conducting the conduction inspection of the signal side substrate 5 will be described with reference to FIG. This figure shows the transparent electrode pattern immediately before the inspection of the signal side substrate 5. Each transparent electrode 3 in the display area
The conductive lines 3a are respectively connected to the IC output line parts 12 which serve as bonding pad parts at these ends.
To make. The group of (n-1) IC output line portions 12 is connected to the corresponding driving ICs 10 in a later step. Reference numeral 13 in the drawing is a drive IC mounting area.
【０００６】導通検査をおこなう場合には、ＩＣ出力線
部１２の個数と同じ本数（ｎ−１）に１本を加えた本
数、すなわちｎ本のプローブピン１４を設けたプローブ
１５を、各透明電極３に当て、次いでピン１４−１とピ
ン１４−２との間、ピン１４−２とピン１４−３との
間、．．．ピン１４−（ｎ−２）とピン１４−（ｎ−
１）との間、ピン１４−（ｎ−１）とピン１４−ｎとの
間の導通有無を検査する。When conducting the continuity inspection, each of the probes 15 provided with n probe pins 14 is added to the same number (n-1) as the number of the IC output line portions 12, that is, each transparent probe. Apply to electrode 3, then between pins 14-1 and 14-2, between pins 14-2 and 14-3 ,. ． ． Pin 14- (n-2) and Pin 14- (n-
1) and the presence or absence of conduction between the pin 14- (n-1) and the pin 14-n.
【０００７】このように、ある駆動用ＩＣ１０に対応す
る透明電極３の列の導通有無を検査した後に、プローブ
１５を隣の駆動用ＩＣ１０に対応する透明電極３の列に
移動させ、同様に導通有無を検査する。In this way, after inspecting the row of the transparent electrodes 3 corresponding to a certain driving IC 10 for conduction, the probe 15 is moved to the row of the transparent electrodes 3 corresponding to the adjacent driving IC 10 to conduct electricity in the same manner. Inspect for presence.
【０００８】[0008]
【発明が解決しようとする問題点】しかしながら、上述
したような導通検査によれば、透明電極３の配列の電極
間隔が、製品によって異なる場合には、その電極間隔に
応じて個別のプローブ１５を用意しなければならず、こ
れにより、プローブ１５の種類が多くなって工程数が増
大し、製造コストが上がるという問題点があった。However, according to the continuity test as described above, when the electrode spacing of the array of the transparent electrodes 3 differs depending on the product, the individual probes 15 are arranged according to the electrode spacing. There is a problem in that the number of types of the probe 15 is increased, the number of processes is increased, and the manufacturing cost is increased.
【０００９】したがって本発明は上記事情に鑑みて完成
されたものであって、その目的はプローブを用いた透明
電極の導通検査を容易にして、製造コストが低減できた
ＣＯＧ方式液晶表示パネルを提供することにある。Therefore, the present invention has been completed in view of the above circumstances, and an object thereof is to provide a COG type liquid crystal display panel which facilitates a continuity inspection of a transparent electrode using a probe and can reduce the manufacturing cost. To do.
【００１０】[0010]
【発明の構成】本発明のＣＯＧ方式液晶表示パネルは、
透明電極パターンと配向膜とを形成して成る一対の透明
基板を液晶層を介して貼り合わせて表示領域と成し、一
方の透明基板の非表示領域上に複数個の駆動用ＩＣを配
し、上記透明電極パターンを複数個の駆動用ＩＣの近傍
にまで延在して配線パターンを設けるとともに、配線パ
ターンには個々の駆動用ＩＣに対応してプロービングパ
ッド列を有し、かつ隣接する駆動用ＩＣのうち一方の駆
動用ＩＣにより電圧印加される透明電極を他方の駆動用
ＩＣのプロービングパッドに供したことを特徴とする。The COG type liquid crystal display panel of the present invention comprises:
A pair of transparent substrates formed by forming a transparent electrode pattern and an alignment film are bonded together via a liquid crystal layer to form a display area, and a plurality of driving ICs are arranged on the non-display area of one transparent substrate. A wiring pattern is provided by extending the transparent electrode pattern to the vicinity of a plurality of driving ICs, and the wiring pattern has a probing pad row corresponding to each driving IC The transparent electrode to which a voltage is applied by one of the driving ICs is used as a probing pad of the other driving IC.
【００１１】[0011]
【作用】上記構成のＣＯＧ方式液晶表示パネルにおいて
は、配線パターンには個々の駆動用ＩＣに対応してプロ
ービングパッド列を具備し、このプロービングパッド列
にプローブを当てることによって透明電極の導通検査を
おこなう構成であって、従来のようにプローブを透明電
極に直に当てないので、透明電極の配列の電極間隔が、
製品間で異なる場合であっても、その電極間隔に応じて
個別のプローブを用意する必要がない。In the COG type liquid crystal display panel having the above structure, the wiring pattern is provided with a probing pad row corresponding to each driving IC, and a probe is applied to the probing pad row to inspect the continuity of the transparent electrode. With this configuration, the probe is not directly applied to the transparent electrode as in the conventional case, so that the electrode spacing of the array of transparent electrodes is
Even when different products are used, it is not necessary to prepare individual probes according to the electrode spacing.
【００１２】さらに、上記プロービングパッド列におい
ては、隣接する駆動用ＩＣのうち、ある駆動用ＩＣによ
って電圧印加される透明電極を他方の駆動用ＩＣのプロ
ービングパッドに供したことによって、各プロービング
パッド列が離れていても、導通検査ができる。Further, in the above probing pad row, among the adjacent driving ICs, the transparent electrode to which a voltage is applied by a certain driving IC is provided to the probing pad of the other driving IC, so that each probing pad row is provided. Continuity test can be performed even if the points are far apart.
【００１３】[0013]
【実施例】以下、本発明のＣＯＧ方式液晶表示パネルを
詳述する。実施例のＣＯＧ方式液晶表示パネルによれ
ば、前記ＣＯＧ方式の液晶表示パネル１のうち非表示領
域にある導電線３ａの形状が異なっているが、それ以外
の構成は液晶表示パネル１と同一である。EXAMPLES The COG type liquid crystal display panel of the present invention will be described in detail below. According to the COG type liquid crystal display panel of the embodiment, the shape of the conductive line 3a in the non-display area of the COG type liquid crystal display panel 1 is different, but other configurations are the same as the liquid crystal display panel 1. is there.
【００１４】本例のＣＯＧ方式液晶表示パネルについて
も、走査側基板４と信号側基板５とを作製するに当たっ
ては、ガラス基板上に透明導電膜を一面に設け、次のフ
ォトエッチングによって所定形状の透明電極２、３を形
成する工程があり、この工程後に両透明電極２、３の導
通検査をおこなう。Also in the COG type liquid crystal display panel of this example, when the scanning side substrate 4 and the signal side substrate 5 are manufactured, a transparent conductive film is provided on one surface of a glass substrate, and a predetermined shape is formed by the next photoetching. There is a step of forming the transparent electrodes 2 and 3, and after this step, a continuity test of both transparent electrodes 2 and 3 is performed.
【００１５】図１は信号側基板５の検査直前の透明電極
パターンを示す。表示領域内の各透明電極３には、それ
ぞれ対応して導電線３ｂが接続され、これらの端にはボ
ンディングパッド部（ＩＣ出力線部）を構成するが、本
例においでは、このボンディングパッド部がプロービン
グパッド列１６を兼ねている。FIG. 1 shows the transparent electrode pattern immediately before the inspection of the signal side substrate 5. The conductive lines 3b are respectively connected to the respective transparent electrodes 3 in the display area, and bonding pads (IC output line parts) are formed at these ends. Also serves as the probing pad row 16.
【００１６】このプロービングパッド列１６は、（ｎ−
１）個の一群のＩＣ出力線部と、ｎ番目である１個のパ
ッドとから成り、（ｎ−１）個の一群のＩＣ出力線部
が、後工程において、駆動用ＩＣ１０と接続される。ま
た、ｎ番目のパッドと接続された透明電極は隣接する駆
動用ＩＣ１０における最初の一番目のＩＣ出力線部と接
続されている。なお、図中の１３は駆動用ＩＣ搭載領域
である。This probing pad row 16 has (n-
1) It is composed of a group of IC output line parts and one pad which is the n-th, and (n-1) group of IC output line parts is connected to the driving IC 10 in a later step. . The transparent electrode connected to the nth pad is connected to the first IC output line portion of the adjacent driving IC 10. Reference numeral 13 in the drawing is a drive IC mounting area.
【００１７】次に図２によって導通検査を説明する。ｎ
本のプローブピン１７を設けたプローブ１８を、ｎ個の
パッドのプロービングパッド列１６に当て、次いでピン
１７−１とピン１７−２との間、ピン１７−２とピン１
７−３との間、．．．ピン１７−（ｎ−２）とピン１７
−（ｎ−１）との間、ピン１７−（ｎ−１）とピン１７
−ｎとの間の導通有無を調べることによって、ある一個
の駆動用ＩＣ１０に対応する透明電極３の配列における
導通検査をおこなう。Next, the continuity test will be described with reference to FIG. n
A probe 18 provided with one probe pin 17 is applied to the probing pad row 16 of n pads, and then between the pins 17-1 and 17-2, between the pins 17-2 and 1
7-3 ,. ． ． Pin 17- (n-2) and pin 17
-(N-1), pin 17- (n-1) and pin 17
By checking the presence / absence of conduction with −n, a conduction test is performed on the array of the transparent electrodes 3 corresponding to one drive IC 10.
【００１８】次にプローブ１８もしくは信号側基板５を
移動させることによって、プローブ１８を隣の駆動用Ｉ
Ｃ１０に対応するプロービングパッド列１６に当て、同
様に導通有無を検査する。Next, the probe 18 or the signal side substrate 5 is moved to move the probe 18 to the adjacent drive I.
It is applied to the probing pad row 16 corresponding to C10, and the presence or absence of continuity is similarly inspected.
【００１９】かくして上記構成のＣＯＧ方式液晶表示パ
ネルにおいては、導電線３ｂには個々の駆動用ＩＣに対
応したプロービングパッド列１６を形成し、プロービン
グパッド列１６にプローブ１８を当てることによって透
明電極３の導通検査をおこなうことができる。そして、
このプロービングパッド列１６においては、隣接する駆
動用ＩＣのうち、ある駆動用ＩＣによって電圧印加され
る透明電極３を他方の駆動用ＩＣのプロービングパッド
列１６に供したことによって、各プロービングパッド列
１６が離れていても、導通検査ができるようになってい
る。Thus, in the COG type liquid crystal display panel having the above-mentioned structure, the probing pad row 16 corresponding to each driving IC is formed on the conductive line 3b, and the probe 18 is applied to the probing pad row 16 so that the transparent electrode 3 is formed. The continuity test of can be performed. And
In this probing pad row 16, among the adjacent driving ICs, the transparent electrode 3 to which a voltage is applied by a certain driving IC is provided to the probing pad row 16 of the other driving IC, so that each probing pad row 16 is provided. The continuity test can be performed even if the points are far apart.
【００２０】したがって、透明電極３の配列の電極間隔
が、製品間で異なる場合であっても、その電極間隔に応
じて個別のプローブを用意する必要がなくなった。Therefore, even if the electrode spacing of the array of the transparent electrodes 3 differs between products, it is not necessary to prepare individual probes according to the electrode spacing.
【００２１】なお、本発明は上記実施例のような液晶パ
ネルに限定されるものではなく、本発明の要旨を逸脱し
ない範囲内で種々の変更や改良などは何ら差し支えな
い。The present invention is not limited to the liquid crystal panel as in the above embodiment, and various modifications and improvements may be made without departing from the scope of the present invention.
【００２２】[0022]
【発明の効果】以上の通り、本発明のＣＯＧ方式液晶表
示パネルにおいては、配線パターンには個々の駆動用Ｉ
Ｃに対応してプロービングパッド列を具備し、このプロ
ービングパッド列にプローブを当てることによって透明
電極の導通検査をおこない、さらに上記プロービングパ
ッド列においては、隣接する駆動用ＩＣのうち、ある駆
動用ＩＣによって電圧印加される透明電極を他方の駆動
用ＩＣのプロービングパッドに供した構成であり、この
ような構成によれば、各プロービングパッド列が離れて
いても、導通検査ができ、そして、従来のようにプロー
ブを透明電極に直に当てないので、透明電極の配列の電
極間隔が、製品間で異なる場合であっても、その電極間
隔に応じて個別のプローブを用意する必要がなく、その
結果、プローブを用いた透明電極の導通検査を容易にし
て、製造コストが低減できたＣＯＧ方式液晶表示パネル
が提供できる。As described above, in the COG type liquid crystal display panel of the present invention, the wiring pattern has individual driving I.
A probing pad row corresponding to C is provided, and a probe is applied to the probing pad row to conduct a continuity test of the transparent electrode. Further, in the probing pad row, a driving IC among adjacent driving ICs is provided. The transparent electrode to which a voltage is applied is provided to the probing pad of the other driving IC. According to such a configuration, the continuity test can be performed even if the probing pad rows are separated from each other. Since the probe is not directly applied to the transparent electrode like this, even if the electrode spacing of the array of transparent electrodes differs between products, it is not necessary to prepare individual probes according to the electrode spacing, and as a result Thus, it is possible to provide a COG liquid crystal display panel in which the manufacturing cost can be reduced by facilitating the conduction test of the transparent electrode using the probe.
【図１】実施例の液晶表示パネルにおける基板の透明電
極パターンを示す説明図である。FIG. 1 is an explanatory diagram showing a transparent electrode pattern of a substrate in a liquid crystal display panel of an example.
【図２】図１の透明電極パターンに対する導通検査を示
す説明図である。FIG. 2 is an explanatory diagram showing a continuity test for the transparent electrode pattern of FIG.
【図３】液晶表示パネルの平面図である。FIG. 3 is a plan view of a liquid crystal display panel.
【図４】図３のＸ−Ｘ断面線による断面図である。4 is a sectional view taken along line XX in FIG.
【図５】従来における透明電極パターンに対する導通検
査を示す説明図である。FIG. 5 is an explanatory diagram showing a conventional continuity test for a transparent electrode pattern.
１ 液晶表示パネル ２、３ 透明電極 ４ 走査側基板 ５ 信号側基板 ８ 液晶 １０ 駆動用ＩＣ ３ａ、３ｂ 導電線 １２ ＩＣ出力線部 １３ 駆動用ＩＣ搭載領域 １４、１７ プローブピン １５、１８ プローブ １６ プロービングパッド列 DESCRIPTION OF SYMBOLS 1 Liquid crystal display panel 2, 3 Transparent electrode 4 Scanning side substrate 5 Signal side substrate 8 Liquid crystal 10 Driving IC 3a, 3b Conductive wire 12 IC output line part 13 Driving IC mounting area 14, 17 Probe pin 15, 18 Probe 16 Probing Pad row
Claims (1)
成る一対の透明基板を液晶層を介して貼り合わせて表示
領域と成し、一方の透明基板の非表示領域上に複数個の
駆動用ＩＣを配し、上記透明電極パターンを複数個の駆
動用ＩＣの近傍にまで延在して配線パターンを設けると
ともに、該配線パターンには個々の駆動用ＩＣに対応し
てプロービングパッド列を有し、かつ隣接する駆動用Ｉ
Ｃのうち一方の駆動用ＩＣにより電圧印加される透明電
極を他方の駆動用ＩＣのプロービングパッドに供したこ
とを特徴とするＣＯＧ方式液晶表示パネル。1. A pair of transparent substrates, each having a transparent electrode pattern and an alignment film formed thereon, are bonded together via a liquid crystal layer to form a display region, and a plurality of driving electrodes are provided on a non-display region of one transparent substrate. ICs are arranged, the transparent electrode pattern is extended to the vicinity of a plurality of driving ICs to provide a wiring pattern, and the wiring pattern has a probing pad row corresponding to each driving IC. And adjacent drive I
A COG liquid crystal display panel, wherein a transparent electrode to which a voltage is applied by one of the driving ICs of C is provided to a probing pad of the other driving IC.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10129495A JP3217639B2 (en) | 1995-04-25 | 1995-04-25 | COG LCD panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10129495A JP3217639B2 (en) | 1995-04-25 | 1995-04-25 | COG LCD panel |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08297292A true JPH08297292A (en) | 1996-11-12 |
| JP3217639B2 JP3217639B2 (en) | 2001-10-09 |
Family
ID=14296826
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10129495A Expired - Fee Related JP3217639B2 (en) | 1995-04-25 | 1995-04-25 | COG LCD panel |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3217639B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| JP2007278943A (en) * | 2006-04-10 | 2007-10-25 | Nippon Electric Glass Co Ltd | Method and apparatus for inspecting substrate, and method and apparatus for repairing substrate |
| KR101016576B1 (en) * | 2003-12-24 | 2011-02-22 | 삼성전자주식회사 | Thin Film Transistor Substrate |
-
1995
- 1995-04-25 JP JP10129495A patent/JP3217639B2/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| KR101016576B1 (en) * | 2003-12-24 | 2011-02-22 | 삼성전자주식회사 | Thin Film Transistor Substrate |
| JP2007278943A (en) * | 2006-04-10 | 2007-10-25 | Nippon Electric Glass Co Ltd | Method and apparatus for inspecting substrate, and method and apparatus for repairing substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3217639B2 (en) | 2001-10-09 |
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