JPH04286477A - Infrared image pickup device - Google Patents
Infrared image pickup deviceInfo
- Publication number
- JPH04286477A JPH04286477A JP3051698A JP5169891A JPH04286477A JP H04286477 A JPH04286477 A JP H04286477A JP 3051698 A JP3051698 A JP 3051698A JP 5169891 A JP5169891 A JP 5169891A JP H04286477 A JPH04286477 A JP H04286477A
- Authority
- JP
- Japan
- Prior art keywords
- dark current
- cooling temperature
- light receiving
- current component
- receiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001816 cooling Methods 0.000 claims abstract description 68
- 238000003331 infrared imaging Methods 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 10
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
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- Image Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Closed-Circuit Television Systems (AREA)
Abstract
Description
【０００１】0001
【産業上の利用分野】本発明は、赤外線撮像装置に関し
、特に、赤外線検知器の冷却温度変動による出力信号揺
らぎを補正し、高感度信号を得る赤外線撮像装置に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an infrared imaging device, and more particularly to an infrared imaging device that corrects output signal fluctuations due to fluctuations in the cooling temperature of an infrared detector and obtains a highly sensitive signal.
【０００２】近年、赤外線検知器は高性能化の要求に従
ってＳＮ比が向上しており、その結果、検知器から出力
される雑音として、冷却温度変動による出力信号の揺ら
ぎが大きな割合を占めるようになっている。このため、
冷却温度の安定化と同時に冷却温度変動による出力信号
揺らぎを補正する手段が重要となっている。[0002] In recent years, the signal-to-noise ratio of infrared detectors has improved in response to demands for higher performance, and as a result, fluctuations in the output signal due to fluctuations in cooling temperature have come to account for a large proportion of the noise output from the detector. It has become. For this reason,
It is important to have a means for stabilizing the cooling temperature and at the same time correcting output signal fluctuations due to fluctuations in the cooling temperature.
【０００３】0003
【従来の技術】冷却温度変動による出力信号揺らぎを補
正する方法の従来の一例を図５に示す。また、赤外線検
知器出力信号の例を図６に示す。この例では４個の受光
素子■〜■を持つ赤外線検知器を用いている。2. Description of the Related Art An example of a conventional method for correcting output signal fluctuations due to cooling temperature fluctuations is shown in FIG. Further, an example of an infrared detector output signal is shown in FIG. In this example, an infrared detector having four light receiving elements ① to ② is used.
【０００４】図５において、入射光は検知器容器１内に
設けられた赤外線検知器２の受光素子■〜■に入力され
てここで光電変換され、赤外線検知器出力信号としてプ
リアンプ３を介して減（加）算用アンプ４に供給される
。一方、冷却器５に設けられた冷却温度センサ６では冷
却温度が検出されて冷却温度に対応した信号（後述の如
く、入射光によらない受光素子固有の暗電流成分）が出
力され、プリアンプ７を介して減（加）算用アンプ４に
供給される。減（加）算用アンプ４において、検知器出
力信号から冷却温度センサ出力信号が減算されることに
よって検知器出力信号が補正され、ＡＤ変換器８にてＡ
Ｄ変換されて出力される。In FIG. 5, incident light is input to the light receiving elements 1 to 2 of the infrared detector 2 provided in the detector container 1, where it is photoelectrically converted, and is output as an infrared detector output signal via the preamplifier 3. It is supplied to the subtraction (addition) amplifier 4. On the other hand, the cooling temperature sensor 6 provided in the cooler 5 detects the cooling temperature and outputs a signal corresponding to the cooling temperature (as will be described later, a dark current component unique to the light receiving element that is not dependent on the incident light), and the preamplifier 5 The signal is supplied to the subtracting (adding) amplifier 4 via the subtracting (adding) amplifier 4. The subtraction (addition) amplifier 4 corrects the detector output signal by subtracting the cooling temperature sensor output signal from the detector output signal, and the AD converter 8 corrects the cooling temperature sensor output signal.
It is D-converted and output.
【０００５】ここで、受光素子■〜■の各出力信号電圧
は図６に示す如くであり、入射光によらない暗電流成分
（検知器２の冷却温度Ｔに依存した量）、暗電流変動成
分（冷却温度変動△Ｔによる量）、背景入射光成分、信
号入射光成分を含む。図５に示す従来例では、冷却温度
センサ６にて暗電流成分を検出し、減算用アンプ４で検
知器出力信号からこの暗電流成分を減じ、補正後出力信
号を得ている。Here, the output signal voltages of the light-receiving elements (1) to (2) are as shown in FIG. component (amount due to cooling temperature fluctuation ΔT), background incident light component, and signal incident light component. In the conventional example shown in FIG. 5, a cooling temperature sensor 6 detects a dark current component, and a subtraction amplifier 4 subtracts this dark current component from the detector output signal to obtain a corrected output signal.
【０００６】[0006]
【発明が解決しようとする課題】図６において、暗電流
成分及び暗電流変動成分が各受光素子■〜■全て同じ量
であれば特に問題はない。然るに、実際には図６に示す
如く、暗電流成分及び暗電流変動成分は各受光素子■〜
■毎にばらついており、従来例では暗電流成分を各受光
素子共通のものとして扱っていたため、ばらつきの分だ
け補正できない。即ち、図７に示す如く、受光素子■の
暗電流成分及び暗電流変動成分が零となるようにプリア
ンプ７のゲイン及びオフセット電圧を調整すると、その
他の受光素子■，■，■は十分補正しきれずに暗電流成
分及び暗電流変動成分が残り（冷却温度変動による信号
揺らぎを含むことになり）、検知器２の性能が低下する
問題点があった。In FIG. 6, there is no particular problem if the dark current component and the dark current fluctuation component are the same for each of the light receiving elements (1) to (2). However, in reality, as shown in FIG. 6, the dark current component and the dark current fluctuation component are
In the conventional example, the dark current component was treated as something common to each light-receiving element, so it was not possible to correct for the variation. That is, as shown in FIG. 7, when the gain and offset voltage of the preamplifier 7 are adjusted so that the dark current component and the dark current fluctuation component of the light receiving element (2) become zero, the other light receiving elements (2), (2), and (3) will be sufficiently corrected. There is a problem in that the dark current component and the dark current fluctuation component remain (including signal fluctuation due to cooling temperature fluctuation), and the performance of the detector 2 deteriorates.
【０００７】本発明は、検知器出力信号の冷却温度変動
による信号揺らぎをより正確に補正し、高性能化を図る
ことができる赤外線撮像装置を提供することを目的とす
る。SUMMARY OF THE INVENTION An object of the present invention is to provide an infrared imaging device capable of more accurately correcting signal fluctuations in a detector output signal due to fluctuations in cooling temperature and achieving higher performance.
【０００８】[0008]
【課題を解決するための手段】図１は本発明の原理説明
図を示す。同図中、１１は記憶手段で、赤外線検知器の
各受光素子毎の、冷却温度と受光素子の暗電流成分との
関係を予め記憶されている。１５は演算制御手段で、温
度センサにて検出された冷却温度に基づいて記憶手段１
１から各受光素子毎の暗電流成分を読出し、赤外線検知
器出力から該読出した各受光素子の暗電流成分を減じる
。[Means for Solving the Problems] FIG. 1 shows a diagram illustrating the principle of the present invention. In the figure, reference numeral 11 denotes a storage means in which the relationship between the cooling temperature and the dark current component of the light receiving element is stored in advance for each light receiving element of the infrared detector. 15 is an arithmetic control means, and the memory means 1 is stored based on the cooling temperature detected by the temperature sensor.
1, the dark current component of each light receiving element is read out, and the read dark current component of each light receiving element is subtracted from the infrared detector output.
【０００９】[0009]
【作用】本発明では、図３に示すように冷却温度と赤外
線検知器出力の暗電流成分との関係を予め記憶手段１１
に記憶しておき、検知器出力から予め記憶されている各
受光素子固有の暗電流成分を減じるようにしている。従
って、従来例に比して各受光素子について冷却温度変動
による検知器出力の揺らぎをより正確に補正でき、装置
の性能を向上できる。[Operation] In the present invention, as shown in FIG.
The dark current component unique to each light-receiving element stored in advance is subtracted from the detector output. Therefore, compared to the conventional example, it is possible to more accurately correct fluctuations in the detector output due to cooling temperature fluctuations for each light receiving element, and improve the performance of the apparatus.
【００１０】0010
【実施例】図２は本発明の第１実施例の構成図を示し、
同図中、図５と同一構成部分には同一番号を付してその
説明を省略する。図２中、１０は温度判定回路で、図３
に示すように冷却温度Ｔとして通常冷却温度Ｔａ，冷却
変動を生じた場合の冷却温度Ｔｂを設定したとき、プリ
アンプ７の出力により、冷却温度Ｔが冷却温度Ｔａ，Ｔ
ｂの間に設定されている閾値冷却温度Ｔｃ以下にあるか
、Ｔｃを越えているかを判定する。１１はメモリで、メ
モリエリア１１ａには各受光素子■，■，…の通常冷却
温度Ｔａにおける暗電流成分値Ｖ１ａ，Ｖ２ａ，…が、
メモリエリア１１ｂには各受光素子■，■，…の冷却変
動温度Ｔｂにおける暗電流成分値Ｖ１ｂ，Ｖ２ｂ，…が
夫々予め記憶されている。これら暗電流成分値は測定に
よって予め求められている。１２は演算論理回路で、Ａ
Ｄ変換器１３から出力された赤外線検知器出力信号から
メモリ１１の出力信号を減算する。１４は制御回路で、
温度判定回路１０からの出力に応じてメモリ１１のメモ
リエリア１１ａ，１１ｂから暗電流成分値を選択読出し
、演算論理回路１２に供給する。制御回路１４及び演算
論理回路１２にて演算制御手段１５が構成されている。[Embodiment] FIG. 2 shows a configuration diagram of a first embodiment of the present invention,
In the figure, the same components as those in FIG. 5 are given the same numbers and their explanations will be omitted. In Figure 2, 10 is a temperature determination circuit, and Figure 3
As shown in the figure, when the normal cooling temperature Ta and the cooling temperature Tb in case of cooling fluctuation are set as the cooling temperature T, the output of the preamplifier 7 changes the cooling temperature T to the cooling temperature Ta, T.
It is determined whether the cooling temperature is below or above the threshold cooling temperature Tc set during b. Reference numeral 11 denotes a memory, and a memory area 11a stores dark current component values V1a, V2a, . . . at the normal cooling temperature Ta of each of the light receiving elements
In the memory area 11b, dark current component values V1b, V2b, . . . of the respective light receiving elements ①, ②, . . . at the cooling fluctuation temperature Tb are stored in advance, respectively. These dark current component values are determined in advance by measurement. 12 is an arithmetic logic circuit, A
The output signal of the memory 11 is subtracted from the infrared detector output signal output from the D converter 13. 14 is a control circuit;
Dark current component values are selectively read out from memory areas 11 a and 11 b of memory 11 in accordance with the output from temperature determination circuit 10 and supplied to arithmetic logic circuit 12 . The control circuit 14 and the arithmetic logic circuit 12 constitute an arithmetic control means 15.
【００１１】次に、本発明の動作について説明する。Next, the operation of the present invention will be explained.
【００１２】図２において、温度判定回路１０によって
冷却温度Ｔが例えば閾値冷却温度Ｔｃ以下であることが
判定された場合、制御回路１４の制御によってメモリ１
１のメモリエリア１１ａに記憶されている通常冷却温度
Ｔａ時の暗電流成分値Ｖ１ａ，Ｖ２ａ，…が読出され、
演算論理回路１２において検知器出力信号から減算され
る。
一方、温度判定回路１０によって冷却温度Ｔが閾値冷却
温度Ｔｃを越えたことが判定されている場合、制御回路
１４の制御によってメモリ１１のメモリエリア１１ｂに
記憶されている冷却変動温度Ｔｂ時の暗電流成分値Ｖ１
ｂ，Ｖ２ｂ，…が読出され、演算論理回路１２において
検知器出力信号から減算される。In FIG. 2, when the temperature determination circuit 10 determines that the cooling temperature T is below the threshold cooling temperature Tc, the memory 1 is controlled by the control circuit 14.
The dark current component values V1a, V2a, . . . at the normal cooling temperature Ta stored in the memory area 11a of No. 1 are read out,
It is subtracted from the detector output signal in the arithmetic logic circuit 12. On the other hand, if the temperature determination circuit 10 determines that the cooling temperature T has exceeded the threshold cooling temperature Tc, the control circuit 14 controls the cooling fluctuation temperature Tb stored in the memory area 11b of the memory 11. Current component value V1
b, V2b, . . . are read out and subtracted from the detector output signal in the arithmetic logic circuit 12.
【００１３】このように、本発明では、検知器出力信号
から予め測定されている受光素子固有の暗電流成分を減
じるようにしているので、従来例に比して各受光素子に
ついてより正確に補正でき、検知器２の性能を向上でき
る。特に、各受光素子■〜■間での暗電流成分のばらつ
きが大きい場合、従来例に比して冷却温度変動の影響を
減じる効果が大である。As described above, in the present invention, since the dark current component unique to the light receiving element measured in advance is subtracted from the detector output signal, each light receiving element can be corrected more accurately than in the conventional example. It is possible to improve the performance of the detector 2. In particular, when there is a large variation in dark current components among the light receiving elements (1) to (2), the effect of reducing the influence of cooling temperature fluctuations is greater than in the conventional example.
【００１４】なお、上記実施例では冷却温度がＴａ〜Ｔ
ｂの範囲で変動しているのを全て一つの閾値冷却温度Ｔ
ｃを判定点として判定しているので、例えばＴｃより極
く僅か高い冷却温度が検出冷却温度であった場合でも、
冷却温度Ｔｂの暗電流成分値を用いて演算されることに
なる。このため、補正は十分正確に行なわれるわけでは
ない。そこで、図３に示すように例えばＴｃの代りに閾
値冷却温度Ｔｃ１，Ｔｃ２を設け、これに伴ってメモリ
１１に更にメモリエリア１１ｃを設けて図３に示す冷却
温度Ｔｃの暗電流成分値Ｖ１ｃ，Ｖ２ｃ，…を予め測定
して記憶しておく。温度判定回路１０にてＴ１ｃ以上、
Ｔ２ｃ以下が判定された場合にはメモリエリア１１ｃか
ら暗電流成分値Ｖ１ｃ，Ｖ２ｃ，…を選択読出すように
する。このようにすれば、前述の実施例よりも更に正確
に補正を行なうことができる。[0014] In the above embodiment, the cooling temperature ranges from Ta to T.
All fluctuations in the range b are set to one threshold cooling temperature T.
Since the determination is made using c as the determination point, for example, even if the detected cooling temperature is extremely slightly higher than Tc,
It is calculated using the dark current component value of the cooling temperature Tb. Therefore, the correction is not performed accurately enough. Therefore, as shown in FIG. 3, for example, threshold cooling temperatures Tc1 and Tc2 are provided instead of Tc, and accordingly, a memory area 11c is further provided in the memory 11, and the dark current component value V1c of the cooling temperature Tc shown in FIG. Measure and store V2c, . . . in advance. T1c or more in the temperature judgment circuit 10,
If it is determined that T2c or less, the dark current component values V1c, V2c, . . . are selectively read out from the memory area 11c. In this way, it is possible to perform correction more accurately than in the previous embodiment.
【００１５】次に、本発明の第２実施例について説明す
る。図６に示す暗電流成分と暗電流変動成分との和Ｖｎ
（△Ｔ）は、受光素子をｎ，通常冷却温度Ｔａからの温
度変動（温度差）を△Ｔ（＝任意の冷却温度Ｔ−Ｔａ）
とすると、
Ｖｎ（△Ｔ）＝｛（Ｖｎｂ−Ｖｎａ）／（Ｔｂ−Ｔ
ａ）｝△Ｔ＋Ｖｎａで表わすことができる。そこで、各
受光素子毎に、（Ｖ１ｂ−Ｖ１ａ）／（Ｔｂ−Ｔａ）＝
Ａ１ ，（Ｖ２ｂ−Ｖ２ａ）／（Ｔｂ−Ｔａ）＝Ａ２
，…をメモリ１１のメモリエリア１１ａに、Ｖ１ａ＝Ｂ
１ ，Ｖ２ａ＝Ｂ２ ，…をメモリエリア１１ｂに予め
記憶しておく。温度判定回路１０をＡＤ変換器を用いて
構成して温度変動（温度差）△Ｔを検出し、演算論理回
路１２において、各受光素子毎に上記式を演算によって
求め（Ｖ１ （△Ｔ），Ｖ２ （△Ｔ）…）、更に、検
知器出力信号からＶ１ （△Ｔ），Ｖ２ （△Ｔ），…
を減算する。Next, a second embodiment of the present invention will be explained. The sum Vn of the dark current component and the dark current fluctuation component shown in FIG.
(△T) is the light receiving element n, and the temperature fluctuation (temperature difference) from the normal cooling temperature Ta is △T (= arbitrary cooling temperature T - Ta)
Then, Vn(△T)={(Vnb-Vna)/(Tb-T
a)} Can be expressed as △T+Vna. Therefore, for each light receiving element, (V1b-V1a)/(Tb-Ta)=
A1, (V2b-V2a)/(Tb-Ta)=A2
,... in the memory area 11a of the memory 11, V1a=B
1, V2a=B2, . . . are stored in advance in the memory area 11b. The temperature determination circuit 10 is configured using an AD converter to detect temperature fluctuation (temperature difference) ΔT, and the arithmetic logic circuit 12 calculates the above equation for each light receiving element by calculating (V1 (ΔT), V2 (△T)...), and further V1 (△T), V2 (△T),... from the detector output signal.
Subtract.
【００１６】このようにすれば、任意の冷却温度Ｔにお
ける各受光素子の暗電流成分及び暗電流変動成分を除去
でき、前述の各実施例よりも更に正確に補正することが
できる。In this way, the dark current component and dark current fluctuation component of each light receiving element at an arbitrary cooling temperature T can be removed, and correction can be made more accurately than in each of the embodiments described above.
【００１７】次に、本発明の第３実施例について説明す
る。図４は第３実施例の構成図を示し、同図中、図２と
同一構成部分には同一符号を付してその説明を省略する
。図４中、２´は赤外線検知器で、受光素子■〜■と同
列面に冷却温度センサ６が設けられている。第３実施例
では、図２に示す冷却温度センサ出力信号ライン、プリ
アンプ７，温度判定回路１０は設けられていない。Next, a third embodiment of the present invention will be described. FIG. 4 shows a configuration diagram of the third embodiment, and in the figure, the same components as those in FIG. In FIG. 4, 2' is an infrared detector, and a cooling temperature sensor 6 is provided on the same plane as the light receiving elements (1) to (2). In the third embodiment, the cooling temperature sensor output signal line, preamplifier 7, and temperature determination circuit 10 shown in FIG. 2 are not provided.
【００１８】赤外線検知器の出力信号は図６に示すよう
に、各受光素子■，■，…からの信号が順次出力される
が、一般に、あるフレームの出力（受光素子■〜■の出
力）から次のフレームの出力までに時間的隙間がある。
そこで、第３実施例では、冷却温度センサ６を受光素子
■〜■と同列面に設け、受光素子ドライブ信号によって
冷却温度センサ６もドライブして冷却温度センサ６の出
力信号を上記隙間に挿入し、つまり、検知器出力信号に
冷却温度センサ６の出力信号を多重化して出力する。As shown in FIG. 6, the output signals of the infrared detector are sequentially output from each of the light-receiving elements ①, ②, . There is a time gap between the output of the next frame and the output of the next frame. Therefore, in the third embodiment, the cooling temperature sensor 6 is provided on the same plane as the light-receiving elements ■ to ■, and the cooling temperature sensor 6 is also driven by the light-receiving element drive signal, and the output signal of the cooling temperature sensor 6 is inserted into the gap. That is, the output signal of the cooling temperature sensor 6 is multiplexed with the detector output signal and output.
【００１９】この検知器及び冷却温度センサ出力信号は
プリアンプ３，ＡＤ変換器１３を介して演算論理回路１
２に供給され、制御回路１４の制御によって冷却温度セ
ンサ出力信号のみ抜出されて冷却温度に応じた暗電流成
分がメモリ１１内から選択読出される。前述の各実施例
と同様に、演算論理回路１２において検知器出力信号か
ら暗電流成分が減じられる。第３実施例は、前記第１，
第２実施例よりもプリアンプ７，温度判定回路１０が設
けられていない分だけ装置を小形化でき、しかも、冷却
温度センサ６を受光素子■〜■と同列面に設けているの
で冷却温度検出をより正確に行なうことができる。The output signals of the detector and the cooling temperature sensor are sent to the arithmetic logic circuit 1 via the preamplifier 3 and the AD converter 13.
2, only the cooling temperature sensor output signal is extracted under the control of the control circuit 14, and a dark current component corresponding to the cooling temperature is selectively read out from the memory 11. As with the previous embodiments, the dark current component is subtracted from the detector output signal in the arithmetic logic circuit 12. The third embodiment is based on the first,
Compared to the second embodiment, the device can be made more compact since the preamplifier 7 and the temperature determination circuit 10 are not provided.Moreover, since the cooling temperature sensor 6 is provided on the same plane as the light receiving elements 1 to 2, cooling temperature detection is possible. It can be done more accurately.
【００２０】なお、図６に示す受光素子毎の背景入射光
成分のばらつきを補正するための演算論理回路を既に設
けられている装置においては、本発明で用いる演算論理
回路１２と共用でき、回路を複雑化することなく構成で
きる。It should be noted that in an apparatus already provided with an arithmetic logic circuit for correcting variations in background incident light components for each light receiving element shown in FIG. 6, the arithmetic logic circuit 12 used in the present invention can be used in common with the can be configured without complication.
【００２１】[0021]
【発明の効果】本発明によれば、検知器出力から予め記
憶されている各受光素子固有の暗電流成分を減じるよう
にしているので、従来例に比して各受光素子について冷
却温度変動による検知器出力の揺らぎをより正確に補正
でき、装置の高性能化を図ることができる。According to the present invention, since the dark current component unique to each light-receiving element stored in advance is reduced from the detector output, it is possible to reduce the dark current component unique to each light-receiving element, which is stored in advance, from the detector output. Fluctuations in the detector output can be corrected more accurately, and the performance of the device can be improved.
【図１】本発明の原理説明図である。FIG. 1 is a diagram explaining the principle of the present invention.
【図２】本発明の第１実施例の構成図である。FIG. 2 is a configuration diagram of a first embodiment of the present invention.
【図３】冷却温度と暗電流成分との関係を示す図である
。FIG. 3 is a diagram showing the relationship between cooling temperature and dark current component.
【図４】本発明の第２実施例の構成図である。FIG. 4 is a configuration diagram of a second embodiment of the present invention.
【図５】従来の一例の構成図である。FIG. 5 is a configuration diagram of a conventional example.
【図６】赤外線検知器出力信号を示す図である。FIG. 6 is a diagram showing an infrared detector output signal.
【図７】従来例における補正後の出力信号を示す図であ
る。FIG. 7 is a diagram showing an output signal after correction in a conventional example.
■〜■ 赤外線受光素子 ２，２´ 赤外線検知器 ６ 冷却温度センサ １０ 温度判定回路 １１ メモリ（記憶手段） １１ａ，１１ｂ メモリエリア １２ 演算論理回路 １４ 制御回路 １５ 演算制御手段 ■～■ Infrared receiving element 2,2´ Infrared detector 6 Cooling temperature sensor 10 Temperature judgment circuit 11 Memory (storage means) 11a, 11b Memory area 12 Arithmetic logic circuit 14 Control circuit 15 Arithmetic control means
Claims (3)
度センサを設けられ、該赤外線検知器出力から該温度セ
ンサ出力を減じて赤外線検知器出力補正を行なう赤外線
撮像装置において、上記赤外線検知器の各受光素子毎の
、冷却温度と受光素子の暗電流成分との関係を予め記憶
された記憶手段（１１）と、上記温度センサにて検出さ
れた冷却温度に基づいて該記憶手段から各受光素子毎の
暗電流成分を読出し、上記赤外線検知器出力から該読出
した各受光素子の暗電流成分を減じる演算制御手段（１
５）とを設けてなることを特徴とする赤外線撮像装置。1. An infrared imaging device that is provided with a temperature sensor that detects the cooling temperature of an infrared detector, and that corrects the output of the infrared detector by subtracting the output of the temperature sensor from the output of the infrared detector. A storage means (11) in which the relationship between the cooling temperature and the dark current component of the light receiving element is stored in advance for each light receiving element, and each light receiving element is stored from the storage means based on the cooling temperature detected by the temperature sensor. an arithmetic control means (1
5) An infrared imaging device comprising:
度センサを設けられ、該赤外線検知器出力から該温度セ
ンサ出力を減じて赤外線検知器出力補正を行なう赤外線
撮像装置において、上記赤外線検知器の各受光素子毎の
、冷却温度差と冷却温度差による受光素子の暗電流成分
差との比、及び、冷却温度に対する暗電流成分を予め記
憶された記憶手段（１１）と、上記温度センサにて検出
された冷却温度から冷却温度差を求め、該記憶手段から
各受光素子毎の上記比及び暗電流成分を読出して予め設
定されている演算式に基づいて各受光素子毎の、暗電流
成分と暗電流変動成分との和を求め、上記赤外線検知器
出力から該暗電流成分と暗電流変動成分との和を減じる
演算制御手段（１５）とを設けてなることを特徴とする
赤外線撮像装置。2. An infrared imaging device that is provided with a temperature sensor that detects the cooling temperature of the infrared detector, and performs infrared detector output correction by subtracting the temperature sensor output from the infrared detector output, wherein The storage means (11) in which the ratio of the cooling temperature difference to the dark current component difference of the light receiving element due to the cooling temperature difference and the dark current component with respect to the cooling temperature are stored in advance for each light receiving element, and the temperature sensor The cooling temperature difference is determined from the detected cooling temperature, the ratio and the dark current component for each light receiving element are read out from the storage means, and the dark current component and the dark current component for each light receiving element are calculated based on a preset calculation formula. An infrared imaging device characterized by comprising: arithmetic control means (15) for determining the sum of the dark current component and the dark current fluctuation component, and subtracting the sum of the dark current component and the dark current fluctuation component from the output of the infrared detector.
子と同列面に設け、前記赤外線検知器出力に前記温度セ
ンサ出力を多重化して前記演算制御手段（１５）に供給
する構成としたことを特徴とする請求項１又は２の赤外
線撮像装置。3. The temperature sensor (6) is provided on the same plane as each of the light receiving elements, and the temperature sensor output is multiplexed with the infrared detector output and supplied to the calculation control means (15). The infrared imaging device according to claim 1 or 2, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3051698A JPH04286477A (en) | 1991-03-15 | 1991-03-15 | Infrared image pickup device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3051698A JPH04286477A (en) | 1991-03-15 | 1991-03-15 | Infrared image pickup device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04286477A true JPH04286477A (en) | 1992-10-12 |
Family
ID=12894121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3051698A Withdrawn JPH04286477A (en) | 1991-03-15 | 1991-03-15 | Infrared image pickup device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04286477A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001289712A (en) * | 2000-03-03 | 2001-10-19 | Boeing Co:The | Method for correcting video signal of infrared sensor and imaging system |
| JP2007174113A (en) * | 2005-12-20 | 2007-07-05 | Sumitomo Electric Ind Ltd | Obstacle detection system and obstacle detection method |
| JP2008022454A (en) * | 2006-07-14 | 2008-01-31 | Sumitomo Electric Ind Ltd | Obstacle detection system and obstacle detection method |
| JP2008187254A (en) * | 2007-01-26 | 2008-08-14 | Sumitomo Electric Ind Ltd | Infrared imaging apparatus, and output value calculating method for imaging element |
| WO2015072006A1 (en) * | 2013-11-15 | 2015-05-21 | 富士通株式会社 | Infrared ray detection device |
-
1991
- 1991-03-15 JP JP3051698A patent/JPH04286477A/en not_active Withdrawn
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001289712A (en) * | 2000-03-03 | 2001-10-19 | Boeing Co:The | Method for correcting video signal of infrared sensor and imaging system |
| JP2007174113A (en) * | 2005-12-20 | 2007-07-05 | Sumitomo Electric Ind Ltd | Obstacle detection system and obstacle detection method |
| JP2008022454A (en) * | 2006-07-14 | 2008-01-31 | Sumitomo Electric Ind Ltd | Obstacle detection system and obstacle detection method |
| JP2008187254A (en) * | 2007-01-26 | 2008-08-14 | Sumitomo Electric Ind Ltd | Infrared imaging apparatus, and output value calculating method for imaging element |
| WO2015072006A1 (en) * | 2013-11-15 | 2015-05-21 | 富士通株式会社 | Infrared ray detection device |
| JPWO2015072006A1 (en) * | 2013-11-15 | 2017-03-09 | 富士通株式会社 | Infrared detector |
| US9967484B2 (en) | 2013-11-15 | 2018-05-08 | Fujitsu Limited | Infrared detection apparatus |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Application deemed to be withdrawn because no request for examination was validly filed |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19980514 |