JPH05101663A - Semiconductor memory - Google Patents

Semiconductor memory

Info

Publication number
JPH05101663A
JPH05101663A JP3260221A JP26022191A JPH05101663A JP H05101663 A JPH05101663 A JP H05101663A JP 3260221 A JP3260221 A JP 3260221A JP 26022191 A JP26022191 A JP 26022191A JP H05101663 A JPH05101663 A JP H05101663A
Authority
JP
Japan
Prior art keywords
data register
data
transistor
contacts
voltage holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3260221A
Other languages
Japanese (ja)
Inventor
Kenji Mori
健治 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP3260221A priority Critical patent/JPH05101663A/en
Publication of JPH05101663A publication Critical patent/JPH05101663A/en
Pending legal-status Critical Current

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  • Dram (AREA)

Abstract

PURPOSE:To reduce the current consumption for data transfer by connecting voltage holding contacts of complementary data registers to each other by a transistor switch. CONSTITUTION:An N-type MOS transistor TR 16 which takes a signal line BAL as the gate input is added between capacitors 30 and 31. After data register power supply is stopped, the signal BAL is set to the high level, and the transistor switch 16 between data register voltage holding contacts is opened. Thus, data register voltage holding contacts are balanced at 1/2 Vcc, and transistor switches 20 and 21 which connect bit lines BL and the inverse of BL and data registers LB and the inverse of LB respectively are opened, and data transfer is completed. Since contacts of registers LB and the inverse of LB have levels only varied from 1/2 Vcc at the time of opening the transistor switches, the electric charge discharged by a sense amplifier 1 is reduced to a half, and the current is reduced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体メモリに関し、特
にDT動作(センス終了したビットのデータを各ビット
線にトランジスタスイッチを介して接続しているパワー
供給制御可能な相補型データレジスタに転送する)機能
を有しているメモリ回路に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor memory, and more particularly, to a DT operation (transfer of sensed bit data to a complementary data register capable of controlling power supply connected to each bit line through a transistor switch). ) A memory circuit having a function.

【0002】[0002]

【従来の技術】従来の回路では、相補型データレジスタ
の電圧保持接点間にトランジスタスイッチを介していな
かった。
2. Description of the Related Art In a conventional circuit, no transistor switch is provided between the voltage holding contacts of the complementary data register.

【0003】図3はこのような従来の回路図を示す。FIG. 3 shows such a conventional circuit diagram.

【0004】図3において、従来の半導体メモリは、セ
ンスアンプ1と、ビット線BL・BL(反転値)と、デ
ータレジスタパワ供給信号PC・PC(反転値)と、デ
ータレジスタ接点LB・LB(反転値)と、DT信号を
ゲート入力とするN型MOSトランジスタ20,21
と、信号PCをゲート入力とするP型MOSトランジス
タ11と、信号PC(反転値)をゲート入力とするN型
MOSトランジスタ13と、P型MOSトランジスタ1
0,12と、N型MOSトランジスタ14,15と、コ
ンデンサ30,31とを有する。
In FIG. 3, the conventional semiconductor memory includes a sense amplifier 1, bit lines BL and BL (inverted value), data register power supply signals PC and PC (inverted value), and data register contacts LB and LB ( N-type MOS transistors 20 and 21 whose gate inputs are the inverted value) and the DT signal.
, A P-type MOS transistor 11 having a signal PC as a gate input, an N-type MOS transistor 13 having a signal PC (inverted value) as a gate input, and a P-type MOS transistor 1
0, 12, N-type MOS transistors 14 and 15, and capacitors 30 and 31.

【0005】図4において、図3の回路の各部は、電源
電圧VCCと接地(GND)との間で変位する。また図
4を用いて、図3のDT動作を説明する。図3,図4に
おいて、ビット線BL・BL(反転値)のセンス動作が
完了した後、データレジスタパワ供給信号PC・PC
(反転値)をおのおの高・低(High・Low)レベ
ルにする事により、データジスタへのパワ供給を止め
る。その後、ビット線BL・BL(反転値)とデータレ
ジスタの接点LB・LB(反転値)をおのおの接続させ
ているトランジスタスイッチを開ける。それにより、デ
ータレジスタの接点LB・LB(反転値)のレベルはビ
ット線BL・BL(反転値)のレベルに変化し、最後に
データレジスタにパワを与える事により、データレジス
タへのビット線BL・BL(反転値)のデータ転送を完
了する。
In FIG. 4, each part of the circuit of FIG. 3 is displaced between the power supply voltage VCC and the ground (GND). The DT operation in FIG. 3 will be described with reference to FIG. In FIG. 3 and FIG. 4, after the sensing operation of the bit lines BL and BL (inverted value) is completed, the data register power supply signals PC and PC
The power supply to the data register is stopped by setting the (inverted value) to the high / low level. After that, the transistor switches connecting the bit lines BL and BL (inverted value) and the contacts LB and LB (inverted value) of the data register are opened. As a result, the level of the contact LB / LB (inverted value) of the data register changes to the level of the bit line BL / BL (inverted value), and finally, the power is applied to the data register, so that the bit line BL to the data register is changed. • Complete the BL (inverted value) data transfer.

【0006】[0006]

【発明が解決しようとする課題】このような従来の回路
では、ビット線BL・BL(反転値)とデータレジスタ
の接点LB・LB(反転値)をおのおの接続させている
トランジスタスイッチを開けた時(図4のt1時)、接
点LB・LB(反転値)にチャージしている電荷をセン
スアンプ1が抜くため、大きな電流を消費するという欠
点がある。
In such a conventional circuit, when the transistor switches connecting the bit lines BL and BL (inverted value) and the contacts LB and LB (inverted value) of the data register respectively are opened. At the time (t1 in FIG. 4), the sense amplifier 1 discharges the electric charges charged in the contacts LB and LB (inversion value), and thus has a drawback that a large current is consumed.

【0007】本発明の目的は、前記欠点を解決し、大き
な電流を消費することのないようにした半導体メモリを
提供することにある。
An object of the present invention is to solve the above-mentioned drawbacks and to provide a semiconductor memory which does not consume a large current.

【0008】[0008]

【課題を解決するための手段】本発明の半導体メモリの
構成は、相補型データレジスタの電圧保持接点を、トラ
ンジスタスイッチで互いに接続していることを特徴とす
る。
The structure of the semiconductor memory of the present invention is characterized in that the voltage holding contacts of the complementary data register are connected to each other by a transistor switch.

【0009】[0009]

【実施例】図1は本発明の一実施例の半導体モリを示す
回路図、図2は図1の各部の動作波形を示すタイミング
図である。
1 is a circuit diagram showing a semiconductor memory according to an embodiment of the present invention, and FIG. 2 is a timing chart showing operation waveforms of respective portions of FIG.

【0010】図1において、本発明の一実施例は、図1
の回路にBAL信号線をゲート入力とするN型MOSト
ランジスタ16が、コンデンサ30,31との間に付加
されており、その他の部分は図1と同様である。
In FIG. 1, one embodiment of the present invention is shown in FIG.
An N-type MOS transistor 16 having a BAL signal line as a gate input is added between the capacitors 30 and 31 and the other parts are the same as in FIG.

【0011】図2も用いて、そのDT動作を説明する。The DT operation will be described with reference to FIG.

【0012】本実施例の回路動作においても、データレ
ジスタパワ供給を止める箇所までは、従来回路と同じ動
作である。
Also in the circuit operation of this embodiment, the operation is the same as the conventional circuit up to the point where the data register power supply is stopped.

【0013】その次に、BAL信号をHighにする事
により、データレジスタ電圧保持接点間のトランジスタ
スイッチを開ける。
Then, the BAL signal is set to High to open the transistor switch between the data register voltage holding contacts.

【0014】それにより、データレジスタ電圧保持接点
を1/2Vccにバランスさせる。その後、従来回路動
作と同様に、ビット線BL・BL(反転値)とデータレ
ジスタLB・LB(反転値)をおのおの接続させている
トランジスタスイッチを開け、データレジスタの接点L
B・LB(反転値)のレベルはビット線BL・BL(反
転値)のレベルに変化し、最後にデータレジスタにパワ
を与える事により、データレジスタへのビット線BL・
BL(反転値)のデータ転送を完了する。
As a result, the data register voltage holding contact is balanced to 1/2 Vcc. After that, similar to the conventional circuit operation, the transistor switch connecting each of the bit lines BL and BL (inverted value) and the data register LB and LB (inverted value) is opened, and the contact L of the data register is connected.
The level of B.LB (inverted value) changes to the level of the bit line BL.BL (inverted value), and finally the power is applied to the data register, so that the bit line BL.BL.
The BL (inverted value) data transfer is completed.

【0015】[0015]

【発明の効果】以上説明したように、本発明の回路で
は、例えばビット線BL・BL(反転値)とデータジス
タの接点LB・LB(反転値)とをおのおの接続させて
いるトランジスタスイッチを開けた時(t1時)、接点
LB・LB(反転値)の接点が1/2Vccからのレベ
ル変動で済むため、従来回路に対してセンスアンプ1が
抜くための電荷が半分になり、このため電流が少なくな
るという効果がある。
As described above, in the circuit of the present invention, for example, the transistor switches connecting the bit lines BL and BL (inverted value) and the contacts LB and LB (inverted value) of the data transistor are opened. At the time of t1 (t1), the level change of the contacts LB and LB (reversal value) from 1/2 Vcc is sufficient, so that the charge for the sense amplifier 1 to pull out is halved compared to the conventional circuit, and therefore the current There is an effect that it decreases.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の半導体メモリを示す回路図
である。
FIG. 1 is a circuit diagram showing a semiconductor memory according to an embodiment of the present invention.

【図2】図1の回路のDT動作波形を示すタイミング図
である。
2 is a timing diagram showing DT operation waveforms of the circuit of FIG.

【図3】従来の半導体メモリの回路図である。FIG. 3 is a circuit diagram of a conventional semiconductor memory.

【図4】図3の回路のDT動作波形を示すタイミング図
である。
4 is a timing diagram showing DT operation waveforms of the circuit of FIG.

【符号の説明】[Explanation of symbols]

1 センスアンプ 10,11,12 P型MOSトランジスタ 13,14,15,16,20,21 N型MOSト
ランジスタ BL・BL(反転値) ビット線 LB.LB(反転値) データジスタ接点
1 sense amplifier 10, 11, 12 P-type MOS transistor 13, 14, 15, 16, 20, 21 N-type MOS transistor BL • BL (inversion value) bit line LB. LB (reversed value) data transistor contact

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 データレジスタの二つの電圧保持接点間
をトランジスタスイッチを介して互いに接続しているこ
とを特徴とする半導体メモリ。
1. A semiconductor memory, wherein two voltage holding contacts of a data register are connected to each other through a transistor switch.
JP3260221A 1991-10-08 1991-10-08 Semiconductor memory Pending JPH05101663A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3260221A JPH05101663A (en) 1991-10-08 1991-10-08 Semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3260221A JPH05101663A (en) 1991-10-08 1991-10-08 Semiconductor memory

Publications (1)

Publication Number Publication Date
JPH05101663A true JPH05101663A (en) 1993-04-23

Family

ID=17345035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3260221A Pending JPH05101663A (en) 1991-10-08 1991-10-08 Semiconductor memory

Country Status (1)

Country Link
JP (1) JPH05101663A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007273079A (en) * 1998-04-28 2007-10-18 Oki Electric Ind Co Ltd Semiconductor integrated circuit
US7865420B1 (en) 2001-01-22 2011-01-04 Voyager Technologies, Inc. Real time electronic commerce telecommunication system and method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01138689A (en) * 1987-11-25 1989-05-31 Toshiba Corp Semiconductor memory device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01138689A (en) * 1987-11-25 1989-05-31 Toshiba Corp Semiconductor memory device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007273079A (en) * 1998-04-28 2007-10-18 Oki Electric Ind Co Ltd Semiconductor integrated circuit
US7865420B1 (en) 2001-01-22 2011-01-04 Voyager Technologies, Inc. Real time electronic commerce telecommunication system and method

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