JPH07297695A - Semiconductor device - Google Patents

Semiconductor device

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Publication number
JPH07297695A
JPH07297695A JP9039694A JP9039694A JPH07297695A JP H07297695 A JPH07297695 A JP H07297695A JP 9039694 A JP9039694 A JP 9039694A JP 9039694 A JP9039694 A JP 9039694A JP H07297695 A JPH07297695 A JP H07297695A
Authority
JP
Japan
Prior art keywords
control
terminal
semiconductor device
output terminal
common output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9039694A
Other languages
Japanese (ja)
Inventor
Koji Yamaguchi
厚司 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP9039694A priority Critical patent/JPH07297695A/en
Publication of JPH07297695A publication Critical patent/JPH07297695A/en
Pending legal-status Critical Current

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  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)

Abstract

PURPOSE:To provide a semiconductor device provided with an overheat protecting function which does not perform malfunction by high positive dv/dt generated at the time of the reverse recovery of an FWD. CONSTITUTION:This semiconductor device is composed of an intelligent power module for which the parallel circuit of an IGBT 3 and the FWD 4 is bridge- connected and an IC 16 for control mounted with the driving circuit of the lower side arm 2 is provided with an overcurrent protection circuit for detecting the overcurrent of the IGBT 3 by the detection resistor 7 and an overheat protection circuit for detecting the overheat of the IGBT 3 by a thermistor 8. As a serge voltage suppression means for suppressing a serge voltage generated at the common output terminal A/E of alarm signals by the high positive dv/dt generated at the time of the reverse recovery of the FWD 4, a unidirectional yield diode (Schottky diode) 20 with low forward voltage decline connected between terminals with a direction from the common output terminal A/E of the alarm signals towards the input terminal Vcc of a control power source 21 as a forward direction is provided for instance.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、直流を入力として交
流出力を得るVVVFインバータなどの電力変換用の半
導体装置、ことに過電流保護機能,短絡保護機能,およ
び過熱保護機能を有するインテリジェントパワーモジュ
ールに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device for power conversion, such as a VVVF inverter which receives a direct current as an input and produces an alternating current output, and more particularly an intelligent power module having an overcurrent protection function, a short circuit protection function and an overheat protection function. Regarding

【0002】[0002]

【従来の技術】図4は従来の半導体装置を三相電力変換
器を例に簡略化して示す接続図、図5は従来の半導体装
置を三相電力変換器を例に模式化して示す平面図、図6
は従来の半導体装置を三相電力変換器を例に簡略化して
示す接続図である。図1において、三相電力変換器の主
回路は直流端子P−N間にアーム接続(三相ブリッジ結
線)された各相1対のスイッチング素子としてのIGB
T(ゲート絶縁型バイポーラトランジスタ)3と、その
コレクタ−エミッタ間に接続されたフリーホイーリング
ダイオード(FWD)4との並列回路からなり、上側ア
ーム(1A,1B,1C),および下側アーム(2A,
2B,2C)で構成され、上下アームの中間接続点から
交流出力端子U,V,Wが引き出される。また、上側ア
ームのIGBTそれぞれのゲートには上側アーム駆動回
路5A,5B,5Cが接続され、また下側アームのIG
BTそれぞれのゲートには下側アーム駆動回路6A,6
B,6Cが接続され、各駆動回路が図示しない駆動信号
発生回路からの指令に基づいて各アームのIGBTをス
イッチングすることにより、例えば交流負荷としての電
動機の可変速度制御が行われる。
2. Description of the Related Art FIG. 4 is a connection diagram schematically showing a conventional semiconductor device by taking a three-phase power converter as an example, and FIG. 5 is a plan view schematically showing a conventional semiconductor device by taking a three-phase power converter as an example. , Fig. 6
FIG. 3 is a connection diagram showing a conventional semiconductor device in a simplified manner by taking a three-phase power converter as an example. In FIG. 1, the main circuit of the three-phase power converter is an IGB as a pair of switching elements for each phase, which is arm-connected (three-phase bridge connection) between the DC terminals P and N.
It is composed of a parallel circuit of a T (gate insulation type bipolar transistor) 3 and a freewheeling diode (FWD) 4 connected between its collector and emitter, and includes an upper arm (1A, 1B, 1C) and a lower arm ( 2A,
2B, 2C), and AC output terminals U, V, W are drawn out from the intermediate connection point of the upper and lower arms. The upper arm drive circuits 5A, 5B and 5C are connected to the respective gates of the upper arm IGBTs and the lower arm IGs are connected.
The lower arm drive circuits 6A, 6 are provided at the respective gates of BT.
B and 6C are connected, and each drive circuit switches the IGBT of each arm based on a command from a drive signal generation circuit (not shown), thereby performing variable speed control of the electric motor as an AC load, for example.

【0003】また、図5に示すように、半導体装置10
はインテリジェントパワーモジュールとして構成され、
その方形容器19内には上側アーム1A,1B,1Cを
搭載したパワー基板部11A,11B,11B等11、
下側アーム2A,2B,2Cを搭載したパワー基板部1
2A,12B,12B等12、および上側アームの駆動
回路5A,5B,5Cを搭載した制御用IC15A,1
5B,15C,等15、下側アームの駆動回路6A,6
B,6Cを搭載した制御用IC16A,16B,16
C,等16とが収納され、方形容器19の枠状部分には
直流端子列16,交流端子列17,および制御端子列1
8が配列され、例えば各基板部のプリント配線14によ
り制御用IC15,16と制御端子列18との接続が行
われるとともに、方形容器内にゲル状樹脂を充填して封
止が行われる。
Further, as shown in FIG. 5, the semiconductor device 10
Is configured as an intelligent power module,
Inside the rectangular container 19, power board parts 11A, 11B, 11B, etc. 11 on which the upper arms 1A, 1B, 1C are mounted,
Power board unit 1 on which lower arms 2A, 2B, 2C are mounted
2A, 12B, 12B, etc. 12 and control ICs 15A, 1 equipped with upper arm drive circuits 5A, 5B, 5C
5B, 15C, etc. 15, lower arm drive circuits 6A, 6
Control ICs 16A, 16B, 16 equipped with B, 6C
C, etc. 16 are stored, and in the frame-shaped portion of the rectangular container 19, a DC terminal row 16, an AC terminal row 17, and a control terminal row 1
8 are arranged. For example, the control ICs 15 and 16 are connected to the control terminal row 18 by the printed wiring 14 of each board portion, and the rectangular container is filled with a gel resin for sealing.

【0004】さらに、インテリジェントパワーモジュー
ルとして構成される半導体装置10は図6に示すよう
に、上側アーム1および下側アーム2がそれぞれIGB
T3のセンス端子とエミッタとの間に接続された過電流
検出抵抗7を備え、その検出電流値をO/S端子(過電
流入力端子)−GND端子間に受けた上側アームの駆動
回路5および下側アームの駆動回路6が、その内部に設
けられた図示しない過電流保護回路および短絡電流保護
回路により過電流または短絡電流の発生を判断してA/
E端子(アラーム信号の共通出力端子)からアラーム信
号を出力するよう構成される。さらにまた、下側アーム
2側のIGBT3に近接して配された負性抵抗素子8
(例えばサーミスタ)によりIGBT3の温度を監視
し、その検出信号を過熱検出信号の入力端子O/Hに受
けた下側アームの駆動回路6が、その内部に設けられた
図示しない過熱保護回路によりIGBTの過熱を判断
し、A/E端子(アラーム信号の共通出力端子)からア
ラーム信号を出力するよう構成される。
Further, as shown in FIG. 6, a semiconductor device 10 configured as an intelligent power module has an upper arm 1 and a lower arm 2 each having an IGBT.
The upper arm drive circuit 5 includes an overcurrent detection resistor 7 connected between the sense terminal and the emitter of T3, and receives the detected current value between the O / S terminal (overcurrent input terminal) and the GND terminal. The drive circuit 6 of the lower arm determines whether an overcurrent or a short circuit current is generated by an overcurrent protection circuit and a short circuit current protection circuit (not shown) provided inside the lower arm drive circuit 6, and A /
It is configured to output an alarm signal from the E terminal (common output terminal for alarm signal). Furthermore, the negative resistance element 8 arranged close to the IGBT 3 on the lower arm 2 side
The temperature of the IGBT 3 is monitored by (for example, a thermistor), and the drive circuit 6 of the lower arm, which receives the detection signal at the input terminal O / H of the overheat detection signal, uses an overheat protection circuit (not shown) provided therein to drive the IGBT. Is determined and an alarm signal is output from the A / E terminal (alarm signal common output terminal).

【0005】なお、過熱保護回路はサーミスタ8の抵抗
値が温度の上昇に逆比例して低下することを利用して、
抵抗値の低下を電圧低下に変換して基準電圧と比較し、
検出電圧が基準電圧以下に低下したとき過熱が生じたも
のと判断してアラームを出力するよう構成され、アラー
ムによってIGBTのスイッチング動作を停止させる過
熱保護機能が得られるとともに、IGBTの温度が低下
してその検出電圧が基準電圧を所定レベル上回ると保護
機能が解除され、半導体装置が動作を再開できるようヒ
ステリシス特性を持たせるよう構成したものが知られて
いる。また、A/E端子はプリント配線14によって制
御端子列18の1つに接続されるが、その出力側にはホ
トカプラを設けて外部回路と電気的に絶縁するととも
に、プリント配線14には直列にホトカプラ内ダイオー
ドに流れる電流の調節抵抗13が設けられる。
The overheat protection circuit utilizes the fact that the resistance value of the thermistor 8 decreases in inverse proportion to the increase in temperature.
Convert the decrease in resistance value into a voltage drop and compare with the reference voltage,
It is configured to output an alarm when it judges that overheating has occurred when the detected voltage drops below the reference voltage.The alarm provides an overheat protection function that stops the switching operation of the IGBT, and the temperature of the IGBT decreases. It is known that the protection function is released when the detected voltage exceeds a reference voltage by a predetermined level and the semiconductor device has a hysteresis characteristic so that the operation can be resumed. Further, the A / E terminal is connected to one of the control terminal rows 18 by the printed wiring 14, and a photocoupler is provided on the output side to electrically insulate the external circuit, and the A / E terminal is connected in series to the printed wiring 14. An adjusting resistor 13 for adjusting the current flowing through the diode in the photocoupler is provided.

【0006】[0006]

【発明が解決しようとする課題】上述のようにインテリ
ジェントパワーモジュールとして構成された半導体装置
10には、過電流保護機能,短絡電流保護機能,および
過熱保護機能と、さらには制御電源電圧Vccの異常保護
機能が付加されてパワーモジュールの信頼性の向上が図
られており、過電流保護機能が過熱保護機能より速く作
動するよう過電流保護レベルおよび過熱保護レベルが設
定されて2重保護を行うのが一般的である。ところが、
定挌交流出力の1.125倍の過電流を流して半導体装
置の保護機能を評価したところ、過電流保護(OCトリ
ップ)が作動する前に過熱保護(OHトリップ)が作動
してしまうという異常が発見された。この異常動作の原
因分析を行った結果、過電流保護レベルおよび過熱保護
レベルの設定値そのものには異常が認められず、上下ア
ームのフリーホイーリングダイオード(FWD)4の逆
回復によってIGBT3に高いプラスdv/dtが印加
されると、IGBTの温度がその過熱保護レベルに到達
していないにも係わらず過熱を報知するアラームが出力
されてしまう過熱保護回路の誤動作が発生することが判
明した。
In the semiconductor device 10 configured as the intelligent power module as described above, the overcurrent protection function, the short-circuit current protection function, the overheat protection function, and the control power supply voltage Vcc are abnormal. The protection function has been added to improve the reliability of the power module, and the overcurrent protection level and the overheat protection level are set so that the overcurrent protection function operates faster than the overheat protection function. Is common. However,
When the protection function of the semiconductor device is evaluated by passing an overcurrent of 1.125 times the constant AC output, the overheat protection (OH trip) is activated before the overcurrent protection (OC trip) is activated. Was discovered. As a result of analyzing the cause of this abnormal operation, no abnormalities were found in the set values of the overcurrent protection level and the overheat protection level itself, and the high recovery of the IGBT 3 due to the reverse recovery of the free wheeling diode (FWD) 4 of the upper and lower arms. It has been found that when dv / dt is applied, a malfunction of the overheat protection circuit occurs in which an alarm notifying overheat is output even though the temperature of the IGBT has not reached the overheat protection level.

【0007】この発明の目的は、FWDの逆回復時に発
生する高プラスdv/dtにより誤動作しない過熱保護
機能を備えた半導体装置を提供することにある。
An object of the present invention is to provide a semiconductor device having an overheat protection function which does not malfunction due to high plus dv / dt generated during reverse recovery of FWD.

【0008】[0008]

【課題を解決するための手段】上記課題を解決するため
に、この発明によれば、スイッチング素子としてのIG
BTを搭載した複数のパワー基板部と、その駆動回路を
搭載した制御用IC基板とが方形容器に収納され、各相
一対のIGBTが直流ライン間にアーム接続されて直流
端子および交流端子が前記方形容器の枠状部分に配列さ
れるとともに、制御用ICがIGBTの過電流および短
絡電流検出信号の入力端子,IGBT側に配された負性
抵抗素子による過熱検出信号の入力端子と,駆動回路が
過電流,短絡電流,または過熱を検出して発するアラー
ム信号の共通出力端子とを備えたものにおいて、IGB
Tのスイッチングに伴って共通出力端子に生ずる過熱ア
ラーム信号の誤動作をサージ電圧の抑制によって阻止す
るサージ電圧抑制手段を制御用ICの共通出力端子側に
設けてなるものとする。
In order to solve the above problems, according to the present invention, an IG as a switching element is provided.
A plurality of power board parts each having a BT mounted thereon and a control IC board having a drive circuit mounted therein are housed in a rectangular container, and a pair of IGBTs of each phase are arm-connected between DC lines to provide a DC terminal and an AC terminal. The control IC is arranged in the frame-shaped portion of the rectangular container, and the control IC has an input terminal for the overcurrent and short-circuit current detection signals of the IGBT, an input terminal for the overheat detection signal by the negative resistance element arranged on the IGBT side, and a drive circuit. With a common output terminal for an alarm signal generated by detecting overcurrent, short-circuit current, or overheat, the IGBT
Surge voltage suppressing means for preventing malfunction of the overheat alarm signal generated at the common output terminal due to the switching of T by suppressing the surge voltage is provided on the common output terminal side of the control IC.

【0009】サージ電圧抑制手段が制御用ICのアラー
ム信号の共通出力端子から制御電源電圧入力端子に向か
う方向を順方向として接続された一方向性降伏ダイオー
ドからなり、その順電圧降下が制御用IC内寄生ダイオ
ードのそれ以下であると良い。サージ電圧抑制手段が制
御用ICのアラーム信号の共通出力端子とグランドライ
ン端子との間に接続されたコンデンサからなり、その静
電容量が0.6nF以上2nF以下であると良い。
The surge voltage suppressing means comprises a unidirectional breakdown diode connected with the direction from the common output terminal of the alarm signal of the control IC to the control power supply voltage input terminal as the forward direction, and the forward voltage drop thereof is the control IC. It is better to be less than that of the internal parasitic diode. It is preferable that the surge voltage suppressor is composed of a capacitor connected between the common output terminal of the alarm signal of the control IC and the ground line terminal, and the capacitance thereof is 0.6 nF or more and 2 nF or less.

【0010】サージ電圧抑制手段が制御用ICの共通出
力端子と方形容器の枠状部分に配列された制御端子列と
を結ぶ空中配線であると良い。
It is preferable that the surge voltage suppressing means is an aerial wire connecting the common output terminal of the control IC and the control terminal row arranged in the frame-shaped portion of the rectangular container.

【0011】[0011]

【作用】この発明の構成は、過熱保護回路の誤動作の原
因が、FWDの逆回復時の急峻な電流変化によってモジ
ュール配線内に蓄積されたエネルギーが、パワー基板部
のグランドから制御用ICの電源グランドラインに流
れ、これが制御端子列に接続されたプリント配線を介し
てA/E端子側に電源電圧Vccより高いサージ電圧とし
て侵入するため、制御用IC内に逆向きの電流が瞬間的
に流れて基準電圧を変化させるので、ヒステリシスの領
域に入っている過熱保護回路が誤動作してアラームを出
力することによるとの検討結果に基づいてなされたもの
であり、IGBTのスイッチングに伴って共通出力端子
に生ずる過熱アラーム信号の誤動作をサージ電圧の抑制
によって阻止するサージ電圧抑制手段を制御用ICのア
ラーム信号の共通出力端子側に設けるよう構成したこと
により、共通出力端子におけるサージ電圧レベルを低減
し、過電圧サージにより制御用IC内に逆向きの電流が
瞬間的に流れるのを阻止するので、制御用IC内の基準
電圧の変化を抑制する機能が得られ、過熱保護回路の誤
動作を防止することができる。
In the configuration of the present invention, the cause of the malfunction of the overheat protection circuit is that the energy accumulated in the module wiring due to the abrupt current change at the time of the reverse recovery of the FWD is the power of the control IC from the ground of the power board. It flows to the ground line, and this flows into the A / E terminal side as a surge voltage higher than the power supply voltage Vcc through the printed wiring connected to the control terminal string, so that the reverse current instantaneously flows in the control IC. This is based on the result of a study that the overheat protection circuit in the hysteresis area malfunctions and outputs an alarm because the reference voltage is changed by the common output terminal. The surge voltage suppressing means for preventing the malfunction of the overheat alarm signal that occurs in the control IC by suppressing the surge voltage is commonly used as the alarm signal of the control IC. Since it is provided on the terminal side, the surge voltage level at the common output terminal is reduced and the reverse current is prevented from instantaneously flowing in the control IC due to overvoltage surge. A function of suppressing a change in voltage is obtained, and a malfunction of the overheat protection circuit can be prevented.

【0012】例えば、サージ電圧抑制手段に制御用IC
のアラーム信号の共通出力端子から制御電源電圧入力端
子に向かう方向を順方向として接続された一方向性降伏
ダイオードを用い、その順電圧降下が制御用IC内寄生
ダイオードのそれ以下とすれば、FWDの逆回復時にグ
ランドラインを介してアラーム信号の共通出力端子に発
生するサージ電圧およびこれに伴って制御用IC内駆動
回路に生ずる基準電圧の変動を制御用IC内寄生ダイオ
ードが導通しない範囲に抑制できるので、制御用IC基
板内に逆向きの電流が流れるのを防ぎ、ヒステリシスの
領域に入っている過熱保護回路が誤動作してアラームを
出力することを回避する機能が得られる。
For example, the control IC is used as the surge voltage suppressing means.
If a unidirectional breakdown diode is connected with the direction from the common output terminal of the alarm signal to the control power supply voltage input terminal as the forward direction and the forward voltage drop is less than that of the parasitic diode in the control IC, the FWD Of the surge voltage generated at the common output terminal of the alarm signal via the ground line at the time of reverse recovery of the control voltage and the fluctuation of the reference voltage generated in the drive circuit in the control IC due to the surge voltage within the range in which the parasitic diode in the control IC does not conduct Therefore, it is possible to prevent the reverse current from flowing in the control IC substrate and prevent the overheat protection circuit in the hysteresis region from malfunctioning and outputting an alarm.

【0013】例えば、サージ電圧抑制手段を制御用IC
のアラーム信号の共通出力端子とグランドライン端子と
の間に接続されたコンデンサとし、その静電容量を0.
6nF以上2nF以下の範囲に設定すれば、FWDの逆
回復時にグランドラインを介してアラーム信号の共通出
力端子に侵入するサージ電圧をコンデンサが吸収し、サ
ージ電圧によって制御用IC内駆動回路に生ずる基準電
圧の変動を抑制するので、過熱保護回路の誤動作を防止
する機能が得られる。
For example, the surge voltage suppressing means may be a control IC.
The capacitor connected between the common output terminal for the alarm signal and the ground line terminal has a capacitance of 0.
If it is set within the range of 6nF or more and 2nF or less, the capacitor absorbs the surge voltage that enters the common output terminal of the alarm signal through the ground line during the reverse recovery of FWD, and the reference that occurs in the drive circuit in the control IC due to the surge voltage. Since the fluctuation of the voltage is suppressed, the function of preventing the malfunction of the overheat protection circuit can be obtained.

【0014】例えば、サージ電圧抑制手段を制御用IC
の共通出力端子と方形容器の枠状部分に配列された制御
端子とを結ぶ空中配線とすれば、この空中配線と制御用
ICおよびパワー基板部にプリント配線として形成され
るグランドラインとの静電的結合を疎にできるので、F
WDの逆回復時の急峻な電流変化によってモジュール配
線内に蓄積されたエネルギーが、パワー基板部のグラン
ドから制御用ICの電源グランドラインに流れ、これが
制御端子列に接続されたプリント配線を介してA/E端
子側に電源電圧Vccより高いサージ電圧として侵入する
という従来の問題点を排除し、空中配線に発生するサー
ジ電圧を低減し、過熱保護回路の誤動作を防止する機能
が得られる。
For example, the surge voltage suppressing means may be a control IC.
If the aerial wiring connecting the common output terminal of the control terminal and the control terminals arranged in the frame-shaped portion of the rectangular container is used, the static electricity between the aerial wiring and the ground line formed as a printed wiring on the control IC and the power board part F can be made sparsely
The energy accumulated in the module wiring due to the abrupt current change at the time of reverse recovery of WD flows from the ground of the power board to the power supply ground line of the control IC, and this is passed through the printed wiring connected to the control terminal row. The conventional problem that a surge voltage higher than the power supply voltage Vcc enters the A / E terminal side is eliminated, the surge voltage generated in the aerial wiring is reduced, and a function of preventing malfunction of the overheat protection circuit is obtained.

【0015】[0015]

【実施例】以下、この発明を実施例に基づいて説明す
る。図1はこの発明の実施例になる半導体装置を三相電
力変換器を例に簡略化して示す要部の接続図であり、従
来技術と同じ構成部分には同一参照符号を付すことによ
り、重複した説明を省略する。図において、スイッチン
グ素子としてのIGBT3とフリーホイーリングダイオ
ード(FWD)4との並列回路からなる上側アーム1
A,1B,1C等1、および下側アーム2A,2B,2
C等2で構成される三相電力変換器の主回路は、それぞ
れの下側アーム2がIGBT3の電流センスに接続され
た過電流検出抵抗7およびIGBTの近傍に配された負
性抵抗素子としてのサーミスタ8を備え、それぞれの検
出信号が下側アーム2の駆動回路を搭載した制御用IC
16A,16B,16C等16のO/S端子およびOH
端子に入力されるとともに、IGBTに過電流,短絡電
流,または過熱が発生したときA/E端子からアラーム
信号を出力するよう構成される。また、制御用IC16
はそのアラーム信号の共通出力端子A/Eから制御電源
入力端子Vccに向かう方向を順方向として接続されたサ
ージ電圧抑制手段20としての一方向性降伏ダイオー
ド,例えばショットキーダイオード(SBD)20を備
える。
EXAMPLES The present invention will be described below based on examples. FIG. 1 is a connection diagram of essential parts showing a semiconductor device according to an embodiment of the present invention in a simplified manner, taking a three-phase power converter as an example. The description is omitted. In the figure, an upper arm 1 composed of a parallel circuit of an IGBT 3 as a switching element and a freewheeling diode (FWD) 4
A, 1B, 1C, etc. 1 and lower arms 2A, 2B, 2
The main circuit of the three-phase power converter composed of C etc. 2 is an overcurrent detection resistor 7 in which each lower arm 2 is connected to the current sense of the IGBT 3 and a negative resistance element arranged in the vicinity of the IGBT. Control IC equipped with the thermistor 8 and each detection signal has a drive circuit for the lower arm 2.
16A, 16B, 16C and other 16 O / S terminals and OH
The alarm signal is input to the terminal and an alarm signal is output from the A / E terminal when overcurrent, short-circuit current, or overheat occurs in the IGBT. In addition, the control IC 16
Is provided with a unidirectional breakdown diode, for example, a Schottky diode (SBD) 20 as a surge voltage suppressing means 20 connected in a forward direction from the common output terminal A / E of the alarm signal to the control power supply input terminal Vcc. .

【0016】このように構成された実施例になる半導体
装置としての三相電力変換器において、下側アームのF
WD4の逆回復時に発生する急峻な電流変化により、モ
ジュール配線内に蓄積されたエネルギーが、パワー基板
部のグランドから制御用IC16の電源グランドライン
に流れ、これが制御端子列18に接続されたプリント配
線14をアンテナとしてA/E端子側にサージ電圧とし
て侵入した場合、ショットキーダイオード(SBD)2
0を介して制御電源21にサージ電流が流れてサージ電
圧を低減する。ことに、ショットキーダイオード(SB
D)20の順電圧降下は0.5V以下と制御用IC内寄
生ダイオードのそれより低いのでサージ電圧の抑制効果
が大きく、制御用IC内に逆向きの電流が流れて基準電
圧を変化させるという従来の問題点を回避でき、従っ
て、ヒステリシスの領域に入っている過熱保護回路が誤
動作してアラームを出力するという過熱保護回路の誤動
作を防止する効果が得られる。
In the three-phase power converter as the semiconductor device according to the embodiment configured as described above, the F of the lower arm is
The energy accumulated in the module wiring flows from the ground of the power board portion to the power supply ground line of the control IC 16 due to the abrupt current change generated at the time of reverse recovery of the WD 4, and the printed wiring connected to the control terminal row 18 is provided. When 14 as an antenna enters the A / E terminal side as a surge voltage, the Schottky diode (SBD) 2
A surge current flows through the control power supply 21 via 0 to reduce the surge voltage. In particular, the Schottky diode (SB
D) Since the forward voltage drop of 20 is 0.5 V or less, which is lower than that of the parasitic diode in the control IC, the effect of suppressing the surge voltage is great, and a reverse current flows in the control IC to change the reference voltage. The conventional problem can be avoided, and therefore, an effect of preventing the malfunction of the overheat protection circuit in which the overheat protection circuit in the hysteresis region malfunctions and outputs an alarm can be obtained.

【0017】また、過熱保護レベルを117°Cに設定
した実施例になる三相電力変換器について、パワー基板
部の温度を監視しつつ交流出力電流を徐々に増加し、過
熱保護回路の誤動作を過電流トリップが生ずる前に過熱
アラームが発生するか否かによって判定した。その結
果、パワー基板部の温度が115°Cに到達しても誤動
作せず、サージ電圧抑制手段20としてのショットキー
ダイオードを設けたことによって従来技術で問題となっ
た過熱保護回路の誤動作を高い精度で回避できることが
実証された。
Further, regarding the three-phase power converter according to the embodiment in which the overheat protection level is set to 117 ° C., the AC output current is gradually increased while observing the temperature of the power board to prevent malfunction of the overheat protection circuit. Judgment was made based on whether or not an overheat alarm occurred before an overcurrent trip occurred. As a result, even if the temperature of the power substrate reaches 115 ° C., the malfunction does not occur, and the malfunction of the overheat protection circuit, which has been a problem in the conventional technology due to the provision of the Schottky diode as the surge voltage suppressing means 20, is high. It was proved that it can be avoided with accuracy.

【0018】図2はこの発明の異なる実施例になる半導
体装置を三相電力変換器を例に簡略化して示す要部の接
続図であり、サージ電圧抑制手段30を下側アームの制
御用IC16のアラーム信号の共通出力端子A/Eとグ
ランドライン端子GNDとの間に接続されたコンデンサ
とし、その静電容量を0.6nF以上2nF以下の範囲
に設定した点が前述の実施例と異なっている。このよう
に構成した三相電力変換器においては、FWD4の逆回
復時にグランドラインを介してアラーム信号の共通出力
端子に発生するサージ電圧をコンデンサ30が吸収し、
サージ電圧によって制御用IC内駆動回路に生ずる基準
電圧の変動を抑制するので、過熱保護回路の誤動作を防
止する効果が得られるとともに、ショットキーダイオー
ドに比べて安価なコンデンサをサージ電圧抑制手段に用
いることによる経済効果が得られる。
FIG. 2 is a connection diagram of essential parts showing a semiconductor device according to another embodiment of the present invention in a simplified manner by taking a three-phase power converter as an example. The surge voltage suppressing means 30 is a control IC 16 for the lower arm. Unlike the above-mentioned embodiment, a capacitor is connected between the common output terminal A / E of the alarm signal and the ground line terminal GND, and its capacitance is set in the range of 0.6 nF or more and 2 nF or less. There is. In the three-phase power converter configured as described above, the capacitor 30 absorbs the surge voltage generated at the common output terminal of the alarm signal via the ground line at the time of reverse recovery of the FWD 4,
Since the fluctuation of the reference voltage generated in the drive circuit in the control IC due to the surge voltage is suppressed, the effect of preventing the malfunction of the overheat protection circuit can be obtained, and a capacitor which is cheaper than the Schottky diode is used as the surge voltage suppressing means. Economic effects can be obtained.

【0019】また、上述の過熱保護レベルを117°C
に設定した異なる実施例になる三相電力変換器につい
て、サージ電圧抑制手段としてのコンデンサ30の静電
容量を0.1nFから10nFの範囲で段階的に変え、
パワー基板部の温度を監視しつつ交流出力電流を徐々に
増加し、過熱保護回路の誤動作を過電流トリップが生ず
る前に過熱アラームが発生するか否かによって判定し
た。その結果、コンデンサ30の静電容量を0.56n
F以上とすれば、パワー基板部の温度が115°Cに到
達しても誤動作せず、サージ電圧抑制手段30としての
コンデンサを設けたことにより、従来技術で問題となっ
た過熱保護回路の誤動作を高い精度で回避できることが
実証された。なお、コンデンサ30の静電容量が大き過
ぎるとアラーム出力時の時間遅れを招くので静電容量の
上限を2nF程度に抑えることが好ましい。
Further, the above-mentioned overheat protection level is set to 117 ° C.
In the three-phase power converter according to the different embodiment set to, the capacitance of the capacitor 30 as the surge voltage suppressing means is changed stepwise in the range of 0.1 nF to 10 nF.
The AC output current was gradually increased while monitoring the temperature of the power board, and the malfunction of the overheat protection circuit was determined by whether or not an overheat alarm occurred before the overcurrent trip occurred. As a result, the capacitance of the capacitor 30 is 0.56n
When the temperature is F or higher, the malfunction does not occur even when the temperature of the power board reaches 115 ° C, and the malfunction of the overheat protection circuit, which has been a problem in the conventional technology, is provided by providing the capacitor as the surge voltage suppressing means 30. It has been proved that can be avoided with high accuracy. If the capacitance of the capacitor 30 is too large, it causes a time delay at the time of alarm output, so it is preferable to suppress the upper limit of the capacitance to about 2 nF.

【0020】図3はこの発明の他の実施例になる半導体
装置を三相電力変換器を例に模式化して示す平面図であ
る。図において、半導体装置10はインテリジェントパ
ワーモジュールとして構成され、その方形容器19内に
下側アーム2A,2B,2Cを搭載したパワー基板部1
2A,12B,12B等12とともに収納された下側ア
ームの制御用IC16A,16B,16C,等16は、
それぞれのアラーム信号の共通出力端子A/Eと制御端
子列18との間がサージ電圧抑制手段としての空中配線
34A,34B,34C等34によって接続された点が
従来技術と異なっている。また、空中配線34に直列接
続されるホトカプラ内ダイオード電流の調整抵抗33は
制御用IC16に面実装してもよく、空中配線と同様に
空中で空中配線(リード線)に接続し、しかる後方形容
器内に充填するゲル状樹脂中に埋設するよう構成しても
よい。
FIG. 3 is a plan view schematically showing a semiconductor device according to another embodiment of the present invention by taking a three-phase power converter as an example. In the figure, a semiconductor device 10 is configured as an intelligent power module, and a power board unit 1 in which lower arms 2A, 2B, 2C are mounted in a rectangular container 19 thereof.
The lower arm control ICs 16A, 16B, 16C, etc. 16 housed together with 2A, 12B, 12B, etc. 12 are
This is different from the prior art in that the common output terminal A / E for each alarm signal and the control terminal row 18 are connected by the aerial wiring 34A, 34B, 34C, etc. 34 as surge voltage suppressing means. Further, the adjustment resistor 33 for the diode current in the photocoupler, which is connected in series to the aerial wire 34, may be surface-mounted on the control IC 16, and is connected to the aerial wire (lead wire) in the air similarly to the aerial wire, so that the rear shape may be adjusted. You may comprise so that it may be embedded in the gel resin filled in a container.

【0021】上述の空中配線によるサージ電圧の抑制効
果を検証するために、図1のようにA/E−Vcc端子間
にショットキーダイオード20を有する半導体装置10
に空中配線34を付加した半導体装置と、プリント配線
(配線パターンとも呼ぶ)14を付加した半導体装置と
を供試体として、パワー基板部の温度を監視しつつ交流
出力電流を徐々に増加し、過熱保護回路の誤動作を過電
流トリップが生ずる前に過熱アラームが発生するか否か
によって判定した。その結果、プリント配線を付加した
半導体装置ではパワー基板部の温度が95°C に到達し
た時点で誤動作したのに対して、空中配線を付加した半
導体装置ではパワー基板部の温度が115°Cに到達し
た時点でも誤動作せず、空中配線としてグランドライン
との静電的結合を疎にすることにより、サージ電圧の抑
制効果が得られるとともに、ショットキーダイオードま
たはコンデンサからなるサージ電圧抑制手段と組み合わ
せることにより、より安定化したサージ電圧の抑制効果
が得られることが実証された。
In order to verify the effect of suppressing the surge voltage by the above-mentioned aerial wiring, the semiconductor device 10 having the Schottky diode 20 between the A / E-Vcc terminals as shown in FIG.
Using a semiconductor device to which the aerial wiring 34 is added to the semiconductor device and a semiconductor device to which the printed wiring (also referred to as a wiring pattern) 14 is used as test samples, the AC output current is gradually increased while monitoring the temperature of the power board part, and the overheat The malfunction of the protection circuit was judged by whether the overheat alarm occurred before the overcurrent trip occurred. As a result, in the semiconductor device to which the printed wiring was added, malfunction occurred when the temperature of the power board portion reached 95 ° C, whereas in the semiconductor device to which the aerial wiring was added, the temperature of the power substrate portion was 115 ° C. It does not malfunction even when it arrives, and it has a surge voltage suppression effect by sparse electrostatic coupling with the ground line as aerial wiring, and it should be combined with a surge voltage suppression means consisting of a Schottky diode or capacitor. It was proved that the more stable surge voltage suppression effect was obtained.

【0022】[0022]

【発明の効果】この発明は前述のように、IGBTのス
イッチングに伴ってアラーム信号の共通出力端子に生ず
る過熱アラーム信号の誤動作をサージ電圧の抑制によっ
て阻止するサージ電圧抑制手段を制御用ICの共通出力
端子側に設けるよう構成した。その結果、サージ電圧抑
制手段を制御用ICのアラーム信号の共通出力端子から
制御電源電圧入力端子に向かう方向を順方向として接続
された一方向性降伏ダイオード,例えばショットキーダ
イオードで構成しても、また、制御用ICのアラーム信
号の共通出力端子と接地端子との間に接続された静電容
量が0.6nF以上2nF以下のコンデンサで構成して
も、過電流トリップが生ずる前に過熱アラームが発生す
る過熱保護回路の誤動作を阻止することが可能となり、
従って信頼性の高い過電流保護機能,短絡電流保護機
能,および過熱保護機能を備えた半導体装置、ことにイ
ンテリジェントパワーモジュールを提供することができ
る。
As described above, according to the present invention, the surge voltage suppressing means for preventing the malfunction of the overheat alarm signal generated at the common output terminal of the alarm signal due to the switching of the IGBT by suppressing the surge voltage is common to the control ICs. It is configured to be provided on the output terminal side. As a result, even if the surge voltage suppressing means is constituted by a unidirectional breakdown diode, for example, a Schottky diode, which is connected with the direction from the common output terminal of the alarm signal of the control IC to the control power supply voltage input terminal as the forward direction, Further, even if the capacitor connected between the common output terminal of the alarm signal of the control IC and the ground terminal is composed of a capacitor of 0.6 nF or more and 2 nF or less, the overheat alarm is generated before the overcurrent trip occurs. It is possible to prevent the malfunction of the overheat protection circuit that occurs,
Therefore, it is possible to provide a highly reliable semiconductor device having an overcurrent protection function, a short-circuit current protection function, and an overheat protection function, particularly an intelligent power module.

【0023】また、下側アームの制御用ICのアラーム
信号の共通出力端子と制御端子列との間を空中配線を用
いて接続するよう構成してもサージ電圧抑制効果が得ら
れ、これと前述のショットキーダイオードまたはコンデ
ンサからなるサージ電圧抑制手段とを組み合わせること
により、より信頼性の高い過熱保護機能を有する半導体
装置,ことにインテリジェントパワーモジュールを提供
することができる。
Further, even if the common output terminal for the alarm signal of the control IC of the lower arm and the control terminal row are connected by the aerial wiring, the surge voltage suppressing effect can be obtained. By combining with the surge voltage suppressing means composed of the Schottky diode or the capacitor, it is possible to provide a more reliable semiconductor device having an overheat protection function, particularly an intelligent power module.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施例になる半導体装置を三相電力
変換器を例に簡略化して示す要部の接続図
FIG. 1 is a connection diagram of essential parts showing a semiconductor device according to an embodiment of the present invention in a simplified manner by taking a three-phase power converter as an example.

【図2】この発明の異なる実施例になる半導体装置を三
相電力変換器を例に簡略化して示す要部の接続図
FIG. 2 is a connection diagram of essential parts showing a semiconductor device according to another embodiment of the present invention in a simplified manner by taking a three-phase power converter as an example.

【図3】この発明の他の実施例になる半導体装置を三相
電力変換器を例に模式化して示す平面図
FIG. 3 is a plan view schematically showing a semiconductor device according to another embodiment of the present invention by taking a three-phase power converter as an example.

【図4】従来の半導体装置を三相電力変換器を例に簡略
化して示す接続図
FIG. 4 is a connection diagram schematically showing a conventional semiconductor device by taking a three-phase power converter as an example.

【図5】従来の半導体装置を三相電力変換器を例に模式
化して示す平面図
FIG. 5 is a plan view schematically showing a conventional semiconductor device using a three-phase power converter as an example.

【図6】従来の半導体装置を三相電力変換器を例に簡略
化して示す接続図
FIG. 6 is a connection diagram schematically showing a conventional semiconductor device by taking a three-phase power converter as an example.

【符号の説明】[Explanation of symbols]

1 上側アーム(1A,1B,1C) 2 下側アーム(2A,2B,2C) 3 スイッチング素子(IGBT) 4 FWD 5 上側アームの駆動回路(5A,5B,5C) 6 下側アームの駆動回路(6A,6B,6C) 7 過電流検出抵抗 8 負性抵抗素子(サーミスタ) 10 半導体装置(インテリジェントパワーモジュー
ル) 11 上側アームを搭載したパワー基板部 12 下側アームを搭載したパワー基板部 13 ダイオード電流の調整抵抗 14 プリント配線(配線パターン) 15 上側アームの駆動回路を搭載した制御用IC 16 下側アームの駆動回路を搭載した制御用IC 17 交流端子列 18 制御端子列 19 方形容器 20 サージ電圧抑制手段(ショットキーダイオー
ド) 21 制御電源(Vcc) 30 サージ電圧抑制手段(コンデンサ) 33 ダイオード電流の調整抵抗 34 サージ電圧抑制手段(空中配線) Vcc 制御電源端子 O/S 過電流信号入力端子 OH 過熱検出信号入力端子 A/E アラーム信号の共通出力端子 GND グランドライン端子
1 Upper Arm (1A, 1B, 1C) 2 Lower Arm (2A, 2B, 2C) 3 Switching Element (IGBT) 4 FWD 5 Upper Arm Drive Circuit (5A, 5B, 5C) 6 Lower Arm Drive Circuit ( 6A, 6B, 6C) 7 Overcurrent detection resistor 8 Negative resistance element (thermistor) 10 Semiconductor device (intelligent power module) 11 Power board part with upper arm 12 Power board part with lower arm 13 Diode current Adjustment resistor 14 Printed wiring (wiring pattern) 15 Control IC equipped with a drive circuit for the upper arm 16 Control IC equipped with a drive circuit for the lower arm 17 AC terminal row 18 Control terminal row 19 Rectangular container 20 Surge voltage suppression means (Schottky diode) 21 Control power supply (Vcc) 30 Surge voltage suppression means (condenser) 33) Adjusting resistor for diode current 34 Surge voltage suppressing means (air wiring) Vcc Control power supply terminal O / S Overcurrent signal input terminal OH Overheat detection signal input terminal A / E Alarm signal common output terminal GND Ground line terminal

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】スイッチング素子としてのIGBTを搭載
した複数のパワー基板部と、その駆動回路を搭載した制
御用ICとが方形容器に収納され、各相一対のIGBT
が直流ライン間にアーム接続されて直流端子および交流
端子が前記方形容器の枠状部分に配列されるとともに、
制御用ICがIGBTの過電流および短絡電流検出信号
の入力端子,IGBT側に配された負性抵抗素子による
過熱検出信号の入力端子と,駆動回路が過電流,短絡電
流,または過熱を検出して発するアラーム信号の共通出
力端子とを備えたものにおいて、IGBTのスイッチン
グに伴って共通出力端子に生ずる過熱アラーム信号の誤
動作をサージ電圧の抑制によって阻止するサージ電圧抑
制手段を制御用ICの共通出力端子側に設けてなること
を特徴とする半導体装置。
Claims: 1. A plurality of power board parts each having an IGBT as a switching element mounted therein and a control IC having a drive circuit thereof housed in a rectangular container, and a pair of IGBTs for each phase.
Is arm-connected between the DC lines and the DC terminal and the AC terminal are arranged in the frame-shaped portion of the rectangular container,
The control IC detects the overcurrent and short circuit current detection signals of the IGBT, the overheat detection signal of the negative resistance element arranged on the IGBT side, and the drive circuit detects overcurrent, short circuit current or overheat. A common output terminal of the control IC, which is provided with a common output terminal for the alarm signal issued by the control IC, which is provided with a surge voltage suppressing means for preventing the malfunction of the overheat alarm signal generated at the common output terminal due to the switching of the IGBT by suppressing the surge voltage. A semiconductor device characterized by being provided on a terminal side.
【請求項2】サージ電圧抑制手段が制御用ICのアラー
ム信号の共通出力端子から制御電源電圧入力端子に向か
う方向を順方向として接続された一方向性降伏ダイオー
ドからなり、その順電圧降下が制御用IC内寄生ダイオ
ードのそれ以下であることを特徴とする請求項1記載の
半導体装置。
2. The surge voltage suppressing means is composed of a unidirectional breakdown diode connected with the direction from the common output terminal of the alarm signal of the control IC to the control power supply voltage input terminal as the forward direction, and the forward voltage drop thereof is controlled. 2. The semiconductor device according to claim 1, wherein the semiconductor diode is less than or equal to the parasitic diode in the IC for use.
【請求項3】サージ電圧抑制手段が制御用ICのアラー
ム信号の共通出力端子とグランドライン端子との間に接
続されたコンデンサからなり、その静電容量が0.6n
F以上2nF以下であることを特徴とする請求項1記載
の半導体装置。
3. A surge voltage suppressing means comprises a capacitor connected between a common output terminal of an alarm signal of a control IC and a ground line terminal, and has a capacitance of 0.6n.
The semiconductor device according to claim 1, which is F or more and 2 nF or less.
【請求項4】サージ電圧抑制手段が制御用ICの共通出
力端子と方形容器の枠状部分に配列された制御端子列と
を結ぶ空中配線からなることを特徴とする請求項1記載
の半導体装置。
4. The semiconductor device according to claim 1, wherein the surge voltage suppressing means comprises an aerial wire connecting the common output terminal of the control IC and the control terminal array arranged in the frame-shaped portion of the rectangular container. .
JP9039694A 1994-04-28 1994-04-28 Semiconductor device Pending JPH07297695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9039694A JPH07297695A (en) 1994-04-28 1994-04-28 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9039694A JPH07297695A (en) 1994-04-28 1994-04-28 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH07297695A true JPH07297695A (en) 1995-11-10

Family

ID=13997429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9039694A Pending JPH07297695A (en) 1994-04-28 1994-04-28 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH07297695A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6215634B1 (en) 1998-04-10 2001-04-10 Fuji Electric Co., Ltd. Drive circuit for power device
JP2006166691A (en) * 2004-11-10 2006-06-22 Mitsubishi Electric Corp Semiconductor apparatus for electric power
US7312427B2 (en) 2003-04-22 2007-12-25 Matsushita Electric Industrial Co., Ltd. High-frequency dielectric heating device and printed board with thermistor
KR20190048707A (en) * 2017-10-31 2019-05-09 현대오트론 주식회사 Power Semiconductor Chip
JP2021061750A (en) * 2018-07-24 2021-04-15 広東美的制冷設備有限公司Gd Midea Air−Conditioning Equipment Co.,Ltd. Intelligent power module drive ic circuit, intelligent power module, and air conditioner
US11456658B2 (en) 2018-07-24 2022-09-27 Gd Midea Air-Conditioning Equipment Co., Ltd. Driver IC circuit of intelligent power module, intelligent power module, and air conditioner

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6215634B1 (en) 1998-04-10 2001-04-10 Fuji Electric Co., Ltd. Drive circuit for power device
US7312427B2 (en) 2003-04-22 2007-12-25 Matsushita Electric Industrial Co., Ltd. High-frequency dielectric heating device and printed board with thermistor
JP2006166691A (en) * 2004-11-10 2006-06-22 Mitsubishi Electric Corp Semiconductor apparatus for electric power
US7538587B2 (en) 2004-11-10 2009-05-26 Mitsubishi Denki Kabushiki Kaisha Power semiconductor device
JP4682007B2 (en) * 2004-11-10 2011-05-11 三菱電機株式会社 Power semiconductor device
KR20190048707A (en) * 2017-10-31 2019-05-09 현대오트론 주식회사 Power Semiconductor Chip
JP2021061750A (en) * 2018-07-24 2021-04-15 広東美的制冷設備有限公司Gd Midea Air−Conditioning Equipment Co.,Ltd. Intelligent power module drive ic circuit, intelligent power module, and air conditioner
US11456658B2 (en) 2018-07-24 2022-09-27 Gd Midea Air-Conditioning Equipment Co., Ltd. Driver IC circuit of intelligent power module, intelligent power module, and air conditioner

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