JPH05243534A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH05243534A
JPH05243534A JP4270892A JP4270892A JPH05243534A JP H05243534 A JPH05243534 A JP H05243534A JP 4270892 A JP4270892 A JP 4270892A JP 4270892 A JP4270892 A JP 4270892A JP H05243534 A JPH05243534 A JP H05243534A
Authority
JP
Japan
Prior art keywords
phase clock
wiring
integrated circuit
semiconductor integrated
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4270892A
Other languages
Japanese (ja)
Inventor
Suketaka Yamada
資隆 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4270892A priority Critical patent/JPH05243534A/en
Publication of JPH05243534A publication Critical patent/JPH05243534A/en
Pending legal-status Critical Current

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  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To reduce clock skew in a two-layer clock wiring. CONSTITUTION:A first-phase clock wiring phi1 is wired parallel and adjoining to an upper side of a cell line and a second-phase clock wiring phi2 is wired parallel and adjoining to a lower side of a cell line. Thereby, it is possible to eliminate malfunction due to cross talk, to enable easy isometric wiring across the two-phase clock and to reduce mutual clock skew.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体集積回路に関し、
特に2相クロックの配線構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit,
Particularly, it relates to a wiring structure of a two-phase clock.

【0002】[0002]

【従来の技術】従来例の半導体集積回路の2相クロック
配線のレイアウト図を図3に示す。この図では、スタン
ダードセル列での2相クロックの配線φ1,φ2を示し
ている。図中、1,2は各々、第1相のクロックφ1を
受けるラッチ回路のセル,第2相のクロックφ2を受け
るラッチ回路のセルであり、3〜8は所望機能をもつセ
ルである。
2. Description of the Related Art FIG. 3 shows a layout diagram of a two-phase clock wiring of a conventional semiconductor integrated circuit. In this figure, two-phase clock wirings φ1 and φ2 in the standard cell column are shown. In the figure, 1 and 2 are cells of a latch circuit that receives a first-phase clock φ1, a cell of a latch circuit that receives a second-phase clock φ2, and 3 to 8 are cells having a desired function.

【0003】この回路では、2相のクロック配線φ1,
φ2が、図のようにセル列間の配線チャンネル領域で第
1相クロックφ1と第2相クロックφ2と隣接し、平行
して配線され、各々のラッチ回路のセル1,2に分配さ
れていた。
In this circuit, two-phase clock wiring φ1,
.phi.2 was adjacent to the first-phase clock .phi.1 and the second-phase clock .phi.2 in the wiring channel region between the cell columns as shown in the figure, and was wired in parallel and distributed to the cells 1 and 2 of each latch circuit. ..

【0004】[0004]

【発明が解決しようとする課題】この従来例の構造で
は、前述したように第1相クロックφ1と第2相クロッ
クφ2がスキューを小さくするがために各々隣接し平行
して配線されるため、隣接の距離が長いと、クロストー
クにより誤動作する問題があった。
In the structure of this conventional example, as described above, the first-phase clock φ1 and the second-phase clock φ2 are wired adjacent to each other in order to reduce the skew. If the adjacent distance is long, there is a problem that malfunction occurs due to crosstalk.

【0005】本発明の目的は、このような問題を解決
し、クロストークを少なくして誤動作を除くようにした
半導体集積回路を提供することにある。
An object of the present invention is to provide a semiconductor integrated circuit which solves such a problem and reduces crosstalk to eliminate malfunction.

【0006】[0006]

【課題を解決するための手段】本発明の構成は、2相ク
ロックで動作し、順序回路と組合せ回路とを有し、高さ
の等しい所望の機能をもつセルがゲートアレイまたはス
タンダードセル方式のレイアウトにより構成された集積
回路において、前記2相クロック配線のうち第1相のク
ロック配線をセル高の等しいセル列上辺または下辺に沿
って平行に配線し、第2相のクロック配線を同セル列下
辺または上辺に沿って平行に配線することを特徴とす
る。
The structure of the present invention operates with a two-phase clock, has a sequential circuit and a combinational circuit, and cells having a desired function of the same height are of the gate array or standard cell type. In the integrated circuit configured by the layout, the first-phase clock wirings of the two-phase clock wirings are wired in parallel along the upper side or the lower side of the cell row having the same cell height, and the second-phase clock wirings are arranged in the same cell row. It is characterized in that wiring is provided in parallel along the lower side or the upper side.

【0007】[0007]

【実施例】図1は本発明の第1の実施例でのスタンダー
ドセルの概略レイアウト図である。図において1,2は
ラッチ機能回路セル、3〜7は所望の機能のセル、φ1
は第1相のクロック配線、φ2は第2相のクロック配線
である。セル列とセル列の間はセル間を接続し所望の機
能を得るための配線チャンネル領域であり、通常自動化
が図られ多層のアルミ等で配線される領域である。
1 is a schematic layout diagram of a standard cell according to a first embodiment of the present invention. In the figure, 1 and 2 are latch function circuit cells, 3 to 7 are cells having desired functions, and φ1
Is a first-phase clock wiring, and φ2 is a second-phase clock wiring. Between the cell rows is a wiring channel area for connecting the cells to obtain a desired function, which is usually an area where automation is performed and wiring is made of a multi-layer aluminum or the like.

【0008】本実施例では、第1相のクロック配線φ1
を各セル列の上辺に平行して配線し、第1相クロック使
用のラッチ回路セル1に入力されている。同様に、第2
相クロック配線φ2は同セル列の下辺に平行して配線
し、第2相クロック使用のラッチ回路セル2に入力され
ている。
In this embodiment, the first phase clock wiring φ1
Are wired in parallel to the upper side of each cell row and are input to the latch circuit cell 1 using the first phase clock. Similarly, the second
The phase clock wiring φ2 is wired in parallel with the lower side of the cell row and is input to the latch circuit cell 2 using the second phase clock.

【0009】図2(a),(b)は本発明の第2の本実
施例の部分平面図である。本実施例は、図1と異なり、
レイアウトの簡単な平面図であり、図2(a)は前述と
同様のラッチ回路セル1,2と、電源線10,グランド
線11をセル内に配設している。2相クロックの第1相
クロック配線φ1は、電源線10の外側に隣接平行し
て、電源線と同一の金属層により配線し、ラッチ回路セ
ル1にコンタクトホール12を介し入力されている。同
様に、第2相クロック配線φ2は、グランド線11の外
側に隣接平行して前記と同一の金属層で配線している。
FIGS. 2A and 2B are partial plan views of the second embodiment of the present invention. This embodiment differs from FIG. 1 in that
FIG. 2A is a simple plan view of the layout. In FIG. 2A, the same latch circuit cells 1 and 2, the power supply line 10 and the ground line 11 are arranged in the cell. The first-phase clock wiring φ1 for the two-phase clock is arranged adjacent to and parallel to the outside of the power supply line 10 by the same metal layer as the power supply line, and is input to the latch circuit cell 1 through the contact hole 12. Similarly, the second-phase clock wiring φ2 is arranged adjacent to and parallel to the outside of the ground line 11 in the same metal layer as described above.

【0010】本実施例の構成によれば、第1相,第2相
クロック配線を隣接させていないので、クロストークに
よる誤動作をなくし、相互のクロックスキューも小さく
なる。
According to the configuration of this embodiment, since the first-phase and second-phase clock wirings are not adjacent to each other, malfunction due to crosstalk is eliminated and mutual clock skew is reduced.

【0011】図2(b)は図2(a)と異なり、いずれ
のクロック配線φ1,φ2も電源線10,グランド線1
1の内側に隣接平行して配線されている。なお、第1相
のクロック配線φ1と第2相のクロック配線φ2の間
は、セル内部配線等の他の信号配線が走るべく領域が十
分あるものとする。
Unlike FIG. 2A, FIG. 2B is different from FIG. 2A in that both clock wirings φ1 and φ2 have a power supply line 10 and a ground line 1.
It is wired in parallel with the inside of 1. It is assumed that there is a sufficient area between the first-phase clock wiring φ1 and the second-phase clock wiring φ2 so that other signal wirings such as cell internal wiring can run.

【0012】この図2の例では、クロック配線をグラン
ド線11,電源線10に隣接平行に配線しシールドした
形になっているので、図1の構造よりも一層他信号の影
響を受けにくくし、クロックスキューを小さくできる。
In the example of FIG. 2, since the clock wiring is shielded by wiring in parallel with the ground line 11 and the power supply line 10 in parallel, it is more difficult to be affected by other signals than the structure of FIG. , Clock skew can be reduced.

【0013】[0013]

【発明の効果】以上説明したように本発明は、2相クロ
ック配線における第1相クロック配線と第2相クロック
配線を各々同志の隣接平行配線をなくし、クロストーク
により誤動作をなくし、また各々のクロック配線も等長
配線にしやすく、互いのクロックスキューも小さくなる
という効果がある。
As described above, according to the present invention, the first-phase clock wiring and the second-phase clock wiring in the two-phase clock wiring do not have the adjacent parallel wirings of each other, and the malfunction due to the crosstalk is eliminated. There is an effect that it is easy to make the clock wirings of equal length and the mutual clock skew is also reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例のレイアウト図。FIG. 1 is a layout diagram of a first embodiment of the present invention.

【図2】(a),(b)は本発明の第2の実施例のレイ
アウト図。
2A and 2B are layout diagrams of a second embodiment of the present invention.

【図3】従来例の半導体集積回路のレイアウト図。FIG. 3 is a layout diagram of a conventional semiconductor integrated circuit.

【符号の説明】[Explanation of symbols]

1,2 第1相,第2相クロックを受けるラッチ回路
セル 3〜8 機能セル(組合せ回路) 10 電源線 11 グランド線 12 φ1,φ2の金属線とラッチ回路への入力線と
のコンタクトホール
1, 2 First-phase and second-phase clock latch circuit cells 3-8 Functional cells (combinational circuit) 10 Power supply line 11 Ground line 12 Contact holes between metal wires of φ1 and φ2 and input lines to the latch circuit

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 2相クロックで動作し、順序回路と組合
せ回路とを有し、高さが等しい所望の機能をもつセルが
ゲートアレイまたはスタンダードセル方式のレイアウト
により構成された半導体集積回路において、前記2相ク
ロック配線のうち第1相のクロック配線をセル高の等し
いセル列上辺または下辺に沿って平行に配線し、第2相
のクロック配線を同セル列下辺または上辺に沿って平行
に配線することを特徴とする半導体集積回路。
1. A semiconductor integrated circuit that operates with a two-phase clock, has a sequential circuit and a combinational circuit, and has cells having a desired function with the same height in a gate array or standard cell layout. Among the two-phase clock wirings, the first-phase clock wirings are wired in parallel along the upper side or the lower side of the cell row having the same cell height, and the second-phase clock wirings are wired in parallel along the lower side or the upper side of the same cell row. A semiconductor integrated circuit comprising:
【請求項2】 第1相クロック配線及び第2相クロック
配線がセル内の電源線及び接地線に沿ってそれぞれ配線
されたものである請求項1記載の半導体集積回路。
2. The semiconductor integrated circuit according to claim 1, wherein the first-phase clock wiring and the second-phase clock wiring are wired along a power supply line and a ground line in the cell, respectively.
JP4270892A 1992-02-28 1992-02-28 Semiconductor integrated circuit Pending JPH05243534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4270892A JPH05243534A (en) 1992-02-28 1992-02-28 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4270892A JPH05243534A (en) 1992-02-28 1992-02-28 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH05243534A true JPH05243534A (en) 1993-09-21

Family

ID=12643574

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4270892A Pending JPH05243534A (en) 1992-02-28 1992-02-28 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH05243534A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6753702B2 (en) 2001-08-29 2004-06-22 Nec Electronics Corporation Semiconductor integrated circuit and its layout method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61226943A (en) * 1985-03-30 1986-10-08 Toshiba Corp Standard cell for automatic disposal wiring
JPH01251738A (en) * 1988-03-31 1989-10-06 Toshiba Corp Standard cell
JPH02303145A (en) * 1989-05-18 1990-12-17 Kawasaki Steel Corp Cell for integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61226943A (en) * 1985-03-30 1986-10-08 Toshiba Corp Standard cell for automatic disposal wiring
JPH01251738A (en) * 1988-03-31 1989-10-06 Toshiba Corp Standard cell
JPH02303145A (en) * 1989-05-18 1990-12-17 Kawasaki Steel Corp Cell for integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6753702B2 (en) 2001-08-29 2004-06-22 Nec Electronics Corporation Semiconductor integrated circuit and its layout method

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Effective date: 19980908