JPH05223746A - Method and device for detecting defect of transparent object - Google Patents
Method and device for detecting defect of transparent objectInfo
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- JPH05223746A JPH05223746A JP5723092A JP5723092A JPH05223746A JP H05223746 A JPH05223746 A JP H05223746A JP 5723092 A JP5723092 A JP 5723092A JP 5723092 A JP5723092 A JP 5723092A JP H05223746 A JPH05223746 A JP H05223746A
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- Prior art keywords
- light
- solid
- defect
- state image
- camera
- Prior art date
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- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Closed-Circuit Television Systems (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、ガラスびん等の透明体
（半透明体も含む）の欠陥、例えばガラスびんの場合で
はその胴部の肉厚又は表面部に生ずる泡と言われる空洞
や表面の凹部等の有無を、固体撮像素子カメラを使用し
て検出する透明体の欠陥検査方法及び装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to defects in transparent bodies (including translucent bodies) such as glass bottles, and in the case of glass bottles, for example, cavities called bubbles generated in the thickness of the body or on the surface. The present invention relates to a transparent body defect inspection method and apparatus for detecting the presence or absence of a recess or the like on the surface by using a solid-state imaging device camera.
【０００２】[0002]
【従来の技術】本出願人は、この種の装置として特開昭
３−１６３３４０号公報に記載されているものを既に提
案している。この欠陥検出装置は、びんを回転させる回
転手段と、びんの軸線方向に長い帯状光を発するように
多数の光ファイバを配列しかつ互いの帯状光がびんの胴
部で角度をもって交叉するように配置された一対の投光
手段と、帯状光のびん胴部投射位置へ指向させた固体撮
像素子カメラと、該固体撮像素子カメラとびんとの間に
配置され、びんを透過した屈折・散乱光を通過させるス
リットを固体撮像素子カメラの視野中に有する第１の遮
光部材と、該第１の遮光部材と固体撮像素子カメラとの
間に配置され、第１の遮光部材のスリットを通過してき
た光を通過させるスリットを固体撮像素子カメラの視野
中に有する第２の遮光部材とで構成されている。2. Description of the Related Art The applicant of the present application has already proposed a device of this type, which is described in Japanese Patent Application Laid-Open No. 3-163340. This defect detection device comprises rotating means for rotating a bottle and a large number of optical fibers arranged so as to emit a long strip of light in the axial direction of the bottle, and the strips of light cross each other at an angle at the body of the bottle. A pair of light projecting means arranged, a solid-state imaging device camera directed to the projection position of the band-shaped light of the bottle body, and refraction / scattered light which is arranged between the solid-state imaging device camera and the bottle. Is disposed between the first light shielding member and the solid-state imaging device camera, and has a slit through which the first light-shielding member passes through the slit of the first light-shielding member. The second light blocking member has a slit that allows light to pass therethrough in the visual field of the solid-state imaging device camera.
【０００３】この欠陥検出装置では、一対の光源からの
２条の帯状光はびん胴部で交叉し、びん胴部を２方向か
ら透過する。その際、その透過部分に欠陥がなければ、
２条の帯状光は屈折することなく又は屈折しても極く少
ないため、透過光は第１の遮光部材で遮光される。とこ
ろが、泡などの欠陥があると大きく屈折又は散乱するた
め、第１の遮光部材のスリットを通過する。更に、その
通過光のうち、屈折角度がある所定角度範囲の屈折・散
乱光のみが第２の遮光部材のスリットを通過して固体撮
像素子カメラに入光し、この範囲外の光は第２の遮光部
材で遮光される。In this defect detecting device, two strips of light from a pair of light sources intersect at the bottle barrel and are transmitted through the bottle barrel in two directions. At that time, if there is no defect in the transparent part,
Since the two strips of light are not refracted or are extremely small even when refracted, transmitted light is blocked by the first light blocking member. However, when there is a defect such as a bubble, the light is largely refracted or scattered, and thus passes through the slit of the first light shielding member. Further, of the transmitted light, only refracted / scattered light in a predetermined angle range having a refraction angle passes through the slit of the second light shielding member and enters the solid-state imaging device camera, and light outside this range is second The light is blocked by the light blocking member.
【０００４】[0004]
【発明が解決しようとする課題】ところで、ガラスびん
の胴部に生じて欠陥となる泡には、その発生する部位に
より次の３つのタイプに大別される。 (1) 図４に示すようにガラス内部に生ずる断面円形又は
楕円形の泡。 (2) 図５に示すようにびん外表面に発生し、金型に押し
付けられることで縁の部分が凹んだ泡。 (3) 図６に示すようにびん内表面に発生し、びん内側に
薄い膜を持ち、その膜とガラス壁面の浅い窪みで形成さ
れた泡（いわゆる薄泡）。By the way, the bubbles that are defective in the body of the glass bottle are roughly classified into the following three types depending on the site where the bubbles are generated. (1) Bubbles with a circular or elliptical cross section that occur inside the glass as shown in FIG. (2) Bubbles generated on the outer surface of the bottle as shown in Fig. 5 and the edges of which are recessed by being pressed against the mold. (3) Bubbles that occur on the inner surface of the bottle as shown in FIG. 6, have a thin film inside the bottle, and are formed by the film and the shallow depressions on the glass wall surface (so-called thin bubbles).
【０００５】上述した従来の欠陥検出装置は、帯状光の
屈折角度の大小により欠陥の有無を判別するため、その
屈折角度が大きい上記(1) の泡及び(2) の泡については
検出可能であるが、屈折角度が小さい(3) の薄泡は検出
することができない。また、(1) の泡のなかでも、大き
く広がっているものは、ガラス外表面と泡内表面のなす
角度が小さいために屈折角を小さく検出しにくい。Since the above-mentioned conventional defect detection device determines the presence or absence of a defect based on the size of the refraction angle of the band-shaped light, it is possible to detect the bubbles (1) and (2) having a large refraction angle. However, thin bubbles with a small refraction angle (3) cannot be detected. Further, among the bubbles of (1), those that are widely spread have a small refraction angle and are difficult to detect because the angle formed between the glass outer surface and the bubble inner surface is small.
【０００６】本発明の目的は、光が大きく屈折する欠陥
は勿論のこと、上記のように屈折の小さい薄泡などの欠
陥についても、すなわちガラスの肉厚が変化する欠陥を
その大小にかかわらず精度良くしかも簡単に検出できる
ようにすることにある。The object of the present invention is, of course, not only for defects in which light is greatly refracted, but also for defects such as thin bubbles having small refraction as described above, that is, defects in which the thickness of glass changes, regardless of size. It is to be able to detect accurately and easily.
【０００７】[0007]
【課題を解決するための手段】本発明では、光源からの
光を明暗が交互の規則性をもった識別パターンとして透
明物体の検査領域に照射する。そして、その透過光を、
焦点が上記検査領域の後方に位置するようにした固体撮
像素子カメラで撮影し、該カメラの出力の高低を固体撮
像素子の配列順序に従って検出してその高低の変化量が
急峻な画素数を計数し、その画素数が予め設定された個
数以上存在しているとき欠陥有りと判定する。In the present invention, light from a light source is applied to an inspection area of a transparent object as an identification pattern having regularity of alternating light and dark. And the transmitted light,
A solid-state image sensor camera whose focus is located behind the inspection area is used to detect the height of the output of the camera according to the arrangement order of the solid-state image sensors, and the number of pixels with a sharp change in height is counted. However, when the number of pixels is equal to or more than the preset number, it is determined that there is a defect.
【０００８】[0008]
【作用】いま、図１に示すように、複数の横長スリット
５を上下多段に設けたフィルタ４によって光源１からの
光を横縞状の識別パターンとしてガラスびん８に照射す
る場合を想定する。この場合、照射される識別パターン
の光量を連続した一連のアナログ波形にして表すと、同
図に示すように規則的に光量が変化する波形となる。Now, assume that the glass bottle 8 is irradiated with light from the light source 1 as a horizontal striped identification pattern by the filter 4 having a plurality of horizontally long slits 5 provided in a vertically multi-stage manner as shown in FIG. In this case, when the light quantity of the identification pattern to be irradiated is expressed as a continuous series of analog waveforms, it becomes a waveform in which the light quantity regularly changes as shown in FIG.
【０００９】固体撮像素子カメラ１０の焦点はガラスび
んの検査領域の後方にあるため、ガラスびん８の検査領
域に欠陥がないときは、その検査領域を光はそのまま透
過するため、固体撮像素子カメラ１０に撮影される識別
パターンは、規則性は崩れないがピントをずらしている
ことにより明暗差ははっきりしないものとなる。従っ
て、固体撮像素子カメラ１０の固体撮像素子群９からの
出力を一連のアナログ波形にして表すと、明暗による高
低の差が緩やかなしかも大きな振幅をもって交互に規則
的に連続したものとなる。Since the focus of the solid-state image pickup device camera 10 is behind the inspection region of the glass bottle, when there is no defect in the inspection region of the glass bottle 8, light passes through the inspection region as it is. The identification pattern photographed at 10 does not lose regularity, but the difference in brightness becomes unclear because the focus is shifted. Therefore, when the output from the solid-state image pickup device group 9 of the solid-state image pickup device camera 10 is expressed as a series of analog waveforms, the difference in height due to light and dark becomes gentle and has a large amplitude alternately and regularly.
【００１０】ところが、ガラスびんの検査面に上記(1)
、(2) 、(3) のような泡Ｂがあった場合、ガラスの肉
厚はその泡の部分で薄くなり、その薄くなった部分が一
種の凹レンズの作用をすることになるため、明暗交互の
規則性をもった識別パターンは、泡の部分を透過すると
固体撮像素子カメラ１０の固体撮像素子９上でピントが
合ったような状態となる。この場合の固体撮像素子群９
からの出力を一連のアナログ波形にして表すと、明暗に
よる高低の差が急峻なしかも小さい振幅で交互に規則的
に連続したものとなる。However, on the inspection surface of the glass bottle, the above (1)
If there is a bubble B as in (2) and (3), the wall thickness of the glass becomes thin at the bubble part, and the thinned part acts as a kind of concave lens. When the identification pattern having the alternating regularity is transmitted through the bubble portion, the identification pattern is in a focused state on the solid-state image sensor 9 of the solid-state image sensor camera 10. Solid-state image sensor group 9 in this case
When the output from is expressed as a series of analog waveforms, the difference in height due to light and dark is steep and is regularly continuous with a small amplitude.
【００１１】従って、固体撮像素子群９からの出力をデ
ジタル変換してメモリに記憶し、その高低の変化量を強
調するため必要に応じ微分処理した後、その変化量の大
小を固体撮像素子群の配列順序に従って調べ、その変化
量が所定以上に大きくしかもその高低変化が画素数にし
て所定以上存在していたときに、欠陥有り、それ以外の
ときは欠陥無しと判別することができる。Therefore, the output from the solid-state image pickup device group 9 is digitally converted and stored in a memory, and after differentiating as necessary to emphasize the change amount of the high and low, the magnitude of the change amount is determined. It is possible to determine that there is a defect when the change amount is larger than a predetermined value and the change in height is more than a predetermined number of pixels, and otherwise there is no defect.
【００１２】[0012]
【実施例】次に本発明の実施例について詳細に説明す
る。図２は本発明による欠陥検出装置の全体の概要構成
図である。ハロゲンランプ等の光源１からの光は投光器
２から投光され、ミラー３を反射して垂直に設置されて
いる縞フィルタ４に投射される。この縞フィルタ４は、
不透明板に複数の横長のスリット５を上下に一定の間隔
で多段に設けたもので、スリット５のところだけ光が透
過する。この縞フィルタ４の背面には拡散板６が垂直に
設置されており、該拡散板６を透過した光は、ターンテ
ーブル７上で回転される検査対象のガラスびん８に対
し、明暗の横縞による規則性をもった識別パターンにし
て投影される。EXAMPLES Next, examples of the present invention will be described in detail. FIG. 2 is a schematic configuration diagram of the entire defect detection apparatus according to the present invention. Light from a light source 1 such as a halogen lamp is projected from a light projector 2, reflected by a mirror 3 and projected onto a stripe filter 4 installed vertically. This fringe filter 4 is
An opaque plate is provided with a plurality of horizontally long slits 5 vertically arranged in multiple stages at regular intervals, and light is transmitted only at the slits 5. A diffusing plate 6 is vertically installed on the back surface of the striped filter 4, and the light transmitted through the diffusing plate 6 is caused by bright and dark horizontal stripes with respect to a glass bottle 8 to be inspected which is rotated on a turntable 7. It is projected as an identification pattern having regularity.
【００１３】ガラスびん８に投影された識別パターンに
よる光はガラスびん８を透過し、その透過像が、多数の
固体撮像素子９をマトリックス配列している固体撮像素
子カメラ１０により撮影される。この固体撮像素子カメ
ラ１０は前面に拡大レンズ１１を備え、ガラスびん８の
表面の一部分についてだけ検査領域１２として透過像を
撮影する。該固体撮像素子カメラ１０は、その焦点が検
査領域１２より後方、つまりガラスびん８の内部空間中
に位置するように設置されており、ガラスびん８の検査
領域１２の表面をそのまま撮影した像は、意図的にピン
トのずれたぼやけた像となるようにしてある。Light according to the identification pattern projected on the glass bottle 8 passes through the glass bottle 8, and the transmitted image is photographed by a solid-state image pickup device camera 10 in which a large number of solid-state image pickup devices 9 are arranged in a matrix. This solid-state imaging device camera 10 is provided with a magnifying lens 11 on the front surface, and takes a transmission image as an inspection region 12 only on a part of the surface of the glass bottle 8. The solid-state image pickup device camera 10 is installed so that its focal point is located behind the inspection area 12, that is, in the internal space of the glass bottle 8, and an image of the surface of the inspection area 12 of the glass bottle 8 is taken as it is. , The image is intentionally out of focus so that it becomes a blurred image.
【００１４】従って、検査領域１２に泡等の欠陥がなけ
れば、明暗の横縞による識別パターンは明暗の輝度の変
化が緩やかな、つまり輝度差がはっきりしない間延びし
た像として固体撮像素子カメラ１０に撮影される。しか
し、検査領域１２に例えば泡があれば、その泡の部分で
ガラスの肉厚が薄くなって一種の凹レンズのような作用
をするため、泡の部分を透過した識別パターンは固体撮
像素子カメラ１０においてピントが合った状態となり、
明暗の輝度の変化が急峻な、つまり輝度差のはっきりと
したしかも明暗の幅が縦に圧縮された像として撮影され
る。Therefore, if there are no defects such as bubbles in the inspection area 12, the solid-state image pickup device camera 10 picks up an identification pattern formed by horizontal stripes of light and dark as an image that has a gradual change in brightness of dark and light, that is, an image that extends while the difference in brightness is not clear. To be done. However, if there is a bubble in the inspection area 12, the thickness of the glass becomes thin at the bubble portion and acts like a kind of concave lens. Therefore, the identification pattern transmitted through the bubble portion is the solid-state imaging device camera 10. In the state of being in focus,
The image is captured as an image in which the brightness changes sharply, that is, the brightness difference is clear and the brightness range is vertically compressed.
【００１５】固体撮像素子カメラ１０の固体撮像素子群
９からの出力は、カメラコントローラ１３を通じてイメ
ージ処理ユニット１４へ入力され、アナログ／デジタル
変換してメモリに記憶され、明暗による高低の変化量を
強調するため微分処理をされた後、コンピュータ１５に
よりデジタルで画像処理される。イメージ処理ユニット
１４による微分処理後の画像は、その処理程度を視覚確
認するためモニタＣＲＴ１６により再生できるようにな
っている。ガラスびん８の泡の部分を透過した識別パタ
ーンの微分処理後の再生画像は例えば図３に示すように
なる。The output from the solid-state image pickup device group 9 of the solid-state image pickup device camera 10 is inputted to the image processing unit 14 through the camera controller 13 and converted into an analog / digital signal and stored in the memory to emphasize the amount of change in height due to light and dark. In order to do so, the image is digitally processed by the computer 15 after being differentiated. The image after the differential processing by the image processing unit 14 can be reproduced by the monitor CRT 16 in order to visually confirm the processing level. A reproduced image obtained by differentiating the identification pattern transmitted through the bubble portion of the glass bottle 8 is as shown in FIG. 3, for example.
【００１６】コンピュータ１５は、イメージ処理ユニッ
ト１４で微分処理されたデジタルデータを、固体撮像素
子群９の配列順序に従って比較演算することにより、明
暗による輝度差による高低の変化量が所定以上に大きく
しかもその高低変化が画素数にして所定以上連続してい
たときに、欠陥有り、それ以外のときは欠陥無しと判別
する。The computer 15 compares the digital data differentiated by the image processing unit 14 in accordance with the arrangement order of the solid-state image pickup device group 9 so that the amount of change in height due to the brightness difference due to light and dark is larger than a predetermined value. When the change in height is continuous for a predetermined number of pixels or more, it is determined that there is a defect, and otherwise there is no defect.
【００１７】なお、上記の実施例では識別パターンを横
縞としたが、識別パターンは明暗が交互になるものであ
ればどんなものでも良い。更に、本発明はガラスびんに
生ずる泡以外の欠陥、例えばガラスびんの外表面又は内
表面に生ずる凸状又は凹状の欠陥、合わせ目やセッツル
ラインなどの線状段差となる欠陥などであっても検出で
きる。また、ガラスびんの欠陥の有無に限らず、その他
の透明物体（半透明体を含む）に生ずる上記のような欠
陥の検出にも適用できる。Although the identification pattern is horizontal stripes in the above embodiment, any identification pattern may be used as long as light and dark alternate. Furthermore, the present invention can detect defects other than bubbles that occur in glass bottles, such as convex or concave defects that occur on the outer or inner surface of the glass bottle, and defects that form linear steps such as seams and settling lines. it can. Further, the present invention can be applied not only to the presence or absence of a defect in a glass bottle but also to the detection of the above-described defect that occurs in other transparent objects (including a translucent body).
【００１８】[0018]
【発明の効果】本発明は、光源からの光を明暗が交互の
規則性をもった識別パターンとして透明物体の検査領域
に照射し、その透過光を、焦点が検査領域の後方に位置
するようにした固体撮像素子カメラで撮影することによ
り、その検査領域に泡等の欠陥があるときは、識別パタ
ーンが明暗の輝度差がはっきりとしたしかも明暗の幅が
縦に圧縮された像となり、欠陥がなければ、明暗の輝度
差がはっきりしない間延びした像となることを利用して
欠陥の有無を判別するため、光が大きく屈折する欠陥は
勿論のこと、屈折の小さい薄泡などの欠陥についても、
その大小にかかわらず精度良くしかも簡単に検出でき
る。According to the present invention, light from a light source is applied to an inspection area of a transparent object as an identification pattern having regularity of alternating light and dark, and the transmitted light is focused so that the focal point is located behind the inspection area. When there is a defect such as a bubble in the inspection area by shooting with the solid-state image sensor camera, the identification pattern becomes an image in which the brightness difference between light and dark is clear and the width of light and dark is vertically compressed. If there is not, the presence or absence of a defect is determined by utilizing the fact that the image is extended while the brightness difference between brightness and darkness is not clear.Therefore, not only defects with large refraction of light but also defects such as thin bubbles with small refraction ,
It can be detected accurately and easily regardless of its size.
【図１】本発明の方法を説明する模式図である。FIG. 1 is a schematic diagram illustrating a method of the present invention.
【図２】本発明による欠陥検出装置の一例の概要構成図
である。FIG. 2 is a schematic configuration diagram of an example of a defect detection device according to the present invention.
【図３】ガラスびんに泡があった場合の微分処理後の再
生画像である。FIG. 3 is a reproduced image after differentiation processing when bubbles are present in the glass bottle.
【図４】ガラスびんのガラス内部に生じた泡を示す断面
図である。FIG. 4 is a cross-sectional view showing bubbles generated inside the glass of a glass bottle.
【図５】ガラスびんの外表面に生じた泡を示す断面図で
ある。FIG. 5 is a cross-sectional view showing bubbles generated on the outer surface of the glass bottle.
【図６】ガラスびんの内表面に生じた泡を示す断面図で
ある。FIG. 6 is a cross-sectional view showing bubbles generated on the inner surface of the glass bottle.
【符号の説明】 １ 光源 ４ 縞フィルタ ８ ガラスびん ９ 固体撮像素子 １０ 固体撮像素子カメラ １５ コンピュータ[Explanation of symbols] 1 light source 4 fringe filter 8 glass bottle 9 solid-state image sensor 10 solid-state image sensor camera 15 computer
Claims (2)
た識別パターンとして透明物体の検査領域に照射し、そ
の透過光を、焦点が上記検査領域の後方に位置するよう
にした固体撮像素子カメラで撮影し、該カメラの出力の
高低を固体撮像素子の配列順序に従って検出してその高
低の変化量が急峻な画素数を計数し、その画素数が予め
設定された個数以上存在しているとき欠陥有りと判定す
ることを特徴とする透明物体の欠陥検出方法。1. A solid body in which light from a light source is applied to an inspection area of a transparent object as an identification pattern having regularity of alternating light and dark, and the transmitted light is such that the focal point is located behind the inspection area. An image is captured by the image sensor camera, the output level of the camera is detected according to the arrangement order of the solid-state image sensor, and the number of pixels with a steep change in height is counted, and the number of pixels is greater than or equal to a preset number. A method for detecting a defect in a transparent object, characterized in that it is determined that there is a defect.
該光源からの光を明暗が交互の規則性をもった識別パタ
ーンとして透明体の検査領域に照射するため上記回転手
段と光源との間に配置されたフィルタと、焦点が上記検
査領域の後方に位置するようにした固体撮像素子カメラ
と、該カメラの出力の高低を固体撮像素子の配列順序に
従って検出してその高低の変化量が急峻な画素数を計数
し、その画素数が予め設定された個数以上存在している
とき欠陥有りと判定する判別手段とを備えてなることを
特徴とする透明物体の欠陥検出装置。2. A rotating means for rotating the transparent body, a light source,
A filter arranged between the rotating means and the light source for irradiating the inspection area of the transparent body with the light from the light source as an identification pattern having regularity of alternating light and darkness, and the focus is behind the inspection area. A solid-state image sensor camera positioned so that the height of the output of the camera is detected according to the arrangement order of the solid-state image sensors, the number of pixels with a sharp change in height is counted, and the number of pixels is preset. A defect detecting apparatus for a transparent object, comprising: a determining unit that determines that there is a defect when the number of defects is greater than or equal to the number of defects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5723092A JPH0711490B2 (en) | 1992-02-12 | 1992-02-12 | Defect detection method and device for transparent object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5723092A JPH0711490B2 (en) | 1992-02-12 | 1992-02-12 | Defect detection method and device for transparent object |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05223746A true JPH05223746A (en) | 1993-08-31 |
| JPH0711490B2 JPH0711490B2 (en) | 1995-02-08 |
Family
ID=13049732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5723092A Expired - Fee Related JPH0711490B2 (en) | 1992-02-12 | 1992-02-12 | Defect detection method and device for transparent object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0711490B2 (en) |
Cited By (14)
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|---|---|---|---|---|
| JPH08178869A (en) * | 1994-08-19 | 1996-07-12 | Owens Brockway Glass Container Inc | Method and equipment for inspection of transparent container |
| JPH08178855A (en) * | 1994-12-20 | 1996-07-12 | Asahi Glass Co Ltd | Method for inspecting light-transmissive object or specular object |
| JP2000162155A (en) * | 1998-11-30 | 2000-06-16 | Kirin Techno System:Kk | Method for detecting defect of bottle drum part |
| FR2794242A1 (en) * | 1999-05-25 | 2000-12-01 | Emhart Glass Sa | CONTAINER INSPECTION MACHINE |
| JP2001004553A (en) * | 1999-05-25 | 2001-01-12 | Emhart Glass Sa | Machine for check bottle wall |
| JP2008076223A (en) * | 2006-09-21 | 2008-04-03 | Matsushita Electric Ind Co Ltd | Inspection method of cylindrical transparent body, and inspection apparatus used for it |
| JP2009229221A (en) * | 2008-03-21 | 2009-10-08 | Fujifilm Corp | Optical device defect inspection method and optical device defect inspecting apparatus |
| JP2010014599A (en) * | 2008-07-04 | 2010-01-21 | Asahi Glass Co Ltd | Apparatus and system for visual inspection of transparent tube |
| CN101825582A (en) * | 2010-05-19 | 2010-09-08 | 山东明佳包装检测科技有限公司 | Method and device for detecting wall of cylindrical transparent bottle |
| JP2011167642A (en) * | 2010-02-19 | 2011-09-01 | Npo Hiroshima Junkangata Shakai Suishin Kiko | Identification method of transparent container |
| WO2017144634A1 (en) * | 2016-02-24 | 2017-08-31 | Becton Dickinson France | System and method for inspecting a transparent cylinder |
| US20180156740A1 (en) * | 2016-12-07 | 2018-06-07 | Applied Vision Corporation | Identifying defects in transparent containers |
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1992
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08178869A (en) * | 1994-08-19 | 1996-07-12 | Owens Brockway Glass Container Inc | Method and equipment for inspection of transparent container |
| JPH08178855A (en) * | 1994-12-20 | 1996-07-12 | Asahi Glass Co Ltd | Method for inspecting light-transmissive object or specular object |
| US7781723B1 (en) | 1998-02-19 | 2010-08-24 | Emhart Glass S.A. | Container inspection machine using light source having spatially cyclically continuously varying intensity |
| JP2000162155A (en) * | 1998-11-30 | 2000-06-16 | Kirin Techno System:Kk | Method for detecting defect of bottle drum part |
| FR2794242A1 (en) * | 1999-05-25 | 2000-12-01 | Emhart Glass Sa | CONTAINER INSPECTION MACHINE |
| JP2001027616A (en) * | 1999-05-25 | 2001-01-30 | Emhart Glass Sa | Machine for inspecting wall of bottle |
| JP2001004553A (en) * | 1999-05-25 | 2001-01-12 | Emhart Glass Sa | Machine for check bottle wall |
| JP4612151B2 (en) * | 1999-05-25 | 2011-01-12 | エムハート・グラス・ソシエテ・アノニム | Machine for inspecting bottle walls |
| JP4700784B2 (en) * | 1999-05-25 | 2011-06-15 | エムハート・グラス・ソシエテ・アノニム | Machine for inspecting bottle walls |
| JP2008076223A (en) * | 2006-09-21 | 2008-04-03 | Matsushita Electric Ind Co Ltd | Inspection method of cylindrical transparent body, and inspection apparatus used for it |
| JP2009229221A (en) * | 2008-03-21 | 2009-10-08 | Fujifilm Corp | Optical device defect inspection method and optical device defect inspecting apparatus |
| JP2010014599A (en) * | 2008-07-04 | 2010-01-21 | Asahi Glass Co Ltd | Apparatus and system for visual inspection of transparent tube |
| JP2011167642A (en) * | 2010-02-19 | 2011-09-01 | Npo Hiroshima Junkangata Shakai Suishin Kiko | Identification method of transparent container |
| CN101825582A (en) * | 2010-05-19 | 2010-09-08 | 山东明佳包装检测科技有限公司 | Method and device for detecting wall of cylindrical transparent bottle |
| WO2017144634A1 (en) * | 2016-02-24 | 2017-08-31 | Becton Dickinson France | System and method for inspecting a transparent cylinder |
| JP2019506616A (en) * | 2016-02-24 | 2019-03-07 | ベクトン ディキンソン フランス | System and method for inspecting a transparent cylinder |
| US10663409B2 (en) | 2016-02-24 | 2020-05-26 | Becton Dickinson France | System and method for inspecting a transparent cylinder |
| US11125699B2 (en) | 2016-02-24 | 2021-09-21 | Becton Dickinson France | System and method for inspecting a transparent cylinder |
| US20180156740A1 (en) * | 2016-12-07 | 2018-06-07 | Applied Vision Corporation | Identifying defects in transparent containers |
| US10422755B2 (en) * | 2016-12-07 | 2019-09-24 | Applied Vision Corporation | Identifying defects in transparent containers |
| JP6954484B1 (en) * | 2021-01-20 | 2021-10-27 | オムロン株式会社 | Inspection equipment |
| JP2022111631A (en) * | 2021-01-20 | 2022-08-01 | オムロン株式会社 | Inspection device |
| CN113310993A (en) * | 2021-06-24 | 2021-08-27 | 宗子凯 | Transparent plate point defect detection system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0711490B2 (en) | 1995-02-08 |
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| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |