JPH07277864A - High-temperature heat resistant member - Google Patents

High-temperature heat resistant member

Info

Publication number
JPH07277864A
JPH07277864A JP7474694A JP7474694A JPH07277864A JP H07277864 A JPH07277864 A JP H07277864A JP 7474694 A JP7474694 A JP 7474694A JP 7474694 A JP7474694 A JP 7474694A JP H07277864 A JPH07277864 A JP H07277864A
Authority
JP
Japan
Prior art keywords
graphite
silicon
single crystal
silicon carbide
temperature heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7474694A
Other languages
Japanese (ja)
Inventor
Hirobumi Harada
博文 原田
Takeshi Yamauchi
剛 山内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP7474694A priority Critical patent/JPH07277864A/en
Publication of JPH07277864A publication Critical patent/JPH07277864A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/009After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B41/00After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
    • C04B41/45Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
    • C04B41/50Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
    • C04B41/5093Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials with elements other than metals or carbon
    • C04B41/5096Silicon
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2111/00Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
    • C04B2111/00474Uses not provided for elsewhere in C04B2111/00
    • C04B2111/00844Uses not provided for elsewhere in C04B2111/00 for electronic applications

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To prevent consumption of this member by reaction with SiO2, to prolong its life and to prevent degradation in the quality of a single crystal by coating the surfaces of the graphite or silicon carbide used in a single crystal pulling up device, etc., with silicon. CONSTITUTION:Graphite is baked or the graphite material after the baking is formed to a desired shape by cutting out, etc., or the surfaces of the graphite material after the molding or the metallic material, etc., formed by other metals, etc., are coated with silicon carbide as the base material to be used for a crucible 5b, heat insulating member 11, heater 6 for heating, a heat shielding plate for cooling of the single crystal S not shown, etc., of the parts to be exposed to the high temp. in the silicon single crystal pulling up device. The silicon films are formed by a CVD method or thermal spraying at a thickness of <=1000mum on the surfaces of the graphite or silicon carbide base material formed to the desired shapes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、高温耐熱性部材に関
し、特に半導体単結晶製造をするための装置に用いられ
る高温耐熱性部材に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high temperature heat resistant member, and more particularly to a high temperature heat resistant member used in an apparatus for producing a semiconductor single crystal.

【0002】[0002]

【従来の技術】単結晶の引上げ装置は、一般的に、図1
に示すような構成である。図1に示す装置1は、主にシ
リコン溶融のための構造体が収容される加熱チャンバ2
aと引き上げられるシリコン結晶体Sを収納する引き上
げチャンバ2bが分離機構20により分離、接続が可能
なように接続されたチャンバ2を有し、加熱チャンバ2
a内には、るつぼ5と、このるつぼ5の主に側面部を取
り囲むように配置された加熱ヒータ6とが設けられてい
る。るつぼ5にはこの加熱ヒータ6によって溶融された
シリコンが収容される。このるつぼ5は、図示されてい
ない駆動装置と回転軸4によって接続され、この駆動装
置によって所定の速度で回転される。通常、るつぼ5
は、石英るつぼ5aとこれを保護する黒鉛製るつぼ5b
とから構成されている。また、加熱ヒータ6の加熱チャ
ンバ2a側には断熱部材11が設けられているが、これ
は、加熱ヒータ6からの熱が加熱チャンバ2a外部に逃
げるのを防止するためである。
2. Description of the Related Art A single crystal pulling apparatus is generally shown in FIG.
The configuration is as shown in. The apparatus 1 shown in FIG. 1 comprises a heating chamber 2 in which a structure mainly for melting silicon is housed.
a and the pulling chamber 2b for containing the silicon crystal S to be pulled have a chamber 2 connected so that they can be separated and connected by the separating mechanism 20, and the heating chamber 2
A crucible 5 and a heater 6 arranged so as to mainly surround the side surface of the crucible 5 are provided in a. The crucible 5 contains the silicon melted by the heater 6. The crucible 5 is connected to a driving device (not shown) by a rotary shaft 4, and is rotated at a predetermined speed by the driving device. Usually a crucible 5
Is a quartz crucible 5a and a graphite crucible 5b for protecting it.
It consists of and. Further, a heat insulating member 11 is provided on the heating chamber 2a side of the heating heater 6 to prevent heat from the heating heater 6 from escaping to the outside of the heating chamber 2a.

【0003】一方、引き上げチャンバ2b内には、頂壁
を挿通して垂下された引き上げワイヤ7が設けられ、こ
の引き上げワイヤ7の下端には種結晶8を保持するチャ
ック9が設けられている。この引き上げワイヤ7の上端
側は、ワイヤ巻上機10に巻回されており、シリコン結
晶体Sを所定の速度で引き上げるようになっている。そ
して、チャンバ2内には、引き上げチャンバ2bに形成
されたガス導入口12からアルゴンガスが導入され、加
熱チャンバ2a内をまんべんなく流通してガス流出口1
3から排出される。このようにアルゴンガスを流通させ
るのは、シリコンの溶融に伴ってチャンバ2内に発生す
るSiOをシリコン融液内に混入させないようにするた
めである。
On the other hand, inside the pulling chamber 2b, a pulling wire 7 which is hung down through the top wall is provided, and a chuck 9 for holding a seed crystal 8 is provided at the lower end of the pulling wire 7. The upper end side of the pulling wire 7 is wound around the wire hoisting machine 10 to pull up the silicon crystal body S at a predetermined speed. Then, the argon gas is introduced into the chamber 2 from the gas introduction port 12 formed in the pulling chamber 2b, and the argon gas is evenly distributed in the heating chamber 2a and the gas outlet 1
Emitted from 3. The reason why the argon gas is circulated in this way is to prevent the SiO generated in the chamber 2 due to the melting of silicon from being mixed into the silicon melt.

【0004】上述のように構成された単結晶引上げ装置
の黒鉛製るつぼ5bや断熱部材11等として、黒鉛が用
いられているが、シリコン単結晶引上げ装置にあって
は、単結晶体の原料であるシリコン融液中のSiと石英
製のるつぼから出るOによって装置内部にSiOが生
じ、このSiOと黒鉛のCが反応して黒鉛部材そのもの
が消耗したり、この黒鉛部材の消耗によって生じたCO
がシリコン融液中に混入することにより単結晶の品質を
低下させるなどの問題があった。
Graphite is used as the graphite crucible 5b and the heat insulating member 11 of the single crystal pulling apparatus constructed as described above, but in the silicon single crystal pulling apparatus, it is a raw material of a single crystal body. Si in a silicon melt and O emitted from a quartz crucible generate SiO in the inside of the apparatus, and the SiO reacts with C of graphite to consume the graphite member itself or CO generated by the consumption of the graphite member.
However, there is a problem in that the quality of the single crystal is deteriorated by being mixed in the silicon melt.

【0005】このような黒鉛の消耗やCOの発生を防ぐ
ための方法として、特公昭59−149,593号公報
では黒鉛製部材にCVD法により黒鉛部材表面をSiC
により被覆する方法が、また、特開昭62−113,7
82号公報には黒鉛を金属やセラミックスで被覆する方
法等が開示されている。
As a method for preventing such consumption of graphite and generation of CO, Japanese Patent Publication No. 59-149,593 discloses a graphite member whose surface is covered with SiC by a CVD method.
The method of coating according to JP-A-62-113,7 is also known.
Japanese Patent Publication No. 82 discloses a method of coating graphite with metal or ceramics.

【0006】しかしながら、内部が1100〜1600
℃と言った単結晶引上げ装置の内部では、高温のために
SiCも下式に示すような反応が生じて、SiCが消耗
してCOの発生を完全に防止することができない。 SiC+SiO→2Si+CO↑ 一方、金属を黒鉛に被覆した場合には、高融点金属と言
えどもこの金属自体は高温により少なからず蒸発するた
め、シリコン単結晶に混入する恐れがあり、同様にセラ
ミックス等もその組成物中の成分が蒸発したり、SiO
と反応して生じた反応生成物が単結晶中に混入する等、
超高純度の品質が求められる単結晶の品質低下をもたら
し、単結晶引上げ装置に用いることは好ましくない。
However, the inside is 1100 to 1600.
In the inside of the single crystal pulling apparatus such as ℃, due to the high temperature, SiC also undergoes a reaction as shown in the following formula, so that SiC is consumed and CO cannot be completely prevented from being generated. SiC + SiO → 2Si + CO ↑ On the other hand, when a metal is coated with graphite, even if it is a refractory metal, the metal itself will evaporate to a large extent due to high temperature, and therefore it may be mixed in the silicon single crystal. The components in the composition evaporate, and SiO
The reaction product generated by reacting with is mixed in the single crystal,
It is not preferable to use it in a single crystal pulling apparatus because it causes deterioration of the quality of the single crystal which requires ultra-high purity quality.

【0007】[0007]

【発明が解決しようとする課題】そこで、本発明の目的
は、内部が高温の装置、特に単結晶引上げ装置内部に用
いられる黒鉛または炭化ケイ素等のSiOとの反応によ
る消耗を防止し、黒鉛または炭化ケイ素部材の長寿命化
を図り、かつ引き上げられる単結晶の品質低下を防止す
ることである。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to prevent the consumption of graphite or silicon carbide, which is used in the inside of a high temperature apparatus, especially a single crystal pulling apparatus, by the reaction with SiO. It is intended to extend the life of the silicon carbide member and prevent the quality of the pulled single crystal from being deteriorated.

【0008】[0008]

【課題を解決するための手段】上記諸目的は、黒鉛また
は炭化ケイ素の表面をシリコンにより被覆したことを特
徴とする高温耐熱性部材により達成される。
The above objects can be achieved by a high temperature heat resistant member characterized in that the surface of graphite or silicon carbide is coated with silicon.

【0009】[0009]

【作用】本発明による高温耐熱性部材は、黒鉛または炭
化ケイ素の表面をシリコンによって被覆することによ
り、単結晶体の原料であるシリコン融液中のSiと石英
製のるつぼから出るOによって装置内部に生じるSiO
と黒鉛または炭化ケイ素中のCと反応することがなくな
り、黒鉛または炭化ケイ素部材の消耗を防止することが
でき、かつこの黒鉛または炭化ケイ素部材の消耗によっ
て生じるCOの発生も防止することができるため、高純
度の単結晶の製造が可能となる。
In the high temperature heat resistant member according to the present invention, by coating the surface of graphite or silicon carbide with silicon, Si in the silicon melt, which is the raw material of the single crystal, and O coming out of the quartz crucible are used for the inside of the apparatus. Generated in SiO
Since it does not react with C in graphite or silicon carbide, consumption of the graphite or silicon carbide member can be prevented, and generation of CO caused by consumption of the graphite or silicon carbide member can be prevented. Therefore, it becomes possible to manufacture a high-purity single crystal.

【0010】[0010]

【実施例】以下、本発明を実施例により詳細に説明す
る。
EXAMPLES The present invention will be described in detail below with reference to examples.

【0011】本発明の高温耐熱性部材の形成は、基材と
して黒鉛を焼成もしくは焼成後の黒鉛材料の削り出し等
により所望の形に形成するか、または形成後の黒鉛材料
またはその他の金属等により形成された金属材等の表面
に炭化ケイ素を被覆したものを用いる。この所望の形に
形成した黒鉛または炭化ケイ素基材表面をCVD法や溶
射形成によりシリコン(Si)膜により被覆する。この
シリコン膜は、多結晶状でもアモルファス状でも特に限
定されるものではないが、このとき被覆するシリコン膜
の厚みは1000μm以下、好ましくは300μm程度
とする。この厚みが1000μmを越えると黒鉛と被覆
したシリコン膜との熱膨張の違いによりシリコン膜に割
れやひびが入り、そこからシリコンが脱落したり、黒鉛
がのぞきSiOと反応する等して好ましくなく、一方1
00μm未満であると、シリコン厚が薄すぎるためにシ
リコンでの被覆率が良くなく、黒鉛中のCがSiOと反
応して好ましくない。
The high temperature heat-resistant member of the present invention is formed by firing graphite as a base material or shaving the graphite material after firing to obtain a desired shape, or the formed graphite material or other metal. The surface of the metal material or the like formed by is coated with silicon carbide is used. The surface of the graphite or silicon carbide substrate formed in this desired shape is covered with a silicon (Si) film by the CVD method or thermal spraying. The silicon film is not particularly limited to polycrystal or amorphous, but the thickness of the silicon film to be coated at this time is 1000 μm or less, preferably about 300 μm. If this thickness exceeds 1000 μm, the silicon film may be cracked or cracked due to the difference in thermal expansion between the graphite and the coated silicon film, silicon may drop off from the silicon film, or the graphite may react with the peeping SiO. While 1
When the thickness is less than 00 μm, the coverage of silicon is not good because the silicon thickness is too thin, and C in the graphite reacts with SiO, which is not preferable.

【0012】上述のようにして形成された本発明の高温
耐熱性部材は、単結晶引上げ装置において、装置内部の
高温に晒される部分に用いられる。具体的には例えば図
1に示したような単結晶引上げ装置内部のるつぼ5b、
断熱部材11、加熱ヒータ6、さらに、図示してはいな
いが、引上げ中の単結晶体Sを取り囲むように形成され
る単結晶体Sの冷却用熱遮蔽板等である。
The high temperature heat resistant member of the present invention formed as described above is used in a portion of a single crystal pulling apparatus exposed to a high temperature inside the apparatus. Specifically, for example, the crucible 5b inside the single crystal pulling apparatus as shown in FIG.
The heat insulating member 11, the heater 6, and a heat shield plate for cooling the single crystal S, which is formed so as to surround the single crystal S being pulled, are also provided, although not shown.

【0013】上述のように本発明の高温耐熱性部材をシ
リコン単結晶引上げ装置に用いた場合、高温での装置内
部のSiOと基材である黒鉛または炭化ケイ素のCとの
反応を完全に防止することができるため、基材である黒
鉛または炭化ケイ素の消耗を防止し、これら黒鉛または
炭化ケイ素製部材の長寿命化を図り、かつ、これら黒鉛
または炭化ケイ素中のCが製品に混入するのを防止する
ことができるため、より高純度のシリコン単結晶体を製
造することができる。
As described above, when the high temperature heat resistant member of the present invention is used in a silicon single crystal pulling apparatus, the reaction between SiO inside the apparatus and C of the base material graphite or silicon carbide is completely prevented at high temperature. Therefore, the consumption of graphite or silicon carbide as a base material is prevented, the life of these graphite or silicon carbide members is extended, and C in the graphite or silicon carbide is mixed in the product. Since this can be prevented, a higher purity silicon single crystal body can be manufactured.

【0014】また、本発明の高温耐熱性部材は、単結晶
引上げ装置に用いられる以外に、例えば光ファイバー製
造装置、液晶ディスプレイ用硝子材製造装置、レンズ用
硝子製造装置、半導体素子製造に用いられる熱酸化およ
び熱拡散炉等のように、装置内部が高温となり、しかも
製造されるものにSiを含有し高純度の品質が要求され
るような製造装置において、これまで黒鉛や炭化ケイ素
等が用いられているような部材に代り好適に使用するこ
とができる。
Further, the high temperature heat resistant member of the present invention is used not only in a single crystal pulling apparatus but also in an optical fiber manufacturing apparatus, a glass material manufacturing apparatus for liquid crystal displays, a glass manufacturing apparatus for lenses, a semiconductor element manufacturing apparatus. Graphite, silicon carbide, etc. have been used up to now in manufacturing equipment such as oxidation and thermal diffusion furnaces where the inside of the equipment has a high temperature and the manufactured material contains Si and requires high-purity quality. It can be suitably used in place of the member described above.

【0015】[0015]

【発明の効果】以上説明したように、本発明の高温耐熱
性部材は、基材である黒鉛または炭化ケイ素のCの消耗
を完全に防止することができるため、これら黒鉛または
炭化ケイ素製部材の長寿命化を図り、かつ、これら黒鉛
または炭化ケイ素中のCが製品に混入し、製品の汚染や
純度の低下を防止することができ、より高純度の製品を
製造することができる。
As described above, the high temperature heat resistant member of the present invention can completely prevent the consumption of C of graphite or silicon carbide as the base material, and therefore, the high temperature heat resistant member of the graphite or silicon carbide member can be used. It is possible to prolong the service life, prevent carbon in the graphite or silicon carbide from being mixed into the product, and prevent the product from being contaminated or the purity from being lowered, so that a product with higher purity can be manufactured.

【図面の簡単な説明】[Brief description of drawings]

【図1】 単結晶引上げ装置の一例を説明するための図
面である。
FIG. 1 is a drawing for explaining an example of a single crystal pulling apparatus.

【符号の説明】[Explanation of symbols]

1…単結晶引上げ装置、 2…チャンバ、 2a…加熱チャンバ、 2b…引上げチャンバ、 4…回転軸、 5…るつぼ、 5a…石英るつぼ、 5b…黒鉛るつぼ、 6…加熱ヒータ、 7…ワイヤ、 9…チャック、 10…ワイヤ巻上機、 11…断熱部材、 12…ガス導入口、 13…ガス排出口、 20…分離機構。 DESCRIPTION OF SYMBOLS 1 ... Single-crystal pulling apparatus, 2 ... Chamber, 2a ... Heating chamber, 2b ... Pulling chamber, 4 ... Rotating shaft, 5 ... Crucible, 5a ... Quartz crucible, 5b ... Graphite crucible, 6 ... Heating heater, 7 ... Wire, 9 ... Chuck, 10 ... Wire hoisting machine, 11 ... Insulating member, 12 ... Gas inlet, 13 ... Gas outlet, 20 ... Separation mechanism.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 黒鉛または炭化ケイ素の表面をシリコン
により被覆したことを特徴とする高温耐熱性部材。
1. A high temperature heat-resistant member, characterized in that the surface of graphite or silicon carbide is coated with silicon.
JP7474694A 1994-04-13 1994-04-13 High-temperature heat resistant member Pending JPH07277864A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7474694A JPH07277864A (en) 1994-04-13 1994-04-13 High-temperature heat resistant member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7474694A JPH07277864A (en) 1994-04-13 1994-04-13 High-temperature heat resistant member

Publications (1)

Publication Number Publication Date
JPH07277864A true JPH07277864A (en) 1995-10-24

Family

ID=13556132

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7474694A Pending JPH07277864A (en) 1994-04-13 1994-04-13 High-temperature heat resistant member

Country Status (1)

Country Link
JP (1) JPH07277864A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112899772A (en) * 2019-11-19 2021-06-04 Ftb研究所株式会社 Single crystal growth apparatus, method of using the same, and single crystal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112899772A (en) * 2019-11-19 2021-06-04 Ftb研究所株式会社 Single crystal growth apparatus, method of using the same, and single crystal
CN112899772B (en) * 2019-11-19 2024-04-05 Ftb研究所株式会社 Single crystal growth apparatus, method for using the same, and single crystal

Similar Documents

Publication Publication Date Title
US4956153A (en) Apparatus for Czochralski single crystal growing
WO1997021853A1 (en) Single crystal production apparatus and process
EP0229322A2 (en) Method and apparatus for Czochralski single crystal growing
US4676968A (en) Melt consolidation of silicon powder
JPH0218379A (en) Device for pulling up semiconductor single crystal
JP4601437B2 (en) Quartz glass crucible with inner surface semi-crystallized and manufacturing method thereof
JP3625636B2 (en) Method for producing quartz glass crucible for pulling silicon single crystal
JP2005231986A (en) Quartz glass crucible for pulling up silicon single crystal and method for manufacturing the same
JPH0639351B2 (en) Apparatus and method for manufacturing single crystal ingot
JP2008115056A (en) Crucible for melting silicon and mold-releasing material used in the crucible
JP3601939B2 (en) Method and apparatus for manufacturing quartz glass crucible
JP2004292210A (en) Quartz crucible for pulling silicon single crystal
JPH07277864A (en) High-temperature heat resistant member
KR101111681B1 (en) Apparatus to produce hyper-pure single crystal silicon ingot
JP2937109B2 (en) Single crystal manufacturing apparatus and manufacturing method
JP4890044B2 (en) Chlorosilane reactor
KR100544778B1 (en) A Grower For Silicon Single Crystal Ingot With A Heat Shield Coated With Boron Nitride Layer
JPS6018638B2 (en) Silicon single crystal pulling equipment
JPH07223894A (en) Apparatus for production of semiconductor single crystal
JP2001002490A (en) Single crystal pulling up device
JP2580198B2 (en) Single crystal pulling device
JP2800482B2 (en) Method for producing silicon single crystal
JPH11292685A (en) Apparatus for extending life of graphite susceptor for growing silicon single crystal by coating with silicon nitride and extending method
JPH1112091A (en) Production of spherical single crystal silicon
KR101477163B1 (en) Apparatus of czochralski single crystal silicon ingot