JPH0414298B2 - - Google Patents
Info
- Publication number
- JPH0414298B2 JPH0414298B2 JP6296984A JP6296984A JPH0414298B2 JP H0414298 B2 JPH0414298 B2 JP H0414298B2 JP 6296984 A JP6296984 A JP 6296984A JP 6296984 A JP6296984 A JP 6296984A JP H0414298 B2 JPH0414298 B2 JP H0414298B2
- Authority
- JP
- Japan
- Prior art keywords
- spectrum
- concentration
- interference
- sample
- target substance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001228 spectrum Methods 0.000 claims description 79
- 239000013076 target substance Substances 0.000 claims description 22
- 239000000126 substance Substances 0.000 claims description 18
- 230000003595 spectral effect Effects 0.000 claims description 17
- 238000004364 calculation method Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 4
- 238000003672 processing method Methods 0.000 claims description 2
- 238000010408 sweeping Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 9
- 238000010521 absorption reaction Methods 0.000 description 7
- 238000000862 absorption spectrum Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 5
- 230000005284 excitation Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000000295 emission spectrum Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000009499 grossing Methods 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6296984A JPS60205336A (ja) | 1984-03-30 | 1984-03-30 | スペクトル分析装置における混在物質の干渉スペクトル除去処理方式 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6296984A JPS60205336A (ja) | 1984-03-30 | 1984-03-30 | スペクトル分析装置における混在物質の干渉スペクトル除去処理方式 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60205336A JPS60205336A (ja) | 1985-10-16 |
JPH0414298B2 true JPH0414298B2 (ru) | 1992-03-12 |
Family
ID=13215676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6296984A Granted JPS60205336A (ja) | 1984-03-30 | 1984-03-30 | スペクトル分析装置における混在物質の干渉スペクトル除去処理方式 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60205336A (ru) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007502432A (ja) * | 2003-05-06 | 2007-02-08 | ベイカー ヒューズ インコーポレイテッド | 炭化水素試料の分析用の波長可変ダイオードレーザ分光計を用いる方法及び装置 |
JP2011174798A (ja) * | 2010-02-24 | 2011-09-08 | Mitsui Eng & Shipbuild Co Ltd | スペクトラム分析装置及びスペクトラム分析方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0718795B2 (ja) * | 1986-04-03 | 1995-03-06 | 株式会社日立製作所 | 発光分析装置 |
US5014216A (en) * | 1988-07-19 | 1991-05-07 | Beckman Instruments, Inc. | Concentration determination with multiple wavelength flash photometers |
US4921350A (en) * | 1989-02-10 | 1990-05-01 | Beckman Instruments, Inc. | Monochromator second order subtraction method |
JP2519325B2 (ja) * | 1989-09-13 | 1996-07-31 | 株式会社日立製作所 | 臨床検査用の自動分析装置および方法 |
US5807750A (en) * | 1995-05-02 | 1998-09-15 | Air Instruments And Measurements, Inc. | Optical substance analyzer and data processor |
-
1984
- 1984-03-30 JP JP6296984A patent/JPS60205336A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007502432A (ja) * | 2003-05-06 | 2007-02-08 | ベイカー ヒューズ インコーポレイテッド | 炭化水素試料の分析用の波長可変ダイオードレーザ分光計を用いる方法及び装置 |
JP2011174798A (ja) * | 2010-02-24 | 2011-09-08 | Mitsui Eng & Shipbuild Co Ltd | スペクトラム分析装置及びスペクトラム分析方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS60205336A (ja) | 1985-10-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107014759B (zh) | 用于减少吸收光谱测量中的基线失真的影响的方法和*** | |
US7868296B2 (en) | Spectroscopy having correction for broadband distortion for analyzing multi-component samples | |
Plane et al. | Differential optical absorption spectrometer for measuring atmospheric trace gases | |
RU2396546C2 (ru) | Спектрофотометр | |
US4084906A (en) | Multigas digital correlation spectrometer | |
US4441815A (en) | Self-modulating spectrometer | |
JP4079404B2 (ja) | Ftir法による多成分ガス分析方法 | |
CN111239072B (zh) | 一种精确测量燃烧气体温度的方法 | |
JPH0414298B2 (ru) | ||
JP4048139B2 (ja) | 濃度測定装置 | |
JP3261842B2 (ja) | 非分散形赤外線ガス分析計 | |
US20050280812A1 (en) | Numerical data processing dedicated to an integrated microspectrometer | |
JP7440866B2 (ja) | レーザ式ガス分析装置 | |
JPH07198600A (ja) | フーリエ変換多成分連続吸光分析計 | |
RU51742U1 (ru) | Газоанализатор | |
JP3004748B2 (ja) | フーリエ変換赤外分光計を用いた定量分析方法 | |
Maines et al. | Repetitive Wavelength Scanning in Qualitative and Quantitative Flame Emission Spectroscopy | |
RU2805385C2 (ru) | Способ коррекции изменения амплитуды в спектрометре | |
Werle | Analytical applications of infrared semiconductor lasers in atmospheric trace gas monitoring | |
US4990781A (en) | Spectroscopically operating infrared hygrometer | |
JP7473546B2 (ja) | 分析装置 | |
RU2095788C1 (ru) | Газоанализатор | |
Vickers et al. | On-line monitoring by Raman spectroscopy: instrument control and calibration | |
Hart et al. | Use of partial least squares regression for the multivariate calibration of hazardous air pollutants in open-path FT-IR spectrometry | |
JP2023520836A (ja) | キュベットを通る光路長を判定する方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |