JPH0548866B2 - - Google Patents
Info
- Publication number
- JPH0548866B2 JPH0548866B2 JP60279716A JP27971685A JPH0548866B2 JP H0548866 B2 JPH0548866 B2 JP H0548866B2 JP 60279716 A JP60279716 A JP 60279716A JP 27971685 A JP27971685 A JP 27971685A JP H0548866 B2 JPH0548866 B2 JP H0548866B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- resistance
- patterns
- disconnection
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 12
- 239000002131 composite material Substances 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は布線検査方式、特に、プリント配線板
等の回路パターンの短絡および断線の検出を行な
う布線検査方式に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wiring inspection method, and particularly to a wiring inspection method for detecting short circuits and disconnections in circuit patterns of printed wiring boards and the like.
従来の布線検査方式は、被試験物内の回路パタ
ーン及び２つのパターン間の抵抗値を測定するた
めの抵抗計と、抵抗計を試験すべき回路パターン
の２点に接続するためのリレー回路部とを含んで
構成されていた。
The conventional wiring inspection method uses an ohmmeter to measure the circuit pattern within the test object and the resistance value between the two patterns, and a relay circuit to connect the ohmmeter to two points on the circuit pattern to be tested. It was composed of:
次に従来の布線検査方式について図面を参照し
て詳細に説明する。 Next, a conventional wiring inspection method will be explained in detail with reference to the drawings.
第２図は従来の布線検査方式の一例を示すブロ
ツク図である。第２図に示す布線検査方式は、被
試験物１内の各パターン端点に接続されるリレー
回路部４と、リレー回路部４により選択された２
点間の抵抗を測定するための抵抗計２とを含んで
いる。ここで被試験物１内のパターンＡ，Ｂ，Ｃ
は、第３図に示す様なプリント配線板等の回路パ
ターンＡ，Ｂ，Ｃを簡略化し、直線として表現し
たものである。 FIG. 2 is a block diagram showing an example of a conventional wiring inspection method. The wiring inspection method shown in FIG.
and a resistance meter 2 for measuring resistance between points. Here, patterns A, B, C in the test object 1
The circuit patterns A, B, and C of a printed wiring board as shown in FIG. 3 are simplified and expressed as straight lines.
まず、パターンＡの断線を検査するために、リ
レー回路部４はａ−ｄ間及びa′−ｅ間を閉じ、抵
抗計２は、パターンＡの両端ａ−a′の抵抗値を測
定する。このときパターンＡ内に断線がなければ
測定される抵抗値は微小な値となり、逆に断線が
あれば抵抗値は大きくなる。同様にしてｂ−ｄ
間、b′−ｅ間の接続によりパターンＢの断線検査
ができ、ｃ−ｄ間、c′−ｅ間の接続によりパター
ンｃの断線検査ができる。次に、リレー回路部４
がａ−ｄ間及びb′−ｅ間を閉じることにより抵抗
計２はパターンＡとパターンＢに含まれる２点間
の抵抗を測定する。ここでパターンＡ，Ｂに断線
がなくパターンＡとパターンＢ間に短絡があれ
ば、測定される抵抗値は微小なものとなり、逆に
短絡がない場合には抵抗値は大きくなる。 First, in order to check for disconnection in pattern A, the relay circuit section 4 closes the connections between ad and a' and e, and the resistance meter 2 measures the resistance value at both ends a and a' of pattern A. At this time, if there is no wire breakage in the pattern A, the measured resistance value will be a minute value, and conversely, if there is a wire breakage, the resistance value will be large. Similarly b-d
A disconnection test for pattern B can be performed by connecting between and b' and e, and a disconnection test for pattern c can be performed by connecting between c and d and c' and e. Next, relay circuit section 4
By closing between a and d and between b' and e, the resistance meter 2 measures the resistance between two points included in pattern A and pattern B. Here, if there is no disconnection in patterns A and B and there is a short circuit between pattern A and pattern B, the measured resistance value will be minute, and conversely, if there is no short circuit, the resistance value will be large.
同様にして、ｂ−ｄ間、c′−ｅ間の接続により
パターンＢ−Ｃ間の短絡検査ができ、ａ−ｄ間、
c′−ｅ間の接続によりパターンＡ−Ｃ間の短絡検
査ができる。一方、パターンＡ内に断線がある場
合、パターンＡと他のパターンとの短絡を検査す
るためには、パターンＡの２つの端点ａ，a′につ
いてそれぞれ独立に他のパターンとの短絡を調べ
る必要が生じる。従つて、全パターンの内、正常
パターンの数をN1とし、断線のあるパターンの
数をN2とすると、断線検査にN1＋N2回、短絡検
査にN1＋2N2 C2回で合計N1＋N2＋
（N1＋2N2）！／２（N1＋2N2−２）！回の検査が必要と
なる。 In the same way, short circuits between patterns B and C can be tested by connecting between b and d and between c' and e, and between a and d.
A short circuit test between patterns A and C can be performed by connecting between c' and e. On the other hand, if there is a break in pattern A, in order to check for short circuits between pattern A and other patterns, it is necessary to check the two end points a and a' of pattern A independently for short circuits with other patterns. occurs. Therefore, if the number of normal patterns among all patterns is N 1 and the number of patterns with wire breakage is N 2 , the total number of wire breakage tests is N 1 + N 2 times and short circuit testing is N 1 + 2N 2 C 2 times. N 1 +N 2 +
(N 1 + 2N 2 )! /2(N 1 +2N 2 -2)! Multiple inspections are required.
上記３パターンの例では、各パターンに断線の
ない場合で６回全パターン断線の場合には３＋
6C2＝18回の検査を要する。 In the example of the 3 patterns above, if there is no disconnection in each pattern, and all patterns are disconnected 6 times, 3+
6 C 2 = 18 tests required.
上述した従来の布線検査方式は、被試験物内の
回路パターンの１つ１つを独立に試験するため、
抵抗計とパターンとの接続を切換えるためのリレ
ー回路部が、パターンの数と共に複雑化すると共
に、測定回数も増加し、検査時間が長くなるとい
う欠点があつた。
The conventional wiring inspection method described above tests each circuit pattern in the device under test independently.
The disadvantage is that the relay circuit for switching the connection between the resistance meter and the patterns becomes more complex as the number of patterns increases, the number of measurements increases, and the inspection time becomes longer.
本発明の布線検査方式は、互いに異なる抵抗値
をもつ複数の抵抗器を有する抵抗器部と、前記抵
抗器部に接続された抵抗計とを含んで構成され
る。
The wiring inspection method of the present invention includes a resistor section having a plurality of resistors having mutually different resistance values, and a resistance meter connected to the resistor section.
次に、本発明の実施例について、図面を参照し
て詳細に説明する。
Next, embodiments of the present invention will be described in detail with reference to the drawings.
第１図は本発明の一実施例を示すブロツク図で
ある。第１図に示す布線検査方式は、被試験物１
の各パターンに接続される異なる抵抗値をもつ抵
抗器R1，R2，R3，R4，R5が直列接続された抵抗
器部３と抵抗計２とを含んで構成される。ここで
被試験物１は第２図に示す様な、プリント配線板
等の回路パターンＡ，Ｂ，Ｃを簡略化して表現し
たものである。 FIG. 1 is a block diagram showing one embodiment of the present invention. The wiring inspection method shown in Figure 1 is as follows:
The structure includes a resistor unit 3 and a resistance meter 2, in which resistors R 1 , R 2 , R 3 , R 4 , R 5 having different resistance values are connected in series. Here, the test object 1 is a simplified representation of circuit patterns A, B, and C of a printed wiring board, etc., as shown in FIG.
第１図において、抵抗器R1，R3，R5はそれぞ
れパターンＡ，Ｂ，Ｃに並列接続され、R2，R4
はそれぞれパターンＡ−Ｂ間及びＢ−Ｃ間を接続
している。また抵抗計２の測定端子ｄ，ｅはそれ
ぞれパターンＡの端点ａ及びパターンＣの端点
C′に接続している。ここで、抵抗計２により抵抗
値を測定することにより、各パターンの断線及び
短絡の状態に応じて、以下の様な値が得られる。 In FIG. 1, resistors R 1 , R 3 , R 5 are connected in parallel to patterns A, B, C, respectively, and R 2 , R 4
connects patterns A and B and patterns B and C, respectively. Also, the measurement terminals d and e of the resistance meter 2 are the end point a of pattern A and the end point of pattern C, respectively.
Connected to C′. Here, by measuring the resistance value with the resistance meter 2, the following values can be obtained depending on the state of disconnection and short circuit of each pattern.
断線・短絡なし……Ｒ＝R2＋R4（Ｒ：測定抵抗
値）
パターンＡ断線……Ｒ＝R2＋R4＋R1
パターンＢ断線……Ｒ＝R2＋R4＋R1
パターンＣ断線……Ｒ＝R2＋R4＋R5
Ａ−Ｂ間短絡……Ｒ＝R2＋R4−R2
Ｂ−Ｃ間短絡……Ｒ＝R2＋R4−R4
Ｃ−Ａ間短絡……Ｒ＝R2＋R4−R2−R4
従つて、１回の測定により、正常な抵抗値と、
測定された抵抗値との比較することで、各パター
ンの断線及び短絡の検出を行なうことができる。 No disconnection or short circuit...R=R 2 +R 4 (R: Measured resistance value) Pattern A disconnection...R=R 2 +R 4 +R 1 Pattern B disconnection...R=R 2 +R 4 +R 1 Pattern C disconnection... R=R 2 +R 4 +R 5 Short circuit between A and B...R=R 2 +R 4 -R 2 Short circuit between B and C...R=R 2 +R 4 -R 4 Short circuit between C and A...R=R 2 +R 4 -R 2 -R 4 Therefore, by one measurement, the normal resistance value and
By comparing with the measured resistance value, it is possible to detect disconnections and short circuits in each pattern.
ここで、抵抗器R1〜R5の抵抗値は、不良場所
を明らかにするために、異なる値でなければなら
ないが、R1の抵抗値に対し、例えばR2＝2R1、
R3＝4R1、R4＝8R1、R5＝16R1とすることによ
り、測定値Ｒの値により、以下の様な不良診断が
できる。 Here, the resistance values of resistors R 1 to R 5 must be different values in order to reveal the defective location, but for example, R 2 = 2R 1 for the resistance value of R 1 ,
By setting R 3 = 4R 1 , R 4 = 8R 1 , and R 5 = 16R 1 , the following failure diagnosis can be made based on the measured value R.
Ｒ＝10R1……断線・短絡なし。 R=10R 1 ...No disconnection or short circuit.
Ｒ＝11R1……パターンＡ断線。 R=11R 1 ... Pattern A disconnection.
Ｒ＝14R1……パターンＢ断線。 R=14R 1 ...Pattern B disconnection.
Ｒ＝26R1……パターンＣ断線。 R=26R 1 ...Pattern C disconnection.
Ｒ＝8R1……Ａ−Ｂ間短絡。 R=8R 1 ... Short circuit between A and B.
Ｒ＝2R2……Ｂ−Ｃ間短絡。 R=2R 2 ... Short circuit between B and C.
Ｒ＝０……Ｃ−Ａ間短絡。 R=0...C-A short circuit.
本発明の布線検査方式は、被試験物内の各布線
パターンと、抵抗計とを接続するためのリレー回
路部を設ける代りに、異なる値の複数の抵抗器を
設けることにより、パターンの数の増加と共に複
雑化するリレー回路部を簡素化できると共に、１
回の抵抗値測定で、パターンの短絡・断線が検出
できるため、検査時間の大巾な短絡が可能になる
という効果がある。
In the wiring inspection method of the present invention, instead of providing a relay circuit section for connecting each wiring pattern in the object under test and a resistance meter, a plurality of resistors of different values are provided to check the pattern. It is possible to simplify the relay circuit section, which becomes complicated as the number increases, and also
Since short circuits and disconnections in the pattern can be detected by measuring the resistance value twice, short circuits can be detected over a wide range of inspection time.
第１図は本発明の一実施例を含むブロツク図、
第２図は従来の布線検査方式を示すブロツク図、
第３図は第１図及び第２図に示す被試験物の布線
パターンである。
１……被試験物、２……抵抗計、３……抵抗器
部、４……リレー回路部、Ａ，Ｂ，Ｃ……布線パ
ターン、R1，R2，R3，R4，R5……抵抗器。
FIG. 1 is a block diagram including an embodiment of the present invention;
Figure 2 is a block diagram showing the conventional wiring inspection method.
FIG. 3 shows the wiring pattern of the test object shown in FIGS. 1 and 2. 1... Test object, 2... Resistance meter, 3... Resistor section, 4... Relay circuit section, A, B, C... Wiring pattern, R 1 , R 2 , R 3 , R 4 , R5 ...Resistor.
Claims (1)
列接続され各接続点に被検査回路パターンが接続
される抵抗部と、前記抵抗器部の両端に接続され
た抵抗計とを有し、前抵抗器の抵抗値と前記被検
査回路パターンの回路状態との組合せにより計算
上求められる複数推定合成抵抗値と前記抵抗計の
実測抵抗値とを比較することにより前記被検査回
路パターンの良否を判定することを特徴とする布
線検査方式。1. It has a resistance section in which a plurality of resistors having different resistance values are connected in series and a circuit pattern to be tested is connected to each connection point, and a resistance meter connected to both ends of the resistor section, and a resistance meter is connected to both ends of the resistance section. The acceptability of the circuit pattern to be inspected is determined by comparing a plurality of estimated composite resistance values calculated based on a combination of the resistance value of the device and the circuit state of the circuit pattern to be inspected with the actual resistance value of the resistance meter. A wiring inspection method characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60279716A JPS62137571A (en) | 1985-12-11 | 1985-12-11 | Wiring inspecting system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60279716A JPS62137571A (en) | 1985-12-11 | 1985-12-11 | Wiring inspecting system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62137571A JPS62137571A (en) | 1987-06-20 |
| JPH0548866B2 true JPH0548866B2 (en) | 1993-07-22 |
Family
ID=17614884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60279716A Granted JPS62137571A (en) | 1985-12-11 | 1985-12-11 | Wiring inspecting system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62137571A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0242368A (en) * | 1988-08-02 | 1990-02-13 | Nec Corp | Wiring inspection system |
| JP2548395B2 (en) * | 1989-09-04 | 1996-10-30 | シャープ株式会社 | Anisotropic conductive film sticking device |
-
1985
- 1985-12-11 JP JP60279716A patent/JPS62137571A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62137571A (en) | 1987-06-20 |
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