JPH0743326A - Sample holder for coefficient-of-thermal expansion measuring apparatus - Google Patents
Sample holder for coefficient-of-thermal expansion measuring apparatusInfo
- Publication number
- JPH0743326A JPH0743326A JP5186194A JP18619493A JPH0743326A JP H0743326 A JPH0743326 A JP H0743326A JP 5186194 A JP5186194 A JP 5186194A JP 18619493 A JP18619493 A JP 18619493A JP H0743326 A JPH0743326 A JP H0743326A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- thin plate
- thermal expansion
- coefficient
- holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は主に金属、セラミック等
の薄板試料の熱間線膨張率（以下単に、熱膨張率とい
う）を測定する接触式又は非接触式熱膨張率測定に使用
する試料ホルダーに関する。BACKGROUND OF THE INVENTION The present invention is mainly used for contact type or non-contact type thermal expansion coefficient measurement for measuring the hot linear expansion coefficient (hereinafter, simply referred to as the thermal expansion coefficient) of a thin plate sample such as metal or ceramic. Regarding sample holder.
【０００２】[0002]
【従来の技術】電子、半導体材料等に使用される薄板状
の金属、セラミック、ガラスまたはこれら複合材料にと
って熱膨張特性を予じめ知見することは欠くことのでき
ないものである。2. Description of the Related Art It is indispensable to predict the thermal expansion characteristics of thin plate metals, ceramics, glass or composite materials used for electronic or semiconductor materials.
【０００３】従来、熱膨張率測定は、ＪＩＳ Ｒ ２６
１７及びＲ ２２０７で規定されている如く接触式又は
非接触の方式で測定されており、接触式は、加熱炉内に
設置した試料受台に載せた試料に変位検出棒あるいは管
を接触させ、これにより試料の膨張収縮を検知し、この
変位をダイヤルゲージにより、読み取るか差動変圧器式
変位測定器等により読み取るか、又は記録計に記録し、
測定後曲線より変位を読み取り膨張率を計算するのが一
般的であった。Conventionally, the coefficient of thermal expansion is measured according to JIS R 26.
17 and R 2207 are measured by a contact type or a non-contact type. In the contact type, a displacement detection rod or a tube is brought into contact with a sample placed on a sample holder installed in a heating furnace. Detecting the expansion and contraction of the sample by this, read this displacement with a dial gauge, a differential transformer type displacement measuring device, etc., or record it in a recorder,
After the measurement, the displacement was generally read from the curve to calculate the expansion coefficient.
【０００４】しかし、この方法は、試料に検出棒を接触
させて測定圧を加えるため、高温で軟化状態を示す試料
の場合測定圧による圧縮力により、試料自体が変形し、
真の膨張率を測定することが困難である。また、この場
合、試料受台と変位検出棒の膨張量の相違による補正を
要する場合が多く、これが誤差の原因になっていた。However, in this method, since the measuring rod is brought into contact with the sample to apply the measuring pressure, in the case of a sample showing a softened state at high temperature, the sample itself is deformed by the compressive force due to the measuring pressure,
It is difficult to measure the true expansion coefficient. Further, in this case, correction is often required due to the difference in expansion amount between the sample pedestal and the displacement detection rod, which causes an error.
【０００５】従って測定試料に非接触で測定する方法が
採用されているのが現状である。非接触で測定する方法
としては、加熱炉中に設置した試料の両端の変位を目盛
付望遠鏡により、人為的に読み取るものがある。この非
接触方式では試料受台にスリッド状の溝を設け、この溝
に試料を配設して測定している。Therefore, under the present circumstances, a method of non-contact measurement with a measurement sample is adopted. As a non-contact measurement method, there is a method in which the displacement at both ends of a sample placed in a heating furnace is artificially read by a graduated telescope. In this non-contact method, a slit-like groove is provided on the sample holder, and the sample is arranged in this groove for measurement.
【０００６】[0006]
【発明が解決しようとする課題】図１７図示のように試
料をセットし、試料下部のみ遊嵌状に支持された状態で
は昇温すると試料が残留応力等の影響で歪を生じ、湾曲
して試料寸法が変化するため、真の膨張率が測定できな
いという問題があった。When the sample is set as shown in FIG. 17 and the temperature is raised with only the lower part of the sample being supported by loose fitting, the sample is distorted due to the effect of residual stress and is bent. Since the sample size changes, there is a problem that the true expansion coefficient cannot be measured.
【０００７】本発明は前述した従来方式に鑑み、測定中
に薄板試料が湾曲しにくい試料ホルダーとすることによ
り高精度でかつ容易に測定できる試料ホルダーを提供す
ることを目的とする。In view of the above-mentioned conventional method, it is an object of the present invention to provide a sample holder which is highly accurate and can be easily measured by using a sample holder in which a thin plate sample is unlikely to bend during measurement.
【０００８】[0008]
【課題を解決するための手段】本発明者等は前述のよう
な従来方式の諸問題点を解決するために、種々検討、実
験の結果本発明を開発したものであり、本発明の技術的
構成は、金属、セラミック等の薄板試料の熱膨張率を測
定する装置に用いる試料ホルダーにおいて、該薄板試料
を遊嵌状に挾持する２分割型の試料ガイドからなること
を特徴とする熱膨張率測定装置用試料ホルダーにあり、
該２分割型の試料ガイドが何れもその断面形状が半円形
又は多角形でよく、また、該薄板試料の両側全面又は両
側の上下面又は両側の前後両端面を、遊嵌状に挾持する
２分割型の一対の試料ガイドでもよく、更に本発明は、
金属、セラミック等の薄板試料の熱膨張率を測定する装
置に用いる試料ホルダーにおいて、該ホルダーが断面円
柱状又は多角形状であり、薄板試料を遊嵌状に埋設支持
し得る溝を円柱状又は多角形状ホルダーの軸方向に穿設
し、該溝の両端部が開放状であることを特徴とする熱膨
張率測定用一体形試料ホルダーからもなり、この発明の
試料ホルダーは、該薄板試料の両側面全面又は両側の上
下面又は両側の前後両端面を、遊嵌状に挾持する一体状
の枠形試料ガイドとすることができる。The inventors of the present invention have developed the present invention as a result of various studies and experiments in order to solve the problems of the conventional method as described above. The structure is such that, in a sample holder used in an apparatus for measuring the coefficient of thermal expansion of a thin plate sample such as metal or ceramic, the sample holder is a two-division type sample guide that holds the thin plate sample in a loose fit shape. On the sample holder for the measuring device,
Each of the two-divided sample guides may have a semicircular or polygonal cross-sectional shape, and holds the entire thin plate sample on both sides, both upper and lower surfaces, or both front and rear end surfaces in a loose fit. A pair of split type sample guides may be used, and the present invention further
In a sample holder used in a device for measuring the coefficient of thermal expansion of a thin plate sample of metal, ceramic, etc., the holder has a columnar or polygonal cross section, and a groove capable of embedding and supporting the thin plate sample in a loose fitting shape is cylindrical or polygonal. The shape holder also comprises an integral type sample holder for measuring the coefficient of thermal expansion, characterized in that both ends of the groove are open, and the sample holder of the present invention is provided on both sides of the thin plate sample. The entire surface, the upper and lower surfaces on both sides, or both front and rear end surfaces on both sides can be used as an integral frame-shaped sample guide that is held by a loose fit.
【０００９】前述の如き技術的構成とすることにより、
本発明では、従来方式より高精度の測定が可能となり、
従来全く測定不可能の０．１ｍｍ厚さ以下の薄板試料も
容易に精度よく、測定でき、更に加工時に歪を生じ湾曲
した試料も本発明ホルダーの使用により緩かに拘束され
るため、歪が矯正され、精度よく測定できる等種々の作
用、効果を達成しうる。By adopting the technical structure as described above,
In the present invention, it is possible to measure with higher accuracy than the conventional method,
A thin plate sample having a thickness of 0.1 mm or less, which cannot be measured at all in the past, can be easily and accurately measured, and a curved sample that is distorted during processing is loosely restrained by the use of the holder of the present invention. It is possible to achieve various actions and effects such as being corrected and being able to measure accurately.
【００１０】本発明の種々の具体例を示す添付図面に基
づいて詳細に説明する。A detailed description will be given with reference to the accompanying drawings showing various embodiments of the present invention.
【００１１】図１及び図２は本発明の一例を示し、図２
は図１のII−II線に沿った断面図である。図において、
１，１′は断面が半円柱状の試料ガイドであり、３は前
記両者の接合面間に配設するスペーサー、４はスペーサ
ー配設位置に設ける組立ネジ、５は熱膨張率を測定しよ
うとする試料である。1 and 2 show an example of the present invention.
FIG. 2 is a sectional view taken along line II-II in FIG. 1. In the figure,
1, 1'is a sample guide having a semi-cylindrical cross section, 3 is a spacer provided between the joining surfaces of the two, 4 is an assembly screw provided at the spacer installation position, and 5 is an attempt to measure the coefficient of thermal expansion. It is a sample that does.
【００１２】試料ガイド１，１′は図１に示す如く試料
の厚さを考慮して試料が遊嵌状となるようにスペーサー
３の厚さを選ぶこととなる。In the sample guides 1, 1 ', the thickness of the spacer 3 is selected so that the sample is loosely fitted in consideration of the thickness of the sample as shown in FIG.
【００１３】試料を遊嵌状に保持する間隙範囲は、試料
厚さの１１０〜２００％が好ましく、２００％を超える
と試料の変形が抑制されず測定精度が低下し、１１０％
未満では試料の膨張、収縮による動きを拘束し、正確な
熱膨張が測定できない。The gap range for holding the sample in a loose-fitting state is preferably 110 to 200% of the sample thickness, and if it exceeds 200%, the deformation of the sample is not suppressed and the measurement accuracy is lowered to 110%.
If it is less than the range, the movement of the sample due to expansion and contraction is restricted, and accurate thermal expansion cannot be measured.
【００１４】図３及び図４は本発明の他の例を示し、図
３は図４の左側端面図、図４は図３の縦断面図であり、
試料５の膨張収縮変位伝達用の押棒６を付設した例を示
し、前述の例と同一符号は同一部材を示す。3 and 4 show another example of the present invention. FIG. 3 is a left end view of FIG. 4, and FIG. 4 is a vertical sectional view of FIG.
An example in which a push rod 6 for transmitting the expansion / contraction displacement of the sample 5 is attached is shown, and the same reference numerals as those in the above-mentioned examples indicate the same members.
【００１５】図５及び図６は一対の試料ガイド１をスリ
ーブ７内に挿入、保持し、しかも試料５を遊嵌状に保持
する例を示し、図６は図５VI−VI線の縦断面図であり、
その他の符号は前述の例と同一部材を示す。FIGS. 5 and 6 show an example in which the pair of sample guides 1 are inserted and held in the sleeve 7, and the sample 5 is held in a loose fit state, and FIG. 6 is a vertical sectional view taken along line VI-VI of FIG. And
Other reference numerals indicate the same members as those in the above-mentioned example.
【００１６】以上詳記した具体例は主として接触式熱膨
張率測定装置に用いられる試料ホルダーの例であるが、
非接触式熱膨張率測定装置用の試料ホルダーの具体例を
詳述する。The specific examples described in detail above are examples of the sample holder mainly used in the contact type thermal expansion coefficient measuring device.
A specific example of the sample holder for the non-contact type thermal expansion coefficient measuring device will be described in detail.
【００１７】図７は一対の断面Ｌ形の試料ガイドの組立
体端面であり、該Ｌ形試料ガイド８及び８′の長辺側間
に試料５を挾持、保持する（ブックエンドで書籍を挾持
するように）型式のものであり、一対の試料ガイド８及
び８′間の間隔は、前述の場合と同様に試料の膨張、収
縮による動きを拘束せず、また湾曲等の変形を抑制する
ようにスペーサー３を用いて遊嵌状態として挾持、保持
するものである。FIG. 7 shows an end face of an assembly of a pair of L-shaped sample guides, which holds and holds the sample 5 between the long sides of the L-shaped sample guides 8 and 8 '(holding the book at the book end. As described above, the distance between the pair of sample guides 8 and 8'is such that the movement due to the expansion and contraction of the sample is not restricted and the deformation such as bending is suppressed. The spacers 3 are used to hold and hold them in a loosely fitted state.
【００１８】図８は図７の試料ガイドの間隙の両端面間
にスペーサー３を配設した例を示し、図９は試料ガイド
８及び８′の長辺側の両側に対応して連通する窓１８を
設け、図示の如く試料５の両端面を測定可能なように露
出する構成とし、図１０に示す例はスペーサー３の配置
を両試料ガイドの上下及び左右のそれぞれの端面のみと
し、試料５の両端部を試料ガイド組立体の両端部より突
出させる構成とする例を示す正面図である。FIG. 8 shows an example in which a spacer 3 is arranged between both end faces of the gap of the sample guide of FIG. 7, and FIG. 9 shows a window communicating with the both sides of the long sides of the sample guides 8 and 8 '. 18, the both end surfaces of the sample 5 are exposed so that they can be measured as shown in the figure. In the example shown in FIG. 10, the spacer 3 is arranged only on the upper and lower end surfaces of both sample guides, respectively. FIG. 7 is a front view showing an example in which both ends of the above are projected from both ends of the sample guide assembly.
【００１９】図１１は試料ホルダー８，８′の変形例の
端面図であり、断面三角形の試料ガイド８，８′の各１
面間に試料５を挾持、保持し、試料ガイド台９に設けた
凹所内に嵌合、配置し、試料ガイド８、８′のクサビ作
用により試料をゆるやかに拘束、支持するものである。
なお、図１１の例では試料ガイド８，８′を三角形とし
たが、その他の多角形又は半円柱状としてもよい。FIG. 11 is an end view of a modified example of the sample holders 8 and 8 ', each one of the sample guides 8 and 8'having a triangular cross section.
The sample 5 is held and held between the surfaces, fitted and arranged in a recess provided in the sample guide base 9, and the sample is gently restrained and supported by the wedge action of the sample guides 8 and 8 '.
Although the sample guides 8 and 8'are triangular in the example of FIG. 11, they may be polygonal or semi-cylindrical.
【００２０】図１２は試料ガイド１を一体型円柱体と
し、試料支持用溝１０を設け、該溝１０内に遊嵌状に試
料を保持する機構の斜視図である。図１２では円柱状一
体型としてあるが、多角形一体型としてもよい。FIG. 12 is a perspective view of a mechanism in which the sample guide 1 is an integral columnar body, a sample supporting groove 10 is provided, and the sample is held in the groove 10 in a loosely fitted manner. In FIG. 12, it is a cylindrical integral type, but it may be a polygonal integral type.
【００２１】図１３〜図１６分割型枠形の試料ガイドの
数例を示す何れも斜視図であって、図１３はほゞ２分割
型の試料ガイド８，８′からなり、試料５を図示のよう
に挾持、支持する機構であり、図１４及び図１５は図１
３の変形例である。図１６は一体枠形の支持ホルダーを
示し、前述の例と同一符号は同一部材を示す。なお、こ
れら変形例でも必要に応じスペーサーを用いることがで
きる。FIGS. 13 to 16 are perspective views showing several examples of split mold-shaped sample guides, and FIG. 13 shows a sample 5 shown in FIG. It is a mechanism for holding and supporting like FIG. 14 and FIG.
It is a modification of No. 3. FIG. 16 shows a support holder having an integral frame shape, and the same reference numerals as those in the above-mentioned examples indicate the same members. In addition, also in these modified examples, a spacer can be used if necessary.
【００２２】本発明の試料ホルダーの材質は金属、セラ
ミック又は黒鉛等であり、測定温度、雰囲気等の測定機
構に応じて使い分ける。The material of the sample holder of the present invention is metal, ceramic, graphite or the like, which is used properly according to the measuring mechanism such as measuring temperature and atmosphere.
【００２３】試料の巾は試料ガイドの内部空間窓の上下
巾以上が必要で、また試料の長さは試料ガイドの内部空
間窓の左右巾より短く、かつ、光学的に試料側端部のエ
ッヂが確認できるようになっていなければならない。The width of the sample needs to be equal to or more than the vertical width of the internal space window of the sample guide, the length of the sample is shorter than the horizontal width of the internal space window of the sample guide, and the edge of the sample side end is optically. Must be confirmed.
【００２４】前述の如き機構の本発明試料ホルダーに試
料をセットし、接触式膨張計又は非接触式膨張計の加熱
炉の均熱帯に装着し、試料の端部の変化を差動変圧器式
変位測定器又は非接触式寸法測定器で測定する。上記非
接触式膨張計は例えば本出願人がさきに提案した特開昭
６１−７４５２号公報又は特開平３−７７０５３号公報
に開示された変位測定装置が好適である。The sample is set in the sample holder of the present invention having the above-mentioned mechanism and mounted on the soaking zone of the heating furnace of the contact type dilatometer or the non-contact type dilatometer, and the change of the end of the sample is changed by the differential transformer type. Measure with a displacement measuring instrument or non-contact type dimension measuring instrument. As the non-contact type dilatometer, for example, the displacement measuring device disclosed in Japanese Patent Application Laid-Open No. 61-7452 or Japanese Patent Application Laid-Open No. 3-77053 previously proposed by the present applicant is suitable.
【００２５】[0025]
【実施例１】図２の試料ホルダーで、試料ガイド１をス
テンレスで長さ４９ｍｍとし、０．１５ｍｍ厚さのスペ
ーサー３を使い、ステンレスで厚さ０．１ｍｍ、幅８ｍ
ｍ、長さ５０ｍｍの試料を遊嵌状態にしたものを、接触
式熱膨張率測定装置にセットして、無酸化雰囲気下で毎
分４℃で８００℃まで熱膨張率を測定した。その結果従
来は測定できなかったものが正確に測定できた。Example 1 In the sample holder of FIG. 2, the sample guide 1 is made of stainless steel and has a length of 49 mm, and a spacer 3 having a thickness of 0.15 mm is used. The stainless steel has a thickness of 0.1 mm and a width of 8 m.
A sample having a length of 50 mm and a length of 50 mm was loosely fitted to the contact type thermal expansion coefficient measuring device, and the coefficient of thermal expansion was measured at 4 ° C./min up to 800 ° C. in a non-oxidizing atmosphere. As a result, what could not be measured conventionally could be measured accurately.
【００２６】[0026]
【実施例２】図６の試料ホルダーの試料ガイド基台６及
び試料ガイド１をステンレス製の一体構造とし、内部空
間開口部を高さ６ｍｍ、幅５０ｍｍにしたものを０．１
ｍｍのスペーサーを用いて、厚さ０．０７５ｍｍ×幅１
０ｍｍ×長さ４０ｍｍの特殊鋼の薄板試料を遊嵌状態に
セットし、レーザによる非接触式熱膨張率測定装置を使
い無酸化雰囲気とし、毎分５℃で８００℃まで熱膨張率
を測定した。その結果試料の変形もなく正確な測定がで
きた。[Embodiment 2] The sample guide base 6 and the sample guide 1 of the sample holder shown in FIG. 6 are made of stainless steel and have an internal space opening of 6 mm in height and 50 mm in width.
mm spacer, thickness 0.075 mm x width 1
A thin steel plate sample of 0 mm × length 40 mm was set in a loosely fitted state, and the thermal expansion coefficient was measured up to 800 ° C. at 5 ° C./min in a non-oxidizing atmosphere using a non-contact type thermal expansion coefficient measuring device using a laser. . As a result, accurate measurement was possible without deformation of the sample.
【００２７】[0027]
【発明の効果】本発明の試料ホルダーを使用すること
で、従来の試料ホルダーでは精度良く測定できなかった
厚さ０．５ｍｍ程度の試料を高精度（正確）の測定がで
きるようになる。By using the sample holder of the present invention, it becomes possible to perform highly accurate (accurate) measurement of a sample having a thickness of about 0.5 mm, which could not be accurately measured by the conventional sample holder.
【００２８】また従来全く測定できなかった０．１ｍｍ
厚さ以下の試料も容易に精度良く測定できる。また加工
時に歪を生じ、湾曲した試料も本発明の試料ホルダーを
使うことで、緩かに拘束されるため歪が矯正され精度良
く測定できる。In addition, 0.1 mm which could not be measured at all in the past
It is possible to easily and accurately measure a sample having a thickness or less. Further, the sample holder of the present invention is used to restrain even a curved sample that is distorted during processing, so that the strain can be corrected and measured accurately.
【図１】本発明の一例を示す断面図FIG. 1 is a sectional view showing an example of the present invention.
【図２】図１のII−II線に沿った断面図FIG. 2 is a sectional view taken along line II-II in FIG.
【図３】本発明の他の例を示す端面図FIG. 3 is an end view showing another example of the present invention.
【図４】図３の縦断面図FIG. 4 is a vertical sectional view of FIG.
【図５】一対の試料ガイドをスリーブ内に保持した本発
明の他の例FIG. 5 is another example of the present invention in which a pair of sample guides are held in a sleeve.
【図６】図５のVI−VI線の縦断面図6 is a vertical sectional view taken along line VI-VI of FIG.
【図７】本発明の別の例で、一対の断面Ｌ形の試料ガイ
ドFIG. 7 is another example of the present invention, which is a pair of L-shaped sample guides in cross section.
【図８】図７と類似の例でスペーサーを有する側面図FIG. 8 is a side view with a spacer in an example similar to FIG.
【図９】Ｌ字形試料ガイドに窓を設けた例の側面図FIG. 9 is a side view of an example in which a window is provided on the L-shaped sample guide.
【図１０】スペーサーの配置の変形例を示す側面図FIG. 10 is a side view showing a modification of the arrangement of spacers.
【図１１】断面三角形の試料ガイドの端面図FIG. 11 is an end view of a sample guide having a triangular cross section.
【図１２】一体型円柱体の試料ガイドの斜視図FIG. 12 is a perspective view of an integral cylindrical sample guide.
【図１３】分割型枠形の試料ガイドの例の端面斜視図FIG. 13 is an end perspective view of an example of a split formwork sample guide.
【図１４】分割型枠形の試料ガイドの例の端面斜視図FIG. 14 is an end perspective view of an example of a split formwork sample guide.
【図１５】分割型枠形の試料ガイドの例の端面斜視図FIG. 15 is an end perspective view of an example of a split formwork sample guide.
【図１６】一体型枠形の試料ガイドの例の端面斜視図FIG. 16 is an end perspective view of an example of an integral frame-shaped sample guide.
【図１７】従来の試料ホルダーの斜視図FIG. 17 is a perspective view of a conventional sample holder.
１，１′ 試料ガイド ３ スペーサー ４ 組立ネジ ５ 試料 ６ 押棒 ７ スリーブ ８ Ｌ形試料ガイド ８′ Ｌ形試料ガイド ９ 試料ガイド台 １０ 試料支持用溝 1, 1'Sample guide 3 Spacer 4 Assembly screw 5 Sample 6 Push rod 7 Sleeve 8 L-shaped sample guide 8'L-shaped sample guide 9 Sample guide stand 10 Sample support groove
Claims (5)
率を測定する装置に用いる試料ホルダーにおいて、該薄
板試料を遊嵌状に挾持する２分割型の試料ガイドからな
ることを特徴とする熱膨張率測定装置用試料ホルダー。1. A sample holder used in a device for measuring the coefficient of thermal expansion of a thin plate sample such as metal or ceramic, comprising a two-division type sample guide for holding the thin plate sample in a loose fit shape. Sample holder for expansion coefficient measuring device.
断面形状が半円形又は多角形である請求項１記載の熱膨
張率測定装置用試料ホルダー。2. The sample holder for a thermal expansion coefficient measuring device according to claim 1, wherein each of the two-divided sample guides has a semicircular or polygonal cross-sectional shape.
率を測定する装置に用いる試料ホルダーにおいて、該薄
板試料の両側全面又は両側の上下面又は両側の前後両端
面を、遊嵌状に挾持する２分割型の一対の試料ガイドか
らなることを特徴とする熱膨張率測定装置用試料ホルダ
ー。3. A sample holder for use in an apparatus for measuring the coefficient of thermal expansion of a thin plate sample such as metal or ceramic. The thin plate sample is clamped in a loose fit manner on the entire surface on both sides, the upper and lower surfaces on both sides, or both front and rear end surfaces on both sides. A sample holder for a thermal expansion coefficient measuring device, comprising a pair of two-divided sample guides.
率を測定する装置に用いる試料ホルダーにおいて、該ホ
ルダーが断面円柱状又は多角形状であり、薄板試料を遊
嵌状に埋設支持し得る溝を円柱状又は多角形状ホルダー
の軸方向に穿設し、該溝の両端部が開放状であることを
特徴とする熱膨張率測定用一体形試料ホルダー。4. A sample holder used in an apparatus for measuring the coefficient of thermal expansion of a thin plate sample of metal, ceramic, etc., wherein the holder has a columnar or polygonal cross section, and a groove capable of embedding and supporting the thin plate sample in a loose fit form. Is formed in the axial direction of a cylindrical or polygonal holder, and both ends of the groove are open, and an integrated sample holder for measuring a coefficient of thermal expansion.
率を測定する装置に用いる試料ホルダーにおいて、該薄
板試料の両側面全面又は両側の上下面又は両側の前後両
端面を、遊嵌状に挾持する一体状の枠形試料ガイドから
なることを特徴とする熱膨張率測定装置用試料ホルダ
ー。5. A sample holder used in an apparatus for measuring the coefficient of thermal expansion of a thin plate sample of metal, ceramic, etc., wherein the entire thin plate sample has both sides, upper and lower surfaces on both sides, or both front and rear end surfaces are loosely fitted. A sample holder for a thermal expansion coefficient measuring device, which comprises an integrated frame-shaped sample guide that is held.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5186194A JP2749249B2 (en) | 1993-07-28 | 1993-07-28 | Sample holder for coefficient of thermal expansion measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5186194A JP2749249B2 (en) | 1993-07-28 | 1993-07-28 | Sample holder for coefficient of thermal expansion measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0743326A true JPH0743326A (en) | 1995-02-14 |
| JP2749249B2 JP2749249B2 (en) | 1998-05-13 |
Family
ID=16184034
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5186194A Expired - Lifetime JP2749249B2 (en) | 1993-07-28 | 1993-07-28 | Sample holder for coefficient of thermal expansion measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2749249B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110043787A1 (en) * | 2009-08-20 | 2011-02-24 | Carlos Duran | Photoelastic method for absolute determination of zero cte crossover in low expansion silica-titania glass samples |
| JP2013036980A (en) * | 2011-07-05 | 2013-02-21 | Baehr Thermoanalyse Gmbh | Dilatometer for measuring metallic sample |
| KR101717591B1 (en) * | 2015-12-07 | 2017-03-17 | 김민성 | Apparatus for measuring thermal expansion coefficient |
-
1993
- 1993-07-28 JP JP5186194A patent/JP2749249B2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110043787A1 (en) * | 2009-08-20 | 2011-02-24 | Carlos Duran | Photoelastic method for absolute determination of zero cte crossover in low expansion silica-titania glass samples |
| US8328417B2 (en) * | 2009-08-20 | 2012-12-11 | Corning Incorporated | Photoelastic method for absolute determination of zero CTE crossover in low expansion silica-titania glass samples |
| JP2013036980A (en) * | 2011-07-05 | 2013-02-21 | Baehr Thermoanalyse Gmbh | Dilatometer for measuring metallic sample |
| KR101717591B1 (en) * | 2015-12-07 | 2017-03-17 | 김민성 | Apparatus for measuring thermal expansion coefficient |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2749249B2 (en) | 1998-05-13 |
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