JPH0531074A - Eye refraction measuring device - Google Patents

Eye refraction measuring device

Info

Publication number
JPH0531074A
JPH0531074A JP3208497A JP20849791A JPH0531074A JP H0531074 A JPH0531074 A JP H0531074A JP 3208497 A JP3208497 A JP 3208497A JP 20849791 A JP20849791 A JP 20849791A JP H0531074 A JPH0531074 A JP H0531074A
Authority
JP
Japan
Prior art keywords
refraction
split
light
difference
objective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3208497A
Other languages
Japanese (ja)
Inventor
Yoshi Kobayakawa
嘉 小早川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP3208497A priority Critical patent/JPH0531074A/en
Publication of JPH0531074A publication Critical patent/JPH0531074A/en
Pending legal-status Critical Current

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  • Eye Examination Apparatus (AREA)

Abstract

PURPOSE:To measure the difference between the subjective refraction value and the objective refraction value and semi-objectively perform the correct eye refraction measurement with the difference. CONSTITUTION:The light from a light source 11 is projected to a split plate 10 with a slit and a split prism, and slit images are projected on the eyeground Er of an eye under test E from two positions of a pupil P through a filter 9 with the transmission band in the visual range and the near infrared range respectively and a two-hole aperture 7 with two openings. The reflected image by the visual light on the eyeground Er and the reflected image by the near infrared light differ from each other due to the difference in the color aberration and the eyeground reflection position. A person under test moves a lens 8 to subjectively match the split by the visual light, and the subjective refraction value is obtained from there. The objective refraction value is obtained from the split image by the near infrared light forming an image on an image pickup element 5, and the difference between two refraction values is determined.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、眼科や眼鏡店で使用す
る眼屈折測定装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an eye refraction measuring device used in ophthalmology and spectacle stores.

【0002】[0002]

【従来の技術】従来、他覚的な眼屈折測定には近赤外光
を使ったオートレフラクトメータが使用されるのが一般
的である。
2. Description of the Related Art Conventionally, an autorefractometer using near infrared light is generally used for objective eye refraction measurement.

【0003】[0003]

【発明が解決しようとする課題】しかし、網膜における
近赤外光の反射面は可視光の反射面よりも奥にあるため
に、測定値が自覚的測定によるものと合致せず、またそ
のずれにも個人差があるという問題がある。そのため、
他覚的測定による屈折値は、より正確な自覚的測定の出
発点或いは参考値として使用されていることが多い。
However, since the reflection surface of near-infrared light on the retina is deeper than the reflection surface of visible light, the measured values do not match those measured by subjective measurement, and their deviations are caused. However, there is a problem that there are individual differences. for that reason,
The refraction value obtained by objective measurement is often used as a starting point or reference value for more accurate subjective measurement.

【0004】一方、自覚的測定には被検者の的確な応答
が必要であり、幼児等の被検者によっては測定が困難で
ある。
On the other hand, the subjective measurement requires an accurate response of the subject, which is difficult for some subjects such as infants.

【0005】本発明の目的は、自覚的屈折値と他覚的屈
折値の差を測定し、その差を利用して半他覚的に正確な
眼屈折測定を行う眼屈折測定装置を提供することにあ
る。
An object of the present invention is to provide an eye refraction measuring apparatus for measuring a difference between a subjective refraction value and an objective refraction value and utilizing the difference to perform semi-objective accurate eye refraction measurement. Especially.

【0006】[0006]

【課題を解決するための手段】上述の目的を達成するた
めの本発明に係る眼屈折測定装置は、可視光により瞳の
2個所から指標を投影する指標投影系と、該指標の視度
を被検者が調節する調節手段と、近赤外光で光位置セン
サにより他覚的に眼屈折測定を行う他覚屈折測定手段
と、前記調節手段の状態と前記他覚屈折測定手段による
測定値とから自覚的屈折値と他覚的屈折値の差を求める
演算手段と有することを特徴とするものである。
An eye refraction measuring apparatus according to the present invention for achieving the above-mentioned object, an index projection system for projecting an index from two positions of a pupil by visible light, and a diopter of the index. Adjusting means adjusted by the subject, objective refraction measuring means for objectively measuring eye refraction by the optical position sensor with near infrared light, state of the adjusting means and measurement value by the objective refraction measuring means It is characterized by having a calculating means for obtaining the difference between the subjective refraction value and the objective refraction value from the above.

【0007】[0007]

【作用】上述の構成を有する眼屈折測定装置は、可視光
により被検眼瞳の2個所から被検眼に投影された指標像
を、被検者が調節手段を操作することにより一致させ、
その時の調節手段の状態から自覚的屈折値を得る。
In the eye refraction measuring device having the above-mentioned structure, the index image projected by the visible light from the two positions of the pupil of the eye to be inspected is made coincident by the subject operating the adjusting means,
The subjective refraction value is obtained from the state of the adjusting means at that time.

【0008】[0008]

【実施例】本発明を図示の実施例に基づいて詳細に説明
する。図1は第1の実施例であり、被検眼Eの眼軸を通
る光路O1上には、対物レンズ1、穴あきミラー2、図2
に示すように瞳Pに共役な中心開口3aを持つ絞り3、
レンズ4、近赤外光に感度を有するCCDから成る撮像
素子5を有するテレビカメラ6が順次に配置されてい
る。また、穴あきミラー2の反射方向の光路O2上には、
図3に示すように瞳Pに共役な開口7a、7bを有する
2穴絞り7、レンズ8、図4に示すように可視域λ1
低いレベルの透過バンドと近赤外域λ2 の高いレベルの
透過バンドを有するフィルタ9、図5に示すようにスリ
ット10a、スプリットプリズム10b、10cを有す
るスプリット板10、光源11が順次に配置されてい
る。また、テレビカメラ6の出力は演算装置12に接続
されている。更に、矢印方向に動くレンズ4、8は、被
検者が動かすことができるようになっている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail based on the illustrated embodiments. FIG. 1 shows a first embodiment, in which an objective lens 1, a perforated mirror 2, and an optical path O1 passing through the eye axis of an eye E to be inspected are provided.
, A diaphragm 3 having a central aperture 3a conjugate to the pupil P,
A television camera 6 having a lens 4 and an image pickup device 5 composed of a CCD sensitive to near infrared light is sequentially arranged. Also, on the optical path O2 in the reflection direction of the perforated mirror 2,
As shown in FIG. 3, a 2-hole diaphragm 7 having apertures 7a and 7b conjugated to the pupil P, a lens 8, and a low-level transmission band in the visible region λ 1 and a high level in the near-infrared region λ 2 as shown in FIG. 5, a filter 9 having a transmission band, a slit 10a, a split plate 10 having split prisms 10b and 10c, and a light source 11 are sequentially arranged as shown in FIG. The output of the television camera 6 is connected to the arithmetic unit 12. Further, the lenses 4 and 8 that move in the directions of the arrows can be moved by the subject.

【0009】光源11からの光はスプリット板10、フ
ィルタ9、レンズ8、2穴2穴絞り7、穴あきミラー
2、対物レンズ1を通って、被検眼Eの瞳の2個所から
被検眼E内に入り、眼底Erにスプリット光束を投影す
る。眼底Erからの反射光は対物レンズ1、穴あきミラー
2の穴、絞り3、レンズ4を通って、CCD撮像素子5
にスプリット光束を結像する。レンズ4、8が動いてス
プリット板10が可視光眼底に共役になると、被検眼E
にはスプリットが合致して1本に見える。
The light from the light source 11 passes through the split plate 10, the filter 9, the lens 8, the two-hole two-hole diaphragm 7, the perforated mirror 2, and the objective lens 1 from two positions of the pupil of the eye E to be examined E. It enters inside and projects the split light flux onto the fundus Er. The reflected light from the fundus Er passes through the objective lens 1, the hole of the perforated mirror 2, the diaphragm 3 and the lens 4, and the CCD image pickup device 5
The split light flux is imaged on. When the lenses 4 and 8 move and the split plate 10 becomes conjugate with the fundus of visible light, the eye E
The splits match and looks like one.

【0010】しかし、被検眼Eにより可視光によるスプ
リットが合致しても、テレビカメラ6に映される近赤外
光による像は、色収差や眼底反射位置の相違のために、
図6に示すようにスプリットがずれている。そこで、こ
れらの像を通る走査線S1、S1の信号を演算装置12に取
り込み、近赤外光の眼底反射位置を計算する。従って、
レンズ4、8を被検者が動かして自覚的にスプリットを
合致することによって、可視光の自覚屈折値を求めるこ
とができ、その時点での近赤外線によるスプリット像か
ら、他覚的屈折値を求めることができる。
However, even if the split by the visible light is matched by the eye E to be inspected, the image by the near infrared light projected on the television camera 6 is due to the chromatic aberration and the difference in the fundus reflection position.
The split is displaced as shown in FIG. Therefore, the signals of the scanning lines S1 and S1 passing through these images are taken into the arithmetic unit 12 and the fundus reflection position of near infrared light is calculated. Therefore,
The subjective refraction value of the visible light can be obtained by the subject moving the lenses 4 and 8 to subjectively match the split, and the objective refraction value can be obtained from the split image by the near infrared rays at that time. You can ask.

【0011】なお、スプリット視標の代りに補色から成
る2本のスリットを瞳の2個所から投影してもよい。そ
の場合には、合致すると白色の1本の線となる。
Instead of the split target, two slits of complementary colors may be projected from two positions of the pupil. In that case, if they match, a single white line is formed.

【0012】図7は第2の実施例の構成図であり、被検
眼Eの前方の光路O3上には自覚屈折検査レンズ21、ダ
イクロイックミラー22が順次に配置され、その遠方に
は視標23が設置されている。また、自覚屈折検査レン
ズ21は例えばホロプタのように多数の度の違うレンズ
を有しており、ターレット24、25、26を適当に回
転させて自在にディオプタを変えることができるように
なっている。ダイクロイックミラー22の反射方向の光
路O4上には、可視光を反射し赤外光を透過するダイクロ
イックミラー27、LED光源を使用し公知の近赤外他
覚的屈折測定手段28が順次に配置されており、ダイク
ロイックミラーの反射方向の光路O5上にはレンズ29、
スプリット投影系30が配置されている。このスプリッ
ト投影系30は第1の実施例と同様のものであり、レン
ズ29側から2穴絞り7、レンズ8、スプリット板1
0、光源11によって構成されていて、スプリット板1
0と光源11は矢印のように動くようになっている。
FIG. 7 is a block diagram of the second embodiment, in which the subjective refraction test lens 21 and the dichroic mirror 22 are sequentially arranged on the optical path O3 in front of the eye E to be inspected, and the optotype 23 is located in the distance. Is installed. Further, the subjective refraction inspection lens 21 has a large number of lenses with different degrees, such as a holopter, and the turrets 24, 25 and 26 can be appropriately rotated to freely change the diopter. .. On the optical path O4 in the reflection direction of the dichroic mirror 22, a dichroic mirror 27 that reflects visible light and transmits infrared light, and a known near infrared objective refraction measuring means 28 that uses an LED light source are sequentially arranged. Lens 29, on the optical path O5 in the reflection direction of the dichroic mirror,
A split projection system 30 is arranged. The split projection system 30 is similar to that of the first embodiment, and the two-hole diaphragm 7, the lens 8 and the split plate 1 are arranged from the lens 29 side.
0, a light source 11, and a split plate 1
0 and the light source 11 move as shown by arrows.

【0013】図8はこの実施例のブロック回路構成図で
ある。中央の計算機能を持つコントローラ31は、自覚
屈折検査レンズ21のターレット24、26の入力手
段、スプリット板10の位置入力手段32、他覚屈折値
の入力手段33、他覚測定釦34等とそれぞれ接続され
ている。
FIG. 8 is a block circuit diagram of this embodiment. The controller 31 having a central calculation function includes input means for the turrets 24 and 26 of the subjective refraction test lens 21, position input means 32 for the split plate 10, objective refraction value input means 33, and objective measurement button 34, respectively. It is connected.

【0014】スプリット投影系30はダイクロイックミ
ラー22、自覚屈折検査レンズ21を介して被検眼Eに
スプリット光束を投影し、被検者は自覚屈折検査レンズ
21、ダイクロイックミラー22を通して視標23を見
ている状態で、スプリット板10、光源11を動かして
スプリットを合致させる。この時点で、近赤外他覚的屈
折測定手段28によって他覚的に屈折値を測定し、可視
光による自覚値と近赤外の他覚値との関係を求める。
The split projection system 30 projects the split light flux onto the eye E through the dichroic mirror 22 and the subjective refraction test lens 21, and the subject looks at the visual target 23 through the subjective refraction test lens 21 and the dichroic mirror 22. The split plate 10 and the light source 11 are moved in this state to match the splits. At this point, the near-infrared objective refraction measuring unit 28 objectively measures the refraction value to obtain the relationship between the subjective value of visible light and the objective value of the near-infrared.

【0015】なお、他覚的屈折測定手段28としては、
近赤外スポット光を瞳孔中心から眼底に投影し、瞳孔周
辺の複数個所から光束を取り出して撮像素子上に受光
し、それらの光束の位置関係から屈折値を演算装置で算
出する方法が採られているが、測定方式がこれに限られ
るものではないことはいうまでもない。
As the objective refraction measuring means 28,
A method is adopted in which near-infrared spot light is projected from the center of the pupil to the fundus, light fluxes are extracted from multiple locations around the pupil, received on an image sensor, and the refraction value is calculated by a computing device from the positional relationship of these light fluxes. However, it goes without saying that the measurement method is not limited to this.

【0016】なお、自他覚の測定値の差が判っていれ
ば、自覚屈折検査レンズ21の選択は他覚的屈折測定手
段28の測定値を使って行うことができ、被検者の応答
をそれほど用いなくとも正確な屈折測定ができる。
If the difference between the measured values of the subjective objective is known, the subjective refraction test lens 21 can be selected by using the measured value of the objective refraction measuring means 28, and the response of the subject. Accurate refraction measurement is possible without using much.

【0017】[0017]

【発明の効果】以上説明したように本発明に係る眼屈折
測定装置は、可視光による自覚的屈折値と近赤外光によ
る他覚的屈折値の差を求めることができ、この差を用い
ることによって、被検者の応答を最小限にして正確な眼
屈折測定が可能となる。
As described above, the eye refraction measuring apparatus according to the present invention can obtain the difference between the subjective refraction value of visible light and the objective refraction value of near infrared light and use this difference. This enables accurate eye refraction measurement while minimizing the response of the subject.

【図面の簡単な説明】[Brief description of drawings]

【図1】第1の実施例の構成図である。FIG. 1 is a configuration diagram of a first embodiment.

【図2】中心開口絞りの正面図である。FIG. 2 is a front view of a central aperture stop.

【図3】2穴絞りの正面図である。FIG. 3 is a front view of a two-hole diaphragm.

【図4】フィルタの透過特性である。FIG. 4 is a transmission characteristic of a filter.

【図5】スプリット板の正面図である。FIG. 5 is a front view of a split plate.

【図6】スプリット像の説明図である。FIG. 6 is an explanatory diagram of a split image.

【図7】第2の実施例の構成図である。FIG. 7 is a configuration diagram of a second embodiment.

【図8】第2の実施例のブロック回路構成図である。FIG. 8 is a block circuit configuration diagram of a second embodiment.

【符号の説明】[Explanation of symbols]

2 穴あきミラー 5 撮像素子 6 テレビカメラ 7 2穴絞り 10 スプリット板 11 光源 12 演算装置 21 自覚屈折検査レンズ 22 ダイクロイックミラー 23 視標 28 他覚的屈折測定手段 30 スプリット投影系 31 コントローラ 2 Mirror with a hole 5 Image sensor 6 Television camera 7 2 Aperture 10 Split plate 11 Light source 12 Arithmetic device 21 Subjective refraction test lens 22 Dichroic mirror 23 Target 28 Objective refraction measuring means 30 Split projection system 31 Controller

Claims (1)

【特許請求の範囲】 【請求項1】 可視光により瞳の2個所から指標を投影
する指標投影系と、該指標の視度を被検者が調節する調
節手段と、近赤外光で光位置センサにより他覚的に眼屈
折測定を行う他覚屈折測定手段と、前記調節手段の状態
と前記他覚屈折測定手段による測定値とから自覚的屈折
値と他覚的屈折値の差を求める演算手段と有することを
特徴とする眼屈折測定装置。
Claim: What is claimed is: 1. An index projection system for projecting an index from two positions of a pupil by visible light, an adjusting means for adjusting a diopter of the index by a subject, and a near infrared light. The difference between the subjective refraction value and the objective refraction value is obtained from the objective refraction measuring means for objectively measuring the eye refraction by the position sensor, and the state of the adjusting means and the measurement value by the objective refraction measuring means. An eye refraction measuring device comprising: an arithmetic unit.
JP3208497A 1991-07-25 1991-07-25 Eye refraction measuring device Pending JPH0531074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3208497A JPH0531074A (en) 1991-07-25 1991-07-25 Eye refraction measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3208497A JPH0531074A (en) 1991-07-25 1991-07-25 Eye refraction measuring device

Publications (1)

Publication Number Publication Date
JPH0531074A true JPH0531074A (en) 1993-02-09

Family

ID=16557141

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3208497A Pending JPH0531074A (en) 1991-07-25 1991-07-25 Eye refraction measuring device

Country Status (1)

Country Link
JP (1) JPH0531074A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1444945A1 (en) * 2001-11-13 2004-08-11 Kabushiki Kaisha TOPCON Optometric device
JP2007097873A (en) * 2005-10-05 2007-04-19 Topcon Corp Ocular optical characteristic measuring apparatus
CN106444028A (en) * 2016-09-27 2017-02-22 成都虚拟世界科技有限公司 Near-to-eye display system and virtual reality equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1444945A1 (en) * 2001-11-13 2004-08-11 Kabushiki Kaisha TOPCON Optometric device
EP1444945A4 (en) * 2001-11-13 2009-04-01 Topcon Corp Optometric device
JP2007097873A (en) * 2005-10-05 2007-04-19 Topcon Corp Ocular optical characteristic measuring apparatus
CN106444028A (en) * 2016-09-27 2017-02-22 成都虚拟世界科技有限公司 Near-to-eye display system and virtual reality equipment
CN106444028B (en) * 2016-09-27 2019-11-19 成都虚拟世界科技有限公司 A kind of near-eye display system and virtual reality device

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