JPH05197857A - Diagnostic device for fault in process facility - Google Patents

Diagnostic device for fault in process facility

Info

Publication number
JPH05197857A
JPH05197857A JP4009737A JP973792A JPH05197857A JP H05197857 A JPH05197857 A JP H05197857A JP 4009737 A JP4009737 A JP 4009737A JP 973792 A JP973792 A JP 973792A JP H05197857 A JPH05197857 A JP H05197857A
Authority
JP
Japan
Prior art keywords
product
cause
facility
equipment
fault
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4009737A
Other languages
Japanese (ja)
Inventor
Ikue Tanaka
育恵 田中
Takeshi Yamakita
剛 山北
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4009737A priority Critical patent/JPH05197857A/en
Publication of JPH05197857A publication Critical patent/JPH05197857A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To exactly judge whether a product is satisfactory or defective for each facility and to restart an operation in a short recovery time by discovering a fault position and the cause and removing the cause by a worker even without always setting the specialist of a process on standby when the process facility generates a fault, especially, even when the fault is peculiar for the facility. CONSTITUTION:At the fault-diagnostic device for process facility equipped with an input means 1 to input the result data of the product inspection of a production facility, storing means 3 to the normal value of the product, inferring means 2 to infer the fault position and the cause of the product facility by judging whether the product is satisfactory or defective while using the data in the input means 1 and the storing means 3, and display means 4 to display the fault position and the cause, the storing means 4 stores various data peculiar for the facility, and the inference device 2 grasps the detailed state of the production facility based on the data in the input means 1 and infers the fault position and the cause when the cause of the fault is peculiar for the facility.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プロセス設備の故障診
断に係わり、製品検査結果データを利用して設備の状態
を把握し、故障原因を発見する故障診断装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure diagnosis of a process equipment, and more particularly to a failure diagnosis device for grasping the state of the equipment by using product inspection result data and discovering the cause of the failure.

【0002】[0002]

【従来の技術】プロセス設備稼働中に装置の状態が変化
したり、装置が作動しなくなることがある。その結果、
製品の品質が変化したり、不良品が生産されたり、製品
が生産できなくなることがある。製品が良品か不良品か
を判断し、不良品である場合は原因がプロセス設備かそ
の他に問題があるか判断し、原因を見つけだし取り除い
ている。
2. Description of the Related Art The state of a device may change or the device may not operate during the operation of process equipment. as a result,
Product quality may change, defective products may be produced, or products may not be produced. Whether the product is a good product or a defective product is judged. If it is a defective product, it is judged whether the cause is the process equipment or other problems, and the cause is found and removed.

【0003】製品を生産後、検査工程で製品検査結果が
規定内かどうかの判定を、作業者が製品規定値と比較し
行っている。製品規定値は同一機種であっても設備毎に
相違があるので作業者は各設備毎に製品規定値を記録し
ておかなければならない。
After the product is produced, the worker compares the product inspection result with the product specified value in the inspection process to determine whether or not the product inspection result is within the specified value. Even if the product specifications are the same, there are differences in each equipment, so the worker must record the product specifications for each equipment.

【0004】製品検査結果が良品の規定内に入っていな
い場合や稼働中に作業者が明らかに不良品である製品を
見つけた場合はプロセス設備の故障であることが多いの
で作業者がその設備担当のプロセスの専門家に連絡しプ
ロセスの専門家が設備の個々のパラメータ設定箇所や設
備の状況を順にチェックし、故障原因を見つけだし、そ
の対策を行っている。
When the product inspection result does not fall within the regulation of a non-defective product or when the worker finds a product which is obviously a defective product during operation, it is often the case that the process equipment is out of order. The process expert in charge is contacted, and the process expert sequentially checks the individual parameter setting points of the equipment and the condition of the equipment, finds the cause of the failure, and takes countermeasures.

【0005】プロセス設備が故障である場合は、パラメ
ータの設定ミスや、設備の状態の変化が原因である場合
が多い。同一機種でも設定パラメータ値、使用データ、
設備の状態は異なるのでその対応方法は設備によって異
なる。
When the process equipment is out of order, it is often caused by a parameter setting error or a change in the equipment state. Even with the same model, setting parameter values, usage data,
Since the condition of the equipment is different, the corresponding method differs depending on the equipment.

【0006】設備が作動しなくなる場合に対しては、プ
ロセスの専門家が設備の内部を目視したり、設備のパラ
メータ設定箇所を順にチェックし、故障原因を見つけだ
しその対策を行っている。
When the equipment does not operate, a process expert visually checks the inside of the equipment or sequentially checks the parameter setting points of the equipment to find the cause of failure and take countermeasures against it.

【0007】[0007]

【発明が解決しようとする課題】設備毎に、製品規定値
が異なるので製品検査時には作業者が設備毎に対応しな
ければならないといった問題点がある。
There is a problem that a worker must deal with each equipment at the time of product inspection because the specified value of the product is different for each equipment.

【0008】また、プロセス設備の故障である場合でそ
の原因が設備に依存する場合は、プロセス設備の仕様が
設備によって異なっているため一般的な点検では故障原
因を見つけ出せないことが多く作業者では対処できず、
故障した設備担当のプロセスの専門家に頼らざるをえな
い。又、担当者が不在である場合には他のプロセスの専
門家が保存されている仕様データを基に対応を行い復旧
時間を多く要す。
Further, in the case of a process equipment failure and its cause depends on the equipment, the cause of the failure cannot often be found by a general inspection because the specifications of the process equipment differ depending on the equipment. I can't handle it,
We have to rely on the process experts responsible for the failed equipment. In addition, when the person in charge is absent, a specialist in another process responds based on the stored specification data, which requires a long recovery time.

【0009】この発明は、設備毎に製品の良品、不良品
の判定を正確に行うとともに、プロセス設備が故障した
場合に、特に故障が設備特有であってもプロセスの専門
家が常時待機していなくても作業者が故障箇所と原因が
発見でき、作業者が原因を取り除き少ない復旧時間で運
転を再開することができるようなプロセス設備の故障診
断装置を提供することを目的とする。
The present invention accurately determines whether a product is a good product or a defective product for each equipment, and when a process equipment fails, a process expert always waits even if the failure is specific to the equipment. It is an object of the present invention to provide a failure diagnosis device for process equipment that enables a worker to find a failure location and a cause without the need for the worker to remove the cause and restart the operation in a short recovery time.

【0010】[0010]

【課題を解決するための手段】本発明は、上記の目的を
達成するため、生産設備の製品検査の結果データを入力
する入力手段と、製品規定値を記憶する記憶手段と、前
記入力手段および記憶手段のデータを使用して製品の良
品、不良品の判定をし、且つ生産設備の故障箇所と原因
を推論する推論手段と、故障箇所および原因を表示する
表示手段とを備えたプロセス設備の故障診断装置におい
て、上記記憶手段は設備固有の多種多様データを記憶
し、上記推論装置は上記入力手段のデータを基に生産設
備の詳細な状態を把握し故障原因が設備固有である場合
に故障箇所と原因を推論するようになっていることを特
徴とする。
In order to achieve the above object, the present invention provides an input means for inputting the result data of the product inspection of the production facility, a storage means for storing the product specified value, the input means, and Using the data of the storage means, it is possible to judge whether the product is a good product or a defective product, and to infer the failure location and the cause of the production equipment, and the display means for displaying the failure location and the cause. In the failure diagnosis device, the storage means stores a wide variety of data unique to the equipment, and the inference device grasps the detailed state of the production equipment based on the data of the input means and fails when the cause of the failure is equipment-specific. It is characterized by being able to infer the location and cause.

【0011】[0011]

【作用】製品検査結果を入力装置に入力すると、良品、
不良品の判定をし、良品であると判定された場合には、
プロセス設備の故障診断は行わない。
[Operation] When the product inspection result is input to the input device,
If it is judged as a defective product and it is judged as a good product,
Failure diagnosis of process equipment is not performed.

【0012】不良品である場合は、自動的に故障診断シ
ステムが開始し、生産設備の情報が入力装置から入力さ
れる毎に記憶装置は設備の状態が変化しているか判定す
る。設備の状態の変化とその原因のテーブルの中から該
当する設備の状態があればその故障箇所と原因を推論結
果とする。
If the product is defective, the failure diagnosis system is automatically started, and the storage device determines whether or not the condition of the equipment is changed every time the information of the production equipment is input from the input device. If there is a corresponding equipment state from the table of equipment state changes and their causes, the failure location and cause are used as the inference result.

【0013】[0013]

【実施例】以下、本発明の一実施例を図1から図5に基
づいて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS.

【0014】本実施例は、ドライエッチング装置(図示
省略)に適用した場合の実施例について示している。
This embodiment shows an embodiment applied to a dry etching apparatus (not shown).

【0015】1)作業者が製品検査を行った時に、エッ
チングレートが2200Å/minであった。
1) When the worker inspected the product, the etching rate was 2200 Å / min.

【0016】2)作業者が製品検査結果であるエッチン
グレートを図1の入力手段1を使用して入力すると、図
1に示す記憶手段3のドライエッチング装置の製品規定
値と比較される。製品規定値は2938Å/minであ
る。エッチングレートが20%以下であれば不良品であ
ると判断する。
2) When an operator inputs the etching rate which is the product inspection result using the input means 1 of FIG. 1, it is compared with the product specified value of the dry etching apparatus of the storage means 3 shown in FIG. The product specified value is 2938Å / min. If the etching rate is 20% or less, it is determined that the product is defective.

【0017】[0017]

【数1】 [Equation 1]

【0018】であるのでこの製品は不良品である。 3)ドライエッチング装置の故障であると仮定し、プロ
セス設備の故障箇所、原因の推論を開始する。
Therefore, this product is defective. 3) Assuming that the dry etching equipment has a failure, start inferring the failure location and cause of the process equipment.

【0019】4)図1の推論手段2は作業者にドライエ
ッチング装置の情報を図1の入力手段1を使用し入力す
るよう要求する。
4) The inference means 2 of FIG. 1 requests the operator to input the information of the dry etching apparatus using the input means 1 of FIG.

【0020】図2のドライエッチング装置稼働時のプロ
セスデータの設定値を表示する。作業者はドライエッチ
ング装置の設定値が表示装置のデータ通りかチェックを
行う。プロセスデータの設定値が正しくない場合は設定
値ミスが故障原因である。表示手段4に「故障原因はプ
ロセスデータの設定ミスです。対策はプロセスデータの
設定値を下記の通り設定して下さい。」と表示し、その
下に図2を表示する。
The set values of the process data when the dry etching apparatus of FIG. 2 is operating are displayed. The operator checks whether the set value of the dry etching device is the same as the data of the display device. If the set value of the process data is not correct, the mistake is the set value. The display means 4 displays "The cause of the failure is a process data setting error. As a countermeasure, set the process data setting value as follows.", And FIG. 2 is displayed below it.

【0021】5)プロセスデータの設定値が正しい場合
は、作業者がエッチング中のモニタリングを行い、プロ
セスデータの現在値が正かどうかチェックする。作業者
がエッチング実験を行う。図3のCRT画面にガス流
量,電極温度,RFパワー,圧力の設定値と現在値が表
示される。エッチング中に現在値が設定値と同じかどう
かチェックする。O2ガス流量現在値が設定値通りにな
らない。
5) When the set value of the process data is correct, the operator monitors during etching to check whether the current value of the process data is correct. An operator conducts an etching experiment. The CRT screen of FIG. 3 displays the gas flow rate, electrode temperature, RF power, pressure set value and current value. During etching, check if the current value is the same as the set value. The current O 2 gas flow rate does not reach the set value.

【0022】6)ガス流量異常の場合、プロセスデータ
の設定値を変えて作業者がエッチング実験を行う。O2
設定値を2SCCMから1SCCMに変えて実験する。製品検査
をするとエッチングレートが1722Å/minであっ
た。エッチングレートを図 1の入力手段1より入力す
る。前記1)のエッチングレートを併せて2個のエッチ
ングレートにより作成される直線の傾きと、図4のエッ
チング速度グラフの最小自乗法により求められた傾きが
同じでエッチング速度切片が異なる場合は、マスフロー
コントローラの不良が故障原因であると推論される。図
1の表示手段4に「故障原因はマスフローコントローラ
の不良です。対策はマスフローコントローラのフルスケ
ース設定値又は、流量をチェックして下さい。」と表示
する。
6) When the gas flow rate is abnormal, the operator performs an etching experiment by changing the set value of the process data. O 2
Experiment by changing the setting value from 2 SCCM to 1 SCCM. Upon product inspection, the etching rate was 1722Å / min. The etching rate is input from the input means 1 in FIG. When the slope of a straight line created by two etching rates including the etching rate of 1) and the slope obtained by the method of least squares of the etching rate graph of FIG. 4 are the same but the etching rate intercepts are different, the mass flow It is inferred that the failure of the controller is the cause of the failure. The display means 4 in Fig. 1 displays "The cause of failure is a defect in the mass flow controller. The countermeasure is to check the full-scale case set value of the mass flow controller or the flow rate."

【0023】[0023]

【発明の効果】本発明は、以上のように構成され、記憶
手段が設備固有の製品規定値を記憶しているので、製品
の良品、不良品の判定をこのシステムに任せることが可
能となる。製品が不良品である場合は、プロセス設備故
障復旧のためにシステムが開始し、その原因が設備固有
である場合でも故障箇所と原因と対策が推測できる。
Since the present invention is constructed as described above and the storage means stores the product specified value peculiar to the equipment, it is possible to let this system determine whether the product is good or defective. . If the product is defective, the system is started to recover the process equipment failure, and even if the cause is specific to the equipment, the failure location, cause and countermeasure can be inferred.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明装置の全体構成を示すブロック図FIG. 1 is a block diagram showing the overall configuration of a device of the present invention.

【図2】プロセスデータの表示を示す説明図FIG. 2 is an explanatory diagram showing a display of process data.

【図3】表示手段のCRT画面を示す説明図FIG. 3 is an explanatory view showing a CRT screen of a display means.

【図4】エッチング速度を示すグラフFIG. 4 is a graph showing an etching rate.

【符号の説明】[Explanation of symbols]

1 入力手段 2 推論手段 3 記憶手段 4 表示手段 1 Input Means 2 Inference Means 3 Storage Means 4 Display Means

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 生産設備の製品検査の結果データを入力
する入力手段と、製品規定値を記憶する記憶手段と、前
記入力手段および記憶手段のデータを使用して製品の良
品、不良品の判定をし、且つ生産設備の故障箇所と原因
を推論する推論手段と、故障箇所および原因を表示する
表示手段とを備えたプロセス設備の故障診断装置におい
て、上記記憶手段は設備固有の多種多様データを記憶
し、上記推論装置は上記入力手段のデータを基に生産設
備の詳細な状態を把握し故障原因が設備固有である場合
に故障箇所と原因を推論するようになっていることを特
徴とするプロセス設備の故障診断装置。
1. An input means for inputting result data of a product inspection of a production facility, a storage means for storing a prescribed value of a product, and determination of a good product or a defective product using data of the input means and the storage means. In addition, in the failure diagnosis device for process equipment, which comprises inference means for deducing the failure location and cause of the production equipment and display means for displaying the failure location and cause, the storage means stores various kinds of data unique to the equipment. It is characterized in that the reasoning device stores the detailed state of the production facility based on the data of the input means and infers the failure location and the cause when the cause of the failure is specific to the facility. Failure diagnosis device for process equipment.
JP4009737A 1992-01-23 1992-01-23 Diagnostic device for fault in process facility Pending JPH05197857A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4009737A JPH05197857A (en) 1992-01-23 1992-01-23 Diagnostic device for fault in process facility

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4009737A JPH05197857A (en) 1992-01-23 1992-01-23 Diagnostic device for fault in process facility

Publications (1)

Publication Number Publication Date
JPH05197857A true JPH05197857A (en) 1993-08-06

Family

ID=11728628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4009737A Pending JPH05197857A (en) 1992-01-23 1992-01-23 Diagnostic device for fault in process facility

Country Status (1)

Country Link
JP (1) JPH05197857A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004214591A (en) * 2002-11-15 2004-07-29 Renesas Technology Corp Semiconductor manufacturing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004214591A (en) * 2002-11-15 2004-07-29 Renesas Technology Corp Semiconductor manufacturing device

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