JPH04248408A - Measuring method for thickness of coating film - Google Patents

Measuring method for thickness of coating film

Info

Publication number
JPH04248408A
JPH04248408A JP1224791A JP1224791A JPH04248408A JP H04248408 A JPH04248408 A JP H04248408A JP 1224791 A JP1224791 A JP 1224791A JP 1224791 A JP1224791 A JP 1224791A JP H04248408 A JPH04248408 A JP H04248408A
Authority
JP
Japan
Prior art keywords
coating film
thickness
distance
displacement meter
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1224791A
Other languages
Japanese (ja)
Inventor
Masaji Hattori
服部 正司
Taiichi Inaba
稲葉 泰一
Tadashi Kawamura
川村 正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Priority to JP1224791A priority Critical patent/JPH04248408A/en
Publication of JPH04248408A publication Critical patent/JPH04248408A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PURPOSE:To measure the thickness of a coating film in an non contact state by measuring the distances from a reference position to the surfaces of the paint film and metal coated with the film with a laser displacement gauge and magnetic displacement gauge and finding the difference between the distances to the surfaces of the coating film and metal. CONSTITUTION:When a laser displacement gauge 11 is actuated, the distance L1 to the surface of a coating film 2 is found and its corresponding signal is outputted. In addition, an eddy current displacement gauge 12 detects the distance L2 to the surface of the steel plate 1 coated with the film 2 and outputs its corresponding signal. the signals are amplified by means of an amplifier 13, converted into digital signals by means of an A/D converter 14, and supplied to a personal computer 15. The computer 15 finds the thickness (t) of the coating film 2 from the difference (L2-L1) between the inputted distance signals. therefore, the thickness of the coating film can be measured with high accuracy in a non contact state.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は金属構造物への高分子材
料の塗装防蝕施工において塗膜厚さを非接触で精度良く
測定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for accurately measuring the thickness of a coating film in a non-contact manner when coating a metal structure with a polymeric material to prevent corrosion.

【0002】0002

【従来の技術】従来から塗膜厚さを測定する方法には各
種の方法があるが、例えば磁力式センサや渦流センサを
用いた方法においては、塗膜にセンサを押し付けて塗膜
の厚さにより変化するインダクタンス等の電磁気的な特
性を利用して塗膜の厚さを計測していた。
[Prior Art] There are various methods for measuring the thickness of a coating film. For example, in the method using a magnetic force sensor or an eddy current sensor, the thickness of the coating film is measured by pressing the sensor against the coating film. The thickness of the paint film was measured using electromagnetic characteristics such as inductance, which changes due to the change in inductance.

【0003】また、特開昭55−149803号公報に
は静電容量型距離測定計によって塗膜の厚さを測定する
方法が開示されている。
[0003] Furthermore, Japanese Patent Application Laid-Open No. 149803/1983 discloses a method of measuring the thickness of a coating film using a capacitance type distance meter.

【0004】0004

【発明が解決しようとする課題】磁力式センサや渦流セ
ンサを用いた測定方法においては、センサを塗膜に押し
付けていため、その加圧力で塗膜が変形し、また、その
押し付け力は測定者によってバラツキがあり、正確な塗
膜厚さの測定ができないという問題点があった。更に、
塗膜が完全に乾燥してからでないと測定できず、従って
、塗装作業中に塗膜厚さを知りたいという現場の要請に
は応えることができないという問題点があった。
[Problems to be Solved by the Invention] In measurement methods using magnetic force sensors or eddy current sensors, the sensor is pressed against the paint film, and the paint film is deformed by the pressure applied. There was a problem that the coating film thickness could not be accurately measured due to variations in the coating thickness. Furthermore,
There is a problem in that it cannot be measured until the paint film is completely dry, and therefore it cannot meet the on-site demand for knowing the thickness of the paint film during the painting process.

【0005】静電容量型距離測定計による測定方法にお
いては、塗膜が厚くなるに従って測定精度が悪化し、ま
た塗膜厚さが同じでもその種類(材料)により静電容量
が異なり、塗膜材料に応じた補正が必要である。更に、
磁力式センサ等の場合と同様に塗膜が完全に乾燥してか
らでないと測定できなかった。つまり、塗膜が完全に乾
燥していないと、塗膜厚さが同じでも静電容量が異なり
その補正も困難であり、また水に濡れていると静電容量
が大幅に変化してしまい測定できなかった。更に、測定
精度が外部の誘導により影響を受けるという問題点があ
った。
[0005] In the measurement method using a capacitive distance measuring meter, the measurement accuracy deteriorates as the coating film becomes thicker, and even if the coating thickness is the same, the capacitance differs depending on the type (material), Correction is required depending on the material. Furthermore,
As with magnetic sensors, measurements could not be made until the coating film was completely dry. In other words, if the paint film is not completely dry, the capacitance will be different even if the film thickness is the same, and it will be difficult to correct for it.Also, if the paint film is wet, the capacitance will change significantly and the measurement will be difficult. could not. Furthermore, there is a problem in that measurement accuracy is affected by external guidance.

【0006】本発明は、このような問題点を解決するた
めになされたものであり、非接触で高精度に塗膜の厚さ
を測定することを可能にして塗膜厚さの測定方法を提供
することを目的とする。
The present invention has been made to solve these problems, and provides a method for measuring coating film thickness by making it possible to measure coating film thickness with high precision in a non-contact manner. The purpose is to provide.

【0007】[0007]

【課題を解決するための手段及び作用】本発明の塗膜厚
さの測定方法は、基準位置から塗膜の表面までの距離を
レーザ変位計又は超音波変位計により測定する工程と、
基準位置から金属の表面までの距離を磁気変位計により
測定する工程と、基準位置から金属の表面までの距離と
塗膜の表面までの距離との差に基づいて塗膜の厚さを求
める工程とを有する。
[Means and effects for solving the problems] The coating film thickness measuring method of the present invention includes the steps of measuring the distance from the reference position to the surface of the coating film using a laser displacement meter or an ultrasonic displacement meter;
The process of measuring the distance from the reference position to the metal surface using a magnetic displacement meter, and the process of determining the thickness of the paint film based on the difference between the distance from the reference position to the metal surface and the distance to the paint film surface. and has.

【0008】[0008]

【実施例】図1はこの発明の一実施例に係る塗膜厚さの
測定方法を実施した測定装置の構成を示すブロック図で
ある。図において、1は例えば鋼板であり、2はその上
に塗布された塗膜である。10はセンサ部であり、レー
ザ変位計11及び渦流変位計12が機械的に一体化され
ており、鋼板1に対して対向した任意の距離の位置に配
置してある。このレーザ変位計11及び渦流変位計12
をそれらの背後から見た位置関係は図2に示したとおり
であり、両者は併置されそれぞれの測定点が一致するよ
うに配置されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram showing the configuration of a measuring device that implements a coating film thickness measuring method according to an embodiment of the present invention. In the figure, 1 is, for example, a steel plate, and 2 is a coating film applied thereon. 10 is a sensor section in which a laser displacement meter 11 and an eddy current displacement meter 12 are mechanically integrated, and is arranged at a position facing the steel plate 1 at an arbitrary distance. This laser displacement meter 11 and eddy current displacement meter 12
The positional relationship seen from behind them is as shown in FIG. 2, and both are placed side by side and arranged so that their respective measurement points coincide.

【0009】13は増幅器であり、レーザ変位計11及
び渦流変位計12からの計測信号を増幅する。14はA
/D変換器であり、増幅器13からのアナログ信号をデ
ジタル信号に変換する。15はパーソナルコンピュータ
(以下パソコンという)であり、A/D変換器からの信
号に基づいて塗膜2の厚さtを求める。
Reference numeral 13 denotes an amplifier, which amplifies measurement signals from the laser displacement meter 11 and the eddy current displacement meter 12. 14 is A
/D converter, which converts the analog signal from the amplifier 13 into a digital signal. 15 is a personal computer (hereinafter referred to as a personal computer), which determines the thickness t of the coating film 2 based on a signal from an A/D converter.

【0010】次に動作説明をする。レーザ変位計11を
作動させると塗膜2の表面までの距離L1を求めそれに
対応した信号を出力する。また、渦流変位計12は鋼板
1の表面までの距離L2を求めそれに対応した信号を出
力する。増幅器13ではそれらの信号をそれぞれ適当に
増幅した後、A/D変換器14に送り出す。A/D変換
器14は入力してきた距離信号であるアナログ信号をデ
ジタル信号に変換してパソコン15に送り出す。パソコ
ン15では入力してきた距離信号の差(=L2−L1)
により塗膜2の厚さtを求める。
Next, the operation will be explained. When the laser displacement meter 11 is activated, the distance L1 to the surface of the coating film 2 is determined and a signal corresponding to the distance L1 is determined. Further, the eddy current displacement meter 12 determines the distance L2 to the surface of the steel plate 1 and outputs a signal corresponding to the distance L2. The amplifier 13 appropriately amplifies these signals and then sends them to the A/D converter 14. The A/D converter 14 converts the input analog signal, which is a distance signal, into a digital signal and sends it to the personal computer 15. In the computer 15, the difference between the input distance signals (=L2-L1)
The thickness t of the coating film 2 is determined by .

【0011】なお、塗膜2までの距離を測定するセンサ
はレーザ変位計11の代わりに超音波変位計を用いても
よく、また、鋼板1などの金属面との距離を測定する磁
気変位計は渦流変位計12に限られるものではなく他の
形式の変位計であってもよい。
[0011] As the sensor for measuring the distance to the coating film 2, an ultrasonic displacement meter may be used instead of the laser displacement meter 11, and a magnetic displacement meter for measuring the distance to a metal surface such as the steel plate 1 may be used. is not limited to the eddy current displacement meter 12, but may be any other type of displacement meter.

【0012】ところで、図1の測定装置は非接触の金属
表面粗さ計にも適用できる。図3は金属の表面粗さ計に
適用したときの動作説明図である。レーザ変位計11は
ビームスポットを100μm以下に設定することができ
るので、塗装の前処理のためにショットブラストなどで
荒らされた金属表面の凹凸を検出することができる。図
においてL10はレーザ変位計11により測定された距
離の軌跡を示している。
By the way, the measuring device shown in FIG. 1 can also be applied to a non-contact metal surface roughness meter. FIG. 3 is an explanatory diagram of the operation when applied to a metal surface roughness meter. Since the beam spot of the laser displacement meter 11 can be set to 100 μm or less, it is possible to detect irregularities on a metal surface roughened by shot blasting or the like for pretreatment of painting. In the figure, L10 indicates the trajectory of the distance measured by the laser displacement meter 11.

【0013】一方、渦流変位計12は10mm前後の広
い範囲で平均的な距離を測定するため、その測定軌跡は
L20に示すように平均距離の軌跡となる。従って、こ
の2つのL10及びL20をパソコン15で演算処理す
ることにより金属の表面粗さが得られる。
On the other hand, since the eddy current displacement meter 12 measures an average distance over a wide range of about 10 mm, its measurement locus becomes an average distance locus as shown at L20. Therefore, the surface roughness of the metal can be obtained by arithmetic processing of these two L10 and L20 using the personal computer 15.

【0014】[0014]

【発明の効果】以上のように本発明によれば、塗膜表面
までの距離及び金属表面までの距離をレーザー変位計又
は超音波センサ及び磁気センサによりそれぞれ求めてそ
の差により塗膜の厚さを求めるようにしたので、非接触
でかつ高精度に塗膜の厚さが測定できる。
As described above, according to the present invention, the distance to the paint film surface and the distance to the metal surface are respectively determined by a laser displacement meter, an ultrasonic sensor, and a magnetic sensor, and the thickness of the paint film is calculated based on the difference. , the thickness of the coating film can be measured non-contact and with high precision.

【0015】つまり、レーザー変位計又は超音波センサ
により塗膜の表面までの距離を求めるようにしたので、
塗膜が厚くなっても測定精度が劣化することがなく、塗
膜材料の相違によって測定値が異なるということもなく
、塗膜が乾いていない状態であっても、一定の測定精度
で測定できるので、塗装作業中に塗膜の厚さがリアルタ
イムで認識でき、その情報を自動塗装機にフィードバッ
クすることにより塗装作業が無人でできる。更に、塗膜
表面との距離を大きくとることができ、また、焦点を絞
ることにより直径0.2ミクロン程度の狭い範囲の塗膜
厚さが測定でき、局部の塗膜の厚さの変化を精度よく測
定できる。また、測定精度が外部の環境の変化を受けず
らいという利点もある。
In other words, since the distance to the surface of the coating film is determined using a laser displacement meter or an ultrasonic sensor,
Measurement accuracy does not deteriorate even when the paint film becomes thick, and measurement values do not differ due to differences in paint film materials, and measurements can be made with constant measurement accuracy even when the paint film is not dry. Therefore, the thickness of the paint film can be recognized in real time during the painting process, and this information is fed back to the automatic coating machine, allowing the painting process to be completed unattended. Furthermore, it is possible to maintain a large distance from the paint film surface, and by narrowing the focus, it is possible to measure the paint film thickness in a narrow range of about 0.2 microns in diameter, and to detect changes in local paint film thickness. Can be measured with high accuracy. Another advantage is that measurement accuracy is less susceptible to changes in the external environment.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の一実施例に係る塗膜厚さの測定方法を
実施例した測定装置のブロック図である。
FIG. 1 is a block diagram of a measuring device implementing a coating film thickness measuring method according to an embodiment of the present invention.

【図2】図1のレーザ変位計及び渦流変位計をその背面
から見た状態の配置を示す図である。
FIG. 2 is a diagram showing the arrangement of the laser displacement meter and eddy current displacement meter of FIG. 1 as viewed from the back.

【図3】図1の測定装置を金属の表面粗さの測定に適用
した場合の説明図である。
FIG. 3 is an explanatory diagram when the measuring device of FIG. 1 is applied to measuring the surface roughness of metal.

【符号の説明】[Explanation of symbols]

1  鋼板 2  塗膜 11  レーザ変位計 12  渦流変位計 1 Steel plate 2 Coating film 11 Laser displacement meter 12 Eddy current displacement meter

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  金属板上のに塗布された塗膜厚さを測
定する方法において、基準位置から塗膜の表面までの距
離をレーザ変位計により測定する工程と、基準位置から
金属の表面までの距離を磁気変位計により測定する工程
と、基準位置から金属の表面までの距離と塗膜の表面ま
での距離との差に基づいて塗膜の厚さを求める工程とを
有することを特徴とする塗膜厚さの測定方法。
Claim 1: A method for measuring the thickness of a coating film applied on a metal plate, comprising: measuring the distance from a reference position to the surface of the coating film using a laser displacement meter; and a step of determining the thickness of the coating film based on the difference between the distance from the reference position to the surface of the metal and the distance to the surface of the coating film. How to measure coating film thickness.
【請求項2】  レーザ変位計の代わりに超音波変位計
を用いることを特徴とする請求項1記載の塗膜厚さの測
定方法。
2. The method for measuring coating film thickness according to claim 1, wherein an ultrasonic displacement meter is used in place of the laser displacement meter.
JP1224791A 1991-02-01 1991-02-01 Measuring method for thickness of coating film Pending JPH04248408A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1224791A JPH04248408A (en) 1991-02-01 1991-02-01 Measuring method for thickness of coating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1224791A JPH04248408A (en) 1991-02-01 1991-02-01 Measuring method for thickness of coating film

Publications (1)

Publication Number Publication Date
JPH04248408A true JPH04248408A (en) 1992-09-03

Family

ID=11800039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1224791A Pending JPH04248408A (en) 1991-02-01 1991-02-01 Measuring method for thickness of coating film

Country Status (1)

Country Link
JP (1) JPH04248408A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0589315A1 (en) * 1992-09-24 1994-03-30 Krupp Hoesch Tecna Aktiengesellschaft Device for measuring the coating thickness of a steel tubular article moving continuously in its axial direction
KR20020006355A (en) * 2000-07-12 2002-01-19 이구택 Coating Weight Measurement System
JP2003014616A (en) * 2001-06-28 2003-01-15 Toshiba Corp Friction force-measuring apparatus and method
JP2019078719A (en) * 2017-10-27 2019-05-23 日本ウレタンエンジニアリング株式会社 Urethane thickness indicator pin, and prescribed urethane spraying method using urethane thickness indicator pin

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0589315A1 (en) * 1992-09-24 1994-03-30 Krupp Hoesch Tecna Aktiengesellschaft Device for measuring the coating thickness of a steel tubular article moving continuously in its axial direction
KR20020006355A (en) * 2000-07-12 2002-01-19 이구택 Coating Weight Measurement System
JP2003014616A (en) * 2001-06-28 2003-01-15 Toshiba Corp Friction force-measuring apparatus and method
JP4703041B2 (en) * 2001-06-28 2011-06-15 株式会社東芝 Friction force measuring device and measuring method
JP2019078719A (en) * 2017-10-27 2019-05-23 日本ウレタンエンジニアリング株式会社 Urethane thickness indicator pin, and prescribed urethane spraying method using urethane thickness indicator pin

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